CN101349652A - Detection imaging method and apparatus of strip surface flaw - Google Patents
Detection imaging method and apparatus of strip surface flaw Download PDFInfo
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- CN101349652A CN101349652A CNA2007100440054A CN200710044005A CN101349652A CN 101349652 A CN101349652 A CN 101349652A CN A2007100440054 A CNA2007100440054 A CN A2007100440054A CN 200710044005 A CN200710044005 A CN 200710044005A CN 101349652 A CN101349652 A CN 101349652A
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Abstract
The invention discloses an imaging method and a device for detecting band surface defects, wherein the method comprises establishing a sync signal generating unit to generate sync signals, synchronously controlling a switching unit and a camera shooting unit, establishing a light source switching unit, using the switching unit to switch and control the following two light sources, and using the two light sources to alternatively light the surfaces of bands, and respectively and only forming a single ground (a light field, a dark field) to image with the camera shooting unit in a scanning cycle, and obtaining total band surface defect images. The same defect on the band surface can be accurately matched with images which are formed on the same camera shooting unit and different illumination fields. The method avoids the post-treatment problem which is generated by the same defect which repeatedly images, greatly improves the accuracy of detecting the band surface defects, and in addition, and the method further lowers the production cost of the image device and the complexity of the structure.
Description
Technical field
The present invention relates to finished surface defects detection to band, more particularly, relate to a kind of strip surface defects detection formation method and device, this formation method and device can realize using same defective that one group of image unit just can obtain existing whole defectives of strip surface and strip surface throw light in different fields under the images of formation can accurately mate.
Background technology
In each big band manufacturing enterprise of the world, obtained widespread use based on the strip surface defect detecting system of machine vision.Such detection system all adopts ccd video camera to obtain the strip surface image earlier, then by view data is analyzed, draws the detection conclusion.Therefore, the sharpness of imaging and show defective especially and the diversity factor of background directly has influence on the detection effect of this vision detection system.
Formation method at present commonly used has a lot, comprises light field imaging, details in a play not acted out on stage, but told through dialogues imaging and mistake crossing site imaging, see also shown in Figure 1, even light field imaging video camera 1 shooting angle and light source 2 irradiating angles are the normal symmetry; See also shown in Figure 2, asymmetric even details in a play not acted out on stage, but told through dialogues imaging video camera 1 shooting angle and light source 2 irradiating angles are normal; See also shown in Figure 3ly, and cross video camera 1 shooting angle of crossing site imaging and light source 2 irradiating angles between light field and details in a play not acted out on stage, but told through dialogues.More than three kinds of formation methods all be by one group of video camera 1 and single the imaging that light source 2 constitutes, this single imaging can obtain the major part contrast images of strip surface 3 defectives clearly, but its shortcoming is can be insensitive to some specific defective, thereby causes some important defectives of omission.In order to improve universality to various defectives, also have two formation methods that combine by with two single imagings at present, see also shown in Figure 4, this pair field formation method constitutes the details in a play not acted out on stage, but told through dialogues imaging by light source 2b and video camera 1b, and light source 2a and the imaging of video camera 1a formation light field, thereby respectively strip surface 3 is scanned, generate defect image; See also shown in Figure 5ly, in order to reduce system cost and structural complexity, two the formation methods of Fig. 4 are simplified, make same light source 2 and video camera 1b, video camera 1a constitute two of details in a play not acted out on stage, but told through dialogues and light field respectively and form picture.This pair field formation method can obtain comprehensive band defect information, improve the accuracy rate of defects detection, but be compared to single formation method, owing to increased hardware cost and structural complexity, also just increased the defective data treatment capacity, thereby reduced the real-time of imaging, for example, same defective is formed the image that can be different characteristic in the picture two, makes defect image be difficult to accurate coupling, causes producing the phenomenon that one group of defective repeats to quote even be classified as different defectives.
Summary of the invention
The shortcoming of omission, two complicated cost height of imaging arrangement and real-time difference easily takes place at above-mentioned single the imaging that exists in the prior art, the purpose of this invention is to provide a kind of strip surface defects detection formation method and device, this formation method and device can be simple in structure, cost is low, real-time is good, and the images that the same defective of strip surface is formed under different illuminations can accurately mate.
For achieving the above object, the present invention adopts following technical scheme:
The concrete steps of this strip surface defects detection formation method are as follows:
A. set up a synchronous signal generating unit and produce synchronizing signal, following light source switch unit and image unit are carried out synchro control;
B. set up a light source switch unit, use this switch unit that following two light sources are carried out switching controls;
C. use two light sources alternately to the strip surface illumination, and constitute single imaging with image unit respectively.
The concrete steps of the generation synchronizing signal in the described steps A are as follows:
A1. adopt synchronous generator to send original synchronizing signal;
A2. use wave filter that original synchronizing signal is carried out filtering;
A3. by reshaper filtered synchronizing signal is carried out shaping;
A4. the synchronizing signal of frequency of utilization modulator after to shaping carried out frequency modulation (PFM), forms desirable synchronizing signal.
Synchronizing signal in the described steps A also can directly be produced by synchronous generator.
In step C:
The illumination frequencies of two light sources is chosen for image unit sweep frequency 1/2nd.
This strip surface defects detection imaging device comprises:
Synchronizing signal generating unit, this unit produce and make switch unit and image unit carry out synchronous synchronizing signal;
Switch unit has two output control terminals, is connected respectively to two radiation sources, the switching of two radiation sources of control;
Image unit;
Two radiation sources alternately throw light on to strip surface, and constitute single with image unit respectively.
Described synchronizing signal generating unit comprises synchronous generator, wave filter, reshaper and frequency modulator, synchronous generator sends original synchronizing signal, wave filter, reshaper and frequency modulator carry out filtering, shaping and frequency modulation (PFM) to original synchronizing signal successively, form desirable synchronizing signal.
The illumination frequencies of described two light sources be image unit sweep frequency 1/2nd.
In technique scheme, strip surface defects detection formation method of the present invention carries out synchro control for setting up a synchronous signal generating unit and producing synchronizing signal to switch unit and image unit; Use switch unit that two light sources are carried out switching controls; Use two light sources alternately to the strip surface illumination, and constitute single imaging with image unit respectively.Detect imaging device and comprise synchronizing signal generating unit, switch unit, image unit, two radiation sources.This formation method and device are main by the alternately illumination of two radiation sources of switching controls, make light source and image unit in a scan period, only constitute a single imaging, to obtain whole strip surface defect images, and the same defective of strip surface can accurately be mated at same image unit, different the images that form under throwing light on, avoided same defect because of repeating the subsequent treatment problem that imaging produces, improve the accuracy of strip surface defects detection greatly, also reduced the cost of imaging device and the complicacy of structure in addition.
Description of drawings
Fig. 1 is the principle schematic of the light field imaging of prior art;
Fig. 2 is the principle schematic of the details in a play not acted out on stage, but told through dialogues imaging of prior art;
Fig. 3 is the principle schematic of crossing the crossing site imaging of prior art;
Fig. 4 is the principle schematic of two imagings of prior art;
Fig. 5 is the principle schematic of two imagings after the simplification of prior art;
Fig. 6 is the schematic flow sheet of strip surface defects detection formation method of the present invention;
Fig. 7 is the image-forming principle synoptic diagram of strip surface defects detection imaging device of the present invention;
Fig. 8 is the schematic block diagram according to the strip surface defect detecting device of an application example of the present invention;
Fig. 9 is the signal timing diagram of each unit of strip surface defects detection imaging device of the present invention.
Embodiment
Further specify technical scheme of the present invention below in conjunction with drawings and Examples.
See also shown in Figure 6ly, the concrete steps of strip surface defects detection formation method of the present invention are: set up a synchronous signal generating unit earlier and produce synchronizing signal, switch unit and image unit are carried out synchro control; Set up one then and switch the unit, use this switch unit that following two light sources are carried out switching controls; Re-use two light sources alternately to the strip surface illumination, and constitute single imaging with image unit respectively, thereby form the scanning imagery that image unit carries out strip surface.Wherein, synchronizing signal can directly be produced by synchronous generator, also can look concrete condition, adopts synchronous generator to send original synchronizing signal earlier; Use wave filter that original synchronizing signal is carried out filtering then; By reshaper filtered synchronizing signal is carried out shaping again; The synchronizing signal of last frequency of utilization modulator after to shaping carried out frequency modulation (PFM), forms desirable synchronizing signal and exports.This synchronous generator can be chosen speed encoder, the synchronizing signal that speed encoder sends should with the synchronous or proportional coupling of window of web velocities.This switch unit can be chosen high frequency relay or HF switch pipe, or other on-off circuit.For instance,, utilize often opening and normally closed two contacts of high frequency relay, control the conducting of switching two light sources, make two light sources alternately throw light on strip surface with this frequency by the frequency of the synchronizing signal of importing if adopt high frequency relay.Two light sources are arranged to single imaging with image unit respectively, and for example one is the light field imaging, and another is the details in a play not acted out on stage, but told through dialogues imaging, like this, when constituting the light source conducting of light field, just carries out the light field imaging with image unit, closes and constitute the light source of details in a play not acted out on stage, but told through dialogues this moment; Equally when constituting the light source conducting of details in a play not acted out on stage, but told through dialogues, just switch to the details in a play not acted out on stage, but told through dialogues imaging, and the light source that constitutes light field is at this moment closed, and remains and repeat to hocket, the illumination frequencies of two light sources is chosen for image unit sweep frequency 1/2nd.Image unit can adopt general common linear array CCD camera, and strip surface is carried out scanning imagery.Because image unit is an identical signal with the synchronizing signal that switch unit receives, therefore the sweep frequency of image unit and the switching frequency of switch unit remain synchronously, realized that light source and image unit only carry out a single imaging in a scan period, thereby guaranteed that the strip surface defect image that image unit obtains is unique, can not duplicate the scanning phenomenon.The image that the same defective that makes strip surface forms under a different illuminated field can accurately mate, avoided same defect because of repeating the subsequent treatment problem that imaging produces, improved the accuracy of strip surface defects detection greatly, effect is remarkable, not only be suitable for work condition environment cold-rolled band surface defects detection preferably, but also be suitable for the strip surface defects detection under the more abominable hot-rolled band surface defects detection of environment and other the various environment.
See also shown in Figure 7, strip surface defects detection imaging device 10 of the present invention comprises synchronizing signal generating unit 11, synchronizing signal generating unit 11 is connected respectively to switch unit 12, image unit 13, synchronizing signal generating unit 11 sends synchronizing signal, and control switch unit 12 and image unit 13 is synchronous; Switch unit 12 is connected respectively to two radiation source 14a, 14b, and controls the switching of two radiation source 14a, 14b; Two radiation source 14a, 14b alternately throw light on to strip surface 3, and constitute single imaging with image unit 13 respectively, thereby make 13 pairs of strip surface of image unit 3 carry out scanning imagery.Please in conjunction with shown in Figure 8, this synchronizing signal generating unit 11 is a single synchronous generator.When the bigger synchronizing signal of needs, also can look concrete condition, make this synchronizing signal generating unit comprise synchronous generator, wave filter 112, reshaper 113 and frequency modulator 114, synchronous generator can be chosen speed encoder 111, the synchronizing signal that speed encoder 111 sends should with the synchronous or proportional coupling of window of web velocities.Send original synchronizing signal by speed encoder 111, wave filter 112, reshaper 113 and frequency modulator 114 carry out filtering, shaping and frequency modulation (PFM) to original synchronizing signal successively, finally form desirable synchronizing signal and output.Switch unit 12 can be chosen high frequency relay or HF switch pipe 121, or other on-off circuit.When adopting high frequency relay, utilize often opening and normally closed two contacts of high frequency relay 121, frequency by the synchronizing signal of importing is carried out switching controls to the conducting of two light source 14a, 14b, makes two light source 14a, 14b alternately throw light on to strip surface 3 with this frequency.Two light source 14a, 14b are arranged to single imaging with image unit 13 respectively, for example shown in Figure 8, light source 14a and image unit 13 have constituted a light field imaging, light source 14b and image unit 13 have constituted a details in a play not acted out on stage, but told through dialogues imaging, image unit 13 can adopt general common linear array CCD camera 131, and strip surface 3 is carried out scanning imagery.Please again in conjunction with shown in Figure 9, because image unit 13 is an identical signal with the synchronizing signal that switch unit 12 receives, therefore the sweep frequency of image unit 13 and the switching frequency of switch unit 12 remain synchronously, in addition, two radiation source 14a, the illumination frequencies of 14b be image unit 13 sweep frequency 1/2nd, when first rising edge of the switching signal of switch unit 12 arrives, light source 14a conducting, light source 14a carries out bright field illumination, image unit 13 scannings are simultaneously also carried out the light field imaging, this moment, light source 14b closed, when next rising edge arrives, light source 14a closes, light source 14b begins conducting, and carry out dark ground illumination, image unit 13 scannings are simultaneously also carried out the details in a play not acted out on stage, but told through dialogues imaging, until the arrival of the rising edge of next switching signal again, and remain and repeat to hocket, therefore realized light source 14a, 14b and image unit 13 in a scan period, only carry out a single imaging, thereby the defect image that has guaranteed the strip surface 3 that image unit 13 obtains is unique, can not duplicate the scanning phenomenon.The image that the same defective that makes strip surface 3 forms under a different illuminated field can accurately mate, avoided same defect because of repeating the subsequent treatment problem that imaging produces, improved the accuracy of strip surface 3 defects detection greatly, effect is remarkable, not only be suitable for work condition environment cold-rolled band surface defects detection preferably, but also be suitable for the strip surface defects detection under the more abominable hot-rolled band surface defects detection of environment and other the various environment.
Need to prove, in the present invention, detect the field that formation method and device are used, can be to sheet metal strip (copper, aluminium, steel etc.), or the surface defects detection of other nonmetal band (plastics etc.).
Those of ordinary skill in the art will be appreciated that, above embodiment is used for illustrating the present invention, and be not to be used as limitation of the invention, as long as in connotation scope of the present invention, all will drop in claims scope of the present invention variation, the modification of the above embodiment.
Claims (7)
1. a strip surface defects detection formation method is characterized in that,
The concrete steps of this formation method are as follows:
A. set up a synchronous signal generating unit and produce synchronizing signal, following switch unit and image unit are carried out synchro control;
B. set up a light source switch unit, use this switch unit that following two light sources are carried out switching controls;
C. use two light sources alternately to the strip surface illumination, and constitute single imaging with image unit respectively.
2. strip surface defects detection formation method as claimed in claim 1 is characterized in that,
The concrete steps of the generation synchronizing signal in the described steps A are as follows:
A1. adopt synchronous generator to send original synchronizing signal;
A2. use wave filter that original synchronizing signal is carried out filtering;
A3. by reshaper filtered synchronizing signal is carried out shaping;
A4. the synchronizing signal of frequency of utilization modulator after to shaping carried out frequency modulation (PFM), forms desirable synchronizing signal.
3. strip surface defects detection formation method as claimed in claim 1 is characterized in that,
Synchronizing signal in the described steps A also can directly be produced by synchronous generator, and switch unit and image unit are carried out synchro control.
4. strip surface defects detection formation method as claimed in claim 1 is characterized in that:
In step C:
The illumination frequencies of two light sources is chosen for image unit sweep frequency 1/2nd.
5. a strip surface defects detection imaging device is characterized in that,
This imaging device comprises:
Synchronizing signal generating unit, this unit produce and make light source switch unit and image unit carry out synchronous synchronizing signal;
The light source switch unit has two output control terminals, is connected respectively to two radiation sources, the switching of two radiation sources of control;
Image unit;
Two radiation sources alternately throw light on to strip surface, and constitute single imaging with image unit respectively.
6. strip surface defects detection imaging device as claimed in claim 5 is characterized in that:
Described synchronizing signal generating unit comprises synchronous generator, wave filter, reshaper and frequency modulator, synchronous generator sends original synchronizing signal, wave filter, reshaper and frequency modulator carry out filtering, shaping and frequency modulation (PFM) to original synchronizing signal successively, form desirable synchronizing signal.
7. strip surface defects detection imaging device as claimed in claim 5 is characterized in that:
The illumination frequencies of described two light sources be image unit sweep frequency 1/2nd.
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| CNA2007100440054A CN101349652A (en) | 2007-07-19 | 2007-07-19 | Detection imaging method and apparatus of strip surface flaw |
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| CNA2007100440054A CN101349652A (en) | 2007-07-19 | 2007-07-19 | Detection imaging method and apparatus of strip surface flaw |
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Cited By (17)
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| CN102023164A (en) * | 2009-09-23 | 2011-04-20 | 法国圣-戈班玻璃公司 | Device and method for detecting local defects of transparent surface plate |
| CN102780845A (en) * | 2012-06-14 | 2012-11-14 | 清华大学 | Light source alternate strobe synchronous camera shooting method and vision detection system |
| CN103308660A (en) * | 2012-03-16 | 2013-09-18 | 苏州春兴精工股份有限公司 | Method for detecting aerial aluminum product surface defects |
| CN103543157A (en) * | 2012-07-17 | 2014-01-29 | 宝山钢铁股份有限公司 | Simulation and dynamic acquisition method and device for surface images of offline strip |
| CN103959041A (en) * | 2011-11-30 | 2014-07-30 | 株式会社理光 | Attached matter detector, and attached matter detection method |
| CN104458760A (en) * | 2013-09-13 | 2015-03-25 | 楚天科技股份有限公司 | Automatic light inspection machine foreign matter detection device |
| CN106093068A (en) * | 2016-08-10 | 2016-11-09 | 武汉科技大学 | The imaging system of lithium battery pole slice surface defect detection apparatus and using method thereof |
| CN106959292A (en) * | 2016-01-11 | 2017-07-18 | 宝山钢铁股份有限公司 | The quick system for determining precisely imaging scheme is detected for strip defects |
| CN108445008A (en) * | 2018-02-27 | 2018-08-24 | 首钢京唐钢铁联合有限责任公司 | Method for detecting surface defects of strip steel |
| CN109187584A (en) * | 2018-08-08 | 2019-01-11 | 华南理工大学 | Flexible printed circuit defect detecting system and method under a kind of mixing scene |
| CN109507196A (en) * | 2018-11-22 | 2019-03-22 | 大连明和光电有限公司 | A kind of optical detection apparatus and detection method for field of visual inspection |
| CN109991233A (en) * | 2019-04-30 | 2019-07-09 | 博众精工科技股份有限公司 | A kind of optical detection apparatus and method |
| TWI667469B (en) * | 2017-08-02 | 2019-08-01 | 大陸商上海微電子裝備（集團）股份有限公司 | Automatic optical detection method |
| CN110987970A (en) * | 2019-10-26 | 2020-04-10 | 惠州高视科技有限公司 | Object surface defect detection system and detection method |
| CN111289775A (en) * | 2020-03-12 | 2020-06-16 | 北京航空航天大学 | Method for judging imaging defects of scanning electron microscope |
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- 2007-07-19 CN CNA2007100440054A patent/CN101349652A/en active Pending
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| CN102023164A (en) * | 2009-09-23 | 2011-04-20 | 法国圣-戈班玻璃公司 | Device and method for detecting local defects of transparent surface plate |
| CN103959041A (en) * | 2011-11-30 | 2014-07-30 | 株式会社理光 | Attached matter detector, and attached matter detection method |
| CN103959041B (en) * | 2011-11-30 | 2016-06-15 | 株式会社理光 | Attachment detector and attachment detection method |
| CN103308660A (en) * | 2012-03-16 | 2013-09-18 | 苏州春兴精工股份有限公司 | Method for detecting aerial aluminum product surface defects |
| CN102780845A (en) * | 2012-06-14 | 2012-11-14 | 清华大学 | Light source alternate strobe synchronous camera shooting method and vision detection system |
| CN103543157A (en) * | 2012-07-17 | 2014-01-29 | 宝山钢铁股份有限公司 | Simulation and dynamic acquisition method and device for surface images of offline strip |
| CN103543157B (en) * | 2012-07-17 | 2015-12-02 | 宝山钢铁股份有限公司 | Off-line strip surface image simulation dynamic collecting method and device |
| CN104458760A (en) * | 2013-09-13 | 2015-03-25 | 楚天科技股份有限公司 | Automatic light inspection machine foreign matter detection device |
| CN106959292A (en) * | 2016-01-11 | 2017-07-18 | 宝山钢铁股份有限公司 | The quick system for determining precisely imaging scheme is detected for strip defects |
| CN106093068A (en) * | 2016-08-10 | 2016-11-09 | 武汉科技大学 | The imaging system of lithium battery pole slice surface defect detection apparatus and using method thereof |
| TWI667469B (en) * | 2017-08-02 | 2019-08-01 | 大陸商上海微電子裝備（集團）股份有限公司 | Automatic optical detection method |
| US10937151B2 (en) | 2017-08-02 | 2021-03-02 | Shanghai Micro Electronics Equipment (Group) Co., Ltd. | Automatic optical inspection method |
| CN108445008A (en) * | 2018-02-27 | 2018-08-24 | 首钢京唐钢铁联合有限责任公司 | Method for detecting surface defects of strip steel |
| CN109187584A (en) * | 2018-08-08 | 2019-01-11 | 华南理工大学 | Flexible printed circuit defect detecting system and method under a kind of mixing scene |
| CN109507196A (en) * | 2018-11-22 | 2019-03-22 | 大连明和光电有限公司 | A kind of optical detection apparatus and detection method for field of visual inspection |
| CN109507196B (en) * | 2018-11-22 | 2022-02-18 | 大连明和光电有限公司 | Optical detection device and detection method for visual detection field |
| CN109991233A (en) * | 2019-04-30 | 2019-07-09 | 博众精工科技股份有限公司 | A kind of optical detection apparatus and method |
| CN110987970A (en) * | 2019-10-26 | 2020-04-10 | 惠州高视科技有限公司 | Object surface defect detection system and detection method |
| CN111289775A (en) * | 2020-03-12 | 2020-06-16 | 北京航空航天大学 | Method for judging imaging defects of scanning electron microscope |
| CN111289775B (en) * | 2020-03-12 | 2021-08-31 | 北京航空航天大学 | Method for judging imaging defects of scanning electron microscope |
| CN113865830A (en) * | 2021-10-12 | 2021-12-31 | 苏州华兴源创科技股份有限公司 | Display screen defect detection method and system |
| CN113865830B (en) * | 2021-10-12 | 2024-07-05 | 苏州华兴源创科技股份有限公司 | Display screen defect detection method and system |
| WO2024000514A1 (en) * | 2022-06-30 | 2024-01-04 | 宁德时代新能源科技股份有限公司 | Electrode plate test apparatus, method and system |
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