CN101339302A - ITO test board and test method - Google Patents
ITO test board and test method Download PDFInfo
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- CN101339302A CN101339302A CNA2007100758211A CN200710075821A CN101339302A CN 101339302 A CN101339302 A CN 101339302A CN A2007100758211 A CNA2007100758211 A CN A2007100758211A CN 200710075821 A CN200710075821 A CN 200710075821A CN 101339302 A CN101339302 A CN 101339302A
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Abstract
The invention discloses an ITO test board. The test board comprises a glass substrate, an ITO conducting layer and an insulating layer, wherein, the ITO conducting layer is coated on the glass substrate and the insulating layer is coated on part or the whole of the surface of the ITO conducting layer; and the ITO test board can simulate the ITO electrode routing of a SIN or a CSTN liquid crystal display. The invention also discloses a test method by using the ITO test board, which is as follows: the ITO test board is placed in environment with predetermined temperature and humidity, working voltage is conducted to the ITO electrode for a certain time, and the corrosion condition of the ITO test board is evaluated. The adoption of the scheme of the invention can effectively test and evaluate the factors which influence the corrosion of ITO glasses.
Description
Technical field
The present invention relates to the measuring technology that LCD (Liquid Crystal Display, LCD) makes the field, specifically relate to a kind of ITO electrode test technology.
Background technology
ITO (Indium Tin Oxides, indium tin oxide) glass is the LCD important component part, and the ITO corrosion is a very serious problem during LCD is made.ITO corrosion is meant ITO under humidity or acid or alkali environment, obtains electron reduction and becomes metal monomer or exchange to obtain the soda acid radical ion to generate other material.The general reason that causes ITO corrosion be to the protection of ITO layer not enough or before protection ITO contaminated.The ITO corrosion can cause scrapping of LCD panel and LCD, and the ITO corrosion is a kind of reliability failures, and generating process is slow, and "on" position can accelerated reaction speed.If so stay hidden danger in factory, product might occur and be sold to client or even terminal client just embodiment on hand, integrity problem appears in product, and producer can suffer customer complaint and want the joint liability of negative correlation.The ITO corrosion mainly is to be controlled by making technology.Making technology mainly is by strengthening the cleaning to the ITO surface, reduce the ITO surface contamination, strengthening the ITO surfacecti proteon and control the ITO corrosion.Carry out fail-test for improving after effect assessment generally is to use actual product to power up during ITO corrosion at present improves, the quality of judging improvement whether occurs corroding according to fail-test.But exist difference in the reality between the different product: different IC has different output voltages, and Different L CD has different ITO cabling line-spacing and live width.And in the product driving process because the different colours of display frame is different GTGs by adjacent R GB pixel mixes, so the probability that each gray scale voltage appears in every ITO line in complicated picture is inconsistent, the average voltage that is born between each root ITO cabling is also different.Every ITO carries out reliability testing under different voltage conditions like this, and the corrosion that draws assessment can not embody the condition and range that improvement adapts to.And because condition inconsistent, the probability that corrosion appears in every ITO cabling is also different.Also be difficult to assessment equally for the also not enough science of the assessment of the material that is adopted in improving, and for the maximum conditions to corrosion in the reliability testing.
Summary of the invention
Fundamental purpose of the present invention is: for solve in the prior art to the ito glass corrosion improve the recruitment evaluation inconvenience, inaccurate problem proposes a kind of test board and method of testing thereof.
To achieve these goals, the invention provides a kind of ITO test board, comprise glass substrate, ITO conductive layer, insulation course, this ITO conductive layer is coated on this glass substrate, and this insulation course is coated on the part or all of surface of this ITO conductive layer.
Above-mentioned ITO test board, described ITO conductive layer comprises some subregions, each subregion comprises the wide unanimity of two-lines, walks the ITO parallel pole of line parallel.One of the live width of each subregion ITO parallel pole of described ITO conductive layer, line-spacing or two be set to different value.
Above-mentioned ITO test board, described ITO conductive layer comprises some subregions; Per two subregions are one group, in subregion on the same group, and the live width unanimity of described each ITO parallel pole, line-spacing unanimity; And this insulation course only is coated on one of them subregion of subregion on the same group; Between the different component district, one of the live width of described each ITO parallel pole, line-spacing or two be set to different value.
Above-mentioned ITO test board, described ITO conductive layer comprises some subregions; The ITO electrode cabling of each subregion difference emulation STN or CSTN LCD.
Above-mentioned ITO test board, described ITO conductive layer comprises some subregions; Described subregion is divided two groups by integral body, and each subregion in two groups is corresponding one by one, and corresponding partitioned organization is identical, the live width line-spacing of each ITO parallel pole is identical respectively; Described insulation course only is coated on one of them component district; The live width line-spacing of each ITO parallel pole of same subregion is identical respectively.
The present invention also provides a kind of method of testing of ITO electrode corrosion, comprise the steps: the ITO test board of emulation ITO electrode cabling is placed the environment of predetermined humiture, the ITO electrode is passed to the operating voltage of certain hour, the corrosion situation of ITO electrode is assessed.
Above-mentioned method of testing, described operating voltage are emulation ITO electrode suffered effective voltage in practical work process.
Above-mentioned method of testing, the ITO electrode cabling of described ITO test board while emulation STN or CSTN LCD; Or the ITO electrode cabling of difference emulation STN or CSTN LCD.
On method of testing, described ITO test board adopts the ITO electrode of same glass substrate subregion emulation STN and CSTN LCD, and one or more factors of walking in distance between centers of tracks, live width, insulation course covering, the insulation course cladding material of each subregion ITO electrode are inequality.
Above-mentioned method of testing, described ITO test board adopts same glass substrate to be symmetrical arranged the ITO conductive layer, and this ITO conductive layer comprises and is divided into some subregions of two groups, and each subregion is corresponding one by one in two groups, and the ITO Wiring structure of corresponding subregion is identical; In every group one of the cabling live width of each subregion or line-spacing or two be set to different value; One of them group is coated with insulating layer coating.
Above-mentioned method of testing, to applying the ITO electrode of identical insulation course, same line distance, identical live width, different voltages, temperature, humidity by orthogonal design are combined into different hot and humid environments, to each group ITO identical time of electrifying electrodes, to assess the influence of different voltages, temperature, humidity to the ITO corrosion.
Above-mentioned method of testing, the ITO test board identical to ITO electrode cabling line-spacing, that live width is identical applies the insulation course of difference, with the antiseptic property of the insulating layer material of assessing difference.
Useful effect of the present invention is: adopt technical solutions according to the invention, can emulation STN, the ITO of CSTN LCD walks situations such as distance between centers of tracks, live width, suffered effective voltage and insulation course covering, under the certain high temperature super-humid conditions, corrode assessment, evaluation of corrosion that can more objective more science is improved or the effect of new material, for the design of ITO, produce foundation is provided.
In like manner, can be easy to generate voltage, temperature, the damp condition of corrosion most, can be carried out objective assessment, be provided foundation for improving the antiseptic power, the assurance LCD product quality that improve ITO to existing engineering corrosion-resistant erosion ability by range analysis.
Below in conjunction with the drawings and specific embodiments the present invention is done explanation in further detail.
Description of drawings
Fig. 1 is the embodiment of the invention one an ITO test plate structure synoptic diagram;
Fig. 2 is the enlarged diagram of ITO cabling in the 6th zone on the embodiment of the invention one ITO test board.
Embodiment
Embodiment one
As shown in Figure 1, this ITO test board comprises glass substrate, ITO conductive layer, insulation course, and this ITO conductive layer is coated on this glass substrate, and this insulation course is coated on the part surface of this ITO conductive layer.
This ITO test board ITO conductive layer is divided into A of first and second portion B, and each part comprises three zones, and wherein, the A of first comprises first area 1, the 3 and the 5th zone 5, the 3rd zone; Second B divides and comprises second area 2, the 4 and the 6th zone 6, the 4th zone; Each zone of first, second part A, B is symmetrically distributed, and difference is to scribble insulation course on the A of first, is not coated with insulation course on the second area B.All be distributed with the parallel pole that the ITO cabling of two groups of live width unanimities is formed in each zone, each zone is connected in series, and does not link to each other between the electrode and spacing is fixed.Fig. 2 is the enlarged drawing in the 6th zone 6 among Fig. 1, and the line-spacing S in this zone between parallel pole P1 and the P2 is 10 μ m, and parallel pole P1 and the P2 live width W in the 6th zone 6 is 15 μ m.The line-spacing value is designed to different value between the electrode in each zone, like this can be according to the design needs of LCD, and purposive research certain line distance is the corrosion situation of ITO test board down.Same ITO cabling live width also can be set according to the design needs of LCD.The line-spacing of first area 1 and second area 2 interior parallel poles is set to 20 μ m among Fig. 1; Line-spacing in 4 districts, the 3 and the 4th zone, the 3rd zone between the parallel pole is set to 15 μ m; The line-spacing of parallel pole is set to 10 μ m in 6 districts, the 5 and the 6th zone, the 5th zone.ITO cabling live width in the All Ranges all is set to 15 μ m.During test, the voltage difference between any two ITO cablings of same test board all is the same, can improve the inconsistency of making when test of actual product like this.Because zones of different has different line-spacings, thus the situation that the ITO cabling of different line-spacings corrodes can on a test board, be estimated under same test condition, can more objective more scientifically evaluation of corrosion improvement or the effect of new material.
During method of testing: LCD work, signal is the change digital signal during driving, only need apply the DC voltage of equivalence during test.The effective voltage of different model LCD is different, and mainly relevant with initialization driving method and ITO resistance that drive IC is provided with drive IC, the existing product major part is about 10 ~ 15V.To apply the 15V DC voltage between first power connection end 11 of above-mentioned test board, second power connection end 12, suffered effective voltage in the artificial product course of work is 60 ℃ in temperature, and energising is 96 hours under the environmental baseline of humidity 95%.After 96 hours, have a power failure and take out the ITO test board, examining under a microscope the situation of corrosion, is reference with corrosion position and corroded area, is benchmark with the live width of ITO cabling, corroded area is estimated, thereby extent of corrosion is quantized: the hot spot width surpasses half meter 10 minutes of live width, and half meter is 5 minutes inadequately, hot spot length be live width N doubly, then count 10*N, the length score multiply by the corrosion score of i.e. this hot spot of width score.Calculate each regional internal corrosion score sum on the test board, the corrosion situation that can obtain each line-spacing value ITO cabling under these specified conditions is promptly improved effect.
Embodiment two
In this example, use the performance of the new ITO protection glue material of the ITO test board assessment described in the embodiment one.After three groups of test boards process ultrasonic cleaning; apply insulating protective layer respectively; insulating protective layer glue material adopts general No. 1 silica gel of material and 2, No. 3 silica gel of new material at present, and logical then 15V direct current experimentizes under the hot and humid condition of 60 ℃ of temperature of input, humidity 95%.After 48 hours, corrode numerical statistic, obtain following tables of data 1 according to the quantization method that provides in the last example:
Tables of data 1
Can find out significantly that according to tables of data 1 No. 1 silica gel anticorrosion ability of material that No. 2 silica gel of new material use more at present obviously promotes.Just can draw the quality of material objectively through such assessment.Simultaneously draw the product that No. 2 silica gel more is applicable to the line-spacing in the 3rd zone and the 6th zone according to the corrosion condition of zones of different on the test board.
The method is equally applicable to the assessment to the corrosion influence of the material that contacts with ITO.Such as clean-out system, ACF (aeolotropic conductive), ITO insulating protective layer glue material and material that all might contact with ito surface in processing procedure.
Embodiment three
This example is based on embodiment one described ITO test board, and the above-mentioned quantization method that provides carries out the assessment of reliability testing assessment and existing engineering corrosion-resistant erosion ability.
Design DOE (the Design of Experiments experimental design) experiment of one three factor three levels, analysis temperature, humidity and voltage are to the influence of corrosion.The test boards that nine groups of ITO electrode Wiring structures is identical through ultrasonic cleaning after, apply identical ITO insulating protective layer glue material, make up by different voltage, temperature, the humidity of orthogonal design then and carry out hot and humid experiment respectively:
After 96 hours, corrosion numerical value is added up, can be obtained tables of data 2, carry out voltage, temperature, the damp condition that range analysis can be easy to generate corrosion most then.This condition is the stringent condition of reliability testing, just can carry out objective assessment to existing engineering corrosion-resistant erosion ability with this understanding.
Tables of data 2
| The beta version sequence number | Temperature | Humidity | Voltage | Error analysis | Corrosion condition |
| 1 | 50℃ | 85％ | 10V | 1 | 780 |
| 2 | 50℃ | 90％ | 20V | 2 | 930 |
| 3 | 50℃ | 95％ | 30V | 3 | 2490 |
| 4 | 60℃ | 85％ | 20V | 3 | 4265 |
| 5 | 60℃ | 90％ | 30V | 1 | 5490 |
| 6 | 60℃ | 95％ | 10V | 2 | 1007 |
| 7 | 70℃ | 85％ | 30V | 2 | 4175 |
| 8 | 70℃ | 90％ | 10V | 3 | 3245 |
| 9 | 70℃ | 95％ | 20V | 1 | 1180 |
Tables of data 3
| 1 |
2 |
3 levels | Extreme difference | |
| Temperature | 4200 | 10762 | 8600 | 6562 |
| Humidity | 9220 | 9665 | 4677 | 4988 |
| Voltage | 5032 | 6375 | 12155 | 7123 |
Can judge that according to the extreme difference value in the tables of data 3 voltage has the greatest impact big more easy more corrosion of voltage for what corrode; Easier corrosion when humidity is level 2; Temperature is 60 easier corrosion when spending.
Above content be in conjunction with concrete preferred implementation to further describing that the present invention did, can not assert that enforcement of the present invention is confined to these explanations.For the those of ordinary skill of field tests, without departing from the inventive concept of the premise, can also make some simple deduction or replace, all should be considered as belonging to protection scope of the present invention.
Claims (12)
1. ITO test board, it is characterized in that: comprise glass substrate, ITO conductive layer, insulation course, this ITO conductive layer is coated on this glass substrate, and this insulation course is coated on the part or all of surface of this ITO conductive layer.
2. ITO test board as claimed in claim 1 is characterized in that: described ITO conductive layer comprises some subregions, and each subregion comprises the wide unanimity of two-lines, line-spacing unanimity, walks the ITO parallel pole of line parallel.
3. ITO test board as claimed in claim 1 or 2 is characterized in that: described ITO conductive layer comprises some subregions; Per two subregions are one group, in subregion on the same group, and the live width unanimity of described each ITO parallel pole, line-spacing unanimity; And this insulation course only is coated on one of them subregion of subregion on the same group; Between the different component district, one of the live width of described each ITO parallel pole, line-spacing or two be set to different value.
4. as claim 1 or 2 or 3 described ITO test boards, it is characterized in that: described ITO conductive layer comprises some subregions; The ITO electrode cabling of each subregion difference emulation STN or CSTN LCD.
5. ITO test board as claimed in claim 1 or 2 is characterized in that: described ITO conductive layer comprises some subregions; Described subregion is divided two groups by integral body, and each subregion in two groups is corresponding one by one, and corresponding partitioned organization is identical, the live width line-spacing of each ITO parallel pole is identical respectively; Described insulation course only is coated on one of them component district; The live width line-spacing of each ITO parallel pole of same subregion is identical respectively.
6. the method for testing of an ITO electrode corrosion comprises the steps: the ITO test board of emulation ITO electrode cabling is placed the environment of predetermined humiture, and the ITO electrode is passed to the operating voltage of certain hour, and the corrosion situation of ITO electrode is assessed.
7. method of testing as claimed in claim 6 is characterized in that: described operating voltage is emulation ITO electrode suffered effective voltage in practical work process.
8. as claim 6 or 7 described method of testings, it is characterized in that: the ITO electrode cabling of described ITO test board while emulation STN or CSTN LCD; Or the ITO electrode cabling of difference emulation STN or CSTN LCD.
9. as claim 6 or 7 described method of testings, it is characterized in that: described ITO test board adopts the ITO electrode of same glass substrate subregion emulation STN and CSTN LCD, and one or more factors of walking in distance between centers of tracks, live width, insulation course covering, the insulation course cladding material of each subregion ITO electrode are inequality.
10. as claim 6 or 7 described method of testings, it is characterized in that: described ITO test board adopts same glass substrate to be symmetrical arranged the ITO conductive layer, this ITO conductive layer comprises and is divided into some subregions of two groups, and each subregion is corresponding one by one in two groups, and the ITO Wiring structure of corresponding subregion is identical; In every group one of the cabling live width of each subregion or line-spacing or two be set to different value; One of them group is coated with insulating layer coating.
11. as claim 6 or 7 described method of testings, it is characterized in that: to applying the ITO electrode of identical insulation course, same line distance, identical live width, different voltages, temperature, humidity by orthogonal design are combined into different hot and humid environments, to each group ITO identical time of electrifying electrodes, to assess the influence of different voltages, temperature, humidity to the ITO corrosion.
12. as claim 6 or 7 described method of testings, it is characterized in that: the ITO test board identical to ITO electrode cabling line-spacing, that live width is identical applies the insulation course of difference, with the antiseptic property of the insulating layer material of assessing difference.
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Cited By (7)
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| CN101846712A (en) * | 2010-04-01 | 2010-09-29 | 苏州崴展电子科技有限公司 | ITO (Indium Tin Oxide) electrical characteristic detecting method and detecting system of capacitance type touch screen |
| CN101957426B (en) * | 2009-07-14 | 2012-07-18 | 北京圣涛平试验工程技术研究院有限责任公司 | Combined environment test method for integrated circuit |
| CN103091373A (en) * | 2013-01-16 | 2013-05-08 | 烟台正海科技有限公司 | Test method for corrosivity of OCA (Optical Clear Adhesive) optical cement to ITO (Indium Tin Oxide) film |
| CN105785606A (en) * | 2016-01-08 | 2016-07-20 | 郴州市晶讯光电有限公司 | Liquid crystal display test board and manufacturing method thereof |
| WO2018103760A1 (en) * | 2016-12-09 | 2018-06-14 | 惠科股份有限公司 | Device and method for detecting corrosion state of terminal |
| CN109360522A (en) * | 2018-12-10 | 2019-02-19 | 上海天马有机发光显示技术有限公司 | A kind of driving method and display device of display device |
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| JP2000122018A (en) * | 1998-10-09 | 2000-04-28 | Alps Electric Co Ltd | Lcd function inspecting device |
| JP2974214B1 (en) * | 1998-12-16 | 1999-11-10 | 株式会社双晶テック | Probe unit |
| JP2002357627A (en) * | 2001-05-31 | 2002-12-13 | Micronics Japan Co Ltd | Contact sheet |
| JP2007025414A (en) * | 2005-07-20 | 2007-02-01 | Sanyo Epson Imaging Devices Corp | Method for inspecting display device |
| KR100738089B1 (en) * | 2005-12-30 | 2007-07-12 | 삼성전자주식회사 | Thin film transistor inspection system using surface electron emission device array |
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| CN101957426B (en) * | 2009-07-14 | 2012-07-18 | 北京圣涛平试验工程技术研究院有限责任公司 | Combined environment test method for integrated circuit |
| CN101846712A (en) * | 2010-04-01 | 2010-09-29 | 苏州崴展电子科技有限公司 | ITO (Indium Tin Oxide) electrical characteristic detecting method and detecting system of capacitance type touch screen |
| CN101846712B (en) * | 2010-04-01 | 2012-08-29 | 苏州崴展电子科技有限公司 | ITO (Indium Tin Oxide) electrical characteristic detecting method and detecting system of capacitance type touch screen |
| CN103091373A (en) * | 2013-01-16 | 2013-05-08 | 烟台正海科技有限公司 | Test method for corrosivity of OCA (Optical Clear Adhesive) optical cement to ITO (Indium Tin Oxide) film |
| CN105785606A (en) * | 2016-01-08 | 2016-07-20 | 郴州市晶讯光电有限公司 | Liquid crystal display test board and manufacturing method thereof |
| WO2018103760A1 (en) * | 2016-12-09 | 2018-06-14 | 惠科股份有限公司 | Device and method for detecting corrosion state of terminal |
| CN109961752A (en) * | 2017-12-22 | 2019-07-02 | 三星显示有限公司 | Display device |
| CN109360522A (en) * | 2018-12-10 | 2019-02-19 | 上海天马有机发光显示技术有限公司 | A kind of driving method and display device of display device |
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