CN101320966A - Delay circuit - Google Patents
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- CN101320966A CN101320966A CNA2008101254048A CN200810125404A CN101320966A CN 101320966 A CN101320966 A CN 101320966A CN A2008101254048 A CNA2008101254048 A CN A2008101254048A CN 200810125404 A CN200810125404 A CN 200810125404A CN 101320966 A CN101320966 A CN 101320966A
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K5/00—Manipulating of pulses not covered by one of the other main groups of this subclass
- H03K5/15—Arrangements in which pulses are delivered at different times at several outputs, i.e. pulse distributors
- H03K5/151—Arrangements in which pulses are delivered at different times at several outputs, i.e. pulse distributors with two complementary outputs
- H03K5/1515—Arrangements in which pulses are delivered at different times at several outputs, i.e. pulse distributors with two complementary outputs non-overlapping
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K19/00—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits
- H03K19/0008—Arrangements for reducing power consumption
- H03K19/0016—Arrangements for reducing power consumption by using a control or a clock signal, e.g. in order to apply power supply
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K5/00—Manipulating of pulses not covered by one of the other main groups of this subclass
- H03K5/01—Shaping pulses
- H03K5/04—Shaping pulses by increasing duration; by decreasing duration
Abstract
A delay circuit to generate and output a delayed signal delayed from an input signal includes a reference pulse generating circuit to generate a reference pulse train in response to the input of the input signal, the reference pulse generating circuit having a feedback circuit containing a delay portion to determine a time interval between the reference pulses, a counter to output count signals based on a reference clock, the counter receiving the reference pulse train generated by the reference pulse generating circuit as the reference clock, and a delayed signal output circuit to generate and output the delayed signal based on the input signal and the count signals.
Description
Technical field
The present invention relates to a kind of delay circuit, specifically, a kind of electric current that prevents flows through the delay circuit of drive circuit.
Background technology
The drive circuit that is used to drive for example load of motor is equipped with delay circuit to flow through drive circuit to prevent electric current usually.Fig. 4 has shown drive circuit 400 of the prior art.Drive circuit 400 comprises that the through current that is made of delay circuit 402a and 402b and inverter INV1 and INV2 prevents circuit 401 and CMOS transistor (PMOS transistor P1 and nmos pass transistor N1).The CMOS transistor is connected to through current and prevents circuit 401, and is connected between power supply potential and the earth potential.In addition, for example the load (not shown) of motor is connected to the transistorized output of CMOS OUT.
Fig. 6 has shown the internal structure of delay circuit 402 of the prior art.Delay circuit 402 is made of interconnective a plurality of rise edge delay circuit 403.In the rise edge delay circuit 403 each is for example set up the time of delay of expectation by connecting some inverters, and each inverter constitutes (referring to Fig. 7) by PMOS transistor and nmos pass transistor.
Publication number is that the Japanese unexamined patent of 10-13207 discloses a kind of delay circuit (through current prevents circuit), and this delay circuit produces the time of delay (referring to Fig. 8) of expectation by the operation of controlling interconnective some circuits for triggering based on the clock signal that is provided to external clock input CK.
Yet in the delay circuit of Fig. 6, for example, the final delay time may there are differences (or departing from from desired value) in multiple arrangement.That is, the transistor in a plurality of rise edge delay circuit 403a-403n may exist in the process variations that causes in the manufacturing process.Thereby rise edge delay circuit 403 may there are differences each other in its time of delay.Therefore, the final delay time of delay circuit of the prior art there are differences (or departing from from desired value).
Summary of the invention
In one embodiment, generation and output comprise from the delay circuit of the inhibit signal that input signal postpones: reference pulse produces circuit, input in response to input signal produces the reference pulse sequence, and this reference pulse produces circuit and has the feedback circuit that comprises in order to the decay part of determining the time interval between the reference pulse; Counter, based on reference clock output count signal, this counter receives by reference pulse and produces the reference pulse sequence of circuit generation as reference clock; And the inhibit signal output circuit, produce and the output delay signal based on input signal and count signal.
According to one embodiment of present invention, the reference pulse sequence that is produced the circuit generation by reference pulse is input to counter as reference clock, delay circuit can produce and the output delay signal based on input signal and count signal thus, and wherein this reference pulse produces the decay part that circuit comprises the time interval between definite reference pulse.
According on the one hand, the invention provides a kind of delay circuit that can reduce difference time of delay.
Description of drawings
From below in conjunction with the description of accompanying drawing to certain preferred embodiment, above and other purpose of the present invention, advantage and characteristics will be more apparent, wherein:
Fig. 1 is the block diagram that has shown according to the delay circuit of the first embodiment of the present invention;
Fig. 2 is the sequential chart that has shown according to the waveform of each point in the delay circuit of first embodiment of the invention;
Fig. 3 is the block diagram that has shown according to the delay circuit of second embodiment of the invention;
Fig. 4 has shown that the through current that is made of delay circuit in the prior art prevents the block diagram of circuit;
Fig. 5 has shown that through current in the prior art prevents in the circuit sequential chart at the waveform of each point;
Fig. 6 has shown the internal structure of delay circuit of the prior art;
Fig. 7 has shown the internal structure of the rise edge delay circuit in the delay circuit in the prior art; And
Fig. 8 is the block diagram that has shown delay circuit of the prior art.
Embodiment
Now will with reference to exemplary embodiment the present invention be described here.But those skilled in the art should be understood that the instruction of the application of the invention and realizes many interchangeable embodiment, and the embodiment that the invention is not restricted to illustrate for task of explanation.
First embodiment
Explain embodiments of the invention hereinafter with reference to accompanying drawing.Fig. 1 is the block diagram that has shown according to the delay circuit 100 of the first embodiment of the present invention.As shown in Figure 1, the delay circuit 100 according to present embodiment comprises that reference pulse produces circuit 10, counter 20, inhibit signal output circuit 30 and reset signal output circuit 40.
Reference pulse produces circuit 10 and has feedback circuit 11, and this feedback circuit 11 comprises the decay part that is used for determining the time interval between the reference pulse, and produces the reference pulse sequence in response to input signal.Feedback circuit 11 is by using signal based on the delay pulse sequence that produces at decay part, carry out calculating based on the signal and the input signal that produce from inhibit signal output circuit 30 (the explaining after a while) inhibit signal of output in the process that produces reference pulse, and result of calculation is provided to decay part.Counter 20 receives by reference pulse and produces reference pulse sequence that circuit 10 produces as reference clock, and based on the output count signal of this reference clock.Inhibit signal output circuit 30 produces also output delay signal based on input signal with from the count signal that counter 20 is exported.The reset signal that reset signal output circuit 40 will produce based on the inhibit signal of exporting from inhibit signal output circuit 30 outputs to counter 20.The following details of explaining each parts with reference to Fig. 1.
Reference pulse produces circuit 10 and has feedback circuit 11, rising single-shot trigger circuit 4 and decline single-shot trigger circuit 5.And feedback circuit 11 is made of inverter INV, NAND (with non-) circuit 1, counting circuit (hereinafter referred to as " AND (with) circuit ") 2 and decay part (hereinafter referred to as " rise edge delay circuit ") 3.
Inverter INV will be from the level inversion of the inhibit signal OUT of inhibit signal output circuit 30 (after a while explain) output, and consequential signal is outputed to NAND circuit 1.NAND circuit 1 calculate and output from the signal DS of rising single-shot trigger circuit 4 outputs and long-pending from the inverted logic of the inverse delayed signal OUT of inverter INV.Counting circuit 2 calculates input signal IN and from the logic product of the signal of NAND circuit 1 output, and output result signal is as input pulse sequence (hereinafter referred to as " signal DIN ").Rise edge delay circuit 3 produces and output delay pulse trains (hereinafter referred to as " signal DOUT "), and the rising edge of this delay pulse sequence is delayed from the rising edge from the signal DIN of counting circuit 2 outputs.
Rising single-shot trigger circuit 4 produces signal DS, and this signal DS rises synchronously with the rising edge of the signal DOUT that exports from rise edge delay circuit 3, and has predetermined pulse duration.This signal DS is input to NAND circuit 1 and decline single-shot trigger circuit 5.Decline single-shot trigger circuit 5 produces signal DSB, and the trailing edge of this signal DSB and signal DS rises synchronously, and has predetermined pulse duration.
Incidentally, although will be input to NAND circuit 1 by the signal DS that rising single-shot trigger circuit 4 produces in the present embodiment,, in other embodiments, can be with signal DOUT or the signal DSB that produces by rise edge delay circuit 3, rather than signal DS, be input to NAND circuit 1.In addition, in the present embodiment, to be input to counter 20 (explaining after a while) with the corresponding signal DSB of reference pulse sequence that decline single-shot trigger circuit 5 produces as reference clock, at other embodiment, can be with signal DOUT that produces by rise edge delay circuit 3 or the signal DS that produces by rising single-shot trigger circuit 4, rather than signal DSB, be input to counter 20 as reference clock.
Inhibit signal output circuit 30 is made of AND circuit 6.AND circuit 6 calculates input signal IN and from the logic product of the count signal D1-D3 of dff circuit DFF1-DFF3 output, and output result signal is as inhibit signal OUT.
Reset signal output circuit 40 have decline single-shot trigger circuit 7 and OR (or) circuit OR.Decline single-shot trigger circuit 7 outputs to OR circuit OR with pulse signal, and this pulse signal rises synchronously with trailing edge from the signal of AND circuit 6 output and has predetermined pulse duration.OR circuit OR calculate the signal that provides at reset terminal RT and from the logic of the signal of decline single-shot trigger circuit 7 outputs and, and consequential signal outputed to the R that resets of dff circuit DFF1-DFF3 as reset signal.
Fig. 2 is the sequential chart that has shown the waveform of each point in the delay circuit 100 that shows in Fig. 1.Explain operation in detail hereinafter with reference to Fig. 1 and Fig. 2 according to the delay circuit 100 of present embodiment.
Explain that at first, below reference pulse produces the operation of circuit 10.When delay circuit 100 begins to operate, be input to NAND circuit 1 from " height " level signal of inverter INV with from the signal DS that is in " low " level of rising single-shot trigger circuit 4 outputs, wherein this inverter INV inhibit signal OUT that will be in " low " level is inverted into " height " level.Thereby, NAND circuit 1 output " height " level signal.Therefore, when the input signal IN that is in " height " level was input to counting circuit 2, the signal DIN that counting circuit 2 will be in " height " level outputed to rise edge delay circuit 3 (referring to the t1 among Fig. 2).
Rise edge delay circuit 3 output signal DOUT, the rising edge of this signal DOUT is delayed (referring to the t2 Fig. 2) from the rising edge of the signal DIN of input.The time interval between the reference pulse that the amount of this delay is determined to be produced by rise edge delay circuit 3.The signal DOUT that is in " height " level is input to rising single-shot trigger circuit 4.Rising single-shot trigger circuit 4 produces signal DS, this signal DS and rising edge from the signal DOUT of rise edge delay circuit 3 outputs rise synchronously (referring to the t2 Fig. 2).
The signal DS that is in " height " level is input to NAND circuit 1.That is, be in the signal DS of " height " level and be input to NAND circuit 1 by the inverse delayed signal OUT that inverter INV is inverted into " height " level.Thereby NAND circuit 1 outputs to counting circuit 2 with " low " level signal.Therefore, begin after the internal circuit by NAND circuit 1 and counting circuit 2 postpones caused delay from the rising edge of signal DS, signal DIN becomes " low " level (referring to t2 among Fig. 2 and t3).Then, from the signal DOUT of rise edge delay circuit 3 output and the input signal DIN that is in " low " level descend synchronously (referring to the t3 Fig. 2).
Then, the signal DS that is in " height " level becomes " low " level (referring to the t4 among Fig. 2) after the preset time section.This signal DS that is in " low " level is input to NAND circuit 1.That is, be in this signal DS of " low " level and be input to NAND circuit 1 by the inverse delayed signal OUT that inverter INV is inverted into " height " level.Thereby NAND circuit 1 outputs to counting circuit 2 with " height " level signal.Therefore, begin after the internal circuit by NAND circuit 1 and counting circuit 2 postpones caused delay from the trailing edge of signal DS, counting circuit 2 outputs are in the signal DIN (referring to the t5 among Fig. 2) of " height " level.Then, when the signal DIN that is in " height " level is input to rise edge delay circuit 3, rise edge delay circuit 3 output signal DOUT, the rising edge of this signal DOUT is delayed (referring to the t6 Fig. 2) from the rising edge of input signal DIN.Rising single-shot trigger circuit 4 produces and the synchronous signal DS that rises of the rising edge of inhibit signal DOUT.
Decline single-shot trigger circuit 5 output signal DSB, this signal DSB rises synchronously with the trailing edge of the signal DS that is produced by rising single-shot trigger circuit 4, and descends after the preset time section.As mentioned above, the signal DSB that is produced by decline single-shot trigger circuit 5 is input to the input end of clock CK of each dff circuit DFF1-DFF3 as reference clock.
Reference pulse produces circuit 10 can produce the reference pulse sequence by repeating these actions.In addition, the interval of determining between the reference pulse by rise edge delay circuit 3.That is, the signal DOUT that is produced by rise edge delay circuit 3 is big more apart from the retardation of signal DIN, and it is long more that the interval between the reference pulse becomes.When the time interval between the reference pulse became longer, because be delayed from the output timing of the count signal of counter (after a while explain) output, delay circuit 100 can be exported the inhibit signal OUT that bigger delay is arranged apart from input signal IN.
Then, below explain the operation of counter 20.Continue to provide " height " level signal to the input D of dff circuit DFF1.Therefore, in the time will being input to input end of clock CK from the signal DSB of decline single-shot trigger circuit 5 outputs, dff circuit DFF1 exports the count signal D1 (referring to the t4 Fig. 2) that is in " height " level from output Q.The count signal D1 that is in " height " level is input to the input D of dff circuit DFF2.Therefore, when signal DSB was input to input end of clock CK, dff circuit DFF2 exported the count signal D2 (referring to the t7 Fig. 2) that is in " height " level from output Q.
The count signal D2 that is in " height " level is input to the input D of dff circuit DFF3.Therefore, when signal DSB was input to input end of clock CK, dff circuit DFF3 exported the count signal D3 (referring to the t8 Fig. 2) that is in " height " level from output Q.
Then, below explain the operation of inhibit signal output circuit 30.Be input to AND circuit 6 from the count signal D1-D3 of dff circuit DFF1-DFF3 output.That is, input signal IN and count signal D1-D3 are input to AND circuit 6.AND circuit 6 calculates the logic product of the signal of input, and produces inhibit signal OUT.Therefore, AND circuit 6 output delay signal OUT, the rising edge of this inhibit signal OUT and count signal D3 rise synchronously and with the trailing edge of input signal IN descend synchronously (referring to the t8-t9 among Fig. 2).By this way, delay circuit 100 can output delay signal OUT, and the rising edge of this inhibit signal OUT is delayed (referring to the t1-t8 Fig. 2) from the rising edge of input signal IN.Notice that count signal D1-D3 that will be not all is input to AND circuit 6, but can separately count signal D3 be input to AND circuit 6.
Then, inhibit signal OUT is input to the decline single-shot trigger circuit 7 in the reset signal output circuit 40.The trailing edge of the output of decline single-shot trigger circuit and inhibit signal OUT rises synchronously.Be input to OR circuit OR from " height " level signal that is in of decline single-shot trigger circuit output.Therefore, OR circuit OR outputs to reset signal the reset terminal RT of each dff circuit DFF1-DFF3.Based on the input of this reset signal dff circuit DFF1-DFF3 that resets.In addition, also can for example, produce reset signal by reset signal output circuit 40 by providing " height " level signal at reset signal input RT.
As mentioned above, in the present embodiment, rise edge delay circuit 3 produces signal OUT, and the rising edge of this signal OUT is delayed from the rising edge of signal DIN, and this signal DIN produces based on input signal IN with from the input of the signal of NAND circuit 1 output.Then, the signal DSB that produces in response to this signal DOUT is input to circuits for triggering in the counter 20 as the operation of reference clock signal with control counter 20.Circuits for triggering output count signal D1-D3, when signal DSB is input to input end of clock CK as reference clock, this count signal D1-D3 will become " height " level state.Inhibit signal output circuit 30 can be by calculating the logic product output delay signal OUT of described count signal D1-D3 and input signal IN, and the transformation (transition) of this inhibit signal OUT is from the transformation delay of input signal IN.Promptly, in the present embodiment, the reference pulse sequence that is produced circuit 10 generations by reference pulse is input to counter as reference clock, thereby delay circuit 100 can output delay signal OUT, the transformation of this inhibit signal OUT is from the transformation delay of input signal IN, and this reference pulse produces circuit 10 and comprises the rise edge delay circuit 3 of determining the time interval between the reference pulse.In addition, by feeding back to feedback circuit 11, can produce time of delay of 3 times (quantity of circuits for triggering) of the time of delay of single rising delay circuit 3 by the signal DS that rising single-shot trigger circuit 4 produces.In addition, although counter 20 is made of three circuits for triggering in the present embodiment, in other embodiments, also can increase time of delay by the quantity that increases circuits for triggering.
In addition, owing to have single rise edge delay circuit 3 according to the delay circuit 100 of present embodiment, unit delay time does not promptly change the time of delay of each rise edge delay circuit.Therefore, can reduce the final delay temporal differences.
In addition, when big time of delay of needs, delay circuit of the prior art produces delay by connecting some rise edge delay circuit.Therefore, need to be used for the big layout area of delay circuit in the prior art, thereby increased die size.Simultaneously, according to the delay circuit 100 of present embodiment can enough single rise edge delay circuit 3 produce be a delay circuit time of delay several times time of delay.Thereby, can reduce layout area.In addition, according to the delay circuit 100 of present embodiment can enough single rise edge delay circuit produce expectation time of delay (that is, be a delay circuit time of delay N doubly).Thereby, can be at t1 of the prior art shown in Figure 5 between the t2, or t3 is to setting up cut-off state between the t4 really.Therefore, for example, when delay circuit 100 is connected to the CMOS transistor, can set up cut-off state really, during this cut-off state, the two is cut-off state simultaneously for PMOS transistor and nmos pass transistor.Therefore, can prevent that really electric current from flowing to earth potential from power supply potential, otherwise when PMOS transistor and nmos pass transistor became conducting state simultaneously, this electric current may occur.
In addition, the through current of the prior art that shows at Fig. 8 prevents in the circuit 80, controls the operation (referring to Fig. 8) of interconnective some triggers based on the clock signal that is input to input end of clock CK.Therefore, current preventing circuit 80 of the prior art needs external clock to produce circuit is input to input end of clock CK with generation clock signal.Simultaneously, in the present embodiment, the reference pulse sequence that produces in inside in response to input signal IN is used as reference clock.Therefore, therefore delay circuit 100, does not need external clock to produce circuit without any need for external timing signal.
In addition, reset signal output circuit 40 is forwarded to the reset terminal of each dff circuit with reset signal, and this reset signal produces synchronously with trailing edge from the inhibit signal OUT of inhibit signal output circuit 30.Therefore, can change over moment of " low " level state from " height " level state at inhibit signal OUT, a plurality of circuits for triggering in the reset counter.In addition, also may be for example by " height " level signal dff circuit that resets is provided to reset signal input RT.
Second embodiment
Fig. 3 is the block diagram that has shown delay circuit 200 according to a second embodiment of the present invention.Incidentally, in Fig. 3, with identical allocation of symbols give with Fig. 1 in parts parts and the structure identical with structure, and omit their detailed explanation.In first embodiment, counter 20 is made of dff circuit DFF1-DFF3.Relative therewith, in the delay circuit 200 of present embodiment, counter 50 is made of a plurality of dff circuit DFF1-DFFn (n is the integer greater than 1).In addition, delay circuit 200 comprises the selector 8 that is connected between counter 50 and the inhibit signal output circuit 30, and the counter 20 in the delay circuit 100 of this counter 50 and first embodiment is corresponding.Note, except the structure and operation of counter 50 and the new selector 8 that adds, according to the structure of the delay circuit 200 of present embodiment and operation with according to the structure of the delay circuit 100 of first embodiment with operate identical.Therefore, only explain the structure and the operation of counter 50 and the new selector 8 that adds below.
Counter 50 is made of a plurality of dff circuit DFF1-DFFn.The signal DSB that is produced by decline single-shot trigger circuit 5 is input among the dff circuit DFF1-DFFn each as reference clock.Continue to provide " height " level signal to the input D of dff circuit DFF1.In addition, the output Q of dff circuit DFF1 is connected to the input D of dff circuit DFF2, and the output Q of dff circuit DFF2 is connected to the input D of dff circuit DFF3.And the output Q of dff circuit DFF (n-1) is connected to the input D of dff circuit DFFn.In addition, with count signal D1-Dn from dff circuit DFF1-DFFn each output Q output to selector 8.In addition, the output of reset signal output circuit 40 is connected to the R that resets of each dff circuit DFF1-DFFn.
Selector 8 receives from the count signal D1-Dn of a plurality of dff circuit DFF1-DFFn outputs.And selector 8 is selected a count signal based on the selection signal that offers selector 8 from count signal D1-Dn, and it is outputed to inhibit signal output circuit 30.By this way, delay circuit 200 can output delay signal OUT, and the rising edge of this inhibit signal OUT is delayed from the rising edge of input signal IN.
As mentioned above, in the present embodiment, selector 8 is arranged between the counter 50 and inhibit signal output circuit 30 that is made of a plurality of dff circuit DFF1-DFFn.Then, selector 8 is selected a count signal based on the selection signal from count signal D1-Dn, and it is outputed to inhibit signal output circuit 30.Therefore, inhibit signal output circuit 30 can be by calculating input signal IN and producing inhibit signal OUT by the logic product of selector 8 selected count signals.That is, in the delay circuit 200 according to present embodiment, although use single rise edge delay circuit, amount can be selected from and arrive n doubly 1 of original time of delay time of delay.
In addition, because based on the selection signal that is applied to selector 8, delay circuit 200 can produce the time of delay of expectation, thus do not need to change circuit design, and have the flexibility of height at design aspect.In addition, can for example pass through serial line interface, externally set up this selection signal.Therefore, this has allowed to set up from the outside of device the time of delay of expectation.
Obviously, the invention is not restricted to above embodiment, but can under situation about not departing from the scope of the present invention with spirit, revise and change.For example, although produce the reference pulse sequence from rise edge delay circuit 3 in the present embodiment, in other embodiments, can use its trailing edge to produce the reference pulse sequence from the trailing edge delay circuit of the signal DIN delay of input.
Claims (20)
1. one kind produces and exports from the delay circuit of the inhibit signal of input signal delay, comprising:
Reference pulse produces circuit, and in response to the input generation reference pulse sequence of described input signal, described reference pulse produces circuit and has the feedback circuit that comprises in order to the decay part of determining the time interval between the reference pulse;
Counter, based on reference clock output count signal, described counter receives by described reference pulse and produces the described reference pulse sequence of circuit generation as described reference clock; And
The inhibit signal output circuit produces and exports described inhibit signal based on described input signal and described count signal.
2. delay circuit according to claim 1, wherein, described decay part is determined time interval between the described reference pulse based on the signal of described decay part output apart from the retardation that is input to the signal of described decay part.
3. delay circuit according to claim 1, wherein, described decay part produces the delay pulse sequence that is used to produce described reference pulse sequence; And
Described feedback circuit also comprises counting circuit, and the signal that described counting circuit will produce based on described inhibit signal and described delay pulse sequence and the logic product of described input signal output to described decay part.
4. delay circuit according to claim 2, wherein, described decay part produces the delay pulse sequence that is used to produce described reference pulse sequence; And
Described feedback circuit also comprises counting circuit, and the signal that described counting circuit will produce based on described inhibit signal and described delay pulse sequence and the logic product of described input signal output to described decay part.
5. delay circuit according to claim 3, wherein, described decay part will be by feeding back to described counting circuit from the delay pulse from described time interval of signal delay of described counting circuit input, make described counting circuit produce input pulse sequence, and output is from the described delay pulse sequence of described input pulse sequence delay with described time interval.
6. delay circuit according to claim 1, wherein, described counting appliance has in order to produce a plurality of circuits for triggering of described count signal, and each described count signal is made of with second logical value different with described first logical value first logical value; And
Described a plurality of circuits for triggering output to described inhibit signal output circuit with described count signal, and the input of the described reference pulse sequence of described count signal foundation changes over described second logical value with mutual different sequential from described first logical value.
7. delay circuit according to claim 2, wherein, described counting appliance has in order to produce a plurality of circuits for triggering of described count signal, and each described count signal is made of with second logical value different with described first logical value first logical value; And
Described a plurality of circuits for triggering output to described inhibit signal output circuit with described count signal, and the input of the described reference pulse sequence of described count signal foundation changes over described second logical value with mutual different sequential from described first logical value.
8. delay circuit according to claim 3, wherein, described counting appliance has in order to produce a plurality of circuits for triggering of described count signal, and each described count signal is made of with second logical value different with described first logical value first logical value; And
Described a plurality of circuits for triggering output to described inhibit signal output circuit with described count signal, and the input of the described reference pulse sequence of described count signal foundation changes over described second logical value with mutual different sequential from described first logical value.
9. delay circuit according to claim 4, wherein, described counting appliance has in order to produce a plurality of circuits for triggering of described count signal, and each described count signal is made of with second logical value different with described first logical value first logical value; And
Described a plurality of circuits for triggering output to described inhibit signal output circuit with described count signal, and the input of the described reference pulse sequence of described count signal foundation changes over described second logical value with mutual different sequential from described first logical value.
10. delay circuit according to claim 1, wherein, described inhibit signal output circuit produces described inhibit signal based on the logic product of described input signal and described count signal.
11. delay circuit according to claim 2, wherein, described inhibit signal output circuit produces described inhibit signal based on the logic product of described input signal and described count signal.
12. delay circuit according to claim 3, wherein, described inhibit signal output circuit produces described inhibit signal based on the logic product of described input signal and described count signal.
13. delay circuit according to claim 1 also comprises: the reset signal output circuit, it produces reset signal based on described inhibit signal, and the reset signal that produces is outputed to described counter.
14. delay circuit according to claim 2 also comprises: the reset signal output circuit, it produces reset signal based on described inhibit signal, and the reset signal that produces is outputed to described counter.
15. delay circuit according to claim 3 also comprises: the reset signal output circuit, it produces reset signal based on described inhibit signal, and the reset signal that produces is outputed to described counter.
16. delay circuit according to claim 4 also comprises: the reset signal output circuit, it produces reset signal based on described inhibit signal, and the reset signal that produces is outputed to described counter.
17. delay circuit according to claim 1 also comprises: selector, it selects a count signal based on the selection signal from a plurality of count signals of exporting from described counter, and the count signal of selecting is outputed to described inhibit signal output circuit.
18. delay circuit according to claim 2 also comprises: selector, it selects a count signal based on the selection signal from a plurality of count signals of exporting from described counter, and the count signal of selecting is outputed to described inhibit signal output circuit.
19. delay circuit according to claim 3 also comprises: selector, it selects a count signal based on the selection signal from a plurality of count signals of exporting from described counter, and the count signal of selecting is outputed to described inhibit signal output circuit.
20. delay circuit according to claim 4 also comprises: selector, it selects a count signal based on the selection signal from a plurality of count signals of exporting from described counter, and the count signal of selecting is outputed to described inhibit signal output circuit.
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2007149125A JP4913671B2 (en) | 2007-06-05 | 2007-06-05 | Delay circuit |
| JP2007-149125 | 2007-06-05 | ||
| JP2007149125 | 2007-06-05 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN101320966A true CN101320966A (en) | 2008-12-10 |
| CN101320966B CN101320966B (en) | 2012-07-04 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN2008101254048A Expired - Fee Related CN101320966B (en) | 2007-06-05 | 2008-06-05 | Delay circuit |
Country Status (3)
| Country | Link |
|---|---|
| US (1) | US7609103B2 (en) |
| JP (1) | JP4913671B2 (en) |
| CN (1) | CN101320966B (en) |
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101599701B (en) * | 2009-07-02 | 2011-09-28 | 成都芯源系统有限公司 | Switching power supply with fault protection function and control method thereof |
| CN102466779A (en) * | 2010-11-16 | 2012-05-23 | 北京中电华大电子设计有限责任公司 | Built-in testing method for delay of trigger and circuit |
| CN103677189A (en) * | 2012-09-25 | 2014-03-26 | 瑞萨电子株式会社 | Semiconductor device |
| CN104115404A (en) * | 2011-12-30 | 2014-10-22 | 超威半导体公司 | Method for locking a delay locked loop |
| CN105824015A (en) * | 2016-04-25 | 2016-08-03 | 中国人民解放军军械工程学院 | Pulse generating circuit of phased array radar antenna test device |
| CN106849914A (en) * | 2017-03-14 | 2017-06-13 | 苏州格美芯微电子有限公司 | One kind keeps the accurate new structure of sequential logical circuit sequential |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR100809692B1 (en) * | 2006-08-01 | 2008-03-06 | 삼성전자주식회사 | Delay locked loop circuit having low jitter and jitter reducing method thereof |
| JP5922494B2 (en) * | 2012-05-24 | 2016-05-24 | 横河電機株式会社 | Physical quantity measuring device, physical quantity measuring method |
| US20230014288A1 (en) * | 2021-07-16 | 2023-01-19 | Changxin Memory Technologies, Inc. | Staggering signal generation circuit and integrated chip |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6052109A (en) * | 1983-08-31 | 1985-03-25 | Nec Home Electronics Ltd | Delay circuit |
| US7078951B2 (en) * | 2004-08-27 | 2006-07-18 | Micron Technology, Inc. | System and method for reduced power open-loop synthesis of output clock signals having a selected phase relative to an input clock signal |
-
2007
- 2007-06-05 JP JP2007149125A patent/JP4913671B2/en not_active Expired - Fee Related
-
2008
- 2008-06-04 US US12/132,870 patent/US7609103B2/en not_active Expired - Fee Related
- 2008-06-05 CN CN2008101254048A patent/CN101320966B/en not_active Expired - Fee Related
Cited By (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101599701B (en) * | 2009-07-02 | 2011-09-28 | 成都芯源系统有限公司 | Switching power supply with fault protection function and control method thereof |
| CN102466779A (en) * | 2010-11-16 | 2012-05-23 | 北京中电华大电子设计有限责任公司 | Built-in testing method for delay of trigger and circuit |
| CN102466779B (en) * | 2010-11-16 | 2014-01-15 | 北京中电华大电子设计有限责任公司 | Built-in testing method for delay of trigger and circuit |
| CN104115404A (en) * | 2011-12-30 | 2014-10-22 | 超威半导体公司 | Method for locking a delay locked loop |
| CN104115404B (en) * | 2011-12-30 | 2016-04-20 | 超威半导体公司 | For the method for locking delayed lock loop |
| CN103677189A (en) * | 2012-09-25 | 2014-03-26 | 瑞萨电子株式会社 | Semiconductor device |
| CN105824015A (en) * | 2016-04-25 | 2016-08-03 | 中国人民解放军军械工程学院 | Pulse generating circuit of phased array radar antenna test device |
| CN106849914A (en) * | 2017-03-14 | 2017-06-13 | 苏州格美芯微电子有限公司 | One kind keeps the accurate new structure of sequential logical circuit sequential |
Also Published As
| Publication number | Publication date |
|---|---|
| JP4913671B2 (en) | 2012-04-11 |
| US7609103B2 (en) | 2009-10-27 |
| CN101320966B (en) | 2012-07-04 |
| JP2008306263A (en) | 2008-12-18 |
| US20080303571A1 (en) | 2008-12-11 |
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