CN101320082B - Hall magnetic field element test apparatus - Google Patents
Hall magnetic field element test apparatus Download PDFInfo
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- CN101320082B CN101320082B CN2007101096213A CN200710109621A CN101320082B CN 101320082 B CN101320082 B CN 101320082B CN 2007101096213 A CN2007101096213 A CN 2007101096213A CN 200710109621 A CN200710109621 A CN 200710109621A CN 101320082 B CN101320082 B CN 101320082B
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Abstract
The invention discloses a hall magnetic field component testing device, which is provided in the testing device of a rotating magnetic field and used for testing the functional parameters of a hall component such as the field sensitivity, the rotating speed, the orientation recognition, etc. The device at least is provided with a holding and fixing unit, a test mainframe unit and a rotating magnetic unit; wherein, the holding and fixing unit is used for holding and fixing a hall component at the measuring position, and is connected with the test mainframe unit; the rotating magnetic unit is at least a rotating magnetic field which is formed by at least a magnetic substance at the periphery of the hall component; the rotating magnetic unit forms a rotating magnetic field with the switching of the magnetic poles S-N through the rotation of a permanent magnet which is driven by a servo motor or by a rotary platform. The hall magnetic field component testing device which is provided by the invention can test the functional parameters of the hall components in the rotating magnetic field such as the magnetic field sensitivity, the rotating speed, orientation recognition, etc.
Description
Technical field
The present invention relates to a kind of Hall magnetic field element test apparatus, in order in the proving installation of rotary magnetic field, to test Hall element.
Background technology
Carrying object in the magnetic field, its direction of current is vertical with magnetic field, then can produce an additional transverse electric field in the direction perpendicular to electric current and magnetic field, and this phenomenon is called Hall effect (Hall effect).The element that utilizes semi-conductive Hall effect to make promptly is Hall element (Hall component), its kind has: Hall element, magnetoresistive element, magnetic diode, the magnetocrystalline pipe, magnetocrystalline brake tube, Hall integrated circuit (IntegratedCircuits, IC) switch, the linear Hall integrated circuit .... etc.
Hall effect is not still measured the main means of semiconductor material electrical parameter, and utilizes the made Hall element of this effect to be widely used in aspects such as electrical measurement, automatic control.And Hall integrated circuit is to the sensitivity and the magnetic hysteresis width of magnetic field induction, can be in order to judge the perform region of Hall integrated circuit to magnetic field induction.
Because the widespread use of Hall element at present therefore for the testing requirement at various Hall element, also increases day by day.
Summary of the invention
The invention provides a kind of Hall magnetic field element test apparatus.The invention provides in the proving installation of rotary magnetic field, in order to the functional parameters such as magnetic field sensitivity, rotating speed, direction identification of test Hall element.
Hall magnetic field element test apparatus of the present invention has at least seizes fixed cell, Test Host unit and rotation magnetic force unit on both sides by the arms.Seize fixed cell on both sides by the arms, in order to seize on both sides by the arms with fixing Hall element to be tested in the measuring position, and be connected with the Test Host unit; The Test Host unit, it has test procedure, and provides electric current and voltage two electrical parameters to Hall element by seizing fixed cell on both sides by the arms; The rotation magnetic force unit forms at least one rotary magnetic field by at least one magnetisable material arround Hall element.
Aforesaid Hall magnetic field element test apparatus, wherein this magnetisable material of this rotation magnetic force unit is a permanent magnet.
Aforesaid Hall magnetic field element test apparatus, wherein this rotation magnetic force unit is controlled rotation direction, the velocity of rotation of this magnetisable material and is rotated the number of turns by servo motor.
Aforesaid Hall magnetic field element test apparatus, wherein this rotation magnetic force unit is by the switching of magnetic pole N-S, to form this rotary magnetic field.
Aforesaid Hall magnetic field element test apparatus, wherein this proving installation also comprises at least one coil magnetic field.
Aforesaid Hall magnetic field element test apparatus, wherein this proving installation also comprises the combination of this rotation magnetic force unit and this coil magnetic field, this rotation magnetic force unit places the either direction of this Hall element periphery.
Aforesaid Hall magnetic field element test apparatus, the distance of wherein controlling this rotation magnetic force unit and this Hall element also can be used as the parameter factor of test environment, to produce various different magnetic field intensity.
Aforesaid Hall magnetic field element test apparatus, wherein this is seized fixed cell on both sides by the arms and also has stationary platform, in order to fixing and this Hall element of placement.
Aforesaid Hall magnetic field element test apparatus, formed this rotary magnetic field in this rotation magnetic force unit wherein, be that a plurality of these magnetisable materials are symmetrically placed on the rotation platform, Dui Cheng a plurality of these magnetisable materials wherein, its S-N magnetic level each other is relative, this Hall element places between this magnetisable material of symmetry, and this rotation platform is to rotate this magnetisable material clockwise or counterclockwise, to form this rotary magnetic field around this Hall element.
Aforesaid Hall magnetic field element test apparatus, wherein each magnetisable material on this rotation platform can be adjusted the distance with this Hall element, as the parameter factor of test environment.
Aforesaid Hall magnetic field element test apparatus, wherein this seizes the height that fixed cell can be adjusted this stationary platform on both sides by the arms.
And the rotation magnetic force unit can drive the permanent magnet rotation by servo motor, to form the rotary magnetic field that magnetic pole S-N switches; Also can settle the permanent magnet of at least 2 symmetries on rotation platform, Hall element places between the permanent magnet of symmetry, and rotation platform drives the permanent magnet rotation, can form rotary magnetic field arround determinand, and then the function of test Hall element.
According to Hall magnetic field element test apparatus of the present invention, at least one coil magnetic field that it comprises can utilize the combination of coil magnetic field and rotation magnetic force unit at the characteristic of various Hall elements, in order to the directivity and the speed of test Hall element.And the distance of the rotary magnetic field of rotation magnetic force unit and determinand also can be used as the parameter factor of test environment, with the Test Application as the Hall element under the various different magnetic field intensity.
Therefore, Hall magnetic field element test apparatus of the present invention can be tested the functional parameter such as magnetic field sensitivity, rotating speed, direction identification of Hall element in rotary magnetic field.
Now the detailed description and the claim that cooperate following accompanying drawing, embodiment, will on address other objects and advantages of the present invention and be specified in after.
Description of drawings
Fig. 1 is the first enforcement example of the present invention, and an a kind of block schematic diagram of Hall magnetic field element test apparatus is described.
Fig. 2 A and Fig. 2 B are rotation magnetic force unit and determinand distance and the synoptic diagram that concerns of magnetic field intensity.
Fig. 3 A places a synoptic diagram of the top of Hall element for the rotation magnetic force unit.
Fig. 3 B is the synoptic diagram that the rotation magnetic force unit places the top and the below of Hall element respectively.
Fig. 4 is the first work example of the present invention, and a synoptic diagram of the Hall magnetic field element test apparatus of collocation coil magnetic field is described.
Fig. 5 is the second work example of the present invention, illustrates by the synoptic diagram of rotation platform with a kind of Hall magnetic field element test apparatus of formation rotary magnetic field.
Wherein, description of reference numerals is as follows:
1 seizes fixed cell 2 Test Host unit on both sides by the arms
3 rotation magnetic force unit, 4 Hall elements
3A, 3B, 3C, 3D, 3E rotation magnetic force unit
5 coil magnetic fields
1A seizes fixed cell 1A ' stationary platform on both sides by the arms
1A " seize the height control 4 ' Hall integrated circuit of fixed cell on both sides by the arms
3E1,3E2 permanent magnet 3E3 rotation platform
Embodiment
Fig. 1 is the first enforcement example of the present invention, and an a kind of block schematic diagram of Hall magnetic field element test apparatus is described, wherein this device is in order to test Hall element or integrated circuit.With reference to figure 1, this Hall magnetic field element test apparatus has one at least and seizes fixed cell 1, a Test Host unit 2 and a rotation magnetic force unit 3 on both sides by the arms.Seize fixed cell 1 on both sides by the arms, be positioned over the measuring position in order to seize on both sides by the arms, and be connected with the Test Host unit with fixing Hall element 4 to be tested; Test Host unit 2, it has test procedure, and provides electrical parameters such as electric current and voltage to Hall element 4 by seizing fixed cell 1 on both sides by the arms; Rotation magnetic force unit 3 forms at least one rotary magnetic field by at least one magnetisable material (permanent magnet) arround Hall element.
Be without loss of generality, the Hall element 4 of the present invention test, it is by sensor and the amplifying circuit integrated a kind of monocrystalline integrated circuit that constitutes in addition.Seize on both sides by the arms fixed cell 1 with Hall element 4 fixing after, seize fixed cell 1 on both sides by the arms and be connected with Test Host unit 2.With reference to figure 1, and rotation magnetic force unit 3 can be by a column type permanent magnet (not being shown among the figure) rotation to form rotary magnetic field, this column type permanent magnet one side is that S magnetic level, opposite side then are N magnetic level, place Hall element 4 belows, and this column type permanent magnet is connected (not being shown among the figure) with a servo motor, servo motor is controlled the column type permanent magnet and is docile and obedient hour hands or counterclockwise, rotates with various rotating cycle with different rotating speeds, different angles that high speed is stable.
The distance of rotation magnetic force unit 3 and Hall element 4 to be measured also can be used as the parameter factor of test environment, as the Hall element Test Application under various different magnetic field intensity.Wherein, magnetic field intensity is inversely proportional to distance, and far away more apart from determinand when rotation magnetic force unit 3, its magnetic field intensity is weak more, otherwise distance is near more, and magnetic field intensity is strong more.This implements in example, and the distance of rotation magnetic force unit 3 and determinand is between between 1 millimeter (mm) and 140 millimeters.Fig. 2 A and Fig. 2 B are respectively the synoptic diagram that concerns of distance with the magnetic field intensity of rotation magnetic force unit and determinand.
Electric current and the electrical parameter such as voltage of Hall element 4 by seizing fixed cell 1 acceptance test main computer unit 2 on both sides by the arms, servo motor control column type permanent magnet is to rotate clockwise with counterclockwise, form the switching of magnetic pole S-N, that is below Hall element 4,, the column type permanent magnet forms rotary magnetic field because of rotating, Hall element 4 is sensed the variation in magnetic field, and its parameter is sent to Test Host unit 2 by seizing fixed cell 1 on both sides by the arms, whether normal with rotating speed, the direction recognition function of judging this Hall element 4.This first implements in example, and rotation magnetic force unit 3 places the below of Hall element, and according to the characteristic and the demand of Hall element 4, also rotation magnetic force unit 3A can be placed the top of Hall element, as shown in Figure 3A.Fig. 3 B is a proving installation of the upper and lower of rotation magnetic force unit 3B, the 3C Hall element that places test respectively.
Be without loss of generality, Fig. 4 is the first work example of the present invention, and an a kind of synoptic diagram of Hall magnetic field element test apparatus is described.The proving installation of this work example is the combination of rotary magnetic field and coil magnetic field.With reference to figure 4, this Hall magnetic field element test apparatus comprises seizes fixed cell 1, a Test Host unit 2, a rotation magnetic force unit 3D and a coil magnetic field 5 on both sides by the arms.Wherein, seizing fixed cell 1 on both sides by the arms is fixed in Hall element 4 between rotation magnetic force unit 3D and the coil magnetic field 5.Rotation magnetic force unit 3D then with different rotating speeds, sense of rotation to form the switching of magnetic pole S-N, the electrical parameter of rotary magnetic field test Hall element 4 is provided, and judges by Test Host unit 2 whether the recognition function of rotating speed, direction and Hall element of Hall element 4 is normal.
Similarly, the rotation magnetic force unit 3D of this work example also can be below Hall element 4, and coil magnetic field 5 then is positioned at the top of Hall element 4.And rotation magnetic force unit 3D and coil magnetic field 5 can be adjusted the distance with Hall element 4 respectively, and form different magnetic field intensitys, and it adjusts distance range between 1 millimeter to 140 millimeters
Be without loss of generality, Fig. 5 is the second work example of the present invention, and an a kind of synoptic diagram of Hall magnetic field element test apparatus is described.The rotation magnetic force unit of the proving installation of this second work example is with the rotation around Hall integrated circuit of ring-type mode, with the function of test Hall integrated circuit.With reference to figure 5, this Hall magnetic field element test apparatus comprises seizes fixed cell 1A, a Test Host unit (not being shown among the figure) and a rotation magnetic force unit 3E on both sides by the arms.
Wherein, this seizes fixed cell 1A on both sides by the arms and has a stationary platform 1A ', in order to fixing and placement Hall integrated circuit 4 '.This rotation magnetic force unit 3E is two permanent magnet 3E1,3E2, place on the rotation platform 3E3, and the S utmost point of the N utmost point of first permanent magnet 3E1 and second permanent magnet 3E2 is toward each other to form magnetic field.And first and second piece permanent magnet 3E1,3E2 on the rotation platform 3E3 also can adjust its relative distance.
Seizing fixed cell 1A on both sides by the arms places Hall integrated circuit 4 ' between two permanent magnet 3E1, the 3E2 of rotation magnetic force unit, then rotation platform 3E3 then with clockwise with counterclockwise, at Hall integrated circuit 4 ' all around with 360 ° of rotations (Hall integrated circuit 4 ' to be measured is motionless).Whether this proving installation provides the magnetic pole S-N of various angles to switch, and the test environment of different magnetic field intensitys, normal with the function of test Hall integrated circuit 4 '.And seize fixed cell 1A on both sides by the arms and have height control 1A " function, the height that it can adjust Hall integrated circuit 4 ' allows Hall element 4 ' test its function with different height between two permanent magnet 3E1, the 3E2 of rotation magnetic force unit 3E.
The above only is a most preferred embodiment of the present invention, when not limiting practical range of the present invention according to this.Be that every equalization of being done in the present patent application claim changes and modifies, all should still belong in the scope that patent of the present invention contains.
Claims (11)
1. Hall magnetic field element test apparatus, this device is in order to the test Hall element, and this device comprises at least:
Seize fixed cell on both sides by the arms, in order to seize on both sides by the arms and to fix this Hall element in the measuring position;
The Test Host unit, this Test Host unit is seized fixed cell on both sides by the arms by this provides electric current and voltage two electrical parameters to this Hall element; And
The rotation magnetic force unit is by the rotation around this Hall element of at least one magnetisable material, to form at least one rotary magnetic field.
2. Hall magnetic field element test apparatus as claimed in claim 1, wherein this magnetisable material of this rotation magnetic force unit is a permanent magnet.
3. Hall magnetic field element test apparatus as claimed in claim 1, wherein this rotation magnetic force unit is controlled rotation direction, the velocity of rotation of this magnetisable material and is rotated the number of turns by servo motor.
4. Hall magnetic field element test apparatus as claimed in claim 1, wherein this rotation magnetic force unit is by the switching of magnetic pole N-S, to form this rotary magnetic field.
5. Hall magnetic field element test apparatus as claimed in claim 1, wherein this proving installation also comprises at least one coil magnetic field.
6. Hall magnetic field element test apparatus as claimed in claim 5, wherein this proving installation also comprises the combination of this rotation magnetic force unit and this coil magnetic field, this rotation magnetic force unit places the either direction of this Hall element periphery.
7. Hall magnetic field element test apparatus as claimed in claim 1, the distance of wherein controlling this rotation magnetic force unit and this Hall element are also as the parameter factor of test environment, to produce various different magnetic field intensity.
8. Hall magnetic field element test apparatus as claimed in claim 1, wherein this is seized fixed cell on both sides by the arms and also has stationary platform, in order to fixing and this Hall element of placement.
9. Hall magnetic field element test apparatus as claimed in claim 8, formed this rotary magnetic field in this rotation magnetic force unit wherein, be that a plurality of these magnetisable materials are symmetrically placed on the rotation platform, Dui Cheng a plurality of these magnetisable materials wherein, its S-N magnetic level each other is relative, this Hall element places between this magnetisable material of symmetry, and this rotation platform is to rotate this magnetisable material clockwise or counterclockwise, to form this rotary magnetic field around this Hall element.
10. Hall magnetic field element test apparatus as claimed in claim 9, wherein each magnetisable material on this rotation platform is used to adjust the distance with this Hall element, as the parameter factor of test environment.
11. Hall magnetic field element test apparatus as claimed in claim 8, wherein this seizes the height that fixed cell is used to adjust this stationary platform on both sides by the arms.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2007101096213A CN101320082B (en) | 2007-06-07 | 2007-06-07 | Hall magnetic field element test apparatus |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2007101096213A CN101320082B (en) | 2007-06-07 | 2007-06-07 | Hall magnetic field element test apparatus |
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| Publication Number | Publication Date |
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| CN101320082A CN101320082A (en) | 2008-12-10 |
| CN101320082B true CN101320082B (en) | 2010-08-18 |
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| CN2007101096213A Expired - Fee Related CN101320082B (en) | 2007-06-07 | 2007-06-07 | Hall magnetic field element test apparatus |
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Families Citing this family (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102135604B (en) * | 2011-02-25 | 2013-05-01 | 哈姆林电子(苏州)有限公司 | Magnetic field measuring device |
| CN103607069B (en) * | 2013-11-19 | 2016-01-13 | 朱萱 | A kind of using magnet and Hall element as the oscillatory gearing mechanism of detecting element |
| CN106290548A (en) * | 2016-08-29 | 2017-01-04 | 爱德森（厦门）电子有限公司 | A kind of device and method utilizing rotating excitation field detection metal impurities |
| CN110487522B (en) * | 2019-07-18 | 2021-10-01 | 日立楼宇技术（广州）有限公司 | Action reliability testing equipment, method and device |
| CN111397652A (en) * | 2020-03-31 | 2020-07-10 | 珠海格力智能装备有限公司 | Hall element detection circuit and method |
| WO2023102937A1 (en) * | 2021-12-10 | 2023-06-15 | 上海艾为电子技术股份有限公司 | Omnipolar hall sensing device and control method therefor, electronic device |
| CN117110967B (en) * | 2023-09-19 | 2024-02-23 | 南京中旭电子科技有限公司 | Device and method for testing sensitivity of Hall element |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1776929A (en) * | 2005-12-08 | 2006-05-24 | 南开大学 | Hall unit with nano crystal iron-germanium granule magneto sensitive material active layer |
| CN1885050A (en) * | 2005-06-23 | 2006-12-27 | 中国科学院半导体研究所 | Strong magnetic filed Hall effect testing apparatus and testing method thereof |
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2007
- 2007-06-07 CN CN2007101096213A patent/CN101320082B/en not_active Expired - Fee Related
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1885050A (en) * | 2005-06-23 | 2006-12-27 | 中国科学院半导体研究所 | Strong magnetic filed Hall effect testing apparatus and testing method thereof |
| CN1776929A (en) * | 2005-12-08 | 2006-05-24 | 南开大学 | Hall unit with nano crystal iron-germanium granule magneto sensitive material active layer |
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| CN101320082A (en) | 2008-12-10 |
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