CN101303388A - Test system and method - Google Patents
Test system and method Download PDFInfo
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- CN101303388A CN101303388A CNA200710101186XA CN200710101186A CN101303388A CN 101303388 A CN101303388 A CN 101303388A CN A200710101186X A CNA200710101186X A CN A200710101186XA CN 200710101186 A CN200710101186 A CN 200710101186A CN 101303388 A CN101303388 A CN 101303388A
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- test macro
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Abstract
A testing system is disclosed, which comprises an image sensor, a transfer device and a display device. The image sensor can generate an image signal according to a light source; the transfer device is used for transforming the format of the image signal, so as to produce a process signal; the display device presents pictures according to the process signal.
Description
Technical field
The present invention relates to a kind of test macro, relate in particular to a kind of test macro with imageing sensor.
Background technology
Along with integrated circuit (Integrated Circuit; IC) maturation of technology makes the Portability of portable electronic product also significantly be increased.Adorn an imageing sensor in most portable electronic product is equal, in order to the acquisition image.Generally speaking, imageing sensor comprises, charge coupled cell (Charge CoupledDevice; CCD) and cmos image sensor (CMOS Image Sensor; CIS).
Charge coupled cell has many photo-sensitive cells, in order to light is transformed into electric signal.Utilize conversion chip just can convert the electrical signal to digital signal.Each photo-sensitive cell on the charge coupled cell is called pixel (pixel), and it is that the semiconductor material of ISO is made.Cmos image sensor also is a photo-sensitive cell, and extraneous light is converted into electric energy, and utilizing digital-analog convertor (ADC) again is digital signal with analog-signal transitions.
(Complementary Metal-Oxide-Semiconductor, CMOS) technology is made by CMOS for cmos image sensor.CMOS technology can be produced PMOS (P-channel MOSFET) and NMOS (N-channel MOSFET) element on silicon single crystal, because PMOS and NMOS are complementary on characteristic, therefore be called CMOS.Because CMOS only just understands consumed power when switching transistor, therefore by made very power saving and the difficult heating of cmos image sensor of CMOS technology.
Charge coupled cell and cmos image sensor need carry out testing procedure earlier before carrying out canned program.The tester filters out unusual imageing sensor earlier, just normal imageing sensor is carried out canned program then.If the tester can't judge unusual imageing sensor exactly, will make the failure rate of imageing sensor improve significantly.
Summary of the invention
The invention provides a kind of test macro, comprise an imageing sensor, a conversion equipment and a display device.Imageing sensor produces a picture signal according to a light source.The form of conversion equipment converted image signal is to produce a processing signals.Display device presents processing signals.
The present invention provides a kind of method of testing in addition, is applicable to a test macro.Test macro has an imageing sensor, a conversion equipment and a display device.Method of testing of the present invention comprises the following steps: to provide a light source to this imageing sensor; Receive the picture signal that this imageing sensor produces; Change the form of this picture signal, to produce a processing signals; And this display device presents a picture according to this processing signals.
For above and other objects of the present invention, feature and advantage can be become apparent, cited below particularlyly go out preferred embodiment, and conjunction with figs., elaborate.
Description of drawings
Fig. 1 is that one of test macro of the present invention may embodiment.
Fig. 2 is another possibility embodiment of test macro of the present invention.
Fig. 3 is the process flow diagram of method of testing of the present invention.
Fig. 4 is another process flow diagram of method of testing of the present invention.
Wherein, description of reference numerals is as follows:
100,200: test macro;
110,210: imageing sensor;
120,220: conversion equipment;
130,240: display device;
230: demoder;
S310～S340, S410～S450: step.
Embodiment
Fig. 1 is that one of test macro of the present invention may embodiment.As shown in the figure, test macro 100 has an imageing sensor 110, a conversion equipment 120 and a display device 130.Imageing sensor 110 is according to light source S
L, produce picture signal S
IConversion equipment 120 converted image signal S
IForm, to produce processing signals S
PDisplay device 130 is according to processing signals S
PAnd present a picture.
By the picture that display device 130 is presented, the tester can judge just whether each pixel of imageing sensor 110 is normal.When certain pixel of imageing sensor 110 takes place when unusual, then this abnormal pixel will provide wrong testing result.Because the picture signal S that imageing sensor 110 is produced
IHave wrong composition, therefore, in the picture that display device 130 is presented, dim spot or shade may occur.The tester just can be positioned at the position of picture according to dim spot or shade, judges the opposite position of abnormal pixel at imageing sensor 110.Because yuv format is focused on the brightness of image, therefore, appear at that dim spot on the picture or shade can be suitable obviously, so the tester can learn the position of abnormal pixel immediately, thereby the shortening test duration.
Opposite, if display device 130 is directly according to the picture signal S with rgb format
IAnd when presenting picture, because the abnormal occurrence that picture occurred is more not obvious, be normally so the tester probably takes for all pixels of imageing sensor 110.Therefore, the processing signals S that has yuv format when display device 130 bases
PAnd present corresponding picture, can reduce tester's fault rate.
Fig. 2 is another possibility embodiment of test macro of the present invention.Test macro 200 comprises, an imageing sensor 210, a conversion equipment 220, a demoder 230 and a display device 240.Imageing sensor 210 is according to light source S
L, produce picture signal S
IConversion equipment 220 converted image signal S
IForm, to produce processing signals S
PDemoder 230 decoding processing signal S
P, to produce a decoded signal S
PDDisplay device 240 is according to decoded signal S
PDAnd present corresponding picture.Because imageing sensor 210, conversion equipment 220 and display device 240 are similar to imageing sensor 110, conversion equipment 120 and display device 130, so repeat no more.
In the present embodiment, because processing signals S
PBe a Low Voltage Differential Signal (Low VoltageDifferential Signaling; LVDS), so need to make display device 240 present picture in real time by demoder 230 action of decoding.Though demoder 230 decoding processing signal S
P, but the decoded signal S that demoder 230 is produced
PDAlso has yuv format.Therefore, display device 240 still can present picture according to the signal with yuv format.In addition, because demoder 230 had been handled processing signals S
PSo, when the test phase of imageing sensor 210 after encapsulation, can omit the testing procedure of relevant LVDS.In another possibility embodiment, conversion equipment 220 can be arranged on the identical circuit board (test board) with demoder 230.
Fig. 3 is the process flow diagram of method of testing of the present invention.Method of testing of the present invention is applicable to test macro shown in Figure 1.At first, provide light source (step S310) to imageing sensor.Please refer to Fig. 1, imageing sensor 110 can be charge coupled cell or cmos image sensor, in order to receive light source S
LThen, receive the picture signal (step S320) that imageing sensor produced.When imageing sensor 110 is sensed light source S
LThe time, just can produce picture signal S
I
Then, the form of converted image signal is to produce a processing signals (step S330).Because picture signal S
IHave rgb format, so in the present embodiment, with picture signal S
IConvert processing signals S to yuv format by rgb format
PAt last, display device presents a picture (step S340) according to processing signals.The processing signals S that has yuv format when display device 130 bases
PAnd when presenting picture, the tester can be learnt the position of abnormal pixel easily by picture.Thereby shorten the test duration
Fig. 4 is another possibility embodiment of method of testing of the present invention.Method of testing of the present invention is applicable to test macro shown in Figure 2.At first, provide light source (step S410) to imageing sensor.Then, receive the picture signal (step S420) that imageing sensor produced.When imageing sensor 210 is sensed light source S
LThe time, just can produce picture signal S
I
Then, the form of converted image signal is to produce a processing signals (step S430).The picture signal S that imageing sensor 210 is produced
IHas rgb format.In the present embodiment, with picture signal S
IFormat conversion become to have the processing signals S of yuv format
PThen, decoding processing signal (step S440).As processing signals S
PDuring for LVDS, then decoding step need be passed through, processing signals S can be handled or receive in real time
P
Display device presents a picture (step S450) according to decoded result.In the present embodiment, though the decoded signal S that display device 240 is produced according to demoder 230
PDAnd present corresponding picture, but demoder 230 is according to processing signals S
PAnd generation decoded signal S
PDTherefore, display device 240 is indirectly according to processing signals S
PAnd present picture.Though processing signals S
PThrough decoding step, but decoded result still is a yuv format, so display device 240 just can be according to the decoded signal S with yuv format
PDAnd present picture.Therefore, the tester just can be correctly and the picture that presented by display device 240 apace in, the position of learning abnormal pixel.
Above-described only is preferable possible embodiments of the present invention; described embodiment is not in order to limit scope of patent protection of the present invention; therefore the equivalent structure done of every utilization instructions of the present invention and accompanying drawing content changes, and in like manner all should be included in the scope of patent protection of the present invention.
Claims (10)
1. test macro comprises:
One imageing sensor according to a light source, produces a picture signal;
One conversion equipment is in order to change the form of this picture signal, to produce a processing signals; And
One display device presents a picture according to this processing signals.
2. test macro as claimed in claim 1 is characterized in that, this picture signal is a rgb format, and this processing signals is a yuv format.
3. test macro as claimed in claim 2 is characterized in that, this processing signals is a Low Voltage Differential Signal.
4. test macro as claimed in claim 3 also comprises a demoder, is arranged between this conversion equipment and this display device, in order to this processing signals of decoding.
5. test macro as claimed in claim 4 is characterized in that, this conversion equipment and this demoder are arranged on the identical circuit board.
6. test macro as claimed in claim 5 is characterized in that, this conversion equipment is a digital signal processor.
7. test macro as claimed in claim 1 is characterized in that, this imageing sensor is a charge coupled cell or a cmos image sensor.
8. a method of testing is applicable to a test macro, and this test macro has an imageing sensor, a conversion equipment and a display device, and this method of testing comprises the following steps:
Provide a light source to this imageing sensor;
Receive the picture signal that this imageing sensor produces;
Change the form of this picture signal, to produce a processing signals; And
This display device presents a picture according to this processing signals.
9. method of testing as claimed in claim 8 is characterized in that this switch process converts this picture signal to a yuv format by a rgb format.
10. method of testing as claimed in claim 9 also comprises this processing signals of decoding, makes this display device present this picture according to decoded result.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CNA200710101186XA CN101303388A (en) | 2007-05-09 | 2007-05-09 | Test system and method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CNA200710101186XA CN101303388A (en) | 2007-05-09 | 2007-05-09 | Test system and method |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN101303388A true CN101303388A (en) | 2008-11-12 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CNA200710101186XA Pending CN101303388A (en) | 2007-05-09 | 2007-05-09 | Test system and method |
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Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103245844A (en) * | 2012-02-03 | 2013-08-14 | 中芯国际集成电路制造(上海)有限公司 | Electrical accident analysis and test method and testing system for CIS (CMOS Image Sensor) device |
| CN104484885A (en) * | 2014-12-25 | 2015-04-01 | 上海华岭集成电路技术股份有限公司 | ATE test method for CIS chip YUV format output |
| CN106908715A (en) * | 2017-03-23 | 2017-06-30 | 张家港市欧微自动化研发有限公司 | A kind of test system for linear transducer |
-
2007
- 2007-05-09 CN CNA200710101186XA patent/CN101303388A/en active Pending
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103245844A (en) * | 2012-02-03 | 2013-08-14 | 中芯国际集成电路制造(上海)有限公司 | Electrical accident analysis and test method and testing system for CIS (CMOS Image Sensor) device |
| CN103245844B (en) * | 2012-02-03 | 2015-12-16 | 中芯国际集成电路制造(上海)有限公司 | CIS device electric fault analysis test method and test macro |
| CN104484885A (en) * | 2014-12-25 | 2015-04-01 | 上海华岭集成电路技术股份有限公司 | ATE test method for CIS chip YUV format output |
| CN104484885B (en) * | 2014-12-25 | 2017-09-19 | 上海华岭集成电路技术股份有限公司 | The ATE method of testings of CIS chips yuv format output |
| CN106908715A (en) * | 2017-03-23 | 2017-06-30 | 张家港市欧微自动化研发有限公司 | A kind of test system for linear transducer |
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Open date: 20081112 |