CN101201390A - Method for rapidly and accurately detecting armature overtravel of electromagnetic relay and device thereof - Google Patents
Method for rapidly and accurately detecting armature overtravel of electromagnetic relay and device thereof Download PDFInfo
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- CN101201390A CN101201390A CNA2007100097384A CN200710009738A CN101201390A CN 101201390 A CN101201390 A CN 101201390A CN A2007100097384 A CNA2007100097384 A CN A2007100097384A CN 200710009738 A CN200710009738 A CN 200710009738A CN 101201390 A CN101201390 A CN 101201390A
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Abstract
The invention discloses a method and its device, which are used for rapid and exact detection of armature over-stroke of electromagnetic relay. The invention is that an excitation voltage is applied on a coil of the electromagnetic relay; the connection situation of contact is obtained by a contact monitoring circuit; the gradually increasing current on the coil is obtained by a current sampling circuit; the signals from the contact monitoring circuit and the current sampling circuit are respectively transmitted to a microprocessor MCU; the microprocessor MCU analyzes and determines the connection time of contact, which is recorded as t1; the microprocessor MCU analyzes and determines the appearance time of inflection point of the gradually increasing current, which is recorded as t2; the difference between the appearance time of inflection point and the connection time of contact is a relative value of the armature over-stroke of electromagnetic relay. The method can determine the relative value of the armature over-stroke of electromagnetic relay rapidly and exactly. And the invention is also has characterized in the simple operation and the realization of automatic measurement.
Description
Technical field
The present invention relates to the detection method of electromagnetic relay parameter, particularly relate to a kind of method and device thereof that is used for accurately detecting fast the armature overtravel of electromagnetic relay.
Background technology
Relay is a kind of automatic switch element of the IN/OUT of having isolation features, is widely used in remote control, remote measurement, communication, control automatically, electromechanical integration and the power electronic equipment, and be one of most important basic control element.Electromagnetic relay is a kind of of relay, it generally is made up of iron core, solenoid, armature iron plate, contact reed etc., when the two ends at coil add certain voltage, will flow through certain electric current in the coil, thereby generate an electromagnetic field effect, movable armature will be under the effect of electromagnetic attracting force, overcome the pulling force (or permanent-magnet steel) of return spring and inhale to the iron core that is entangled by coil, thereby drive the moving contact that is fixed on the armature and relay often open the stationary contact adhesive; Behind coil blackout, the suction of electromagnetism also disappears thereupon, and movable armature will return original position under the reset force effect of spring (or permanent-magnet steel), thereby makes moving contact and original normally closed stationary contact adhesive.Action (adhesive or release) by armature makes its dynamic and static contact open and close like this, thereby reaches the conducting in circuit, the purpose of cut-out.
For the result of use (function) that guarantees electromagnetic relay, need some parameters of electromagnetic relay be detected usually, such as coil resistance, contact contact circuit resistance, adhesive/release voltage, adhesive/release time or the like.Definition is IEC 61810-7:2006 standard to contact overtravel: contact with stationary contact from moving contact and play the complete adhesive of armature, the sound contact is moved the distance of (maybe may move) jointly.That is to say for the contact that guarantees the contact well, reduce contact contact circuit resistance, moving contact and stationary contact after contact under the effect of power, the LAP that also will move on, to increase the contact pressure of contact, this that advances section stroke just is a contact overtravel.In order to guarantee relay realization reliable functioning, relay has all designed over travel when design, and over travel can cause the loose contact of contact inadequately, and over travel is excessive or too small, all can directly influence the reliability of relay.Therefore, a very important parameter index during whether the contact overtravel that detects electromagnetic relay meets the requirements and just become the electromagnetic relay manufacturing and use, and contact overtravel mainly guarantees by armature overtravel.
Because the iron core and the contact of electromagnetic relay generally all are sealed in plastics or the betal can (group) armature, so its contact mechanical parameter (as over travel etc.) assembles at relay and can't test after finishing at all.Method commonly used at present is to detect by feeler gauge before the plastic packaging case, during realization, be the operation that is provided with one special measurement armature overtravel on production line, detection person is put into product on the anchor clamps earlier, coil to electromagnetic relay applies driving voltage, checks the break-make situation of contact; If contact break-make situation is normal, again feeler gauge is inserted in the slit of armature and iron core, see contact break-make situation again; Judge the armature overtravel of electromagnetic relay with this, and then filter out the underproof product of armature overtravel.This method not only bothers, and can not accurately measure the sizes values of armature overtravel.
The utility model content
The objective of the invention is to overcome the deficiency of prior art, a kind of method and device thereof that is used for accurately detecting fast the armature overtravel of electromagnetic relay is provided, can judge the relative value of the armature overtravel of electromagnetic relay quickly and accurately, have simple to operately again, under the situation of outer cover sealing, can realize the characteristics of measuring automatically.
The technical solution adopted for the present invention to solve the technical problems is: a kind of method that is used for accurately detecting fast the armature overtravel of electromagnetic relay, be on electromagnetic relay coil, to apply a driving voltage, obtain the contacting situation of electromagnetic relay with the contact observation circuit, the signal of contacting is given microprocessor MCU, by time of microprocessor MCU analysis and judgement contacting and this time is designated as t1; Meanwhile, obtain the electric current that increases gradually on the coil with current sampling circuit, this current signal is delivered to microprocessor MCU after amplifying, and the electric current that is increased gradually by microprocessor MCU analysis and judgement the time of flex point occurs and this time is designated as t2; Microprocessor MCU is designated as T with the difference that electric current occurs between the time t1 that the time t2 of flex point and contact signal connect, and this T value is the relative value of the armature overtravel of this electromagnetic relay.
Described driving voltage is produced by microprocessor MCU.
A kind of device that is used to realize the method for the above-mentioned armature overtravel that accurately detects electromagnetic relay fast, it comprises a coil driver, a current sampling circuit, an amplifying circuit, a microprocessor MCU, a contact observation circuit; The positive output end of coil driver is connected to an end of relay coil, and the other end of relay coil is connected to the negative output terminal of coil driver by noncontacting switch; Current sampling circuit adopts current transformer, is arranged in the relay coil loop, and the output of current sampling circuit is connected to the input of microprocessor MCU by amplifying circuit; The output of microprocessor MCU is connected to the input of coil driver; The contact observation circuit is by sound contact ground connection, and the output of contact observation circuit is connected to the input of microprocessor MCU; The control signal output of microprocessor MCU is connected to the control end of noncontacting switch.
A kind of method that is used for accurately detecting fast the armature overtravel of electromagnetic relay of the present invention, be to have utilized following principle to realize the judgement of armature overtravel: usually, the electromagnetic relay contacting contacts required coil voltage and time with armature with iron core be to be not quite similar; From current waveform as can be known, coil electricity moment, electric current increased according to index law before the armature movement, and behind the armature setting in motion, because the back electromotive force that movement velocity produces has suppressed the variation of electric current, coil current no longer changes according to index law; After armature motion stopped, electric current changed according to index law again, reaches steady state (SS) at last.From the time, the time of contacting will be early than the time of armature adhesive, and mistiming of armature adhesive and contacting just time of armature overtravel, here armature overtravel is big more, the time of armature overtravel is big more, i.e. the mistiming of armature adhesive and contacting is also just big more, and armature overtravel is more little, the time of armature overtravel is also more little, i.e. the mistiming of armature adhesive and contacting is also just more little.Therefore, the mistiming of armature adhesive and contacting is the relative value of the armature overtravel of relay, the time by obtaining the armature adhesive and the time of contacting, just can obtain the relative value of the armature overtravel of electromagnetic relay, and and then the armature overtravel of judging electromagnetic relay whether meet the requirements, because the armature overtravel of electromagnetic relay is excessive or too small, all can directly influence the reliability of electromagnetic relay.
A kind of method that is used for accurately detecting fast the armature overtravel of electromagnetic relay of the present invention, be to adopt the contact observation circuit when obtaining the signal of contacting, when apply a driving voltage to solenoid after making contacting, the connection of contact changes the contact signal level of contact observation circuit, this signal conveys is given microprocessor MCU, and microprocessor MCU just obtains the time of contacting; When voltage continues increase and makes armature of relay adhesive, when the adhesive of electromagnetic relay armature, because the back electromotive force that movement velocity produces has suppressed the variation of electric current, make coil current can produce a flex point, we can obtain the electric current that increases gradually on the coil by current sampling circuit, this current signal is delivered to microprocessor MCU after amplifying, time of flex point occurs by microprocessor MCU analysis and judgement, and the time of this flex point is the time of armature adhesive; Thus, obtained the flex point of coil current waveform appearance and the time difference that contact signal is connected, this difference is the relative value of the armature overtravel of this electromagnetic relay.
A kind of device that is used for accurately detecting fast the armature overtravel of electromagnetic relay of the present invention, adopted microprocessor MCU, on the one hand, microprocessor MCU can make electromagnetic relay coil obtain driving voltage by digital to analog converter to coil driver output adjustable voltage signal; On the other hand, it accepts the coil current signal that current sampling circuit is sent here by amplifying circuit, by in the current signal corresponding to the judgement that occurs flex point on the coil, obtain the time of armature adhesive, simultaneously, it also accepts the contact signal that the contact observation circuit is sent here, by the judgement that the contact signal level is changed, obtain the time of contacting, by calculating armature and the difference between iron core pickup time and dwell time, obtain the relative value of the armature overtravel of electromagnetic relay, and by the judgement to relative value, thereby whether the armature overtravel that determines electromagnetic relay meets the requirements.
A kind of device that is used for accurately detecting fast the armature overtravel of electromagnetic relay of the present invention, current sampling circuit has adopted current transformer, so that such relay standard IEC 61810-7:2006 of test method conforms International Electrotechnical Commission.The signal that is obtained by current sampling circuit is very little, thereby is defeated by microprocessor MCU after will amplifying by amplifying circuit; In amplifying circuit, be provided with adjustable resistance, the size of adjustable resistance can become with the size of coil resistance.
Before the test, the relative value that will determine the armature overtravel of electromagnetic relay earlier is the scope of T value, and the mode of employing is, gets the electromagnetic relay of some, detects the electromagnetic relay armature overtravel by mechanical means with feeler gauge.Simultaneously, the relative value of measuring armature overtravel with device of the present invention is the T value, with test result tabulation comparison, and obtain the corresponding T value of upper and lower scope of the armature overtravel of electromagnetic relay, the upper and lower limit T value of the armature overtravel of electromagnetic relay is deposited among the microprocessor MCU, then, just can accurately test judgement to the armature overtravel parameter of electromagnetic relay with device of the present invention.During test, CPU (central processing unit) by microprocessor MCU is exported an adjustable voltage signal by the D/A change-over circuit to coil driver, make electromagnetic relay coil obtain driving voltage, the contact observation circuit is gathered contact signal then, this signal is also sent into microprocessor MCU, simultaneously, electric current on the current sampling circuit sampling coil, this electric current is sent into the A/D input port of microprocessor MCU after amplifying, when the coil voltage of electromagnetic relay reaches a certain value, the contacting of electromagnetic relay, the contact signal level of contact observation circuit changes, microprocessor MCU is subjected to the signal triggering of contact observation circuit, obtains the time t1 of contacting; When the voltage of coil continues to rise to another value, the armature of electromagnetic relay and iron core adhesive, flex point appears in the electric current that flows through on the coil, by the judgement of microprocessor MCU to flex point, obtain the time t2 of armature adhesive, calculating the relative value that difference between the time t1 of the time t2 of armature adhesive and contacting obtains armature overtravel by microprocessor MCU is the T value, in this T value and setting, the corresponding T value of following scope is compared, test T value is last, in the lower range, the armature overtravel of this electromagnetic relay meets the requirements, when testing the T value not last, in the time of in the lower range, the armature overtravel of this electromagnetic relay is undesirable, whole process has realized fast, correctly, accurately and robotization.
The invention has the beneficial effects as follows, owing to adopted and on electromagnetic relay coil, applied a driving voltage, obtain the contacting situation of relay with the contact observation circuit, the signal of contacting is given microprocessor MCU, by time of microprocessor MCU analysis and judgement contacting and this time is designated as t1; Meanwhile, obtain the electric current that increases gradually on the coil with current sampling circuit, this current signal is delivered to microprocessor MCU after amplifying, and the time of flex point occurred and this time is designated as t2 by microprocessor MCU analysis and judgement; Microprocessor MCU is designated as T with the difference that electric current occurs between the time t1 that the time t2 of flex point and contact signal connect, this T value is the relative value of the armature overtravel of this electromagnetic relay, relative value by the armature overtravel that obtains judges whether armature overtravel meets the requirements, make the detection of the armature overtravel simplification that becomes, class on the measuring accuracy, and measuring speed is greatly enhanced; Owing to adopted microprocessor MCU that driving voltage is provided, adopted microprocessor MCU that the flex point of the coil current signal that obtains in the current sampling circuit is discerned, make whole measuring process realize robotization, having avoided the people is the error of bringing, removed from and on each bar production line, established a special messenger and remove to survey armature overtravel, reached the purpose of saving man-hour; Adopt this method and device, outside whether the armature overtravel that can fast, accurately, accurately judge electromagnetic relay meets the requirements, have simple to operately again, can realize the advantage of measuring automatically.
Below in conjunction with drawings and Examples the present invention is described in further detail; But a kind of method and device thereof that is used for the armature overtravel of accurate fast detection electromagnetic relay of the present invention is not limited to embodiment.
Description of drawings
Fig. 1 is the synoptic diagram of the coil current of electromagnetic relay;
Fig. 2 is the circuit diagram of apparatus of the present invention;
Fig. 3 is the coil driver synoptic diagram of apparatus of the present invention;
Fig. 4 is the contact observation circuit synoptic diagram of apparatus of the present invention.
Embodiment
Shown in accompanying drawing, a kind of method that is used for accurately detecting fast the armature overtravel of electromagnetic relay of the present invention, be on electromagnetic relay coil JA, to apply a driving voltage, the contact JB that obtains electromagnetic relay with the contact observation circuit connects situation, the signal that contact JB connects is given microprocessor MCU, and the time of being connected by microprocessor MCU analysis and judgement contact JB also is designated as t1 with this time; Meanwhile, Current Transformer is that K1 obtains the electric current that increases gradually on the coil, and this current signal is delivered to microprocessor MCU after amplifying, the time of flex point occurred and this time is designated as t2 by microprocessor MCU analysis and judgement; Microprocessor MCU is designated as T with the difference that electric current occurs between the time t1 that the time t2 of flex point and contact signal connect, and this T value is the relative value of the armature overtravel of this electromagnetic relay.
The present invention has utilized following principle to realize the judgement of armature overtravel: usually, electromagnetic relay contacting and armature contact required coil voltage and time and are not quite similar with iron core; A driving voltage is added on the coil JA of electromagnetic relay, from coil current waveform (as Fig. 1) as can be seen, the contact of electromagnetic relay is connected earlier; Coil electricity moment, electric current increased according to index law before the armature movement, and behind the armature setting in motion, because the back electromotive force that movement velocity produces has suppressed the variation of electric current, coil current no longer changes according to index law; After armature motion stopped, electric current changed according to index law again, reaches steady state (SS) at last.From the time, the time t1 of contacting will be early than the time t2 of armature adhesive, and the time of the armature overtravel mistiming T=t2-t1 of armature adhesive and contacting just, because armature overtravel is big more, the actuation time of armature overtravel is also big more, i.e. the mistiming of armature adhesive and contacting is also just big more, and armature overtravel is more little, the time of armature overtravel is also just more little, i.e. the mistiming of armature adhesive and contacting is more little.Therefore, the mistiming T of armature adhesive and contacting is the relative value of the armature overtravel of relay.The time t2 by obtaining the armature adhesive and the time t1 of contacting, just can obtain the relative value of the armature overtravel of electromagnetic relay, and and then the armature overtravel of judging electromagnetic relay whether meet the requirements, because, the armature overtravel of electromagnetic relay is excessive or too small, all can influence the reliability of electromagnetic relay.
Be to adopt the contact observation circuit when obtaining the signal of contacting, after contact JB is connected, the connection of contact JB changes the contact signal level of contact observation circuit, this signal conveys is given microprocessor MCU, and microprocessor MCU just obtains the time of contacting; When voltage continues increase and makes armature of relay adhesive, when the adhesive of electromagnetic relay armature, because the back electromotive force that movement velocity produces has suppressed the variation of electric current, make coil current can produce a flex point, we can obtain the electric current that increases gradually on the coil by current sampling circuit, this current signal is delivered to microprocessor MCU after amplifying, time of flex point occurs by microprocessor MCU analysis and judgement, and the time of this flex point is the time of armature adhesive; Thus, obtained the flex point of coil current waveform appearance and the time difference that contact signal is connected, this difference T is the relative value of the armature overtravel of this electromagnetic relay.
Wherein, driving voltage is produced by microprocessor MCU, certainly, also can be produced by other electric elements.
A kind of device that is used to realize the method for the above-mentioned armature overtravel that accurately detects electromagnetic relay fast of the present invention, it comprises a coil driver 1, a current sampling circuit 3, an amplifying circuit 4, a microprocessor 5, a contact observation circuit 2; The positive output end of coil driver 1 is connected to the end of relay coil JA, and the other end of relay coil JA is connected to the negative output terminal of coil driver 1 by noncontacting switch T1; Current sampling circuit 3 adopts current transformer K1, is arranged in the relay coil loop, and the output of current sampling circuit 3 is connected to the input of microprocessor MCU5 by amplifying circuit 4; The output of microprocessor MCU5 is connected to the input of coil driver 1; Contact observation circuit 2 is by sound contact JB ground connection, and the output of contact observation circuit 2 is connected to the input of microprocessor MCU5; The control signal output of microprocessor MCU5 is connected to the control end of noncontacting switch T1.
Wherein, contact observation circuit 2 comprises resistance R A1 and resistance R A2, the termination 5V power supply of resistance R A1, the other end is by contact JB ground connection, one of resistance R A2 is connected to the link of resistance R A1 and contact JB, the other end is connected to the INT input end of microprocessor MCU, and the INT end is the pin of microprocessor MCU; Current sampling circuit 3 is current transformer K1; Amplifying circuit 4 comprises integrated amplifier IC1, adjustable resistance RP, and adjustable resistance RP is used for the adjustment of resistance value, so that suitable with coil resistance, the output of amplifying circuit 4 is the AN0 pin by the input end that resistance R 4 is connected to microprocessor MCU; The DA pin of microprocessor MCU is connected with coil driver 1, promptly is connected on the in-phase input end of the integrated amplifier in the coil driver 1.
A kind of device that is used for accurately detecting fast the armature overtravel of electromagnetic relay of the present invention, adopted microprocessor MCU, on the one hand, microprocessor MCU can export the adjustable voltage signal to coil driver 1 by the analog to digital converter that carries, and makes electromagnetic relay coil JA obtain driving voltage; On the other hand, it accepts the contact signal that contact observation circuit 2 is sent here, by the judgement that the contact signal level is changed, obtains the time that contact JB connects; Simultaneously, it also accepts the coil current signal that current sampling circuit 3 is sent here by amplifying circuit 4, by to occur the judgement of flex point in the current signal corresponding to the electric current on the coil JA, obtain the time of armature adhesive, by calculating the difference between armature t2 pickup time and the dwell time t1, obtain the relative value T of the armature overtravel of electromagnetic relay, and by the judgement to relative value T, thereby whether the armature overtravel that determines electromagnetic relay meets the requirements.Current sampling circuit 3 has adopted current transformer K1, and this signal is very little, thereby is defeated by microprocessor MCU after will amplifying by amplifying circuit 4; In amplifying circuit 4, be provided with adjustable resistance RP, the size of adjustable resistance RP can become with the size of coil resistance.
Before the test, the relative value that will determine the armature overtravel of electromagnetic relay earlier is the scope of T value, the mode that adopts is, get the electromagnetic relay of some, adopt mechanical means to detect the electromagnetic relay armature overtravel with feeler gauge, simultaneously, the relative value of measuring armature overtravel with device of the present invention is the T value, with test result tabulation comparison, and obtain electromagnetic relay armature overtravel on, the corresponding T value of following scope, on the armature overtravel of electromagnetic relay, lower limit T value deposits among the microprocessor MCU, then, just can accurately test judgement to the armature overtravel parameter of electromagnetic relay with device of the present invention.During test, CPU (central processing unit) by microprocessor MCU is exported an adjustable voltage signal by the D/A change-over circuit to coil driver 1, make electromagnetic relay coil JA obtain driving voltage, contact observation circuit 2 is gathered contact signal then, this signal is also sent into microprocessor MCU, when the coil voltage of electromagnetic relay reaches a certain value, the contact JB of electromagnetic relay connects, the contact signal level of contact observation circuit 2 changes, microprocessor MCU is subjected to the signal triggering of contact observation circuit 2, obtains the time t1 of contacting; Simultaneously, electric current on the current sampling circuit 3 sampling coil JA, this electric current is sent into microprocessor MCU after amplifying, when the voltage of coil continues to rise to another value, the armature of electromagnetic relay and iron core adhesive, flex point appears in the electric current that flows through on the coil JA, by the judgement of microprocessor MCU to flex point, obtain the time t2 of armature adhesive, calculating the relative value that difference between the time t1 of the time t2 of armature adhesive and contacting obtains armature overtravel by microprocessor MCU is the T value, in this T value and setting, the corresponding T value of following scope is compared, and test T value is last, in the lower range, the armature overtravel of this electromagnetic relay meets the requirements, when testing the T value not last, in the time of in the lower range, the armature overtravel of this electromagnetic relay is undesirable, and whole process has realized fast, accurately and robotization.
A kind of method conformance with standard IEC61810-7:2006 regulation requirement that is used for accurately detecting fast the armature overtravel of electromagnetic relay of the present invention.Method of the present invention (device) is suitable for the plastic packaging electromagnetic relay of any volume size, such as third and fourth communication relay etc. in generation.
The foregoing description only is used for further specifying a kind of method and device thereof that is used for accurately detecting fast the armature overtravel of electromagnetic relay of the present invention; but the present invention is not limited to embodiment; every foundation technical spirit of the present invention all falls in the protection domain of technical solution of the present invention any simple modification, equivalent variations and modification that above embodiment did.
Claims (3)
1. one kind is used for fast the accurately method of the armature overtravel of detection electromagnetic relay, it is characterized in that: be on electromagnetic relay coil, to apply a driving voltage, obtain the contacting situation of electromagnetic relay with the contact observation circuit, the signal of contacting is given microprocessor MCU, by time of microprocessor MCU analysis and judgement contacting and this time is designated as t1; Meanwhile, obtain the electric current that increases gradually on the coil with current sampling circuit, this current signal is delivered to microprocessor MCU after amplifying, and the electric current that is increased gradually by microprocessor MCU analysis and judgement the time of flex point occurs and this time is designated as t2; Microprocessor MCU is designated as T with the difference that electric current occurs between the time t1 that the time t2 of flex point and contact signal connect, and this T value is the relative value of the armature overtravel of this relay.
2. a kind of method that is used for accurately detecting fast the armature overtravel of electromagnetic relay according to claim 1, it is characterized in that: described driving voltage is produced by microprocessor MCU.
3. the device of the method for an armature overtravel that detects fast accurately electromagnetic relay as claimed in claim 1, it is characterized in that: it comprises an electromagnetic coil driving circuit, a current sampling circuit, an amplifying circuit, a microprocessor MCU, a contact observation circuit; The positive output end of coil driver is connected to an end of relay coil, and the other end of relay coil is connected to the negative output terminal of coil driver by noncontacting switch; Current sampling circuit adopts current transformer, is arranged in the relay coil loop, and the output of current sampling circuit is connected to the input of microprocessor MCU by amplifying circuit; The output of microprocessor MCU is connected to the input of coil driver; The contact observation circuit is by sound contact ground connection, and the output of contact observation circuit is connected to the input of microprocessor MCU; The control signal output of microprocessor MCU is connected to the control end of noncontacting switch.
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| CN200710009738A CN101201390B (en) | 2007-10-30 | 2007-10-30 | Method for rapidly and accurately detecting armature overtravel of electromagnetic relay and device thereof |
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| CN200710009738A CN101201390B (en) | 2007-10-30 | 2007-10-30 | Method for rapidly and accurately detecting armature overtravel of electromagnetic relay and device thereof |
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| CN106249140A (en) * | 2016-09-29 | 2016-12-21 | 北京慧智神光科技有限公司 | A kind of method and device for detecting breaker actuation time and speed of action |
| CN106772017A (en) * | 2017-01-17 | 2017-05-31 | 云南电网有限责任公司西双版纳供电局 | Actuating of relay power automatic measuring instrument |
| CN106772017B (en) * | 2017-01-17 | 2023-11-17 | 云南电网有限责任公司西双版纳供电局 | Automatic measuring instrument for relay action power |
| CN109738794A (en) * | 2019-01-24 | 2019-05-10 | 广东星美灿照明科技股份有限公司 | A kind of real-time monitoring system of relay |
| CN110850193A (en) * | 2019-09-04 | 2020-02-28 | 一汽解放汽车有限公司 | Online fault diagnosis method for proportional solenoid valve, vehicle and storage medium |
| CN114988247A (en) * | 2022-04-27 | 2022-09-02 | 宁波欣达电梯配件厂 | Current detection-based power-off brake control method and system |
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