CN101131370A - Double-light path full-reflection X fluorescence analyser - Google Patents
Double-light path full-reflection X fluorescence analyser Download PDFInfo
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- CN101131370A CN101131370A CNA2006101113394A CN200610111339A CN101131370A CN 101131370 A CN101131370 A CN 101131370A CN A2006101113394 A CNA2006101113394 A CN A2006101113394A CN 200610111339 A CN200610111339 A CN 200610111339A CN 101131370 A CN101131370 A CN 101131370A
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Abstract
The invention relates to a dual light path total reflection X-ray fluorescence analyzer, including at least two different excitation sources (X-ray tubes), the upper reflector, the lower reflector, sample glass, sample junk ring, the said two different excitation sources share the same power source and can automatically switch. Between the two excitation sources and sample glass and sample junk ring was set with the upper reflector and the lower reflector each, there was very small the space between the referred upper and lower reflector, the X-ray illuminate into the gap at a very small grazing angle, and total reflects on the reflecting surface of the upper and lower reflectors, finally reach the measured samples. The advantages of the dual light path total reflection X-ray fluorescence analyzer in this invention lies in that it can be used to measure different element, do not need to change excitation source in use, it can significantly improve the efficiency of testing when repeatedly cut off power supply and adjust the light path. And improves the analytical sensitivity owing to the complementary effect of using different excitation sources, with obvious operability and convenience, can meet the user's requirements better.
Description
Technical field
The present invention relates to a kind of double-light path full-reflection X fluorescence analyser.
Background technology
The full-reflection X fluorescence analysis is a kind of brand new technical that grows up on the xrf analysis technical foundation, and its principal character is to remove the influence of high-energy scattering background in common xrf analysis by reflection technology, has improved sensitivity for analysis.The characteristics of xrf analysis are that different excitaton sources have different sensitivity to different elements, so the most elements that exists for the energy measurement occurring in nature (is meant that generally Na～U), just needs use different excitation apparatus.Usual practice is to change dissimilar excitation apparatus (as X-ray pipe or radioactive source), distinguishes different elements, in order to guarantee measuring accuracy.But this method in use often need be adjusted light path once more, need repeatedly cut off the electricity supply etc., and inconvenience is arranged in the use.
Summary of the invention
The object of the present invention is to provide a kind of double-light path full-reflection X fluorescence analyser, can be used in the different element of test.
Double-light path full-reflection X fluorescence analyser of the present invention comprises at least two different excitaton sources (X-ray pipe), last reflecting body, following reflecting body, load sample sheet, sample pressure ring, and the shared same power supply of described two different excitaton sources also can automatically switch.Between two excitaton sources and load sample sheet and the sample pressure ring, respectively be provided with reflecting body and following reflecting body, described going up between reflecting body and the following reflecting body has very little spacing, X ray is injected this gap with very little glancing angle, and on the reflecting surface of last reflecting body and/or following reflecting body, produce total reflection, finally arrive the sample place.When this analysis instrument was in running order, described load sample sheet upper surface overlapped with following reflecting body upper surface, and sample pressure ring lower surface also overlaps with following reflecting body upper surface.
The advantage of double-light path full-reflection X fluorescence analyser of the present invention is: can be used in the different element of test, not need in the use repeatedly to change excitaton source, repeatedly cut off the electricity supply, adjust light path etc., can obviously improve testing efficiency.And make that on sensitivity for analysis operability and convenience are obvious, can satisfy user's requirement better owing to using different excitaton sources to obtain complementary the raising.
Be described further below in conjunction with the embodiment of accompanying drawing temperature-control circuit of the present invention.
Description of drawings
Fig. 1 is a structural representation of the present invention;
Fig. 2 is the A-A cut-open view of Fig. 1
Embodiment
Embodiment one: the described double-light path full-reflection X fluorescence analyser of present embodiment is shown in accompanying drawing 1,2, comprise mainly that wherein two different X-ray pipes (Mo target and W target) 1,6 is as excitaton source, the angled θ of two beam X-rays, θ can be 0～180 °, θ is 60 ° in the present embodiment.Above-mentioned two different X-ray pipes, 1,6 shared same power supplys also can automatically switch.The described double-light path full-reflection X fluorescence analyser of present embodiment also comprises reflecting body 3, following reflecting body 2, load sample sheet 5, sample pressure ring 4 simultaneously.Between last reflecting body 3 and the following reflecting body 2 very little spacing is arranged, X ray is injected with very little glancing angle (generally can not surpass 20 '～30 '), satisfies the necessary condition that produces the full-reflection X ray.When structure was in running order, load sample sheet 5 upper surfaces overlapped with following reflecting body 2 upper surfaces, and sample pressure ring 4 lower surfaces also overlap with following reflecting body 2 upper surfaces.
In the present embodiment, following reflecting body 2 is a monolithic construction, referring to accompanying drawing 1, this time reflecting body 2 almost fan, respectively establish a reflecting surface along its both sides of the edge edge, respectively corresponding two different X-ray pipes (Mo target and W target) 1,6, simultaneously, be respectively equipped with reflecting body 3 in the position of above-mentioned two reflecting surface correspondences, and on, form uniform slit between the following reflecting body, at this moment from two different X-ray pipes (Mo target and W target) 1, the X ray that satisfies total reflection condition that 6 directions are injected all can shine on the testing sample, in the present embodiment, two X-ray tubes have good complementarity to the elements are contained from Na to U, thereby can satisfy the multielement Testing requirement.
Claims (2)
1. double-light path full-reflection X fluorescence analyser, it is characterized in that comprising at least two different X-ray pipes, last reflecting body, following reflecting body, load sample sheet, sample pressure ring, the shared same power supply of described two different excitaton sources also can automatically switch, between two excitaton sources and load sample sheet and the sample pressure ring, respectively be provided with reflecting body and following reflecting body, described going up between reflecting body and the following reflecting body has very little spacing.When this analysis instrument is in running order.
2. double-light path full-reflection X fluorescence analyser as claimed in claim 1 is characterized in that described load sample sheet upper surface overlaps with following reflecting body upper surface, and sample pressure ring lower surface also overlaps with following reflecting body upper surface.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CNA2006101113394A CN101131370A (en) | 2006-08-23 | 2006-08-23 | Double-light path full-reflection X fluorescence analyser |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CNA2006101113394A CN101131370A (en) | 2006-08-23 | 2006-08-23 | Double-light path full-reflection X fluorescence analyser |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN101131370A true CN101131370A (en) | 2008-02-27 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
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| CNA2006101113394A Pending CN101131370A (en) | 2006-08-23 | 2006-08-23 | Double-light path full-reflection X fluorescence analyser |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| RU2706445C1 (en) * | 2019-01-09 | 2019-11-19 | Акционерное общество "Научные приборы" | Device for waveguide-resonance x-ray fluorescence element analysis |
-
2006
- 2006-08-23 CN CNA2006101113394A patent/CN101131370A/en active Pending
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| RU2706445C1 (en) * | 2019-01-09 | 2019-11-19 | Акционерное общество "Научные приборы" | Device for waveguide-resonance x-ray fluorescence element analysis |
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| C06 | Publication | ||
| PB01 | Publication | ||
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| C02 | Deemed withdrawal of patent application after publication (patent law 2001) | ||
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Open date: 20080227 |