CN101034126A - Testing method for components mounted parameter - Google Patents
Testing method for components mounted parameter Download PDFInfo
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- CN101034126A CN101034126A CN 200710037752 CN200710037752A CN101034126A CN 101034126 A CN101034126 A CN 101034126A CN 200710037752 CN200710037752 CN 200710037752 CN 200710037752 A CN200710037752 A CN 200710037752A CN 101034126 A CN101034126 A CN 101034126A
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Abstract
This invention belongs to detection technique field of electron element, which concretely relates detection method and system of pasting parameter of electron element. Through product number of element manufacturer, this invention computes element parameter and allowable value by specially specified regulation. Further more, the invention uses pasting NC data to compute most suitable detection sequence, and make CAD picture. According to detection sequence and CAD picture that shows detection sequence, LCR detection machine detects element parameter, and transmits data to computer, which judge this value is in allowable value scope, in order to improve rationalization and precision of element parameter detection.
Description
Technical field
The invention belongs to electronic devices and components detection technique field, be specifically related to electronic component and mount parameter detection method.
Background technology
At present, check that electronic component mounts parametric technique, mainly be to use the LCR detecting device that mounts parameter of checking electronic component,, whether mate Yi Bian check determination data on one side check the differentiation of L, C that the staff observes notes and wait the electronic component of record, R and parameter value thereof, allowable value.
There is following problem in this method.The 1st, need considerable time by the differentiation of the investigation of manufacturer identification symbol L, the C of electronic component, R and parameter thereof, allowable value.The 2nd, correct and measure this work of mensuration order of the electronic component that has mounted with only path, require correctness, and need considerable time.The 3rd, confirm by the LCR detecting device whether the numerical value of measuring numerical value and board design mates, and needs correctly to take industry really as, and making this daily paper needs considerable time.
Summary of the invention
The object of the present invention is to provide a kind of detection efficiency height and detect correct electronic component to mount parameter detection method and system thereof, make when mounted with electronic components, can confirm immediately that whether this element is the value with the values match of board design.
The electronic component that the present invention proposes mounts parameter detection method, and its step is as follows:
(1) identification symbol of extraction element manufacturer from mount data specifies manufacturer's identification symbol by the identification symbol ordering, forms the secret signal table;
(2) then, the secret signal table calculates the parameter and the allowable value of L, C, Zone R branch and L, C, R size automatically thus;
(3) the element coordinate data by mounting data vertically cutting apart or the horizontal partition mode is calculated the mensuration order that is fit to the LCR detecting device, and is made the CAD picture of expression LCR detecting device mensuration order according to certain amplitude again;
(4), and judge automatically whether L, C, Zone R branch and parameter thereof, allowable value that the identification symbol of this value and element manufacturer calculates mate according to the value of the mensuration sequential determination element of CAD picture.
In the said method, described vertically to cut apart or landscape mode calculate to be fit to the program of LCR detecting device, concrete steps are as follows:
About vertical partitioning scheme (seeing shown in Figure 6):
(1) to circuit board by vertically dividing, specifying and dividing spacing is N, the size of N is determined according to the actual size and the element distribution situation of circuit board, be generally 3mm≤N≤15mm, (X Y) is divided in each zone coordinate the measured object on the circuit board (comprising each L, C, R etc.) like this;
(2) first zoning from the right side, (X Y), by being sorted to mode far away by near apart from initial point, and adds the path number in order to the measuring object coordinate in the zone;
(3) (X Y), presses apart from initial point series arrangement from far near, and is right after the number of the back measuring object of amount in the last zone, adds the path number by the order of arranging to measurand coordinate in second zoning, the right side again;
(4) repeat aforesaid operations, to the last till zone.
So just with the coordinate (x of all measurands on the circuit board, y) in certain sequence (path) arranged and numbered, be made into CAD picture (as shown in Figure 8) then, by the order of each detected element on this CAD picture measurand carried out element differentiation, parametric measurement and differentiation for the testing staff.
About horizontal partition mode (seeing shown in Figure 7):
(1) to circuit board by laterally dividing, specifying and dividing spacing is N, equally usually, 3mm≤N≤15mm, (X Y) is divided in each zone coordinate the measured object on the circuit board (comprising each L, C, R etc.) like this;
(2) from following first zoning, (X Y) by arranging apart from initial point mode from far near, and compiles the upper pathway number by putting in order to the measured object coordinate in the zone;
(3) (X Y), by being arranged by formula closely afield apart from initial point, and is right after the number of last measuring object in the last zone, compiles the upper pathway number by the order of arranging to the measurand coordinate in following second zoning again;
(4) repeat aforesaid operations, to the last till zone.
Like this, same with all the measurand coordinate (x on the circuit board, y) in sequence (path) arranged and numbered, and is made into CAD picture (as shown in Figure 8) then, by the order on this CAD picture measurand carried out element differentiation, parameter detecting and differentiation for the testing staff.
Corresponding to above-mentioned detection method, its detection system comprises that having imported electronic component mounts the computing machine 1 LCR detecting device 2 that 1 communication is connected with computing machine of parameter detecting software and the measurement terminal 3 of mount components being measured and being connected with LCR detecting device 2 according to the measuring sequence that the CAD picture shows.Wherein, measurement terminal is by manually-operated.Electronic component in the computing machine 1 mounts parameter detecting software and comprises: mount data module, L, C, Zone R branch and size thereof, parameter and permissible value computing module, LCR differentiation/size/parameter/allowable value database module is calculated the module that is fit to LCR detecting device detection order.Measure and judge the module of the value of product according to the mensuration of CAD picture order by the LCR detecting device, daily paper is made module etc. as a result.These software modules are mainly finished following function:
(1) calculates specific manufacturer's identification symbol by the initial product number that mounts the element manufacturer in the data, and calculate L, C, the parameter of Zone R branch and size, element, allowable value by the rule list of identification symbol.
(2) finish component parameters measuring position on the circuit board for clear and definite component mounter, cut apart by certain amplitude is vertical or horizontal by mounting data, calculate easy measurement and understandable only measuring sequence, make the CAD picture of expression LCR detectors measure order then.
(3) L that relatively calculates by the identification symbol that mounts the element manufacturer in the data, C, the value of Zone R branch, parameter, allowable value and LCR detectors measure judges whether coupling automatically.
(4) the detailed form that will conclude the measurement result of mount components identification symbol and LCR detecting device is printed as report, perhaps each mounted board with parameter detecting as a result complete list and print as daily paper.
The concrete workflow of native system as shown in Figure 8.At first,, electronic component L, C, R are distinguished, and the higher limit of parameter, lower limit send to the LCR detecting device according to measuring sequence; Operating personnel aim at the detected element terminal with detection terminal, and the LCR detecting device is measured the parameter of element, and judge OK or NG; By the LCR detecting device determination data and judged result are sent to computing machine; The computing machine judged result, and show measurement data and judged result; Operating personnel carry out the measurement of element next time by next button; Judge whether it is last measuring sensor, finish until measurement.
The effect of invention
As mentioned above, the present invention confirms immediately that when mounted with electronic components whether this element is the value with the values match of board design, mount the work efficiency of parameter detecting thereby improve electronic component, and can begin to mount the production of engineering in advance, help to improve the productivity that mounts operation.
Description of drawings
Fig. 1 is a system of the present invention pie graph.
Fig. 2 is detection system flow process diagram of the present invention.
Fig. 3 is for checking the flow process diagram of data creating method.
Fig. 4 is the calculating of secret signal table " L, C, the differentiation of R ", " component size ", " parameter ", " allowable value " diagram by the component products number.
Fig. 5 is the size displaying contents diagram of element " SOP " " QFP " " connector ".
Fig. 6 is optimum measurement order computation " a horizontal partitioning scheme ".
Fig. 7 is optimum measurement order computation " a vertical partitioning scheme ".
Fig. 8 is the circuit diagram of optimized element measuring sequence.
Fig. 9 mounts the work flow diagram of parameter detecting system for electronic component.
Figure 10 is the display frame diagram of the measurement result of computing machine.
Number in the figure: 1 mounts the computing machine of parameter detecting system software for having imported electronic component, 2 for having imported computing machine of this software and the LCR detector means that communicates to connect, 3 is the measuring sequence that shows according to CAD picture line, the terminal that mount components is measured, 4 serve as reasons mounts data module, 5 is L, C, Zone R divides and size, parameter and allowable value computing module, 6 are LCR differentiation/size/parameter/allowable value database module, 7 for calculating the module that is fit to the LCR detecting device, 8 is the CAD diagram of LCR detecting device order, 9 for according to the order of CAD picture by detecting device and judge the module of the value of product, 10 illustrate for daily paper as a result.
Embodiment
Below with regard to example of the present invention, by the LCR differentiation that mounts the data computation element and size, parameter, allowable value and optimal measuring sequence, the example till judging according to measurement result, on one side describe on one side with reference to picture.
1, Fig. 1 represents that computing machine is to mount L, C, Zone R branch and electronic component dimensions, parameter, the allowable value that data are the basic calculation element, and calculate only measuring sequence, the staff observes the CAD picture of expression measuring sequence on one side, on one side by the order of computing machine according to the indication of LCR detecting device, measure, the judgement of OK/NG, this result by the LCR communication detector to computing machine, display frame.
2, Fig. 2 represents detection system flow process diagram of the present invention.
The component products number sequencing table of each element manufacturer is shown in Table 1.
3, Fig. 3 is in order to make the inspection data, to mount the preparation of data, according to data designated form disposal data, computing machine is arrived in this data importing.According to the component products number that imports data, by the component products number sequencing table of each element manufacturer shown in the table 1, the L of computing element manufacturer, C, R.When this element is a Murata Manufacturing Co. Ltd. system capacitor shown in the table 1, then calculate component size, parameter and the allowable value of respective element identification symbol by component size table, parameter list, allowable value table.
The steps include:
At first component mounter data and array data (txt, xls) are read computing machine by floppy disk etc.
Whether mate by product primary number table look-up then with the identification symbol of mount components identification symbol chips element manufacturer.
During the said goods numbers match, size of component, parameter and the allowable value of the identification symbol of inspection and chip component manufacturer.
When the said goods number does not match, whether check and Small Outline Package that if the element coupling of Quad Flat Package, connector is coupling then determine size.Be of a size of under other situations: (horizontal stroke) 3.2mm, (indulging) 1.6mm.
Check result is presented in the component data table that the chip component parameter can measure.
SOP is [Small Outline Package]
QFP is [Quad Flat Package]
CN is [connector]
3216 is [size: (horizontal stroke) 3.2mm, (indulging) 1.6mm].
4, Fig. 4 is the component products number diagram of element manufacturer.Wherein:
[1]: be component size
Unit: mm
| 2 bit digital | Size |
| 03 | 0.6*0.3 |
| 05 | 0.5*0.5 |
| 08 | 0.8*0.8 |
| 11 | 1.25*1.0 |
| 15 | 1.0*0.5 |
| 18 | 1.6*0.8 |
| 1D | 1.4*1.4 |
| 21 | 2.0*1.25 |
| 22 | 2.8*2.8 |
| 31 | 3.2*1.6 |
| 32 | 3.2*2.5 |
| 42 | 4.5*3.2 |
| 43 | 4.5*3.2 |
| 52 | 5.7*2.8 |
| 55 | 5.7*5.0 |
[2]: parameter, with 3 demonstrations.Starting 2 is significant figure, the multiple of the 3rd bit representation 10.
The position that " R " puts into the radix point place replaces radix point to show.
＜example〉3 bit digital value (pF)
| 3 bit digital | Value (pF) |
| R50 | 0.5 |
| 1R0 | 1.0 |
| 100 | 10×10 0 |
| 102 | 10×10 2 |
| 105 | 10×10 5 |
| 107 | 10×10 7 |
[3]: allowable value
| Character | Numerical value |
| B | ±0.1p |
| C | ±0.25p |
| D | ±0.5p |
| F | ±1％ |
| G | ±2％ |
| J | ±5％ |
| K | ±10％ |
| M | ±20％ |
| Z | +80％，-20％ |
5, Fig. 5 is that the surveying work personnel are the mark shape for the object that specifies the measuring position is easily shown in the CAD picture.The size of determining " SOP ", " QFP ", " connector " shows rule, and input in advance mounts the component products number of data, import mount data after, when then making the CAD picture in these contents of coordinate data position display.
6, Fig. 6 and Fig. 7 are in order to allow the surveying work personnel understand the method that measuring sequence is made the CAD picture that shows measuring route.
The step of the horizontal partition method of circuit board is as follows:
(1) to circuit board by laterally dividing, specifying and dividing spacing is N, 3mm≤N≤15mm, (X Y), is divided in each zone the coordinate of measured object (comprising L, C, R);
(2) from following first zoning of DM, (X Y), presses and sorts apart from initial point (0,0) mode from far near to the measuring object coordinate in the zone; And add the path number in order;
(3) again to the measuring object coordinate in following the 2nd zone (X, Y), by apart from initial point (0,0) by near to series arrangement far away, and be right after the number of last measuring object in first zone, add the path number by the order of arranging;
(4) repeat aforesaid operations up to final split position.
The step of vertical dividing method of circuit board is as follows:
(1) to circuit board by vertically dividing, specifying and dividing spacing is N, 3mm≤N≤15mm, (X Y) is divided in each zone the coordinate of measured object (comprising L, C, R);
(2) first zoning from the right side, (X Y), presses apart from initial point (0,0) and is sorted by nearly extremely mode far away, and add the path number by the order to arrangement to the measuring object coordinate in the zone;
(3) (X Y), by sorting apart from initial point (0,0) mode from far near, and is right after in the 1st zone last number, adds the path number by the order of arranging to the measuring object coordinate in the 2nd zoning, the right side again;
(4) repeat aforesaid operations up to final split position.
7, Fig. 8 is component size, parameter, the allowable value of the component products number that draws with said method and mounts the coordinate data basis that data are obtained, and makes the CAD picture that shows the measuring sequence path.It adopts vertical partitioning scheme, gets N=12mm.
8, Fig. 9 represents that electronic component mounts the flow process of the measurement operation of parameter detecting system.
(A) from computing machine to the LCR detecting device, send " L, C, the differentiation of R and the higher limit of parameter, lower limit " according to measuring sequence.
(B) staff aims at the element terminal and measures terminal.
(C) the LCR detecting device carries out the mensuration of parameter, carries out the judgement of OK/NG.
(D) the LCR detecting device sends to computing machine with determination data and judged result.
(E) computing machine shows " determination data and judged result " in the judged result table, and OK, NG ring with hummer.
(F) in addition in order to measure following element, the staff presses the Next button.Repeat above operation, measure Zhi Dao Zui Final element.
(G) picture 10 is the situation that measurement result data " L, C, Zone R branch ", " value ", " judgement " is shown to computer picture by the LCR detecting device.
When using the present invention to detect mounted with electronic components, can confirm immediately that whether this element is the value with the values match of board design, can improve electronic component mounts the operating efficiency of parameter detecting and mounts quality, and can begin in advance to produce and mount engineering, help to improve the productivity that mounts operation.Be particularly suitable for having the manufacturing industry that mounts engineering.
Table 1:
| Manufacturer name | Kind | The identification symbol ordering | ||||||||||
| 1 | 2 | 3 | 4 | 5 | 6 | 7 | 8 | 9 | ||||
| 1 | Murata Manufacturing Co. Ltd. | Capacitor | GR | ER | GQ | GM | GN | LL | | GA | G C | |
| 2 | KYOCERA | Capacitor | CM | CT | | DM | CA | |||||
| 3 | TAIYO YUDAN | Capacitor | AM | JM | LM | EM | TM | UM | | |||
| Inductance | LE | |||||||||||
| 4 | ROHM | | MC H | |||||||||
| 5 | Panasonic's electronic component | Capacitor | EC | |||||||||
| Resistance | ER | |||||||||||
| Inductance | EL | |||||||||||
| 6 | Advance industry | Capacitor | HT | |||||||||
| Resistance | RG+numeral | |||||||||||
| Inductance | HP (allowable value is not in the open) | |||||||||||
| 7 | TDK | Capacitor | The C+ | |||||||||
| Inductance | ML | |||||||||||
| 8 | KOA | Resistance | | |||||||||
| Inductance | KL | |||||||||||
| 9 | North land | Resistance | CR | |||||||||
| 1 0 | Still room motor | Resistance | RM | RGC | RN | RV | RP | FC | RL | RL | RH |
Claims (4)
1, a kind of electronic component mounts parameter detection method, it is characterized in that concrete steps are as follows:
(1) identification symbol of extraction element manufacturer from mount data specifies manufacturer's identification symbol by the identification symbol ordering, forms the secret signal table;
(2) then, the secret signal table calculates the parameter and the allowable value of L, C, Zone R branch and L, C, R size automatically thus;
(3) the element coordinate data by mounting data vertically cutting apart or the horizontal partition mode is calculated the mensuration order that is fit to the LCR detecting device, and is made the CAD picture of the mensuration order of expression LCR detecting device according to certain amplitude again;
(4), and judge automatically whether L, C, Zone R branch and parameter thereof, allowable value that the identification symbol of this value and element manufacturer calculates mate according to the value of the mensuration sequential determination element of CAD picture.
2, detection method according to claim 1 is characterized in that describedly vertically to cut apart or landscape mode calculate to be fit to the program of LCR detecting device, and concrete steps are as follows:
About vertical partitioning scheme:
(1) to circuit board by vertically dividing, specifying and dividing spacing is N, 3mm≤N≤15mm, (X Y) is divided in each zone the measured object coordinate on the circuit board like this;
(2) first zoning from the right side, (X Y), by being sorted to mode far away by near apart from initial point, and adds the path number in order to the measuring object coordinate in the zone;
(3) (X Y), presses apart from initial point series arrangement from far near, and is right after the number of last measuring object in the last zone, adds the path number by the order of arranging to measurand coordinate in second zoning, the right side again;
(4) repeat aforesaid operations, to the last till zone;
So just with the coordinate (x of all measurands on the circuit board, y) arrange in certain sequence and number, be made into the CAD picture then, for the testing staff by the order of each detected element on this CAD picture to measurand distinguish, parameter measurement and differentiation;
About the horizontal partition mode:
(1) to circuit board by laterally dividing, specifying and dividing spacing is N, 3mm≤N≤15mm, (X Y) is divided in each zone the measured object coordinate on the circuit board like this;
(2) from following first zoning, (X Y) by arranging apart from initial point mode from far near, and compiles the upper pathway number by putting in order to the measured object coordinate in the zone;
(3) (X Y), by being arranged by formula closely afield apart from initial point, and is right after the number of last measuring object in the last zone, puts in order and compiles the upper pathway number to the measurand coordinate in following second zoning again;
(4) repeat aforesaid operations, to the last till zone;
Like this, equally with all the measurand coordinates on the circuit board (x y) arranges in sequence and numbers, and is made into the CAD picture then, for the testing staff by the order on this CAD picture to measurand distinguish, the detection and the differentiation of parameter.
3, a kind of electronic component mounts parameter detecting system, it is characterized in that system comprises: imported electronic component and mounted computing machine (1) the LCR detecting device (2) that communication is connected with computing machine (1) of parameter detecting software and the measurement terminal (3) of mount components being measured and being connected with LCR detecting device (2) according to the measuring sequence that the CAD picture shows; Wherein, measurement terminal (3) is by manually-operated; Electronic component in the computing machine (1) mounts parameter detecting software and comprises: mount data module, L, C, Zone R branch and size thereof, parameter and permissible value computing module, LCR differentiation/size/parameter/allowable value database module, calculate the module that is fit to LCR detecting device detection order, measure and judge the module of the value of product according to the mensuration of CAD picture order by the LCR detecting device, daily paper is made module as a result.
4, detection system according to claim 3 is characterized in that the operating process of this system is as follows: at first, according to measuring sequence, electronic component L, C, R are distinguished, and higher limit, the lower limit of parameter sent to the LCR detecting device; Operating personnel aim at the detected element terminal with detection terminal; The LCR detecting device is measured the parameter of element, and judges OK or NG; By the LCR detecting device determination data and judged result are sent to computing machine; The computing machine judged result, and show measurement data and judged result; Operating personnel carry out the measurement of element next time by next button; Judge whether it is last measuring sensor, finish until measurement.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 200710037752 CN101034126A (en) | 2007-03-01 | 2007-03-01 | Testing method for components mounted parameter |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 200710037752 CN101034126A (en) | 2007-03-01 | 2007-03-01 | Testing method for components mounted parameter |
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| Publication Number | Publication Date |
|---|---|
| CN101034126A true CN101034126A (en) | 2007-09-12 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN 200710037752 Pending CN101034126A (en) | 2007-03-01 | 2007-03-01 | Testing method for components mounted parameter |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102116826A (en) * | 2009-12-30 | 2011-07-06 | 鸿富锦精密工业（深圳）有限公司 | System and method for measuring voltage of pin of electronic component |
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2007
- 2007-03-01 CN CN 200710037752 patent/CN101034126A/en active Pending
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102116826A (en) * | 2009-12-30 | 2011-07-06 | 鸿富锦精密工业（深圳）有限公司 | System and method for measuring voltage of pin of electronic component |
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Open date: 20070912 |