CN100518023C - Burst light-emitting signal power testing method and apparatus in PON system - Google Patents
Burst light-emitting signal power testing method and apparatus in PON system Download PDFInfo
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- CN100518023C CN100518023C CNB2006100197301A CN200610019730A CN100518023C CN 100518023 C CN100518023 C CN 100518023C CN B2006100197301 A CNB2006100197301 A CN B2006100197301A CN 200610019730 A CN200610019730 A CN 200610019730A CN 100518023 C CN100518023 C CN 100518023C
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Abstract
This invention discloses a method and a device for testing powers of burst optical signals in a PON system, which utilizes signal transformation, shaping, comparison, delay trigger and signal sample to maintain optical signal packets on a technical capture circuit to turn high frequency burst optical signals to low frequency maintained electric signal pulse level to be sampled to get a mean optical power of the single signal packet so as to get the actual light emitting power of burst signals on the circuit, in which, the circuit is composed of a pre-amplifying, signal shaping, signal comparison, pulse time delay, trigger control, signal sample maintenance and signal process control, which only captures and samples the optical signals so as to reduce the difficulty for dealing with signals and increase the accuracy for testing signal power.
Description
Technical field
(Fiber to the home: FTTH to the present invention relates to FTTX in the optical communication; Optical fiber is to the residence: the FTTP) measuring technology of the EPON of networking (hereinafter to be referred as PON) system burst optical signal power.
Background technology
FTTX networking is at present just becoming the focus of domestic and international access network construction.FTTX is owing to use the passive optical network PON technology, making a plurality of users share single optical fiber connects, and do not need to use any active element, promptly generate element with convert light by photoelectricity light (OEO) conversion, this single-point greatly reduces network installation, administers and maintains cost to the framework of multiple spot.
The networking of a new generation will inevitably bring new test problem, just need new means of testing, luminous power test for upward signal (1310nm) in the PON system is exactly a new problem, because this signal is a burst luminous signal, rather than common etalon optical power meter the continuous light signal that can correctly test, if use traditional method of testing (writing down the average light power in the sampling period) can not obtain correct test result like this, thereby maintenance brings difficulty to network installation.
Fig. 1 uses time division multiple access access (TDMA) mode that the uplink information of a plurality of optical network units (hereinafter to be referred as ONU) is organized into the situation that a Time Division Multiplexing information flow is sent to optical line terminal (hereinafter to be referred as OLT) for the basic boom (compiling of uplink information stream) of PON system, expression.It is that transmission bandwidth is divided into a row continuous time slot that time division multiple access inserts, and according to the difference of transfer mode, allocates in advance or distributes these time slots to give the user according to user's needs.In standard G.983, the 1310nm upward signal of ONU only distribute by OLT and the predetermined time slot of management in transmit.Up access must be adopted burst mode in this structure, and the light signal on the circuit is burst luminous signal, and correctly detecting burst luminous signal is exactly the average light power that need detect between transmitter activation light emission period, and special detection method be arranged.
Table 1 among Fig. 2 is the width of the minimum unit lattice of various PON system configurations, and the burst luminous signal power detection also must satisfy the requirement of this minimum widith in the PON system.
Summary of the invention
The object of the present invention is to provide burst luminous signal power testing method and device in a kind of PON system, solve the technical problem of correct test burst optical signal power in the PON system.
Technical scheme of the present invention is: burst luminous signal power testing method in a kind of PON system, its feature in: convert the photo-signal that photo-detector produces to voltage signal with preamplifier, after this voltage signal is removed clutter through signal shaping, sending into comparison circuit respectively carries out the signal comparison and sends into sample/hold amplifier and carry out signal sampling, send into the circuits for triggering of trigger action after the pulse process time-delay that comparison circuit has light ratio to produce, controlling of sampling pin by the trigger circuit triggers sample/hold amplifier, there is light signal voltage to keep, the light signal of high-frequency burst type is become low-frequency maintainable signal of telecommunication impulse level, signal processing control circuit detects this impulse level and handles, draw the average light power that has on the circuit between the photophase, i.e. the actual luminous power of burst.
Burst luminous signal device for testing power in the PON system, its feature in: whole device is made up of photo-detector, preamplifier, signal transformation circuit, signal comparator circuit, delay circuit, circuits for triggering, sampling hold circuit and signal processing control circuit, optical-electrical converter, preamplifier, signal transformation circuit, signal comparator circuit, delay circuit, circuits for triggering and signal processing control circuit are electrically connected successively, signal transformation circuit, sampling hold circuit and signal processing control circuit are electrically connected successively, and sampling hold circuit is electrically connected with circuits for triggering.
Burst luminous signal device for testing power in the aforesaid PON system, its feature in: photo-detector PIN pipe is EPM605, is added with reversed bias voltage on it; Adopt the AD8065 operational amplifier in the preamplifier.
Basic process of the present invention is: in a cycle period, to there be the light signal bag to catch fast and maintain that (each cycle only need be caught one the light signal bag, other light signal needn't be considered in this cycle, because just can think on this intraperiod line road light is arranged as long as catch one, if one does not all have to catch then illustrates on this intraperiod line road unglazed), the minimal sampling time of sampling hold circuit will satisfy minimum light signal bag width requirement, only the voltage signal that maintains is detected processing then, draw the signal light power size in this cycle, so just detect the average light power that light signal is arranged in the one-period, i.e. the luminous power of burst on the circuit.Enter next cycle then, so circulation just can constantly correctly detect the luminous power of burst on the circuit.
The present invention has the following advantages:
1, the light signal of high-frequency burst type is become low-frequency maintainable signal of telecommunication impulse level, thereby carry out sampling processing again after the quick light signal of burst being caught and maintained, therefore do not need analog to digital converter at a high speed and microprocessor at a high speed, reduced product cost and power consumption.
2, only, greatly reduce the Signal Processing difficulty to having light signal to catch sampling and keeping processing, improve the accuracy that signal power detects.
3, satisfy the burst power test requirement of various PON system configurations.
4, burst luminous signal can not only be accurately detected, also the continuous light signal can be accurately detected.
5, utilize the method can conveniently be easy to make the light power meter that is used for the burst luminous signal power detection of function admirable.
Description of drawings
Fig. 1: the basic boom of PON system (compiling of uplink information stream).Wherein: optical line terminal 1;
Fig. 2: the width of the minimum unit lattice under the various PON system configurations of table 1.
Fig. 3: the circuit block diagram of the embodiment of the invention.Wherein:
The U1-photo-detector;
The U2-preamplifier is made up of broadband operational amplifier;
The U3-signal transformation circuit;
The U4-signal comparator circuit is made up of high-speed comparator;
The U5-delay circuit is made up of monostable flipflop;
The U6-circuits for triggering are made up of D type rising edge trigger;
The U7-sampling hold circuit is made up of the high-speed sampling retainer;
The U8-signal processing control circuit is made up of the microprocessor of band analog to digital converter.
Fig. 4: the working waveform figure of an interior each point of cycle period.Wherein, a, b, c, d are each signaling point.
The photooscillogram of the burst luminous signal of Fig. 5: 155M.
The burst luminous signal of Fig. 6: 155M converts voltage signal to also through the ideal waveform figure after the signal shaping through preamplifier.
The circuit structure diagram of Fig. 7: Fig. 3.
The instantiation figure of Fig. 8: Fig. 6.
Embodiment
Device circuit block diagram of the present invention as shown in Figure 3.The specific implementation process of method of the present invention is as follows:
The pre-amplification circuit U2 that is made of broadband operational amplifier converts the light signal that photo-detector PIN pipe U1 receives to linear corresponding relation voltage signal;
Send into the input of sampling hold circuit U7 and the comparator anode of comparison circuit U4 respectively after this voltage signal process signal transformation circuit U3 shaping;
This moment, U7 was in the signal sampling stage (by signal processing control circuit U8 rising edge trigger U6 being carried out initialization makes U7 be in sample phase), the comparator negative terminal of comparison circuit U4 connects a reference voltage as the unglazed decision level of light is arranged on the circuit, positive terminal voltage is less than negative terminal voltage when unglazed, the comparator output low level, subsequent conditioning circuit is kept reset condition, as positive terminal voltage of light time greater than negative terminal voltage, the output of high-speed comparator is uprised by low rapidly, produce a rising edge signal, this rising edge signal is sent into the input of pulse delay circuit U5, the input of this rising edge signal being sent into circuits for triggering U6 through pulse delay (minimum according to the deration of signal requires to determine delay time) triggers, the output output low level of U6 after the circuit triggers, the U7 entering signal maintenance stage is waited for the sampling processing of U8; Each cycle U7 only catches one the light signal bag, there is other light signal U7 then not consider in this cycle, because if after this also have optical signal pulses, then the input of U6 also the rising edge signal can occur, but because the effect of latching of circuits for triggering U6, output low level remains unchanged, and U7 still is in signal and keeps the stage, makes U7 be in the signal sampling stage again after next one circulation beginning is resetted to circuits for triggering U6 by signal processing control circuit U8.
Processing just draws burst luminous power size through U8, signal processing control circuit U8 is with rising edge circuits for triggering U6 forced resetting (allowing U7 be in sample phase again) and keep a period of time (greater than the minimal sampling time of sample/hold amplifier then, avoid reset signal to remove the back just has triggering signal to produce at once, thereby makes the not enough sample error that produces subsequent conditioning circuit of sampling time) after begin the sampling of next cycle period.
The work wave of each point is seen Fig. 4 in the one-period, the d point as can be seen from Fig. 4, sample/hold amplifier U7 is initially in sample phase and (magnitude of voltage is sampled, no photophase sampled voltage is zero), keep sample phase (this moment, the sampling capacitance to sample/hold amplifier U7 charged) after having light signal to contract out now, (delay time must be greater than the minimal sampling time of sample/hold amplifier U7 in the time-delay of process pulse delay circuit U5, guarantee that sampling fully, less than minimum the optical signal pulses width arranged, guarantee only the to sample power of photophase) after, be in the maintenance stage (magnitude of voltage of photophase is accommodated in maintenance), the detection of waiting signal control and treatment circuit U8 is handled, therefore, the detected performance number of cycle period is not the mean value that light and no photophase are arranged in the whole cycle, and the power average value of photophase is just arranged.A cycle period is from signal processing control circuit U8 circuits for triggering U6 to be resetted to begin to finish the signal level detection end to U8.
The preferred version of circuit of the present invention is the processing of front end signal, be preamplifier and signal shaping part, it converts the photo-signal that the PIN pipe produces to certain linear corresponding relation voltage signal, and the quality of voltage signal will directly have influence on accuracy and the stability that subsequent conditioning circuit detects.
The conversion quality of signal is mainly by the influence of following three aspects:
1, bandwidth of operational amplifiers, gain and noise;
2, the junction capacitance of PIN pipe, junction resistance, dark current and noise;
3, the ripple of power supply and noise, circuit noise.
For this reason, should select the bandwidth height, gain greatly and the little operational amplifier of noise, as the AD8065 of ADI company; The PIN pipe also should select bandwidth height, junction capacitance and noise little, as the EPM605 of JDSU company, PIN should be added reversed bias voltage in order to reduce junction capacitance and noise; Good signal signal shaping can be good at improving voltage signal quality (Fig. 6 is the desired voltage signal after handling).
Experimental results show that: the method can well be carried out the test of burst luminous signal power in the PON system, has good accuracy and stability.
Concrete preferred embodiment is as follows: referring to Fig. 7 and Fig. 8 (cycle period is 100mS).
Pre-amplification circuit U2 manages the light signal that U1 receives with PIN and converts the voltage signal with linear corresponding relation to, this voltage signal through signal shaping U3 after oscillogram such as Fig. 8 (it is 1000nS that the optical signal pulses width is arranged, and amplitude is 1V) shown in;
This signal is sent into the input of sampling hold circuit U7 (minimal sampling time is 300nS) and the comparator anode of comparison circuit U4 respectively;
This moment, U7 was in the signal sampling stage, the comparator negative terminal of comparison circuit U4 connects a reference voltage (being made as 100mV herein) as the unglazed decision level of light is arranged on the circuit, positive terminal voltage is less than negative terminal voltage when unglazed, the comparator output low level, subsequent conditioning circuit is kept reset condition (being the a-b stage), as positive terminal voltage of light time greater than negative terminal voltage, the output of high-speed comparator is uprised by low rapidly, produce a rising edge signal, this rising edge signal is sent into the input of pulse delay circuit U5, trigger (being the b-c stage) through the input of behind the pulse delay 400nS this rising edge signal being sent into circuits for triggering U6, the output output low level of U6 after the circuit triggers, the U7 entering signal keeps the stage (voltage of maintenance is 1V), handling up to the detection of U8 (is the c-d stage, this stage occur again other have light signal just no longer to handle, the luminous power that samples is just as the luminous power of whole circulation in the cycle b-c stage like this);
Through the U8 sampling processing just draw burst luminous power size (this moment the 1V correspondence luminous power for-10dBm), the sampling processing of signal processing control circuit U8 next cycle period of beginning and after keeping 400nS then with rising edge circuits for triggering U6 forced resetting.
Claims (3)
1, burst luminous signal power testing method in a kind of PON system, its feature in: convert the photo-signal that photo-detector produces to voltage signal with preamplifier, after this voltage signal is removed clutter through signal shaping, sending into comparison circuit respectively carries out the signal comparison and sends into sample/hold amplifier and carry out signal sampling, send into the circuits for triggering of trigger action after the pulse process time-delay that comparison circuit has light ratio to produce, controlling of sampling pin by the trigger circuit triggers sample/hold amplifier, there is light signal voltage to keep, the light signal of high-frequency burst type is become low-frequency maintainable signal of telecommunication impulse level, signal processing control circuit detects this impulse level and handles, draw the average light power that has on the circuit between the photophase, i.e. the actual luminous power of burst.
2, burst luminous signal device for testing power in the PON system of method according to claim 1, its feature in: whole device is by photo-detector, preamplifier, signal transformation circuit, signal comparator circuit, delay circuit, circuits for triggering, sampling hold circuit and signal processing control circuit are formed, optical-electrical converter, preamplifier, signal transformation circuit, signal comparator circuit, delay circuit, circuits for triggering and signal processing control circuit are electrically connected successively, signal transformation circuit, sampling hold circuit and signal processing control circuit are electrically connected successively, and sampling hold circuit is electrically connected with circuits for triggering.
3, burst luminous signal device for testing power in the PON as claimed in claim 2 system, its feature in: photo-detector PIN pipe is EPM605, is added with reversed bias voltage on it; Adopt the AD8065 operational amplifier in the preamplifier.
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| CNB2006100197301A CN100518023C (en) | 2006-07-28 | 2006-07-28 | Burst light-emitting signal power testing method and apparatus in PON system |
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| CNB2006100197301A CN100518023C (en) | 2006-07-28 | 2006-07-28 | Burst light-emitting signal power testing method and apparatus in PON system |
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| CN100518023C true CN100518023C (en) | 2009-07-22 |
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Families Citing this family (10)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN101431372B (en) * | 2007-11-07 | 2011-11-16 | 华为技术有限公司 | Method and apparatus for acquiring optical power, and optical line terminal |
| US8200083B2 (en) * | 2008-01-03 | 2012-06-12 | Futurewei Technologies, Inc. | Burst power measurements using averaged power measurement |
| CN101447830B (en) * | 2008-12-26 | 2013-05-22 | 武汉电信器件有限公司 | Ethernet passive optical network (EPON) optical line terminal photoelectric module with digital supervision and reporting functions |
| CN101527597B (en) * | 2009-04-17 | 2011-10-12 | 青岛海信宽带多媒体技术有限公司 | Burst power monitoring unit and optical line terminal provided with same |
| CN102571209B (en) * | 2011-12-20 | 2015-01-28 | 深圳市大族激光科技股份有限公司 | Optical fiber communication device of laser marking control system and coding method |
| CN103763023A (en) * | 2014-01-22 | 2014-04-30 | 桂林聚联科技有限公司 | ONU state tester for passive optical network test |
| CN104168067A (en) * | 2014-08-29 | 2014-11-26 | 四川华拓光通信股份有限公司 | Method for judging optical power signal intensity in optical receiving circuit and circuit thereof |
| CN107809285B (en) * | 2017-11-15 | 2019-12-20 | 成都嘉纳海威科技有限责任公司 | Limiting amplifier for burst mode receiver |
| CN109495170B (en) * | 2018-12-04 | 2021-06-22 | 青岛海信宽带多媒体技术有限公司 | Received signal monitoring method for optical module, optical module and optical line terminal |
| CN113938202A (en) * | 2021-09-28 | 2022-01-14 | 苏州英威腾电力电子有限公司 | Optical fiber communication method and optical fiber communication system |
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| CN1434584A (en) * | 2003-01-28 | 2003-08-06 | 武汉理工大学 | PON system imitator for testing receive module |
| JP2006005472A (en) * | 2004-06-15 | 2006-01-05 | Sumitomo Electric Ind Ltd | Burst signal receiver and receiving method in optical communication system |
| CN1794613A (en) * | 2004-12-21 | 2006-06-28 | 阿尔卡特公司 | Passive optical network monitoring method and passive optical network |
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1434584A (en) * | 2003-01-28 | 2003-08-06 | 武汉理工大学 | PON system imitator for testing receive module |
| JP2006005472A (en) * | 2004-06-15 | 2006-01-05 | Sumitomo Electric Ind Ltd | Burst signal receiver and receiving method in optical communication system |
| CN1794613A (en) * | 2004-12-21 | 2006-06-28 | 阿尔卡特公司 | Passive optical network monitoring method and passive optical network |
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