CN100492029C - Inspecting apparatus and waveform display apparatus - Google Patents

Abstract

To improve efficiency of debug by detecting external signal and program variable independently from a program for describing procedure and normalized value for executing inspection and a program for indicating waveform on a screen, simultaneously indicating both waveforms on the same screen, and facilitating comparison of both sides. The inspection device inspects according to an inspection program and comprises an execution means for inspecting according to the inspection program, a memory means storing the program variable in the inspection program and the external signal input and output from the inspection device, and a waveform display means selecting a specific signal from the program variable and the external signal and displaying the waveform. The device is characterized in that the program variable and the external signal can be displayed by waveform independently from the execution means of the inspection program.

Description

Testing fixture and Waveform display apparatus

Invention field

The present invention relates to be applicable to the testing fixture of the product examination of carrying out in the production line of general industry products such as electric product, engineering goods or the production system, particularly according to checking that object realizes the testing fixture able to programme of checks sequence and judgment processing by programming.

Background technology

In the past, as the method that computing machine is programmed, described computing machine contains: a plurality of storeies of carrying out the information of function and a plurality of data modes of area definition, display device at least 1 display image controlling imaginary device and device, receive the device of user's input, and data processor, this method possesses: according to the data flow diagram combination step of user's input combination, described data flow diagram comprises as the data flow diagram on the described display device: with described a plurality of corresponding function icons of carrying out in the function of a function, with the corresponding variable icon of a form in described a plurality of data modes, the scheduling icon of representing the control stream of described data flow diagram, and interconnect described function icon and described variable icon and described scheduling graph target camber line; According to user's input front panel combination step on display with the front panel combination; And generating step according to the executable program that provides described front panel to the user interface of described data flow diagram and described executable program to generate executable program, described executable program contains and shows according to described function icon display and described camber line and interconnectively like that more than onely describedly to carry out function and have with respect to according to the described scheduling icon display control stream established of at least one the 1st function icon like that; Described data flow diagram combination step comprises at least one the 1st function icon in the described data flow diagram is placed step in the described scheduling icon of described data flow diagram in fact, described executable program has according to such by described at least one the 1st function icon being placed in fact in the described scheduling icon, the control that described at least one the 1st function icon is established is flowed, described data flow diagram combination step comprises the outer step of described scheduling icon that at least one the 2nd function icon in the described data flow diagram is placed described data flow diagram in fact, described executable program is in order to place described at least one the 2nd function icon in fact outside the described scheduling icon, and (for example with reference to following patent documentation 1) do not flowed in the control that described at least one the 2nd function icon is established.

[patent documentation 1] No. the 3016783rd, patent (claim 1)

Can adopt following method in the system of described patent documentation 1 in the past, promptly utilize object-oriented display unit to come display frame is programmed, the signal that records with the stitch of anchor clamps on this picture is through the A/D conversion, be taken into robot calculator, the program internal variable that it and checks sequence and standard value are used shows in described display frame, and compare, it is believed that, this situation has above-mentioned effect, promptly reduce trouble and the expense of using testing tool in addition, reduce that the space being set, and reduce because the observation mistake that causes of picture waveform more one by one.But, utilize object-oriented and effect that reduce trouble though at this moment have, yet the problem that exists is to implement programming and its debugging behavior of described display frame fully.

The present invention does for solving the above problems, its purpose is to provide a kind of testing fixture, it is independent that this testing fixture will be described the program of display waveform on the program of order that carry out to check and standard value and the picture, detect external signal and program variable, and both waveform is shown in same picture simultaneously, make and easily carry out the two comparison, thereby improve the efficient when debugging.

Summary of the invention

Testing fixture of the present invention, possess the program variable in the actuating unit checked according to scrutiny program, the described scrutiny program of storage and select specified signal and carry out the Waveform display apparatus that waveform shows by the memory storage of the external signal of described testing fixture input and output and from described program variable and described external signal, can with the actuating unit of scrutiny program independently waveform show described program variable and described external signal.

Waveform display apparatus of the present invention, be to be connected with the testing fixture of checking according to scrutiny program, possess from described testing fixture and be taken into the program variable in the described scrutiny program and select specified signal and carry out the waveform oscilloscope that waveform shows by the capture apparatus of the external signal of described testing fixture input and output and from described program variable and described external signal with communication line.

According to testing fixture of the present invention, then possess in the memory check program program variable and by the memory storage of the external signal of testing fixture input and output and the Waveform display apparatus of selecting specified signal and display waveform from program variable and external signal, since can with the actuating unit of scrutiny program independently conversion of waveform display routine and external signal, observe external signal whether simultaneously confirm correctly and the corresponding to operation of program internal variable so can carry out one side effectively.

According to Waveform display apparatus of the present invention, it is connected with the testing fixture of checking according to scrutiny program with communication line, since have from testing fixture be taken in the scrutiny program program transformation and by the capture apparatus of the external signal of testing fixture input and output, and select specified signal and carry out the Waveform display apparatus that waveform shows from described program transformation and external signal, therefore can not need the in addition any improvement of the structure of testing fixture itself, just can utilize this Waveform display apparatus to carry out one side effectively and observe external signal whether simultaneously confirm correctly and the corresponding to operation of program internal variable.

Description of drawings

Fig. 1 illustrates the hardware structure diagram of the testing fixture of the invention process form 1.

Fig. 2 illustrates the function constitution map of the testing fixture inside of the invention process form 1.

Fig. 3 illustrates the external signal of testing fixture of the invention process form 1 and the demonstration illustration of program internal variable.

Fig. 4 illustrates the action flow graph of the built-in variable/external signal selecting arrangement of the testing fixture of the invention process form 1.

Fig. 5 illustrates the basic comprising figure of the Waveform display apparatus of the invention process form 2.

The function that Fig. 6 illustrates the Waveform display apparatus inside of the invention process form 2 constitutes block diagram.

Fig. 7 illustrates the Waveform display apparatus block diagram of the testing fixture of the invention process form 3.

Fig. 8 illustrates the altitude scale that the waveform of the testing fixture of the invention process form 3 shows and the setting device figure of time ruler.

Fig. 9 illustrates the Waveform display apparatus block diagram of the testing fixture of the invention process form 4.

Figure 10 illustrates the Waveform display apparatus block diagram of the testing fixture of the invention process form 5.

Figure 11 illustrates the Waveform display apparatus block diagram of the testing fixture of the invention process form 6.

Figure 12 illustrates the Waveform display apparatus block diagram of the testing fixture of the invention process form 7.

Figure 13 illustrates the function setting device figure of the testing fixture of the invention process form 7.

Figure 14 illustrates the holding device and the coupling arrangement pie graph of the title of the program variable of testing fixture of the invention process form 8 and external signal.

Figure 15 illustrates the testing fixture pie graph that is made of prerequisite technology of the present invention.

Figure 16 illustrates the process flow diagram of the checks sequence of the testing fixture that is made of prerequisite technology of the present invention.

Embodiment

The prerequisite technology of invention

In production line or the production system, carry out manufacturing a product certain processing or the assembling after, for whether product or the semi-manufacture that checked qualified, check with testing fixture.Testing fixture provides test signal in accordance with regulations in proper order to each position that the inspection object promptly manufactures a product.This signal each functional block by manufacturing a product detects response signal by testing fixture.This response signal is just judged to manufacture a product within the limits prescribed the time and is certified products, in the time of outside the scope of regulation, as unacceptable product.The unacceptable product process is reprocessed, or once more by the testing fixture inspection, or superseded from production line.

For example the occasion of electric product is made up of various circuit blocks, and when checking that whether certain circuit block is correctly assembled by qualified parts, testing fixture adds the voltage or the electric current of test usefulness to this circuit block.This test signal passes through this circuit block, or exports the outside to as output voltage or electric current, or is sent to the circuit block of next stage, and testing fixture judges that by detecting this output signal and making comparisons with the specified standard value whether qualified corresponding circuit block is.In general, electric product is the assembly of sort circuit piece, and testing fixture is tested each circuit block with the order of regulation successively with test signal, and whether qualified final decision is.

Figure 15 illustrates the pie graph of the testing fixture of testing successively with the afore mentioned rules order.Among the figure, testing fixture 1500 is the center with robot calculator 1505 generally, by display device 1506, the DA translation circuit 1503 of test signal takes place, detect the AD translation circuit 1509 of response signal, the connector cable (wire harness) 1510 that connects DA translation circuit 1503 and AD translation circuit 1509 usefulness, a plurality of wire harness are converged into the wiring conversion substrate 1508 of a branch of usefulness, the wire harness 1511 of connecting wiring conversion substrate 1508 and anchor clamps 1512, possess checking that object 1507 directly provides and the anchor clamps 1512 of the stitch 1502 of received signal constitute, as an example of this robot calculator 1505, enumerate personal computer.Here, the order of inspection, be used for judging whether qualified reference value with and comparison process, described and carried out by the program in the robot calculator.

Figure 16 illustrates the example of the transmission of the processing undertaken by the program of the testing fixture of Figure 15 and signal.Checks sequence is represented by the program shown in the process flow diagram of Figure 16, with language descriptions such as C language or BASIC.In this checks sequence, test signal output step S1601 is that robot calculator 1505 from testing fixture is by DA translation circuit 1503 output test signals.This test signal is added to and checks object 1507 via wire harness 1510, wiring conversion substrate 1508, next stage wire harness 1511, anchor clamps 1512, stitch 1502.This test signal forms the output signal of this piece by checking the functional block in the object 1507.This output signal is opposite with test signal, via stitch 1502, anchor clamps 1512, wire harness 1511, wiring conversion substrate 1508, wire harness 1510, AD translation circuit 1509, turns back to the robot calculator 1505 of testing fixture.In the signal detection step S1602 of Figure 16, will be taken into the routine processes inside of robot calculator 1505 from the signal of AD translation circuit 1509.Thereafter, with the determination step S1603 of standard value in, carry out the comparison of output signal and standard value, carry out whether qualified judgement.In addition, generally on the display device 1506 of the robot calculator 1505 of Figure 15, according to the whether qualified result of determination of checking, will be for example by (OK) or negate that the treatment state that carries out of the testing fixture inside such as waveform of the message of (NG) and detection signal shows, people are easily seen from the outside.

Here, description be the program of testing fixture, generally this for software is whole, but be time-consuming operation.Different with it is, Auto-Test System is constructed by system in the above-mentioned patent documentation 1, it is to describe the program that order is in accordance with regulations tested usefulness with block diagram, utilizes the formation of carrying out the block diagram content by the robot calculator of object, can alleviate program composition man-hour effectively.And, in this system, in order easily to see the also variation of display routine internal variable clearly, programme with the picture of graphic presentation waveform for generating, this is also utilized the object-oriented software part of preparing a plurality of demonstration usefulness in advance, therefrom select necessary parts, and to the variable in the parts linker of selecting, robot calculator is construed to program with it, carries out picture and shows, by such formation, improve the efficient that waveform display frame generates.Realize the gimmick of this program by pattern description, in the programmable logic controller (PLC) of other industrial uses (sequential control), also can see example.In addition, utilize the generation gimmick of the display frame of object-oriented software part, also in programable display, see same example.

Below, the order of the generation phase of Figure 15, testing fixture shown in Figure 16 is described.Testing fixture with and program, the general process flow diagram of the design drawing of testing fixture, various translation circuit and wire harness wiring diagram, checks sequence and the program of in fact using of generating successively by the computing machine flowchart, carry out hardware manufacturing and installation according to design drawing and wiring diagram, with the program robot calculator of packing into, constitute testing fixture integral body.Then, be referred to as the operation of debugging.This debugging is that one side makes testing fixture action, and one side confirms that design drawing and wiring diagram or the hardware of making are free from mistakes in design or fit on, and the affirmation program do not have design error and coding error yet, when finding mistake then to its correction.When debugging finishes, the action of confirming testing fixture is for just often, the testing fixture manufacturing is finished, and the production line etc. of packing into comes into operation.

The most general method of this debugging, be that program is progressively carried out down, whether the logic of confirming program successively correct, incorrect on the data of each variable in the program, especially in the DA shift step, whether correctly arrive the stitch of terminal anchor clamps through the DA conversion and with this as signal with the variable in the testing tool observation programs such as oscillograph or tester, confirm whether the interior variable change of it and original program equates.Equally, in the AD shift step, one side is being seen variable change, and one side confirms that signal that the stitch at anchor clamps observes with testing tool is whether by in the regulation variable in the read-in programme correctly.In this debugging operation, for example suppose when the signal waveform that does not correctly observe on the stitch of anchor clamps after the DA conversion, just judge some design error or the assembling mistakes of existing in DA translation circuit, wire harness or the wiring conversion substrate, next just on anchor clamps, do not observe then, but observe the signal that detects at wire harness and circuit board, each position of DA translation circuit with testing tool, determine the place of mistake, and revise.

In the debugging operation of above-mentioned testing fixture, check that except that time, expense, working space, the correctness aspect also had problems when variable change in the signal of anchor clamps stitch observation and program was whether consistent.That is to say, because necessary setup test device in addition, and in the display frame of tester, show the waveform of stitch, and then also to prepare in addition the variation of program variable is shown in program on the picture that testing fixture possessed with waveform, carry out this program, the not only variation of display routine variable, and compare with waveform that tester shows, adopt such operation, so the problem that exists has: the expense that needs tester, the space of tester is set, be used for time of programming of display routine variable, debug the mistake of this program and the time of altering error etc., and when contrasting both waveforms, because by the visual picture that relatively separates, so can not correctly compare.Also has such problem especially, promptly as the main cause that is easier to cause mistake with visual ratio, be because the display frame size of tester, resolution, show rulers are generally different with picture size, resolution, the show rulers of program variable demonstration usefulness, so even same waveform as seems the waveform that also becomes different.

Different therewith is, method in the system of above-mentioned patent documentation 1 is can utilize object-oriented display unit that display frame is programmed, utilize the AD conversion that this picture is taken into robot calculator at the signal of anchor clamps stitch observation, the program internal variable that it and checks sequence and standard value are used is shown in described display frame, and compare, this situation can be thought and adopts tester institute's time spent and expense in addition, the space is set and contrasts and produce effect aspect the mistake that the waveform of picture causes one by one reducing.Yet, have the effect of minimizing time though this occasion is utilized object-oriented, also exist the programming must implement above-mentioned display frame fully with and debug such operation.

In addition, replace with the signal demonstration of visual relatively anchor clamps stitch and the waveform demonstration of program variable, can also correctly carry out with the robot calculator of object, but at this moment must be in addition will this program of usefulness relatively, exist increase program composition with and the problem of debugging work.The problem that has again is, the signal of anchor clamps stitch often makes its original appearance of waveform change because of noise or the impedance of transfer path midway, or the skew on the generation time, relatively judge consistent with program variable with being difficult to more by visual, when the program that other preparation compares, the work of treatment that adds or remove these signals variations takes place further to increase perhaps.

Here, what the external signal of anchor clamps etc. and program internal variable be described relatively is work for debugging, be this comparison display routine internal variable, or require the occasion of program with the part that the object robot calculator is handled relatively itself, this is that the i.e. description of the original program order used with the action phase of testing fixture and the program of standard value are separated, and is the labour who adds.And, in debug phase, when the debugging of the debugging of carrying out these original programs and additional program, can not separate the occasion that the two becomes one as program, being difficult to put in order the place of being debugged is original part, or additional part, also have to make the debugging operation that chaotic problem take place.

Testing fixture of the present invention is the device for addressing the above problem, it will describe the order of execution inspection and the program and the program independence that waveform is shown in picture of standard value, the external signal of detection anchor clamps etc., detect the program variable of describing checks sequence simultaneously, both waveforms are shown on the same picture simultaneously, carry out both comparisons easily, thereby improved the efficient when debugging.

And, after being taken into external signal and program variable, need not visually carry out this comparison, but compare with the comparison means in the testing fixture, in addition, external signal or program variable elimination are permitted to hold error, or the skew of timing countershaft, or utilize filtering to remove unwanted compositions such as denoising, compare after the calculation process arbitrarily carrying out other, thereby improve debugging efficiency.

And, be connected with testing fixture with communication line, utilize communication line to read in the interior program variable of this testing fixture, and import the external signal of anchor clamps etc. therewith respectively, described program variable and described external signal are shown on display device with overlapping abreast or, thus the efficient when improving debugging.

Example 1

The testing fixture of example 1 of the present invention, with with the program of describing checks sequence and standard value with and the actuating unit formation of separating, fetch program variable and external signal, possesses the Waveform display apparatus that waveform and external signal with the representation program variable change are shown in same picture, in the debug phase of testing fixture, one side is observed external signal, and one side confirms that whether this signal is correctly consistent with program variable, improves this affirmation efficiency of operation.In addition, the external signal pick-up unit of importing external signals such as anchor clamps newly is set.

Fig. 1 illustrates the basic comprising figure of the testing fixture of the invention process form 1.Among the figure, the hardware of testing fixture 100, with robot calculator 105 is the center, by the wire harness 111 of display device 106, the DA translation circuit 103 that test signal takes place, the AD translation circuit 109 that detects response signal, the connector cable (wire harness) 110 that connects DA translation circuit 103 and AD translation circuit 109, the wiring conversion substrate 108, connecting wiring conversion substrate 108 that are used for a plurality of wire harness are converged into 1 bundle and anchor clamps 112 and possess checking that object 107 directly provides and the anchor clamps 112 of the stitch 102 of received signal are constituted.

In addition, testing fixture 100 is except that above-mentioned formation, and the central part that also possess the external signal pick-up unit 101 that detects external signal, external signal pick-up unit 101 detected signals is read in testing fixture is the A/D converting means 104 of robot calculator 105.And, constitute the external signal input media by external signal pick-up unit 101 and A/D converting means 104.These are to detect by D/A converting means 103 to export the device that the magnitude of voltage of the stitch etc. of anchor clamps 102 is used to, for example with the front end of external signal pick-up unit 101 as probe, connect this probe and A/D converting means 104 with flexible cable, thereby can detect the signal that outputs to anchor clamps stitch 102 from robot calculator 105.Not only detect the signal that exports anchor clamps stitch 102 to, and detect to check object 107 any circuit block output signal and with the signal of wiring conversion substrate 108 relayings, and detect the external status that reads in the signal of robot calculator 105 from inspection object 107 by A/D converting means 109.

Fig. 2 is the functional block diagram of the inner testing fixture of mainly realizing with software of the robot calculator 105 of Fig. 1.Routine data 201 is routine datas of using by software processes checks sequence and standard value, is stored in the memory storage of RAM in the robot calculator 105 and ROM etc., is carried out by the control task 203 of the central processing department (CPU) of robot calculator 105.This part is the part of carrying out the original processing of the product examination that production system carries out at the working stage of testing fixture.Picture data 202 is to be used for carrying out data presented on the display device 106 of Fig. 1, it is the picture data of the message that shows and waveform etc., also be stored in the memory storages such as RAM in the robot calculator 105 and ROM, show that by the picture of the central processing department (CPU) of robot calculator 105 task 204 handles.This part also is the part of carrying out the original processing of the product examination that production system carries out at the working stage of testing fixture, or show OK (by), the result of determination of NG (negating), or the waveform of each one that checks out in producing demonstration.Among Fig. 2, routine data 201 shows that with picture task 204 constitutes respectively with picture data 202 and control task 203, and is optimum with this formation in the computer system of utilizing multitask OS management.But also can not that configuration program data 201 show task 204 with picture data 202 and control task 203 with picture respectively, but constitute one.

Among Fig. 2, show between each task that task 204 provides respectively,, shared storage 205 is set for utilizing signal data and variable data jointly at control task 203 and picture.In the shared storage 205, Data0, Data1 ... be that control task 203 or picture show the program variable that task 204 is handled.In1, In2 ..., Out1, Out2 ... be to utilize AD/DA conversion 208 external signal data of upgrading of executing the task, by the AD conversion with external signal input to In1, In2 ... in, by the DA conversion with Out1, Out2 ... value output to the outside.These external signals are the same with program variable, show that by control task 203 or picture task 204 reads or writes.In addition, the PROB signal that to be expression detected by the external signal pick-up unit 101 of Fig. 1 in the Corporate Memory 205, the execute the task AD converting means 104 of 208 couples of Fig. 1 of AD/DA conversion is carried out the AD conversion, and data are deposited among this PROB.Though Fig. 2 utilizes shared storage 205 to implement, also the storer that can only wait some task to visit with for example control task 203 is realized it, by showing that with picture task 204 waits other task to carry out intertask communication, utilizes data jointly.

Internal signal/external signal selecting arrangement 206 and waveform show that task 207 and control task 203 and picture show that task was arranged in 204 minutes.Waveform show task 207 from shared storage 205 read respectively by program variable Data0, Data1 that internal signal/external signal selecting arrangement 206 is selected ... with the external signal PROB that detects by the external signal pick-up unit of Fig. 1 or other external signal data In1, In2 ..., Out1, Out2 ..., it is shown with waveform.

Fig. 3 illustrates by the waveform of Fig. 2 and shows that task 207 is shown in the demonstration example on the display device 106 of Fig. 1, has shown 2 waveforms of waveform 301 with waveform 302 here.The waveform number that shows also can be 3 and more than.Signal/variable specified device the 303, the 304th, directly appointment comprises the built-in variable/program internal variables of external signal selecting arrangement 206 interior formations of Fig. 2 and the device of the external signal of probe signal, uses in the debug phase of testing fixture.Signal/variable specified device 303 is to make which external signal or program internal variable show specified device as waveform 301.Equally, signal/variable specified device 304 is to make which external signal or program internal variable show specified device as waveform 302.As the example of signal/variable specified device 303,304, illustrate the form of drop-down table among Fig. 3.It is shown by operation such as for example double-clicking to waveform 301 or waveform 302 that this is the operator that debugs.In addition, also can be in the display frame of Fig. 3 setup menu, be presented on the picture of Fig. 3 according to the selection inventory of this menu waveform 303 or waveform 304.

Fig. 4 illustrates the action flow graph of built-in variable/external signal selecting arrangement 206 of Fig. 2, by demoder 402 with program internal variable Data0, the Data1 of the signal/variable specified device 303 of Fig. 3 or 304 appointments ..., or external signal PROB, In1, In2 ..., Out1, Out2 ... Deng selective value be that signal/Variables Selection value 401 is transformed to address 403.Utilize this address 403 to obtain specified data, data are transferred to waveform show task 207 and display waveform from the shared storage 205 of Fig. 2.

According to above-mentioned example 1, since possess in the memory check program program variable and by the memory storage (shared storage 205) of the external signal of testing fixture input and output, with select the signal of regulation from program variable and external signal and carry out the Waveform display apparatus (built-in variable/external signal specified device 206 shows task 207 with waveform) that waveform shows, make program variable and the external signal can be independent with the actuating unit (control task 203) of scrutiny program, carry out waveform and show, so can make one side observe external signal, whether one side is confirmed correctly to be consistent with program variable and is taken that really industry raises the efficiency as.

That is to say, in the debug phase of testing fixture 100, whether the variable in the program of robot calculator 105 execution is carried out correct DA conversion, and whether it is correctly delivered to the stitch 102 of anchor clamps by wire harness 110,111 and wiring conversion substrate 108, follow the original program of the action class of debugger object to be separated, and do not need the analyzer of other oscillograph or tester etc., the external signal of detections such as program internal variable and anchor clamps stitch is carried out waveform simultaneously and is shown on same picture, can confirm to carry out both results relatively effectively.

Example 2

The Waveform display apparatus of example 2 of the present invention, it is the device that the debugging operation of the testing fixture that other is established is raised the efficiency, it connects testing fixture with communication line, have by communication line read input and output in the program variable of the external signal of testing fixture and testing fixture, and will represent that the waveform of external signal and program variable variation is shown in the Waveform display apparatus of same picture.So, also can use in the debugging to the testing fixture of establishing in addition again that can connect with communication line, the device that waveform shows usefulness needn't be set on each testing fixture, expense is low and the debugging operation of a plurality of testing fixtures is raised the efficiency.

Fig. 5 illustrates the basic comprising figure of the Waveform display apparatus of the invention process form 2.Be arranged in 501 minutes with testing fixture among Fig. 5 and be connected to the Waveform display apparatus 500 of this testing fixture 501 with communication line (no matter wired, wireless) 502.507 formations of central arithmetic unit (CPU) that this Waveform display apparatus 500 is detected the external signal pick-up unit 506 of usefulness and controlled each device of this Waveform display apparatus 500 by waveform oscilloscope 503, the communication interface 504 with communication line 502, AD converting means 505, external signal.In addition, AD converting means 505 and external signal pick-up unit 506 constitute signal input apparatus.

Fig. 6 illustrates by the software of central arithmetic unit (CPU) 507 execution of Fig. 5 or the formation of processing.Among Fig. 6, AD transformation task 602 usefulness external signal pick-up units 506 are taken into the signal in observations such as the stitch of anchor clamps, and do the AD conversion.Built-in variable/external signal selecting arrangement 603 is and Fig. 3 and the same device of Fig. 4, and the selective value of selected signal or variable is transformed to the address.Communication task 604 is by the robot calculator 605 of communication line 607 with the other testing fixture that is provided with of described address notification.Specified data according to this address visit shared storage 205, is taken out in the address that the communication task 604 that the communication task 606 of establishing in the robot calculator 605 receives Waveform display apparatus is sent here.After taking out specified data, next data are returned to the communication task 604 of Waveform display apparatus by communication line 607.Waveform display apparatus 601 is that the value of the value that obtains with AD transformation task 602 and communication task 604 foldbacks shows task as the waveform that the waveform of the display 503 of Fig. 5 shows.Here also can in built-in variable/external signal selecting arrangement 603, be sent to robot calculator 605 by communication line 607 by a selective value, this selective value is transformed into the address in the inside of robot calculator 605 with selected signal or waveform.

As mentioned above, waveform testing fixture according to this example, owing to be connected with the testing fixture of checking by scrutiny program with communication line, has the device that is taken into the external signal of program variable in the scrutiny program and testing fixture input and output from testing fixture, and select specified signal to carry out the Waveform display apparatus that waveform is represented from program variable and external signal, so can from testing fixture 605 itself, omit waveform demonstration task 601, AD transformation task 602, built-in variable/relevant waveform device shown such as external signal discriminating gear 603, the formation of testing fixture itself can be simplified, the identical effect of effect that obtains with the testing fixture shown in the example 1 can be obtained at low cost.

Example 3

The testing fixture of example 3 of the present invention is to possess the setting of the altitude scale of waveform and time shaft scale and show debugging apparatus, use the testing fixture of operation of the waveform of Visual Confirmation external signal and program variable easily.

Fig. 7 illustrates the block diagram of Waveform display apparatus of the testing fixture of example 3 of the present invention.The Waveform display apparatus of this example is that built-in variable/external signal selecting arrangement 206 and the waveform at Fig. 2 shows the device that is provided with debugging waveform altitude scale between the task 207.This is the enlarging and reducing device 701,702 that processing is dwindled in the amplification that is multiplied by a certain multiplying power by the number of the waveform that only shows with waveform demonstration task, to the data that variable/external signal selecting arrangement 206 obtains internally, and altitude scale setting device 801,802 shown in Figure 8 is constituted.Altitude scale setting device the 801, the 802nd with the device of signal/303,304 same purposes of variable specified device of Fig. 3, is specified the altitude scale of waveform separately by carrying out the commissioning staff.

Time shaft debugging apparatus 703 debugging of Fig. 7 shows the time shaft scale of task 207 waveform of retouching by waveform, the scale value of time shaft scale setting device 803 appointments of Fig. 8 is delivered to waveform show task 207.The waveform of Fig. 7 shows that task 207 can determine 1 figure that display waveform is used and the interval of following 1 figure according to this value.Perhaps make pattern spacing certain in advance, determine the time interval of carrying out the waveform demonstration also can according to the scale value.

According to above-mentioned example 3, then,, can make effective waveform relatively so can carry out easily looking the operation of confirming external signal and program variable with target owing to can freely debug waveform altitude scale and time shaft scale.

Example 4

Example 4 of the present invention is to possess the external signal of built-in variable/external signal selecting arrangement selection and the comparison means that program variable compares, by showing consistent or inconsistent comparative result, compare operation rapidly and correctly, the debugging operation is raised the efficiency.

Fig. 9 illustrates the block diagram of Waveform display apparatus of the testing fixture of example 4 of the present invention. in the back level of built-in variable/external signal selecting arrangement 206, the comparison means (comparer) 901 that selected external signal and program variable are compared is set among Fig. 9.The comparative result of comparison means 901 is delivered to the Waveform display apparatus 207 of back level, replaces waveform, shows OK etc. when both are consistent, shows NG etc. when inconsistent.At this moment, because as long as differentiate comparative result, so needn't use graphic display device, the display element of cheapnesss such as available LED substitutes.Can realize at low cost than with visual more more accurate comparison with this formation.

According to above-mentioned example 4, owing to possess the comparison means that external signal 3 and program variable are made comparisons, consistent or the inconsistent comparative result of expression, so can visual comparison, can rapidly, correctly carry out the comparisons of waveform, and, can improve the debugging efficiency of operation at low cost by omitting actual waveform demonstration.

Example 5

Example 5 of the present invention is when external signal that shows or relatively selected by built-in variable/external signal selecting arrangement and program variable, have error at measurment of removing etc. and permitted to hold the device of error, by rapidly, correctly comparing operation, improve the debugging efficiency of operation.

Figure 10 illustrates the block diagram of Waveform display apparatus of the testing fixture of the invention process form 5.Among Figure 10, adder subtracter 1001 is set, utilizes this formation in the back level of built-in variable/external signal selecting arrangement 206, might eliminate regulation such as error at measurment permitted compare after holding error.When filter processing being set here replacing adder subtracter, can after eliminating the frequency content that noise etc. do not want, compare.

According to above-mentioned example 5, then remove the error of being permitted to hold error and remove device by possessing, can remove noise contribution, rapidly, correctly carry out the comparisons of waveform, can improve the debugging efficiency of operation.

Example 6

Example 6 of the present invention is when external signal that shows or relatively selected by built-in variable/external signal selecting arrangement and program variable, the device that possesses the skew of time delay on the erasure signal drive access or the time shaft that processing produced till the value with program variable is sent to Waveform display apparatus, by rapidly, correctly comparing operation, improve the debugging efficiency of operation.

This example 6 utilizes the device identical with the signal of Fig. 3/variable specified device 303,304, the device of the corrected value of setting-up time axle offset is set, the waveform that this setting value is sent to Fig. 2 shows task 207, thereby eliminates the skew of time shaft, can carry out waveform relatively.For example, compare, when waveform signal 302 lingeringly is sent to waveform demonstration task, only moves the time shaft corrected value that sets left and show with the waveform signal 301 of Fig. 3, thus the comparison of energy correction signal signal 301 and 302.Perhaps also can be as shown in figure 11, at the back segment of built-in variable/external signal selecting arrangement 206 deferred mount 1101 is set, thus the skew of timing countershaft.

According to above-mentioned example 6, then, can rapidly, correctly carry out the comparisons of waveform by possessing the device that the elimination built-in variable/external signal of external signal selecting arrangement selection and the time shaft of program variable are offset, improve the debugging efficiency of operation.

Example 7

Example 7 of the present invention, the device that possesses function holding device and this function of computing, external signal and program variable that built-in variable/external signal selecting arrangement is selected carry out described functional operation, even the overlapping additional value that nonlinear characteristic is arranged on signal and the program internal variable externally, also can omit other requirement described value remove operation, rapidly, correctly compare operation, thereby improve the debugging efficiency of operation.

Figure 12 illustrates the block diagram of Waveform display apparatus of the testing fixture of the invention process form 7.Back level at built-in variable/external signal selecting arrangement 206 among the figure is provided with functional operation task 1201,1203.Functional operation task 1201,1203 is processed the data that built-in variable/external signal selecting arrangement 206 sends according to the function that reads from function holding device 1202,1204 prescribed function that kept, and is sent to the back level again.Here, the variable of function also can be the data that built-in variable/external signal selecting arrangement 206 sends, or is positioned at other data of the common memory 205 of Fig. 2.In addition, the function that provides of function holding device 1202,1204 is as shown in figure 13 to the function of each wave setting.Again, the text input frame 1310,1302 of Figure 13, for text to each wave setting function.

According to above-mentioned example 7, then the occasion of overlapping non-linear component on signal and data for example utilizes higher order functionality to be similar to non-linear component, might remove the processing that this one-tenth grades, and can compare after the higher correction than generality carrying out.

Example 8

Example 8 of the present invention, possess the holding device of the title that external signal that maintenance selects built-in variable/external signal selecting arrangement and program variable distribute in addition and the coupling arrangement that formation is connected between described title and external signal and program variable, by when waveform is shown in Waveform display apparatus, showing described title, with regard to easily by the visual operation of confirming external signal and program internal variable.

Figure 14 illustrates program variable and the title holding device of external signal and the pie graph of coupling arrangement of the invention process form 8.Among Figure 14, title holding device 1401 is that each data in the common memory 205 of Fig. 2 (external signal that program variable, external signal, external signal pick-up unit produce) are distributed title and kept the device of title, by its data of configuration in the common memory 205 of Fig. 2 are implemented.And between this title of having distributed external signal corresponding or program variable, form and connect with it.Should be shown in the waveform of Waveform display apparatus 1402 is selected by signal/variable specified device 303,304 of Fig. 3, but the Waveform display apparatus corresponding visit shared storage 205 with selective value, read title from the table of title holding device 1401, enforcement shows near to waveform that should title.Utilize this formation, Yi Bian can determine signal, variable character, kind easily, Yi Bian carry out the comparison of waveform.

According to above-mentioned example 8, add to be shown on the waveform with the title of program variable by the external signal that built-in variable/external signal selecting arrangement is selected, can easily use the operation of Visual Confirmation external signal and program internal variable.

Claims (8)

1. a testing fixture is checked according to scrutiny program, it is characterized in that possessing

The actuating unit of checking according to scrutiny program,

Store in the described scrutiny program program variable and by the memory storage of the external signal of described testing fixture input and output and

The program of display waveform on the program of the order describe to carry out checked and standard value and the picture is independent, select specified signal and carry out the Waveform display apparatus that waveform shows simultaneously from described program variable and described external signal at same picture.

2. testing fixture as claimed in claim 1 is characterized in that,

Other establishes the external signal pick-up unit that detects external signal, and the signal that detects with described external signal pick-up unit carries out the waveform demonstration as external signal.

3. testing fixture as claimed in claim 2 is characterized in that,

Show in the Waveform display apparatus of waveform of described program variable and described external signal to possess the device of the setting of the altitude scale of debugging waveform or time shaft scale.

4. testing fixture as claimed in claim 2 is characterized in that,

Show in the Waveform display apparatus of waveform of described program variable and described external signal, possesses the comparison means that external signal and program variable are compared, show consistent or inconsistent comparative result, described external signal and program variable are selected by built-in variable/external signal selecting arrangement.

5. testing fixture as claimed in claim 2 is characterized in that,

Show in the Waveform display apparatus of waveform of described program variable and described external signal, the error that possesses the regulation allowable error of external signal of removing and program variable is removed device, and described external signal and program variable are selected by built-in variable/external signal selecting arrangement.

6. testing fixture as claimed in claim 2 is characterized in that,

Show in the Waveform display apparatus of waveform of described program variable and described external signal, possess the device of the skew of the time shaft of eliminating external signal and program variable, described external signal and program variable are selected by built-in variable/external signal selecting arrangement.

7. testing fixture as claimed in claim 2 is characterized in that,

Show in the Waveform display apparatus of waveform of described program variable and described external signal, external signal and program variable are carried out operate approximately with the function that keeps in the function holding device, and described external signal and program variable are selected by built-in variable/external signal selecting arrangement.

8. testing fixture as claimed in claim 2 is characterized in that possessing

The holding device of the title that maintenance distributes in addition to external signal and program variable and

Between described title and external signal and program variable, form the coupling arrangement that is connected,

When waveform is shown in Waveform display apparatus, show described title,

Described external signal and program variable are selected by built-in variable/external signal selecting arrangement.

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