CN100476045C - Gallium-nitride metal organic-matter chemical gas-phase depositing apparatus for super-high vertical reactor - Google Patents
Gallium-nitride metal organic-matter chemical gas-phase depositing apparatus for super-high vertical reactor Download PDFInfo
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- CN100476045C CN100476045C CNB2007100138204A CN200710013820A CN100476045C CN 100476045 C CN100476045 C CN 100476045C CN B2007100138204 A CNB2007100138204 A CN B2007100138204A CN 200710013820 A CN200710013820 A CN 200710013820A CN 100476045 C CN100476045 C CN 100476045C
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- reactor
- upper plate
- main shaft
- gas
- graphite
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- 238000000151 deposition Methods 0.000 title claims description 11
- 229910052751 metal Inorganic materials 0.000 title claims description 11
- 239000002184 metal Substances 0.000 title claims description 11
- 229910002601 GaN Inorganic materials 0.000 title claims description 10
- 239000005416 organic matter Substances 0.000 title claims description 10
- JMASRVWKEDWRBT-UHFFFAOYSA-N Gallium nitride Chemical compound [Ga]#N JMASRVWKEDWRBT-UHFFFAOYSA-N 0.000 title claims description 9
- 239000000126 substance Substances 0.000 title claims description 5
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 claims abstract description 38
- 229910002804 graphite Inorganic materials 0.000 claims abstract description 38
- 239000010439 graphite Substances 0.000 claims abstract description 38
- 230000005540 biological transmission Effects 0.000 claims description 27
- 238000006243 chemical reaction Methods 0.000 claims description 18
- 241000283216 Phocidae Species 0.000 claims description 6
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 claims description 4
- 239000011521 glass Substances 0.000 claims description 3
- 239000000463 material Substances 0.000 abstract description 23
- 230000012010 growth Effects 0.000 abstract description 22
- 238000005516 engineering process Methods 0.000 abstract description 11
- 238000010438 heat treatment Methods 0.000 abstract description 10
- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 abstract description 5
- 238000000034 method Methods 0.000 abstract description 5
- 238000002474 experimental method Methods 0.000 abstract description 4
- 230000005855 radiation Effects 0.000 abstract description 4
- 238000005229 chemical vapour deposition Methods 0.000 abstract description 2
- 239000007789 gas Substances 0.000 description 27
- 235000012431 wafers Nutrition 0.000 description 12
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 12
- 238000002156 mixing Methods 0.000 description 8
- 238000000407 epitaxy Methods 0.000 description 6
- CHPZKNULDCNCBW-UHFFFAOYSA-N gallium nitrate Chemical compound [Ga+3].[O-][N+]([O-])=O.[O-][N+]([O-])=O.[O-][N+]([O-])=O CHPZKNULDCNCBW-UHFFFAOYSA-N 0.000 description 6
- 239000004065 semiconductor Substances 0.000 description 6
- 229910052782 aluminium Inorganic materials 0.000 description 5
- 230000000694 effects Effects 0.000 description 5
- 238000001816 cooling Methods 0.000 description 4
- 238000004519 manufacturing process Methods 0.000 description 4
- 238000002488 metal-organic chemical vapour deposition Methods 0.000 description 4
- 238000002360 preparation method Methods 0.000 description 4
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 3
- 150000001875 compounds Chemical class 0.000 description 3
- 238000013461 design Methods 0.000 description 3
- 229940044658 gallium nitrate Drugs 0.000 description 3
- NJPPVKZQTLUDBO-UHFFFAOYSA-N novaluron Chemical compound C1=C(Cl)C(OC(F)(F)C(OC(F)(F)F)F)=CC=C1NC(=O)NC(=O)C1=C(F)C=CC=C1F NJPPVKZQTLUDBO-UHFFFAOYSA-N 0.000 description 3
- 238000007789 sealing Methods 0.000 description 3
- 239000002826 coolant Substances 0.000 description 2
- 238000011161 development Methods 0.000 description 2
- 239000010408 film Substances 0.000 description 2
- 238000005259 measurement Methods 0.000 description 2
- 239000000203 mixture Substances 0.000 description 2
- 230000008569 process Effects 0.000 description 2
- 239000000243 solution Substances 0.000 description 2
- JBRZTFJDHDCESZ-UHFFFAOYSA-N AsGa Chemical compound [As]#[Ga] JBRZTFJDHDCESZ-UHFFFAOYSA-N 0.000 description 1
- 229910001218 Gallium arsenide Inorganic materials 0.000 description 1
- GPXJNWSHGFTCBW-UHFFFAOYSA-N Indium phosphide Chemical compound [In]#P GPXJNWSHGFTCBW-UHFFFAOYSA-N 0.000 description 1
- 239000004411 aluminium Substances 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 238000004140 cleaning Methods 0.000 description 1
- 230000008878 coupling Effects 0.000 description 1
- 238000010168 coupling process Methods 0.000 description 1
- 238000005859 coupling reaction Methods 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 230000008021 deposition Effects 0.000 description 1
- -1 gallium nitride compound Chemical class 0.000 description 1
- 150000004678 hydrides Chemical class 0.000 description 1
- 230000006698 induction Effects 0.000 description 1
- 238000012423 maintenance Methods 0.000 description 1
- 238000002844 melting Methods 0.000 description 1
- 230000008018 melting Effects 0.000 description 1
- 238000004377 microelectronic Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 230000005693 optoelectronics Effects 0.000 description 1
- 150000002894 organic compounds Chemical class 0.000 description 1
- 230000003647 oxidation Effects 0.000 description 1
- 238000007254 oxidation reaction Methods 0.000 description 1
- 230000001737 promoting effect Effects 0.000 description 1
- 238000000197 pyrolysis Methods 0.000 description 1
- 238000007634 remodeling Methods 0.000 description 1
- 230000008439 repair process Effects 0.000 description 1
- 230000000630 rising effect Effects 0.000 description 1
- 230000034655 secondary growth Effects 0.000 description 1
- 239000006104 solid solution Substances 0.000 description 1
- 239000000758 substrate Substances 0.000 description 1
- 238000012360 testing method Methods 0.000 description 1
- 239000010409 thin film Substances 0.000 description 1
- 239000002912 waste gas Substances 0.000 description 1
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Abstract
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Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CNB2007100138204A CN100476045C (en) | 2007-03-15 | 2007-03-15 | Gallium-nitride metal organic-matter chemical gas-phase depositing apparatus for super-high vertical reactor |
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Application Number | Priority Date | Filing Date | Title |
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CNB2007100138204A CN100476045C (en) | 2007-03-15 | 2007-03-15 | Gallium-nitride metal organic-matter chemical gas-phase depositing apparatus for super-high vertical reactor |
Publications (2)
Publication Number | Publication Date |
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CN101070611A CN101070611A (en) | 2007-11-14 |
CN100476045C true CN100476045C (en) | 2009-04-08 |
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CNB2007100138204A Expired - Fee Related CN100476045C (en) | 2007-03-15 | 2007-03-15 | Gallium-nitride metal organic-matter chemical gas-phase depositing apparatus for super-high vertical reactor |
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Country | Link |
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CN (1) | CN100476045C (en) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102103980B (en) * | 2009-12-17 | 2012-10-31 | 北京北方微电子基地设备工艺研究中心有限责任公司 | Reaction chamber for plasma processing equipment and plasma processing equipment |
CN106337202B (en) * | 2015-07-17 | 2018-11-06 | 中国科学院苏州纳米技术与纳米仿生研究所 | A kind of gas shower apparatus for high temperature crystal growth |
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2007
- 2007-03-15 CN CNB2007100138204A patent/CN100476045C/en not_active Expired - Fee Related
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Publication number | Publication date |
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CN101070611A (en) | 2007-11-14 |
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Effective date of registration: 20090904 Address after: The city of Yanan city of Qingdao province Shandong three road No. 79, No. 2 Building 2 unit 502 zip code: 266022 Co-patentee after: Liang Liping Patentee after: Zhang Guo Hua Address before: The city of Yanan city of Qingdao province Shandong three road No. 79, No. 2 Building 2 unit 502 zip code: 266022 Patentee before: Zhang Guohua |
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Free format text: FORMER OWNER: LIANG LIPING Owner name: QINGDAO JASON ELECTRIC CO.,LTD. Free format text: FORMER OWNER: ZHANG GUOHUA Effective date: 20100819 |
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Free format text: CORRECT: ADDRESS; FROM: 266022 FAMILY 502, UNIT 2, BUILDING 2, NO. 79, YANAN 3RD ROAD, SHIBEI DISTRICT, QINGDAO CITY, SHANDONG PROVINCE TO: 266101 SOUTHEAST UNIT, 2/F, BUILDING 5, HUITE INDUSTRY CITY, NO. 177, ZHUZHOU ROAD, LAOSHAN DISTRICT, QINGDAO CITY, SHANDONG PROVINCE |
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Effective date of registration: 20100819 Address after: Unit 2 floor southeast whit the industrial city of Zhuzhou road Laoshan District Qingdao city Shandong province 266101 No. 177 Building No. 5 Patentee after: Qingdao Jason Electric Co., Ltd. Address before: The city of Yanan city of Qingdao province Shandong three road 266022 No. 79 No. 2 Building 2 unit 502 Co-patentee before: Liang Liping Patentee before: Zhang Guohua |
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Effective date of registration: 20170420 Address after: 243000 Anhui Province Economic and Technological Development Zone Ma'anshan City Baoqing Road No. 399 Patentee after: Ma'anshan Jason Semiconductor Co. Ltd. Address before: Unit 2 floor southeast whit the industrial city of Zhuzhou road Laoshan District Qingdao city Shandong province 266101 No. 177 Building No. 5 Patentee before: Qingdao Jason Electric Co., Ltd. |
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