CN100452350C - 基于硅衬底无牺牲层的非制冷红外焦平面阵列的制作方法 - Google Patents
基于硅衬底无牺牲层的非制冷红外焦平面阵列的制作方法 Download PDFInfo
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- CN100452350C CN100452350C CNB2006100668884A CN200610066888A CN100452350C CN 100452350 C CN100452350 C CN 100452350C CN B2006100668884 A CNB2006100668884 A CN B2006100668884A CN 200610066888 A CN200610066888 A CN 200610066888A CN 100452350 C CN100452350 C CN 100452350C
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- cantilever beam
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- focal plane
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- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 title claims abstract description 64
- 229910052710 silicon Inorganic materials 0.000 title claims abstract description 64
- 239000010703 silicon Substances 0.000 title claims abstract description 64
- 239000000758 substrate Substances 0.000 title claims abstract description 41
- 238000004519 manufacturing process Methods 0.000 title claims description 12
- 229910052581 Si3N4 Inorganic materials 0.000 claims abstract description 37
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 claims abstract description 37
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 claims abstract description 31
- 239000010931 gold Substances 0.000 claims abstract description 31
- 229910052737 gold Inorganic materials 0.000 claims abstract description 31
- 238000000151 deposition Methods 0.000 claims abstract description 19
- 238000001259 photo etching Methods 0.000 claims abstract description 11
- VYZAMTAEIAYCRO-UHFFFAOYSA-N Chromium Chemical compound [Cr] VYZAMTAEIAYCRO-UHFFFAOYSA-N 0.000 claims abstract description 10
- 229910052804 chromium Inorganic materials 0.000 claims abstract description 8
- 239000011651 chromium Substances 0.000 claims abstract description 8
- 238000007747 plating Methods 0.000 claims abstract description 5
- 238000005530 etching Methods 0.000 claims abstract description 3
- 239000010408 film Substances 0.000 claims description 29
- 238000000034 method Methods 0.000 claims description 24
- 239000000463 material Substances 0.000 claims description 18
- 239000010409 thin film Substances 0.000 claims description 16
- 230000008021 deposition Effects 0.000 claims description 15
- 239000007787 solid Substances 0.000 claims description 14
- CSCPPACGZOOCGX-UHFFFAOYSA-N Acetone Chemical compound CC(C)=O CSCPPACGZOOCGX-UHFFFAOYSA-N 0.000 claims description 12
- 239000003292 glue Substances 0.000 claims description 12
- 238000009413 insulation Methods 0.000 claims description 12
- QTBSBXVTEAMEQO-UHFFFAOYSA-N Acetic acid Chemical compound CC(O)=O QTBSBXVTEAMEQO-UHFFFAOYSA-N 0.000 claims description 9
- 238000005260 corrosion Methods 0.000 claims description 8
- 230000007797 corrosion Effects 0.000 claims description 8
- 230000008020 evaporation Effects 0.000 claims description 8
- 238000001704 evaporation Methods 0.000 claims description 8
- 238000004518 low pressure chemical vapour deposition Methods 0.000 claims description 8
- KRHYYFGTRYWZRS-UHFFFAOYSA-N Fluorane Chemical compound F KRHYYFGTRYWZRS-UHFFFAOYSA-N 0.000 claims description 6
- 238000003491 array Methods 0.000 claims description 6
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 claims description 6
- 239000001301 oxygen Substances 0.000 claims description 6
- 229910052760 oxygen Inorganic materials 0.000 claims description 6
- 230000001413 cellular effect Effects 0.000 claims description 5
- 238000010276 construction Methods 0.000 claims description 5
- 230000003287 optical effect Effects 0.000 claims description 4
- GRYLNZFGIOXLOG-UHFFFAOYSA-N Nitric acid Chemical compound O[N+]([O-])=O GRYLNZFGIOXLOG-UHFFFAOYSA-N 0.000 claims description 3
- 230000015572 biosynthetic process Effects 0.000 claims description 3
- 239000007788 liquid Substances 0.000 claims description 3
- 229910017604 nitric acid Inorganic materials 0.000 claims description 3
- 239000008367 deionised water Substances 0.000 claims description 2
- 229910021641 deionized water Inorganic materials 0.000 claims description 2
- 238000000206 photolithography Methods 0.000 claims description 2
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Chemical compound O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 claims description 2
- 238000004140 cleaning Methods 0.000 abstract 1
- 238000005516 engineering process Methods 0.000 description 9
- 238000010586 diagram Methods 0.000 description 2
- 230000035945 sensitivity Effects 0.000 description 2
- 239000007789 gas Substances 0.000 description 1
- 239000012528 membrane Substances 0.000 description 1
- 238000004377 microelectronic Methods 0.000 description 1
- 230000000087 stabilizing effect Effects 0.000 description 1
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- Optical Elements Other Than Lenses (AREA)
- Mechanical Light Control Or Optical Switches (AREA)
- Micromachines (AREA)
Abstract
Description
Claims (8)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CNB2006100668884A CN100452350C (zh) | 2006-03-31 | 2006-03-31 | 基于硅衬底无牺牲层的非制冷红外焦平面阵列的制作方法 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
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CNB2006100668884A CN100452350C (zh) | 2006-03-31 | 2006-03-31 | 基于硅衬底无牺牲层的非制冷红外焦平面阵列的制作方法 |
Publications (2)
Publication Number | Publication Date |
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CN101047149A CN101047149A (zh) | 2007-10-03 |
CN100452350C true CN100452350C (zh) | 2009-01-14 |
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CNB2006100668884A Expired - Fee Related CN100452350C (zh) | 2006-03-31 | 2006-03-31 | 基于硅衬底无牺牲层的非制冷红外焦平面阵列的制作方法 |
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CN (1) | CN100452350C (zh) |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101659389B (zh) * | 2009-07-17 | 2011-12-21 | 中国传媒大学 | 光读出红外图像传感器像元芯片的光刻方法 |
CN103730535B (zh) * | 2012-10-12 | 2016-03-02 | 南京理工大学 | 应用硅锗薄膜的非制冷红外焦平面阵列像元制造方法 |
CN109911842A (zh) * | 2017-12-13 | 2019-06-21 | Mp 高技术解决方案控股有限公司 | 用于微机械传感器的制造方法 |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN1309191A (zh) * | 2000-12-07 | 2001-08-22 | 中国科学院上海技术物理研究所 | InSb红外焦平面列阵器件减反射膜淀积方法及专用掩膜架 |
US20040142504A1 (en) * | 2003-01-21 | 2004-07-22 | Mp Technologies, Llc | Focal plane arrays in type II-superlattices |
US6777682B2 (en) * | 2001-06-15 | 2004-08-17 | Mitsubishi Denki Kabushiki Kaisha | Infrared detector |
US20050224714A1 (en) * | 2004-04-08 | 2005-10-13 | Tayfun Akin | Ultra low-cost uncooled infrared detector arrays in CMOS |
-
2006
- 2006-03-31 CN CNB2006100668884A patent/CN100452350C/zh not_active Expired - Fee Related
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN1309191A (zh) * | 2000-12-07 | 2001-08-22 | 中国科学院上海技术物理研究所 | InSb红外焦平面列阵器件减反射膜淀积方法及专用掩膜架 |
US6777682B2 (en) * | 2001-06-15 | 2004-08-17 | Mitsubishi Denki Kabushiki Kaisha | Infrared detector |
US20040142504A1 (en) * | 2003-01-21 | 2004-07-22 | Mp Technologies, Llc | Focal plane arrays in type II-superlattices |
US20050224714A1 (en) * | 2004-04-08 | 2005-10-13 | Tayfun Akin | Ultra low-cost uncooled infrared detector arrays in CMOS |
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CN101047149A (zh) | 2007-10-03 |
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Owner name: HANGZHOU HONGXIN ELECTRONICS CO., LTD. Free format text: FORMER OWNER: CHINESE ACADEMY OF SCIENCES MICROELECTRONICS INSTITUTE Effective date: 20090724 |
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Effective date of registration: 20090724 Address after: No. 309, Airport Road, Hangzhou, Zhejiang, Jianggan District Patentee after: Hangzhou red core Electronics Co.,Ltd. Address before: Beijing city Chaoyang District Beitucheng West Road No. 3 Patentee before: Institute of Microelectronics of the Chinese Academy of Sciences |
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