CN100449318C - Device and method for detecting whether circuit array is short circuit - Google Patents
Device and method for detecting whether circuit array is short circuit Download PDFInfo
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- CN100449318C CN100449318C CNB2006100753694A CN200610075369A CN100449318C CN 100449318 C CN100449318 C CN 100449318C CN B2006100753694 A CNB2006100753694 A CN B2006100753694A CN 200610075369 A CN200610075369 A CN 200610075369A CN 100449318 C CN100449318 C CN 100449318C
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- short circuit
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- 238000000034 method Methods 0.000 title claims abstract description 26
- 239000004973 liquid crystal related substance Substances 0.000 claims description 60
- 210000002858 crystal cell Anatomy 0.000 claims description 27
- 238000012360 testing method Methods 0.000 claims description 27
- 238000001514 detection method Methods 0.000 claims description 20
- 210000004027 cell Anatomy 0.000 claims description 19
- 238000005259 measurement Methods 0.000 description 9
- 239000011521 glass Substances 0.000 description 6
- 230000005540 biological transmission Effects 0.000 description 4
- 239000000758 substrate Substances 0.000 description 4
- 230000005856 abnormality Effects 0.000 description 3
- WABPQHHGFIMREM-AKLPVKDBSA-N lead-210 Chemical compound [210Pb] WABPQHHGFIMREM-AKLPVKDBSA-N 0.000 description 3
- 239000000463 material Substances 0.000 description 3
- 238000004519 manufacturing process Methods 0.000 description 2
- 239000002699 waste material Substances 0.000 description 2
- 101150064138 MAP1 gene Proteins 0.000 description 1
- 230000002159 abnormal effect Effects 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 239000013078 crystal Substances 0.000 description 1
- 238000005538 encapsulation Methods 0.000 description 1
- 239000012530 fluid Substances 0.000 description 1
- 238000009413 insulation Methods 0.000 description 1
- 239000000523 sample Substances 0.000 description 1
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- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
- Liquid Crystal (AREA)
Abstract
The present invention provides an array baseplate which can detect whether a circuit array is short-circuited and a method. The array baseplate comprises a first connecting wire, a second connecting wire, a first connecting bonding pad group, a second connecting bonding pad group, a third connecting bonding pad group, a fourth connecting bonding pad group, a first conducting wire, a second conducting wire, a third conducting wire, a fourth conducting wire, a first connecting short string and a second connecting short string, wherein the first conducting wire is connected with the first connecting bonding pad group and the fourth connecting bonding pad group; the second conducting wire is connected with the second connecting bonding pad group and the third connecting bonding pad group; the third conducting wire is electrically connected with the first connecting wire; the fourth conducting wire is electrically connected with the second connecting wire; the first connecting short string is connected with the first conducting wire and the third conducting wire; the second connecting short string is connected with the second conducting wire and the fourth conducting wire.
Description
Technical field
The invention provides the circuit method of short circuit whether on a kind of detection one circuit board, refer to that especially a kind of measurement circuit (shorting bar) that utilizes the measurement circuit district comes the whether method of short circuit of auxiliary detection one lane array (wire on array).
Background technology
See also Fig. 1, Fig. 1 shows a liquid crystal panel 100.Liquid crystal panel 100 includes viewing area 110, and the non-display area 120 beyond the viewing area 110.The material of non-display area 120 is a glass substrate, on glass substrate, can be provided with a plurality of control chips 130, the technology that control chip is set on glass substrate is called glass flip chip encapsulation (chip on glass, COG), yet this technology has a shortcoming, is exactly because the electric conductivity of glass substrate is relatively poor, when therefore control chip being set thereon, coiling between chip and the chip is easy to cause resistance excessive because coiling is long, causes the undertension that control chip received of line end.In order to alleviate the load of coiling, the lead 140,150 in control chip 130 left sides is connected all control chips 130 together among Fig. 1, and this kind coiling design is called series connection (cascade) design, therefore can alleviate the load of coiling.
Liquid crystal panel manufacture finish after, usually can come in the test fluid crystal panel each pixel cell whether working properly with the measurement circuit district.See also Fig. 2, Fig. 2 shows lead 140,150 among first figure and the relation between the measurement circuit district.The measurement circuit district includes many horizontal connecting lines, and every horizontal connecting line all is connected to pixel cell, with the control pixel cell.These many horizontal connecting lines can be divided into two groups, and first group comprises the horizontal connecting line of even number bar, and the horizontal connecting line of those even number bars is connected to lead 210 simultaneously, so the horizontal connecting line of lead 210 and those even number bars conducting state each other; Same, second group comprises the horizontal connecting line of odd number bar, and the horizontal connecting line of those odd number bars is connected to lead 220 simultaneously, so the horizontal connecting line of lead 220 and those odd number bars conducting state each other.Measurement circuit district shown in Figure 2 and lead 140,150 be the different layers in the lane array of liquid crystal panel respectively, is provided with insulation course between it, causes short circuit to avoid lead 140,150 and measurement circuit district.If yet in the process of manufacturing, the liquid crystal panel circuit is polluted, there is unexpected particulate to drop on the liquid crystal panel circuit, cause lead 140,150 to see through lead 210 or 220 and conducting will cause the liquid crystal panel display abnormality.As shown in Figure 2, for example the particulate on the A point makes lead 140 and the horizontal connecting line conducting of odd number bar, and simultaneously the particulate on B point makes the lead 150 same and horizontal connecting line conductings of odd number bar, therefore lead 140,150 just sees through the conducting unusually with lead 220 of the horizontal connecting line of odd number bar, causes the liquid crystal panel display abnormality.
On the known practice, usually to wait until that liquid crystal panel is in module (module) stage, after just control chip 130 all is arranged on the liquid crystal panel, utilize test pixel unit, measurement circuit district whether operate as normal the time, just may find between the lead 140,150 whether short circuit, if yet at this time just find by the time to cause display abnormality because of lead 140,150 short circuits, even the control chip 130 that has then set just must be removed and scrap, cause the waste of material and cost to increase.
Summary of the invention
But the object of the present invention is to provide a kind of detection line array (wire on array) the whether array base palte and the method for short circuit, to address the above problem.
According to embodiments of the invention, but it discloses the whether array base palte of short circuit of a kind of detection line array, and this array base palte comprises one first connecting line, one second connecting line, one first connection pads group, one second connection pads group, one the 3rd connection pads group, one the 4th connection pads group, one first lead, one second lead, a privates, privates, one first short circuit connecting line and one second short circuit connecting line.This first lead connects this first connection pads group and the 4th connection pads group, this second lead connects this second connection pads group and the 3rd connection pads group, this privates and this first connecting line electrically connect, these privates and this second connecting line electrically connect, this first short circuit connecting line connects this first lead and this privates, and this second short circuit connecting line, connect this second lead and this privates, wherein by detect privates and privates whether conducting judge the whether short circuit of detection line array.
According to embodiments of the invention, it also discloses the whether method of short circuit of a kind of detection line array, comprises: an array base palte as in the previous paragraph is provided, and detect the 3rd, privates whether conducting to judge the whether short circuit of this first, second lead.
According to embodiments of the invention, it also discloses the whether method of short circuit of a kind of detection line array, comprise: an array base palte as in the previous paragraph is provided, and detect the 3rd, whether conducting is to judge whether this first, second lead forms short circuit with this first connecting line or this second connecting line for privates.
According to embodiments of the invention, it also discloses the whether method of short circuit of a kind of detection line array, comprise: an array base palte as in the previous paragraph is provided, this array base palte more includes one first testing cushion, be connected in an end of this privates, and one second testing cushion, be connected in an end of these privates, and detect this first, second testing cushion whether conducting to judge the whether short circuit of this first, second lead.
According to embodiments of the invention, it also discloses the whether method of short circuit of a kind of detection line array, comprise: an array base palte as in the previous paragraph is provided, this array base palte also includes one first testing cushion, be connected in an end of this privates, and one second testing cushion, be connected in an end of these privates, and whether conducting is to judge whether this first, second lead forms short circuit with this first connecting line or this second connecting line to detect this first, second testing cushion.
According to embodiments of the invention, it also discloses a kind of whether method of short circuit of the circuit on this liquid crystal panel of checking before a plurality of integrated circuit are arranged at a liquid crystal panel.Before these a plurality of integrated circuit were arranged at this liquid crystal panel, this liquid crystal panel included: a plurality of liquid crystal cells (LCD cell); At least one first lead, one first Port of each integrated circuit in these a plurality of integrated circuit that are used for contacting; At least one second lead, one second Port of each integrated circuit in these a plurality of integrated circuit that are used for contacting; One privates is connected in a plurality of first liquid crystal cells in these a plurality of liquid crystal cells simultaneously; And privates, be connected in a plurality of second liquid crystal cells in these a plurality of liquid crystal cells simultaneously.This method includes: connect this first lead and this privates; Connect this second lead and this privates; And detect the 3rd, privates whether conducting to judge the whether short circuit of this first, second lead.
According to embodiments of the invention, it also discloses a kind of whether supplementary structure of short circuit of the circuit on this liquid crystal panel of checking before a plurality of integrated circuit are arranged at a liquid crystal panel.Before these a plurality of integrated circuit were arranged at this liquid crystal panel, this liquid crystal panel included: a plurality of liquid crystal cells; At least one first lead, one first Port of each integrated circuit in these a plurality of integrated circuit that are used for contacting; At least one second lead, one second Port of each integrated circuit in these a plurality of integrated circuit that are used for contacting; One privates is connected in a plurality of first liquid crystal cells in these a plurality of liquid crystal cells simultaneously; And privates, be connected in a plurality of second liquid crystal cells in these a plurality of liquid crystal cells simultaneously.This supplementary structure includes: one first connecting line is used for connecting this first lead and this privates; And one second connecting line, be used for connecting this second lead and this privates, wherein by detect privates and privates whether conducting judge whether short circuit of circuit on this liquid crystal panel.
Description of drawings
Fig. 1 is a liquid crystal panel, shows the situation that is connected between lead and the control chip;
Relation between lead in Fig. 2 displayed map 1 and the measurement circuit district;
Fig. 3 shows the part of array base palte of the present invention;
Fig. 4 is shown as the relevant position of the connection pads group of various coilings and control chip on the array base palte of the present invention.
The primary clustering symbol description
100 liquid crystal panels
110,410 viewing areas
120,420 non-display areas
130 control chips
140,150,310,320 leads
210,220,330,340 leads
331,341 horizontal connecting lines
335,345 testing cushion
350,360 short circuit connecting lines
400 array base paltes
431～436 connection pads groups
Embodiment
See also Fig. 3, Fig. 3 shows the part of array base palte of the present invention.Lead 310 and lead 320 are used for connecting control chip, and are similarly series design.Lead 310 and lead 320 are used for transmitting the signal of different voltage levvls, for example, if lead 310 transmission level high signals, then lead 320 transmission low voltage level signals; Or on the contrary, if lead 310 transmission low voltage level signals, then lead 320 transmission level high signals.Lead 330 and lead 340 connect one or more than one horizontal connecting lines 331,341 separately, the horizontal connecting line 331,341 of each bar all electrically connects with a pixel cell group, and each pixel cell group includes a plurality of pixel cells (that is liquid crystal cells).Wherein a kind of embodiment as shown in Figure 3, lead 330 connects the horizontal connecting line 331 of even number bars, lead 340 then links to each other with the horizontal connecting line 341 of odd number bar.In order whether to detect lead 310 and lead 320 because technologic some unexpected factor, and cause lead 310 and lead 320 to see through those horizontal connecting lines 331,341 and lead 330 or lead 340 and unusual conducting, therefore in the process of making, can utilize a short circuit connecting line 350 that lead 310 and lead 330 are connected, utilize another short circuit connecting line 360 that lead 320 and lead 340 are connected.Yet the connected mode of short circuit connecting line 350 and short circuit connecting line 360 is not limited to pattern shown in Figure 3, can also utilize short circuit connecting line 350 to connect lead 320 and lead 330, and utilize short circuit connecting line 360 to connect lead 310 and lead 340.In addition, the end of lead 330 and lead 340 is connected with testing cushion 335 and testing cushion 345 respectively, just can be on testing cushion 335 and testing cushion 345 during test with probe points, test whether conducting of testing cushion 335 and testing cushion 345, that is whether conducting of test lead 330 and lead 340, further judge whether short circuit of lead 310 and lead 320, or judge that whether lead 310 or lead 320 are with 331, the 341 formation short circuits of horizontal connecting line.For example, with embodiment shown in Figure 3, lead 310 sees through short circuit connecting line 350 and presents the state of conducting with lead 330, on the other hand, lead 320 sees through short circuit connecting line 360 and presents the state of conducting with lead 340, if find that lead 330 and lead 340 present conducting state when therefore testing, that is, testing cushion 335 and testing cushion 345 present conducting state, then represent lead 310 and lead 320 short circuits.That is to say, by increasing short circuit connecting line 350 and short circuit connecting line 360, liquid crystal panel can just detect whether unusual conducting of lead 310 and lead 320 in the stage of array (that is array base palte), and needn't wait until that module (module) stage that has all connected control chip on the circuit board just can detect, except can make ahead of time suitable in response to, even can also avoid the dismounting of control chip to scrap, and save more costs.
In fact, compared to lead 330 and lead 340, lead 310 and the lead of lead 320 for widening.As previously mentioned, lead 310 is to be used for being connected control chip with lead 320, and on circuit board, lead 310 can be connected to the connection pads group earlier with lead 320, and control chip is arranged on the connection pads group more then, produces with lead 320 with lead 310 to link.See also Fig. 4, Fig. 4 shows the relevant position of the connection gasket of various coilings and control chip on the array basal plate 400, and same array base palte 400 includes viewing area 410 and non-display area 420.Be to be example among Fig. 4 with two control chips, first control chip is arranged on connection pads group 431, connection pads group 432 and the connection pads group 433, and second control chip is arranged on connection pads group 434, connection pads group 435 and the connection pads group 436.Note that each connection pads group 431,432,433,434,435 and 436 all can include one or more a plurality of connection gasket, to be used for doing binding with a plurality of pin position of control chip.As shown in Figure 4, lead 310 connects connection pads group 433 and connection pads group 434, lead 320 then connects connection pads group 432 and connection pads group 435, and short circuit connecting line 350 is used for connecting lead 310 and lead 330, and short circuit connecting line 360 then is used for connecting lead 320 and lead 340.In some cases, array base palte 400 can comprise two or more control chips.If array base palte 400 comprises four control chips, then in Fig. 4, be positioned at graphic upper left lead 310 and can continue to extend upward, and the connection pads group that is positioned at a control chip of graphic top with not showing is connected with lead 320; And the lead 310 that is positioned at graphic lower left also can continue downward extension with lead 320, and does not show with the position and be connected in the connection pads group of a control chip of graphic below.That is to say, be connected on first control chip of connection pads group 431, connection pads group 432 and connection pads group 433 and may also have other control chip, or be connected under second control chip of connection pads group 434, connection pads group 435 and connection pads group 436 and also may also have other control chip, therefore just must there be more lead 310 that connection pads group 431 and another connection pads group on it are coupled together, or connection pads group 436 and another connection pads group under it coupled together, to reach the form of series connection.In this case, because the lead 310 that one or more is arranged and lead 320 are side by side, therefore just need more short circuit connecting line 350 to be connected lead 310,320 and lead 330,340 with short circuit connecting line 360, that is to say, in practical application, may need many short circuit connecting lines 350 and many short circuit connecting lines 360 to come whether unusual conducting of test lead 310 and lead 320.
In sum, the present invention is by increasing by two short circuit lines, just can detect whether conducting unusually of coiling on the array base palte in the lane array stage.Yet known techniques detects liquid crystal panel whether during operate as normal, must wait until that the module stage than the rear end could detect, that is after will waiting until that control chip all is arranged on the liquid crystal panel, aptitude test.Just detect abnormal conditions if arrived module stage, even then must removing, scraps the control chip that then is provided with up, cause the waste of many materials and increase cost, and the method for utilizing this case except the unusual condition that can find circuit early and make early suitable in response to, the more important thing is the reimbursement that can not cause control chip, save more costs virtually.
The above only is preferred embodiment of the present invention, and all equalizations of doing according to claim of the present invention change and modify, and all should belong to covering scope of the present invention.
Claims (19)
1. but the detection line array array base palte of short circuit whether comprises:
One first connecting line;
One second connecting line;
One first connection pads group, one second connection pads group, one the 3rd connection pads group and one the 4th connection pads group;
One first lead connects this first connection pads group and the 4th connection pads group;
One second lead connects this second connection pads group and the 3rd connection pads group;
One privates electrically connects with this first connecting line;
One privates electrically connect with this second connecting line;
One first short circuit connecting line connects this first lead and this privates; And
One second short circuit connecting line connects this second lead and this privates,
Wherein by detect privates and privates whether conducting judge the whether short circuit of detection line array.
2. but whether detection line array as claimed in claim 1 the array base palte of short circuit, and wherein this array base palte more comprises one first pixel cell group, and this first pixel cell group has a plurality of first pixel cells and electrically connects with this first connecting line; And one second pixel cell group, this second pixel cell group has a plurality of second pixel cells and electrically connects with this second connecting line.
3. but whether detection line array as claimed in claim 1 the array base palte of short circuit, and wherein an end of this privates has one first testing cushion, and an end of these privates has one second testing cushion.
But 4. the described detection line array of claim 1 array base palte of short circuit whether, wherein this array base palte also comprises one the 3rd connecting line and one the 4th connecting line, and wherein, this privates and the 3rd connecting line electrically connect; These privates and the 4th connecting line electrically connect.
5. but whether detection line array as claimed in claim 4 the array base palte of short circuit, and wherein this array base palte also comprises one the 3rd pixel cell group, and the 3rd pixel cell group has a plurality of the 3rd pixel cells and electrically connects with the 3rd connecting line; And one the 4th pixel cell group, the 4th pixel cell group has a plurality of the 4th pixel cells and electrically connects with the 4th connecting line.
6. the detection line array method of short circuit whether comprises:
One array base palte as claimed in claim 1 is provided; And
Detect the 3rd, privates whether conducting to judge the whether short circuit of this first, second lead.
7. the detection line array method of short circuit whether comprises:
One array base palte as claimed in claim 1 is provided; And
Detect the 3rd, whether conducting is to judge whether this first lead and second lead form short circuit or form short circuit with this second connecting line with this first connecting line for privates.
8. the detection line array method of short circuit whether comprises:
One array base palte as claimed in claim 3 is provided; And
Detect this first, second testing cushion whether conducting to judge the whether short circuit of this first, second lead.
9. the detection line array method of short circuit whether comprises:
One array base palte as claimed in claim 3 is provided; And
Whether conducting is to judge whether this first lead and second lead form short circuit or form short circuit with this second connecting line with this first connecting line to detect this first, second testing cushion.
10. checked the whether method of short circuit of the circuit on this liquid crystal panel for one kind before a plurality of integrated circuit are arranged at a liquid crystal panel, before these a plurality of integrated circuit were arranged at this liquid crystal panel, this liquid crystal panel included:
A plurality of liquid crystal cells;
At least one first lead, one first Port of each integrated circuit in these a plurality of integrated circuit that are used for contacting;
At least one second lead, one second Port of each integrated circuit in these a plurality of integrated circuit that are used for contacting;
One privates is connected in a plurality of first liquid crystal cells in these a plurality of liquid crystal cells simultaneously; And
One privates are connected in a plurality of second liquid crystal cells in these a plurality of liquid crystal cells simultaneously;
This method includes:
Connect this first lead and this privates;
Connect this second lead and this privates; And
Detect the 3rd, privates whether conducting to judge the whether short circuit of this first, second lead.
11. method as claimed in claim 10, wherein this first, second lead is positioned at first wiring layer, and the 3rd, privates are positioned at one second wiring layer.
12. method as claimed in claim 11, wherein the 3rd, privates and this first, second lead be staggered.
13. method as claimed in claim 12, wherein the 3rd, privates are connected in the grid line of these a plurality of first, second liquid crystal cells.
14. method as claimed in claim 10, wherein these a plurality of first liquid crystal cells are positioned on many strange sweep traces, and these a plurality of second liquid crystal cells are positioned on many even sweep traces.
15. checked the whether supplementary structure of short circuit of the circuit on this liquid crystal panel for one kind before a plurality of integrated circuit are arranged at a liquid crystal panel, before these a plurality of integrated circuit were arranged at this liquid crystal panel, this liquid crystal panel included:
A plurality of liquid crystal cells;
At least one first lead, one first Port of each integrated circuit in these a plurality of integrated circuit that are used for contacting;
At least one second lead, one second Port of each integrated circuit in these a plurality of integrated circuit that are used for contacting;
One privates is connected in a plurality of first liquid crystal cells in these a plurality of liquid crystal cells simultaneously; And
One privates are connected in a plurality of second liquid crystal cells in these a plurality of liquid crystal cells simultaneously;
This supplementary structure includes:
One first connecting line is used for connecting this first lead and this privates; And
One second connecting line is used for connecting this second lead and this privates,
Wherein by detect privates and privates whether conducting judge whether short circuit of circuit on this liquid crystal panel.
16. supplementary structure as claimed in claim 15, wherein this first, second lead is positioned at first wiring layer, and the 3rd, privates are positioned at one second wiring layer.
17. supplementary structure as claimed in claim 16, wherein the 3rd, privates and this first, second lead be staggered.
18. as claim 15 a described supplementary structure, wherein the 3rd, privates are connected in the grid line of these a plurality of first, second liquid crystal cells.
19. supplementary structure as claimed in claim 15, wherein these a plurality of first liquid crystal cells are positioned on many strange sweep traces, and these a plurality of second liquid crystal cells are positioned on many even sweep traces.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CNB2006100753694A CN100449318C (en) | 2006-04-11 | 2006-04-11 | Device and method for detecting whether circuit array is short circuit |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CNB2006100753694A CN100449318C (en) | 2006-04-11 | 2006-04-11 | Device and method for detecting whether circuit array is short circuit |
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|---|---|
| CN1828323A CN1828323A (en) | 2006-09-06 |
| CN100449318C true CN100449318C (en) | 2009-01-07 |
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| CNB2006100753694A Active CN100449318C (en) | 2006-04-11 | 2006-04-11 | Device and method for detecting whether circuit array is short circuit |
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| CN103841763B (en) * | 2013-04-08 | 2017-02-01 | 胜宏科技（惠州）股份有限公司 | Method for testing PCB carbon oil skipping |
| CN109195321B (en) * | 2018-11-12 | 2022-02-15 | 惠科股份有限公司 | Flexible circuit board, display panel and display device |
Citations (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH08220557A (en) * | 1995-02-09 | 1996-08-30 | Mitsubishi Electric Corp | Liquid crystal display device, its examination method, and static electricity preventive method |
| CN1441303A (en) * | 2002-02-26 | 2003-09-10 | Lg.菲利浦Lcd株式会社 | Liquid crystal plate, device for detecting liquid crystal plate and method for producing liquid crystal plate |
| CN1453615A (en) * | 2002-04-16 | 2003-11-05 | Lg.菲利浦Lcd株式会社 | Array base plate for liquid crystal display device and producing method thereof |
| TW589484B (en) * | 2003-10-16 | 2004-06-01 | Au Optronics Corp | Liquid crystal display module |
| JP2004226571A (en) * | 2003-01-21 | 2004-08-12 | Nec Plasma Display Corp | Method for manufacturing wiring board |
| CN1527046A (en) * | 2003-03-07 | 2004-09-08 | 友达光电股份有限公司 | LCD Panel testing method and equipment thereof |
| CN1616977A (en) * | 2003-11-13 | 2005-05-18 | Lg.菲利浦Lcd株式会社 | Apparatus for testing liquid crystal display device and testing method thereof |
| CN1710480A (en) * | 2005-07-05 | 2005-12-21 | 友达光电股份有限公司 | Test circuit of liquid crystal display and test method |
| CN1731205A (en) * | 2005-08-31 | 2006-02-08 | 友达光电股份有限公司 | Test circuit for panel display device |
-
2006
- 2006-04-11 CN CNB2006100753694A patent/CN100449318C/en active Active
Patent Citations (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH08220557A (en) * | 1995-02-09 | 1996-08-30 | Mitsubishi Electric Corp | Liquid crystal display device, its examination method, and static electricity preventive method |
| CN1441303A (en) * | 2002-02-26 | 2003-09-10 | Lg.菲利浦Lcd株式会社 | Liquid crystal plate, device for detecting liquid crystal plate and method for producing liquid crystal plate |
| CN1453615A (en) * | 2002-04-16 | 2003-11-05 | Lg.菲利浦Lcd株式会社 | Array base plate for liquid crystal display device and producing method thereof |
| JP2004226571A (en) * | 2003-01-21 | 2004-08-12 | Nec Plasma Display Corp | Method for manufacturing wiring board |
| CN1527046A (en) * | 2003-03-07 | 2004-09-08 | 友达光电股份有限公司 | LCD Panel testing method and equipment thereof |
| TW589484B (en) * | 2003-10-16 | 2004-06-01 | Au Optronics Corp | Liquid crystal display module |
| US20050083444A1 (en) * | 2003-10-16 | 2005-04-21 | Hui-Chang Chen | Liquid crystal display module |
| CN1616977A (en) * | 2003-11-13 | 2005-05-18 | Lg.菲利浦Lcd株式会社 | Apparatus for testing liquid crystal display device and testing method thereof |
| CN1710480A (en) * | 2005-07-05 | 2005-12-21 | 友达光电股份有限公司 | Test circuit of liquid crystal display and test method |
| CN1731205A (en) * | 2005-08-31 | 2006-02-08 | 友达光电股份有限公司 | Test circuit for panel display device |
Non-Patent Citations (1)
| Title |
|---|
| 特开平8-220557 1996.08.30 |
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| CN1828323A (en) | 2006-09-06 |
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Effective date of registration: 20180428 Address after: Hongkong Chinese Tsuen Tai Chung Road No. 8 TCL industrial center 13 floor Patentee after: Huaxing Optoelectronic International (Hong Kong) Co.,Ltd. Address before: Hsinchu City, Taiwan, China Patentee before: AU OPTRONICS Corp. |
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Effective date of registration: 20231216 Address after: 9-2 Tangming Avenue, Guangming New District, Shenzhen City, Guangdong Province Patentee after: TCL China Star Optoelectronics Technology Co.,Ltd. Address before: Hongkong Chinese Tsuen Tai Chung Road No. 8 TCL industrial center 13 floor Patentee before: Huaxing Optoelectronic International (Hong Kong) Co.,Ltd. |