CN100386641C - Measuring and testing method for gain compression point output power of amplifier - Google Patents
Measuring and testing method for gain compression point output power of amplifier Download PDFInfo
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- CN100386641C CN100386641C CNB2004100695793A CN200410069579A CN100386641C CN 100386641 C CN100386641 C CN 100386641C CN B2004100695793 A CNB2004100695793 A CN B2004100695793A CN 200410069579 A CN200410069579 A CN 200410069579A CN 100386641 C CN100386641 C CN 100386641C
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Abstract
The present invention relates to a method for testing the output power of gain compression points of an amplifier, which comprises that: a. input power of the amplifier is arranged so as to enable Pins to be equal to Pins 1, and at this moment, gain power G0 is testing, wherein the Pins is an input power variable, and the Pins 1 is an initial power value of scanning power; b. an input power value Pins 3 which is limited is calculated so as to enable the Pins 3 to be equal to P0 minus the G0, and the P0 is an output upper limit power value; c. the Pins is arranged so as to enable the Pins to be equal to the Pins 3, and at this moment, gain Gs3 is tested; d. output power Ps3 is calculated so as to enable the output power Ps3 to be equal to the Pins 3 plus the Gs3, and at this moment, gain decrement b of the amplifier is calculated so as to enable the gain decrement b to be equal to the G0 minus the Gs3; e. if the Ps3 is larger than or equal to PadB, the present invention judges that the index of an adB compression point of the amplifier is eligible; if the Ps3 is smaller than the PadB, the present invention judges that the index of the adB compression point of the amplifier is not eligible. The present invention can improve the testing safety and the testing efficiency of an output compression point of the amplifier. The present invention is additionally arranged in an instrument with the function of scanning power and is used as an inspection method of a production test of the instrument so as to enable the test to be more convenient and safe. By using the method, the present invention can complete the judgment that whether the output power of the adB compression point of the amplifier accords with the index or not through the two-time gain test.
Description
Technical field
The present invention relates to communicate by letter and the measuring technology of electronic applications, relate in particular to the limited measuring and testing method for gain compression point output power of amplifier of a kind of output power upper limit.
Technical background
1dB compression point output power is one of an amplifier very important index, characterizing the ability that the amplifier output power increases with power input, in general, power input is increased to a certain degree from small-signal, because of the amplifier nonlinearity characteristic, the output power increase begins to slow down, and the gain beginning obviously descends, as shown in Figure 1.
In the 1dB of amplifier compression point output power method of testing, generally adopt power input to increase step by step or increase method for scanning continuously, judge the output power of correspondence when finding out gain decline 1dB by gain.
Amplifier 1dB compression point output power Test Networking is introduced:
The test of amplifier 1dB compression point output power has two kinds of main networking test implementation methods, and is as follows respectively:
Realize one: as shown in Figure 2, be the synoptic diagram that signal source+power meter test realizes, wherein instrument with power/amplitude test function such as power meter usable spectrum instrument substitutes.By changing the output power of signal source, make it point by point scanning in a power bracket, application is tested out the output power of amplifier, relatively change in gain, the output power of correspondence promptly tests out 1dB compression point output power value accurately in the time of can finding out gain decline 1dB.By the contrast index, can judge whether to meet index.
Realize two: as shown in Figure 3, it is network analyzer power scan method of testing synoptic diagram, wherein " reflection " refers to the signal output part of network analyzer, " transition " refers to the signal receiving end of network analyzer, adapter is an adapter, cable, attenuator etc. of realizing carrying out with amplifier power and Interface Matching, attenuator is to be used for decaying being input to the power of network analyzer input port, to prevent the excessive apparatus damage that causes of power, can select as required.Wherein network analyzer can be realized with Other Instruments with power scan function or instrument combination.
Following surface analysis is realized two test philosophy and test process, is example with the test of 1dB compression point output power, and analyzes and do not carry out the limited problem that causes of output power.
Fig. 4 is a base amplifier gain/input relation curve synoptic diagram, and the power scan gain measurement of available network analyser realizes.Among the figure, horizontal ordinate is represented the power input variable, and ordinate is represented Amplifier Gain, shows among the figure, and gain increases with power input and reduces.
If the 1dB compression point output power index of amplifier is p1dBout.In the test process, the output scanning that configures amplifier test is initial, by power P ins1 and Pins2, the gain of amplifier when power input is Pins1 is designated as G0, along with increasing continuously of power input, the point of Amplifier Gain decline 1dB is labeled as c, correspondence is found out the corresponding power input Pin1dB of c point, just can calculate 1dB compression point output power Pout1dB=Pin1dB+G0-1.
Realize one with realize that two is identical on principle, gain calculating all is to calculate by the outside to realize, by the stepping increase of power input, after gain decline surpasses 1dB, can search out the C point that satisfies certain error, thereby test or calculate 1dB compression point output power.
Realization one and realization two can be referred to as the power scan method, in batch testing, test out 1dB compression point output power accurately, must be provided with enough big Pins2 in above-mentioned test realizes, thereby can test the C point.Therefore, Pins2 require as follows:
Under the power input of Pins2, even amplifier gain is less, the amplifier output power still is greater than P1dBout, otherwise too small because of output power, can't judge.Promptly require Pins2+Gmin＞=P1dBout, promptly Pins2＞=P1dBout-Gmin needs to leave certain surplus in the test, is 1dB, then Pins2=P1dBout-Gmin+1 if get surplus.When Pin=Pins2 and during amplifier gain G=Gmax, the power P out=Pins2+Gmax=P1dBout-Gmin+1+Gmax=P1dBout+ (Gmax-Gmin)+1 of amplifier output power promptly might cause output power than big (Gmax-Gmin)+1 of P1dBout.
For instance, requirement is ± 1 situation (Gmax-Gmin=2) for gain error, at this moment, and 1dB+ (Gmax-Gmin)=1+2=3dB.Be that output signal power may be than the also big 3dB of P1dB.Conversely,, but not necessarily the 1dB compression point can be tested, the processing of transfiniting can only be adopted if linearity of amplifier is enough good.
Therefore,, power output is not controlled for accurately testing out 1dB compression point output power value, just may be because of output power excessive or amplifier overdrive, cause amplifier itself and back grade device damage.
Summary of the invention
The present invention be directed to above problem, designed the limited gain compression point output power test determination methods of a kind of output power, adopt the design's method, do not need to test out concrete power compression point output power value, just can judge whether index up to specification of amplifier.Need as analyzing, test can provide limited output power and limited decrement, the usefulness of analysis for your guidance.
The present invention adopts following scheme:
A kind of measuring and testing method for gain compression point output power of amplifier may further comprise the steps:
Known: need the adB compression point output power of test amplifier whether to meet index, index is PadB, and limited output power P0=PadB+c=PadB+a+m is set, wherein m is a modifying factor, can be provided with according to test empirical data or analysis, generally get m=0, i.e. c=a.Amplifier can be tested the normal gain or the standard gain of amplifier under the Pins1 power input.
A, amplifier power input Pins=Pins1 is set, test gain power G0 at this moment, wherein Pins is the power input variable, and Pins1 is the scanning power input initial power value of gain test, can test the normal gain or the standard gain of amplifier under this power;
B, computation-bound power input value Pins3=P0-G0;
C, Pins=Pins3 is set, the gain G s3 of test this moment;
D, computation-bound output power Ps3=Pins3+Gs3, limited decrement b=G0-Gs3;
E, if Ps3＞=PadB, or b＜=c judges that then amplifier is qualified; If Ps3＜PadB, or b＞c judge that then amplifier is defective.
The production test of pair amplifier of the present invention, batch testing, qualified judgement etc. all have direct directive significance, can avoid the damage of pair amplifier itself in the test activity and back level device or instrument.
The Test Design method that the present invention carried in compression point output power test process, can be used as basic skills and quotes.
The present invention can improve the test safety and the efficient of amplifier output compression point, can use to join in the instrument with power scan function, as the production test method of instrument, makes test more convenient and safe.By this patent, can carry out the qualified judgement that gain test can be finished the compression point output power for 2 times.
Description of drawings
Fig. 1 is the I/O power relation curve synoptic diagram of general amplifier in the prior art;
Fig. 2 is that signal source in the prior art+power meter test compression point index test is realized a synoptic diagram;
Fig. 3 is that the power scan method of testing test of available technology adopting network analyzer realizes two synoptic diagram;
Fig. 4 is the gain trace synoptic diagram that the power scan technology of available technology adopting network analyzer obtains;
Fig. 5 is the relevant limited measuring and testing method for gain compression point output power design example of the output power figure of the present invention;
Fig. 6 is a test flow chart of the present invention.
Embodiment
Below in conjunction with Figure of description the specific embodiment of the present invention is described.
As shown in Figure 4, be the power gain model general synoptic diagram of amplifier, along with the increase of power input, the output power increasing degree begins to slow down, and shows as gain and presents the curve of decline with the power input increase, as shown in Figure 4.
Among Fig. 5, horizontal ordinate is represented the power input variable, ordinate is represented the output power variable, the adB compression point output power index (being exactly 1dB compression point output power index during a=1) of PadB point expression amplifier on the ordinate, Pins1 is the initial scanning power input value that amplifier can carry out the normal gain test, Pins2 is that the standby maximum of scanning is ended power, and its value can be with reference to the derivation result of front.
Whether the adB compression point output power index of amplifier is PadB, require test adB compression point index qualified.Excessive for preventing output power, the output power higher limit should be set, promptly limited output power P0, limited target be the output power of amplifier in test between PadBm～P0, can not surpass P0.Get P0=PadB+c=PadB+a+m, m is a modifying factor, general desirable m=0, i.e. c=a.
In the Test Design, need to determine several constants: compression point decrement a, output power upper limit P0, power scan initial power power input value Pins1.One by one these several amounts are described below.
Pins1 is a scan power initial power value, and this value can have certain scope of activities, need come to determine voluntarily according to measuring accuracy.As have no special requirements, can be provided with and make Pins1＜P1dB-10-Gmax, wherein Gmax is the big value of amount of gain that amplifier allows.Amplifier is tested gain and is G0 under the power input of Pins1.
Output power upper limit P0 in above-mentioned gain model, is the maximum output Upper Bound Power that needs restriction, limited output power P0=PadB+a+m is set, and wherein m is a modifying factor, can be provided with according to test empirical data or analysis, generally get m=0 and get final product, promptly get P0=PadB+a.
A is the decrement index that needs the amplifier compression point of test, formulates according to amplifier and test request.A=1, promptly the 1dB compression point is comparatively common.
Variable has power input Pins and test dynamic gain Gs, and Pins is the power input variable, and Ps is the output power variable, corresponding gain G s=Ps-Pins.
As shown in Figure 6, be test flow chart of the present invention, as we can see from the figure, method of testing of the present invention is achieved as follows:
Known: as to need the adB compression point output power of test amplifier whether to meet index, index is PadB, and limited output power P0=PadB+c=PadB+a+m is set, and wherein m is a modifying factor, can be provided with according to test empirical data or analysis, generally get m=0 and get final product.Amplifier can be tested the normal gain or the standard gain of amplifier under the Pins1 power input.
A, amplifier power input Pins=Pins1 is set, the gain power G0 of test this moment, wherein Pins is the power input variable, Pins1 is a scan power initial power value;
B, computation-bound power input value Pins3=P0-G0; Wherein P0 is output Upper Bound Power value;
C, Pins=Pins3 is set, the gain G s3 of test this moment;
D, calculating output power Ps3 or test computing amplifier gain compression amount b at this moment;
E, if Ps3＞=PadB, perhaps b＜=c judges that then amplifier adB compression point index is qualified; If Ps3＜PadB, perhaps b＞c judges that then amplifier adB compression point index is defective.
Among the present invention, need carry out the power scan pre-calibration, calibration and test are achieved as follows:
For adopting network analyzer etc. to have the testing tool of power scan function, before test, may need pre-calibration.On the specific implementation; can adopt the bigger Pins1 of input power range～Pins2 input value to carry out path and calibrate and save as calibration file; when test G0; can control and open scanning by power; when G0 tested, scanning termination power is made as Pins2e＜P0-Gmax-p, and (wherein Pins2e was that the initial gain test allows power safe in utilization, and Gmax is a proper testing amplifier maximum gain; p is protection power, can according to circumstances establish certainly).Can guarantee output power＜P0, test G0 after, again the input scan power upper limit is decided to be Pins3=P0-G0, can guarantee output power Ps＜P0.Thereby realize the limited test of output power.
Be increased near the situation that gains and descend the compression point, the test output power Pout＜=P0 that adopts this method to realize for gain trace with power input.
The production test of pair amplifier of the present invention, batch testing, qualified judgement etc. all have direct directive significance, can avoid the damage of pair amplifier itself in the test activity and back level device or instrument.
The Test Design method that the present invention carried in compression point output power test process, can be used as basic skills and quotes.
The present invention can improve the test safety and the efficient of amplifier output compression point, can use to join in the instrument with power scan function, as the production test method of instrument, makes test more convenient and safe.
The above; only for the preferable embodiment of the present invention, but protection scope of the present invention is not limited thereto, and anyly is familiar with those skilled in the art in the technical scope that the present invention discloses; the variation that can expect easily or replacement all should be encompassed within protection scope of the present invention.Therefore, protection scope of the present invention should be as the criterion with the protection domain of claims.
Claims (4)
1. a measuring and testing method for gain compression point output power of amplifier is characterized in that, determines compression point decrement a, and a determines PadB according to the compression point decrement, and limited output power P0=PadB+a+m is set, and wherein m is a modifying factor, may further comprise the steps:
A, amplifier power input Pins=Pins1 is set, the gain power G0 of test this moment, wherein Pins is the power input variable, Pins1 is a scan power initial power value;
B, computation-bound power input value Pins3=P0-G0;
C, Pins=Pins3 is set, the gain G s3 of test this moment;
D, calculating output power Ps3=Pins3+Gs3, computing amplifier gain compression amount b=G0-Gs3 at this moment;
E, if Ps3＞=PadB, judge that then amplifier adB compression point index is qualified; If Ps3＜PadB judges that then amplifier adB compression point index is defective.
2. method of testing as claimed in claim 1 is characterized in that, described steps d, and amplifier output adB compression point index PadB computing formula is: PadB=P0-a.
3. method of testing as claimed in claim 1 is characterized in that, in the described steps d, carries out following value: a=1.
4. method of testing as claimed in claim 1 is characterized in that, also comprises step a instrument calibration step before.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CNB2004100695793A CN100386641C (en) | 2004-07-20 | 2004-07-20 | Measuring and testing method for gain compression point output power of amplifier |
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| CNB2004100695793A CN100386641C (en) | 2004-07-20 | 2004-07-20 | Measuring and testing method for gain compression point output power of amplifier |
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| CN100386641C true CN100386641C (en) | 2008-05-07 |
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Families Citing this family (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101377531B (en) * | 2007-08-29 | 2011-09-14 | 海华科技股份有限公司 | Output power detecting structure with direction coupler and direction coupler |
| CN102628897B (en) * | 2011-12-05 | 2014-03-26 | 中国科学院微电子研究所 | Based on N1dB compression point and N2Three-order intermodulation test method of dB compression point |
| CN102798812A (en) * | 2012-08-17 | 2012-11-28 | 爱普科斯科技（无锡）有限公司 | Three-order cross-modulation signal testing system |
| CN106533583B (en) * | 2015-09-14 | 2019-04-09 | 上海原动力通信科技有限公司 | The quickly method and device of test power amplifier 1dB compression point |
| CN111308315A (en) * | 2019-12-04 | 2020-06-19 | 南京派格测控科技有限公司 | P1dB measurement method of radio frequency power amplifier chip |
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Patent Citations (5)
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|---|---|---|---|---|
| JPH11248774A (en) * | 1998-03-03 | 1999-09-17 | Mitsubishi Electric Corp | Measuring method for overall characteristic of amplifier |
| JP2001305173A (en) * | 2000-04-25 | 2001-10-31 | Matsushita Electric Works Ltd | Measuring circuit for operational amplifier and its measuring method |
| JP2002098732A (en) * | 2000-09-27 | 2002-04-05 | Nec Microsystems Ltd | Iddq test circuit |
| JP2002318256A (en) * | 2001-04-24 | 2002-10-31 | Mitsubishi Electric Corp | Total characteristics calculator for amplifier |
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Non-Patent Citations (4)
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| 低噪声放大器1db压缩点输出功率的测试与分析. 黄立，郭志忠，殷克勤，简莉.新疆气象，第27卷第3期. 2004 |
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