CN100369293C - Method for blocking hole in organic layer of organic semiconductor device - Google Patents

Method for blocking hole in organic layer of organic semiconductor device Download PDF

Info

Publication number
CN100369293C
CN100369293C CNB200510023306XA CN200510023306A CN100369293C CN 100369293 C CN100369293 C CN 100369293C CN B200510023306X A CNB200510023306X A CN B200510023306XA CN 200510023306 A CN200510023306 A CN 200510023306A CN 100369293 C CN100369293 C CN 100369293C
Authority
CN
China
Prior art keywords
aluminium
organic
organic semiconductor
luminous
holes
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
CNB200510023306XA
Other languages
Chinese (zh)
Other versions
CN1645643A (en
Inventor
侯晓远
王子君
丁训民
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fudan University
Original Assignee
Fudan University
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fudan University filed Critical Fudan University
Priority to CNB200510023306XA priority Critical patent/CN100369293C/en
Publication of CN1645643A publication Critical patent/CN1645643A/en
Application granted granted Critical
Publication of CN100369293C publication Critical patent/CN100369293C/en
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Abstract

The present invention relates to a method for blocking holes in an organic layer of an organic semiconductor device. In general, two basic processes are adjusted, controlled and influenced by selecting different electrodes to come in contact with an organic semiconductor, namely that the injection rate and the corresponding proportion of electrons or holes are influenced. Consequently, the luminous efficiency of an electronic luminous device and the area position of recombination luminescence are influenced. The present invention adulterates aluminium in a 1 nm to 10 nm of thin area of the organic semiconductor; the adulterating concentration, the molar ratio of the aluminum to an organic molecule, is from 0.1: 1 to 10: 1. Because the aluminium is adulterated, the luminescence of the device can be used for sensitively detecting whether the holes are completely blocked or not. Organic electroluminescence originates from the combination of the electrons and the holes in a luminous area. After the aluminium is adulterated in the thin area (far away from a luminous position for eliminating the influence of metal quenching) of one side of a hole transport area outside the luminous area, the device has not electroluminescence, which illustrates that the holes are completely blocked in the area where the aluminium is adulterated; an experiment indicates that in different NPB and Alq with organic semiconductor material, the operation of adulterating the aluminium can completely block the transmission of the holes.

Description

A kind of in the organic layer of organic semiconductor device the method for blocking hole
Technical field
The present invention relates to the organic luminescent device field, the method for blocking hole in the organic layer of concrete is a kind of organic semiconductor device.
Background technology
At present, device research based on organic semiconducting materials is in the ascendant, organic solar batteries from energy field, the organic electroluminescence device that shows the video picture field to information, and all obtained sufficient displaying to the various functional components and parts of the imitation traditional inorganic semiconductor relevant (except electricity injects organic semiconductor laser diode do not realize) with modern microelectronics, embodied powerful growth momentum of organic semiconductor and huge application potential.All these all directly relate to and are decided by the transmission course of two kinds of charged carriers, i.e. the transmission course in electronics and hole based on many character of organic semi-conductor functional device.If the transport behavior for charge carrier can effectively be regulated and control, just had the effective technical means design and produced the organic semiconductor device of particular characteristic.Organic electroluminescence device, exactly organic semiconductor thin-film is clipped between two electrodes with suitable work function, under forward bias, electronics and cavity energy are injected into effectively and form the exciton recombination luminescence in the organic semiconductor thin-film simultaneously, and its typical structure as shown in Figure 1.This organic semiconductor device structure can be passed through its luminosity, indicates some situation that its charge carrier transmits in semiconductive thin film sensitively, is the device architecture of carrier transport behavior in a kind of effective research organic semiconductor.In fact near the effect (aluminium of thin zone and debita spissitudo mixes by assigned address) of the complete blocking hole of organic semi-conductor any given position, the research that improves the luminous efficiency of device does not appear in the newspapers so far as yet.
Summary of the invention
The objective of the invention is to obtain a kind of technology easy, do not increase cost, improve the method for blocking hole in the organic layer of organic semiconductor device of device luminous efficiency, thereby effectively improve the luminous efficiency of device.
The present invention proposes a kind of in the organic layer of organic semiconductor device the method for blocking hole, be in organic layer as the NPB of hole transmission layer with to carry out thickness as the arbitrary position among the Alq of luminescent layer be that 1-10nm aluminium mixes, doping content is an aluminium to the mol ratio of organic molecule is 0.1: 1~10: 1.
The application of organic semiconductor device in organic semiconductor electronics and opto-electronic device that the present invention obtains.
The mix transmission effects of complete blocking hole of the aluminium in the thin zone in the organic semiconductor of the present invention, can be applied in general the organic semiconductor electronics and opto-electronic device, transmission by effective regulation and control hole, realize the organic semiconductor function element of special performance, perhaps realize the improvement of the organic semiconductor device performance relevant with hole transport.
Example one of the present invention and example two explanations, different organic semiconductors, for example Alq film and NPB film approach the aluminium doping transmission of blocking hole fully of the debita spissitudo in zone.Aluminium in the organic semiconductor thin-film mixes can also explain the J-V curvilinear characteristic to the hole barrier effect.For example, the J-V curve from Fig. 4 finds out that easily along with doping content improves gradually, the J-V curve then moved to the low pressure direction to the high pressure direction before this, and wherein the operating voltage of device 3# and 4# is also lower than the operating voltage of plain sample 1#.Operating voltage rising trend can work gradually owing to hole barrier, and hole current diminishes, and device voltage under same current density raises.Further raising along with doping content, hole barrier no longer is subject matter (substantially all stopping), the electron conduction increase becomes the principal element of decision operating voltage in the doped layer, aluminium is doped with the conduction that is beneficial to electronics, so the voltage drop of device 3# and 4# must be also lower than the voltage of the device 1# that undopes.And for example, the device of doping contents such as size such as among Fig. 2 three show along with doping position near ito anode, the J-V curve moves to the high pressure direction, illustrate that Al mixes the closer to anode, the hole that enters in the device is few more, the hole is blocked in outside the device more effectively, and the voltage at respective devices two ends uprises under the same current density.And the device that undopes is not owing to exist this hole barrier, so its J-V curve is in extreme lower position, under the promptly same current density, voltage is minimum.
The present invention also changes the aluminium negative electrode into the LiF/Al composite cathode, carried out the experimental study that is similar to, the aluminium that has also proved in the organic semiconductor thin-film thin regional debita spissitudo transmission of blocking hole equally fully of mixing, the selection of this effect and negative electrode is described, and it doesn't matter.
The easy easy realization of technology of the present invention, cost is not high, has improved the organic light-emitting device luminous efficiency greatly, by effective hole transmitting regulating and controlling, realizes having the semiconductor function device of special performance.
Description of drawings
Fig. 1 is the OLED structure schematic diagram.
Fig. 2 is four device architectures of making simultaneously and L-J-V curve chart, three device 2#, 3#, 4# aluminium doping molar ratio all is 1: 4, doping position is respectively the hole transmission layer 8nm near luminescent layer, the 8nm zone of the hole transmission layer NPB of the 8nm of hole transmission layer NPB central authorities and close anode ITO.Device 1# does not have doping.
Fig. 3 is four device architectures of making simultaneously and L-J-V curve chart, three device 2#, and 3#, 4# aluminium doping molar ratio was respectively 1: 3, and 1: 10 and 1: 12, doping position was that 1# the device that does not mix among the Alq near the 8nm of hole transmission layer NPB.
Fig. 4 is four device architectures of making simultaneously and L-J-V curve chart, three device 2#, and 3#, 4# aluminium doping molar ratio was respectively 1: 1, and 1: 2 and 1: 8, doping position was near among the 100nmAlq of negative electrode, the device 1# that does not mix to make performance comparison.
Fig. 5 is four device architectures of making simultaneously and L-J-V curve chart, three device 2#, and 3#, 4# aluminium doping molar ratio was respectively 1: 0.2, and 1: 1 and 1: 9, doping thickness all was 3nm, and doping position is the central authorities of 70nmAlq, and device 1# does not have doping.
Embodiment
Use in the experiment of Al doping blocking hole, the ITO substrate that the present invention buys commerce is handled through the conventional method ultrasonic cleaning and through UV ozone earlier, then imports the making of carrying out organic electroluminescence device in the vacuum chamber into.Under the same vacuum environment, same is designed on the good ITO substrate of photoetching, can make four samples that structure is different simultaneously, helps the performance comparison of different structure device like this.The sample for preparing directly imports the synchronism detection that carries out luminous-current density-voltage (L-J-V) curve the anhydrous and oxygen-free nitrogen glove box into from vacuum chamber.
Example one: in order to study the hole barrier effect that hole transmission layer Al mixes, the present invention is respectively in the thin zone of three diverse locations of hole transmission layer, the 6nm of central authorities, 6nm zone, both sides is carried out aluminium and is mixed, as shown in Figure 2, three aluminium doping devices all do not have electroluminescence, have shown simultaneously among the figure that the normal luminous device that does not have adulterated al is to contrast.The device that hole transmission layer aluminium mixes does not have electroluminescence, explanation successfully stops the transmission in hole fully in the aluminium doping in the thin zone of hole transmission layer, outstanding two aluminium doped region is away from the device of light-emitting zone, there is not the participation of the luminous exciton quenching effect of metal pair, the not luminous complete blocking effect that can only come from the hole at all.
Example two: the aluminium of present embodiment explanation Alq layer mixes to the hole barrier effect, mix at the Al that has carried out variable concentrations near the 8nm scope Alq zone of hole transmission layer, as shown in Figure 3, three doping devices give normal luminous not doping device simultaneously without any electroluminescence among the figure as a result.There are two kinds may cause three doping devices not luminous, first hole is successfully stopped by the aluminium doped region of Alq, it is luminous with electron recombination to move to adjacent not doped with Al q zone, it two is that Alq can not blocking hole move to not that doped region and electron recombination form exciton, but the adjacent metal zone falls (1 with the complete quencher of luminous exciton, 2), cause device not luminous.In order to test a kind of possibility in explanation back, the present invention has made the device of another structure, this moment, the 8nm scope Alq zone near hole transmission layer undoped, all the mix aluminium of variable concentrations of adjacent Alq (100nm), as shown in Figure 4, though because adjacent aluminium doped region increases with the aluminium doping content, the concentration quenching effect aggravation, but luminous complete quencher can not be fallen, the doping device of this key diagram 3 is not luminous is not because the concentration quenching of metal (aluminium) causes, but since the aluminium of Alq mix and the hole stopped fully cause.Because if can not stop fully, under enough big voltage, always have considerable hole and be transported to that doped with Al q layer and electron recombination are not luminous.
Example three: the present invention is with Al doping blocking hole effect in the organic semiconductor, be applied to do in the organic electroluminescence device of negative electrode with Al, by the hole being blocked in effectively in the light-emitting zone, realized the raising of device luminous efficiency to increase and the luminous probability of electron recombination.Because do the electroluminescent device of negative electrode with aluminium why low than the electroluminescent device efficient of making negative electrode with the littler lithium of work function, be because the less lithium cathode device of work function, the injection of electronics is more effective, make have enough electronics with from the anode injected holes at the light-emitting zone recombination luminescence, and make the device of negative electrode with the bigger aluminium of work function, because electron injection efficiency is low, feasible have the hole of quite a few not luminous with the electron recombination that negative electrode is come, directly flow to negative electrode on the contrary, form the hole leakage current, device just shows very poor luminous efficiency.Stop if will flow to the hole leakage current of negative electrode by a kind of way, be limited in the luminescent layer, just might improve the luminous efficiency of device.
Experimentally, mix, can contrast by experiment, find reasonable doping position for the Al of certain zone and ratio, both effectively with hole confinement in luminescent layer, reduce again because the negative effect of metal-doped quencher light-emitting zone exciton.Then at this doping position preferably, by regulating the doping ratio,, guarantee again simultaneously effectively hole barrier in light-emitting zone, thereby improve the luminous efficiency of device to reduce the quencher of the luminous exciton of aluminium atom pair.It is 32nm apart from the NPB layer that Fig. 5 has provided the doping position that the present invention's experiment gropes, doped region is three device architecture schematic diagrames of 3nm, sample 2# wherein, and the doping ratio of 3# and 4# was respectively 1: 0.2, (Alq: Al), sample 1# was the device that undopes in 1: 1 and 1: 9.From the J-L curve as can be seen, along with the doping ratio improves gradually, brightness increases gradually, to device 3# brightness maximum, the efficient of doping device 3# is also bigger than the efficient of the device 1# that do not mix, but along with doping content further improves, because the quencher of the luminous exciton of metal pair becomes significantly (2), device 4# brightness has dropped to lower than plain device.In a word, although existence exciton quencher to a certain degree, utilization aluminium doping blocking hole effect can effectively be improved the efficient of making the electroluminescent device of negative electrode with Al.

Claims (2)

1. the method for a blocking hole in the organic layer of organic semiconductor device, it is characterized in that in organic layer as the NPB of hole transmission layer and to carry out thickness as the arbitrary position among the Alq of luminescent layer be that 1-10nm aluminium mixes, doping content is an aluminium to the mol ratio of organic molecule is 0.1: 1~10: 1.
2. the application of organic semiconductor device in organic semiconductor electronics and opto-electronic device of method acquisition according to claim 1.
CNB200510023306XA 2005-01-13 2005-01-13 Method for blocking hole in organic layer of organic semiconductor device Expired - Fee Related CN100369293C (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CNB200510023306XA CN100369293C (en) 2005-01-13 2005-01-13 Method for blocking hole in organic layer of organic semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CNB200510023306XA CN100369293C (en) 2005-01-13 2005-01-13 Method for blocking hole in organic layer of organic semiconductor device

Publications (2)

Publication Number Publication Date
CN1645643A CN1645643A (en) 2005-07-27
CN100369293C true CN100369293C (en) 2008-02-13

Family

ID=34875837

Family Applications (1)

Application Number Title Priority Date Filing Date
CNB200510023306XA Expired - Fee Related CN100369293C (en) 2005-01-13 2005-01-13 Method for blocking hole in organic layer of organic semiconductor device

Country Status (1)

Country Link
CN (1) CN100369293C (en)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7902742B2 (en) * 2006-07-04 2011-03-08 Semiconductor Energy Laboratory Co., Ltd. Light-emitting element, light-emitting device, and electronic device
CN101217838B (en) * 2008-01-11 2012-02-22 北京大学 An organic electroluminescence device based on strongly correlated electron system and the corresponding preparation method
US9608168B2 (en) 2014-06-13 2017-03-28 Seoul Viosys Co., Ltd. Light emitting diode
CN109755402B (en) * 2019-01-10 2021-01-05 云谷(固安)科技有限公司 Display panel and display device

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH11307259A (en) * 1998-04-23 1999-11-05 Tdk Corp Organic el element
US6013384A (en) * 1997-01-27 2000-01-11 Junji Kido Organic electroluminescent devices
JP2000340365A (en) * 1999-05-25 2000-12-08 Matsushita Electric Ind Co Ltd Organic electroluminescence element
CN1290119A (en) * 1999-09-29 2001-04-04 城户淳二 Organic electroluminascent device and assembly, and method for controlling transmitted spectrum in device
JP2002015873A (en) * 2000-05-24 2002-01-18 Eastman Kodak Co Low-voltage organic luminescent device
JP2004200031A (en) * 2002-12-19 2004-07-15 Bridgestone Corp Organic el element and its manufacturing method

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6013384A (en) * 1997-01-27 2000-01-11 Junji Kido Organic electroluminescent devices
JPH11307259A (en) * 1998-04-23 1999-11-05 Tdk Corp Organic el element
JP2000340365A (en) * 1999-05-25 2000-12-08 Matsushita Electric Ind Co Ltd Organic electroluminescence element
CN1290119A (en) * 1999-09-29 2001-04-04 城户淳二 Organic electroluminascent device and assembly, and method for controlling transmitted spectrum in device
US6589673B1 (en) * 1999-09-29 2003-07-08 Junji Kido Organic electroluminescent device, group of organic electroluminescent devices
JP2002015873A (en) * 2000-05-24 2002-01-18 Eastman Kodak Co Low-voltage organic luminescent device
JP2004200031A (en) * 2002-12-19 2004-07-15 Bridgestone Corp Organic el element and its manufacturing method

Also Published As

Publication number Publication date
CN1645643A (en) 2005-07-27

Similar Documents

Publication Publication Date Title
US8120242B2 (en) Transistor and process of producing the same, light-emitting device, and display
US10784457B2 (en) Fabricating method of QLED device and QLED device
Chu et al. Integration of organic light-emitting diode and organic transistor via a tandem structure
JP4498961B2 (en) Organic field effect transistor and flat panel display device having the same
Liu et al. All-solution-processed perovskite light-emitting diodes with all metal oxide transport layers
KR100654579B1 (en) Light-emitting apparatus
CA2537198A1 (en) Vertical organic field effect transistor
Ullah et al. Hybrid light-emitting transistors based on low-temperature solution-processed metal oxides and a charge-injecting interlayer
CN100369293C (en) Method for blocking hole in organic layer of organic semiconductor device
Li et al. Highly efficient and stable organic light-emitting diodes employing MoO 3-doped perylene-3, 4, 9, 10-tetracarboxylic dianhydride as hole injection layer
Di et al. Organic Light‐Emitting Transistors Containing a Laterally Arranged Heterojunction
CN103956433A (en) Monopole organic light-emitting field effect transistor
Ryan et al. Towards low-temperature preparation of air-stable hybrid light-emitting diodes
CN209592087U (en) A kind of organic electroluminescence device mould group and display panel
Wang et al. Solution-processed sodium hydroxide as the electron injection layer in inverted bottom-emission organic light-emitting diodes
Xu et al. Luminescent and photovoltaic properties of poly (9, 9-dioctylfluorene-co-bithiophene) in organic electronic devices
Kim et al. Electroluminescence lifetime and efficiency of polymer LEDs with surface-treated anodes
CN113809264B (en) Light emitting transistor
Zhang et al. Highly efficient inverted organic light-emitting diodes with organic pn junction as electron injection layer
Shi et al. Effect of Ca and buffer layers on the performance of organic light-emitting diodes based on tris-(8-hydroxyquinoline) aluminum
Shi et al. A pentacene-doped hole injection layer for organic light-emitting diodes
Guo et al. Organic oxide/Al composite cathode in small molecular organic light-emitting diodes
Zheng et al. Hybrid nanoparticle/organic devices with strong resonant tunneling behaviors
Irfan et al. Oxide insertion layer in organic semiconductor devices
CN102856513B (en) Anode modification method for improving properties of organic electroluminescent device

Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
C14 Grant of patent or utility model
GR01 Patent grant
C17 Cessation of patent right
CF01 Termination of patent right due to non-payment of annual fee

Granted publication date: 20080213

Termination date: 20110113