CN100336099C - Display panel with circuit connection testing design - Google Patents
Display panel with circuit connection testing design Download PDFInfo
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- CN100336099C CN100336099C CNB031584497A CN03158449A CN100336099C CN 100336099 C CN100336099 C CN 100336099C CN B031584497 A CNB031584497 A CN B031584497A CN 03158449 A CN03158449 A CN 03158449A CN 100336099 C CN100336099 C CN 100336099C
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- display panel
- data line
- photo
- test
- sensitive cell
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Abstract
The present invention relates to a display panel which comprises a basal plate and a plurality of data lines, wherein the data lines are arranged on the basal plate for driving the display panel to display images; a plurality of sensitizing elements are also arranged on the surface of the display panel; one side of each sensitizing element is electrically connected to one end of each data line, and the other side is electrically connected to a test welding spot, wherein the sensitizing element can become a conducting state when the sensitizing element is subjected to irradiating by light rays with certain intensity to electrically connect with the data line and the test welding spot. Thus, the test welding spot can be used for making line connection test for the display panel. When the sensitizing element is not subjected to irradiating by light rays, the sensitizing element is in an off state to enable the data lines to normally drive the display panel to display.
Description
Technical field
The invention provides a kind of display panel, refer in particular to a kind of display panel that circuit connects test (open/shorttest) design that has.
Background technology
Along with making rapid progress of science and technology, the intelligent information products of light and thin, power saving, portable belt have been full of our living space, display has then been played the part of considerable role betwixt, no matter be mobile phone, personal digital assistant or mobile computer, all need the interface of display as man-machine communication.Wherein LCD has that external form is light, thin, power consumption is few and characteristic such as radiationless pollution, be widely used on the portable information products such as mobile computer (notebook), PDA(Personal Digital Assistant), even existing cathode-ray tube (CRT) (catbode ray tube, CRT) trend of monitor that replaces traditional desktop PC gradually.Because liquid crystal molecule is under different ordered states, light had different polarizations or refraction effect, therefore can control the transmission amount of light via the liquid crystal molecule of different ordered states, further produce the output light of varying strength, and LCD promptly is to utilize this specific character of liquid crystal molecule to produce red, blue, the green glow of different gray scales, further makes LCD produce abundant image.
Please refer to Fig. 1, Fig. 1 is the synoptic diagram of a conventional LCD (liquid crystal display) 10.LCD 10 comprises a display panel (display panel) 12, one control circuit 14, a data line drive circuit 16 and one scan line drive circuit 18.Display panel 12 includes a substrate (substrate) and a display unit is located at substrate surface, and wherein this display unit includes a plurality of pixels, and respectively this pixel can present different gray scales according to view data and comes the composition diagram picture.In addition, on the display panel 12 and be provided with many data lines (data line) 22, many sweep traces (scan line) 24, and a plurality of image element circuit 26 that is electrically connected to data line 22 and sweep trace 24 perpendicular to data line 22.For ease of explanation, only show an image element circuit 26 among Fig. 1, in fact, each bar data line 22 is equipped with an image element circuit 26 with the junction (intersection) of sweep trace 24 in the display panel 12, be electrically connected to corresponding data line 22 and sweep trace 24 respectively, so image element circuit 26 is distributed on the display panel 12 in the mode of matrix (matrix), that is to say the direction arrangement of data line 22 according to matrix column (column), and sweep trace 24 is arranged according to the direction of the row (row) of matrix, and each image element circuit 26 carries out the image demonstration all corresponding to a pixel to drive this corresponding pixel.
Quality in order to ensure product, after the making of finishing each element on the display panel 12, usually all can carry out a circuit test earlier, to judge that this display panel is 12 flaw not to be arranged, therefore include a test circuit toward contact on the display panel 12, be located at the outer peripheral areas 28 (dotted portion among Fig. 1) of display panel.Please refer to Fig. 2, Fig. 2 is the local enlarged diagram in display panel 12 surface periphery zones 28.As shown in Figure 2, in outer peripheral areas, be provided with a plurality of test solder joints (test pad) 32, be used for respectively to showing the pixel (redness of different colours, blue and green) test, and data line 22 (DL1, DL2, DL3... etc.) then according to its color of pixel that drives, be electrically connected to corresponding test solder joint 32 respectively, therefore, as long as via the suitable test signal of test solder joint 32 inputs, can judge whether display panel 12 has defective according to the demonstration situation of display panel 12, whether need to discard or carry out again other processing Hotfix to determine this display panel 12.
For convenience for the purpose of the test, carry out many data lines of test period 22 can be electrically connected to simultaneously the test solder joint 32, therefore, after finishing test, need carry out one extra laser cutting process again, as shown in Figure 2, this laser cutting process can cut off the electrical connection of 22 of each data lines, each data line 22 can independently be operated, and driven display panel 12 carries out image and shows.Yet not only process is complicated for this extra laser cutting process, and often need to spend many mutually process times, the related decline that causes output, in addition, in case after carrying out laser cutting process, each data line 22 is connected and will be disconnected with 32 of test solder joints, in case because of any problem takes place in follow-up process this product, also can't come display panel 12 to detect or trace by carrying out circuit connection test once again.Therefore, how to improve the design of circuit connection test in the display panel 12, be one of present considerable problem.
Summary of the invention
Therefore the object of the present invention is to provide a kind of display panel that circuit connects Test Design that has, to connect test process complicated and need expend the problem of plenty of time to overcome custom circuit.
In a preferred embodiment of the invention, a kind of display panel that circuit connects Test Design that has is disclosed, it includes a substrate and many data lines are located on this substrate, carry out the image demonstration to drive this display panel, this panel surface also is provided with a plurality of photo-sensitive cells, respectively a side of this photo-sensitive cell is electrically connected to a respectively end of this data line, opposite side then is electrically connected to a test solder joint, wherein when this photo-sensitive cell is subjected to the irradiate light of certain intensity, can make this photo-sensitive cell become conducting state, to be electrically connected this data line and this test solder joint, therefore can test solder joint via this carries out circuit to this display panel respectively and connects test, and when this photo-sensitive cell was not subjected to irradiate light, this photo-sensitive cell then was an off state, so that respectively this data line can carry out display operation by this display panel of driven.
Because display panel of the present invention includes a plurality of photo-sensitive cells, be located at respectively between this data line and this test solder joint, therefore can decide the respectively situation that is electrically connected between this data line and this test solder joint by the irradiation of light, and can dispense in the routine techniques the essential laser cutting process that uses, so can significantly reduce manufacturing time, and effectively improve output.
Description of drawings
Fig. 1 is the synoptic diagram of a conventional LCD.
Fig. 2 is the local enlarged diagram of outer peripheral areas among Fig. 1.
Fig. 3 is the synoptic diagram of a LCD in the preferred embodiment of the present invention.
Fig. 4 is the local enlarged diagram of outer peripheral areas among Fig. 3.
The reference numeral explanation
10 LCD, 12 display panels
14 control circuits, 16 data line drive circuits
18 scan line drive circuits, 22 data lines
24 sweep traces, 26 image element circuits
28 outer peripheral areas, 32 test solder joints
110 LCD, 112 display panels
114 control circuits, 116 data line drive circuits
118 scan line drive circuits, 122 data lines
124 sweep traces, 126 image element circuits
128 outer peripheral areas, 130 photo-sensitive cells
132 test solder joints
Embodiment
Please refer to Fig. 3, Fig. 3 is the synoptic diagram of a LCD 110 in the preferred embodiment of the present invention.LCD 110 comprises a display panel 112, a control circuit 114, a data line drive circuit 116 and one scan line drive circuit 118.Display panel 112 includes a substrate and a display unit is located at substrate surface, and wherein this display unit includes a plurality of pixels, and respectively this pixel can present different gray scales according to view data and comes the composition diagram picture.In addition, on the display panel 112 and be provided with many data lines 122, many sweep traces 124, and a plurality of image element circuit 126 that is electrically connected to data line 122 and sweep trace 124 perpendicular to data line 122.For ease of explanation, only show an image element circuit 126 among Fig. 1, in fact, each bar data line 122 is equipped with an image element circuit 126 with the junction of sweep trace 124 in the display panel 112, be electrically connected to corresponding data line 122 and sweep trace 124 respectively, in other words, image element circuit 126 is distributed on the display panel 112 in the mode of matrix, that is to say the direction arrangement of data line 122 according to matrix column, and sweep trace 124 is arranged according to the direction of the row of matrix, and each image element circuit 126 carries out the image demonstration all corresponding to a pixel to drive this corresponding pixel.In addition, display panel 112 is in outer peripheral areas 128 (dotted portion) and be provided with a test circuit, connects test to be used for that display panel 112 is carried out circuit.
Please refer to Fig. 4, Fig. 4 is the local enlarged diagram of outer peripheral areas 128 among Fig. 3.As shown in Figure 4, in outer peripheral areas 128, be provided with a plurality of photo-sensitive cells 130 and at least one test solder joint 132, wherein respectively a side of this photo-sensitive cell 130 is electrically connected to the end of data line 122 (DL1, DL2, DL3. etc.) respectively, and opposite side then is electrically connected to test solder joint 132 by suitable lead.In a preferred embodiment of the invention, photo-sensitive cell 130 is the semiconductor film, an amorphous silicon island portion (amorphousisland) for example, in addition, the number of test solder joint 132 then is three, the pixel (red, blue and green) that shows different colours is tested being used for respectively, the color that data line 122 (DL1, DL2, DL3. etc.) then shows according to its institute's pixel that drives is electrically connected to the test solder joint 132 of correspondence respectively.
Image element circuit 126 that it should be noted that display panel 112 surfaces can include at least one low-temperature polysilicon film transistor (low temperature polysilicon thin filmtransistor) usually; and when making respectively this low-temperature polysilicon film transistor; usually need to form earlier an amorphous silicon island portion, to utilize this amorphous silicon island portion to form a polysilicon island portion and as the active region of this low-temperature polysilicon film transistor.Therefore, in a preferred embodiment of the invention, only need when making respectively this low-temperature polysilicon film transistor, suitably to adjust the shape of mask, formation photo-sensitive cell 130 in outer peripheral areas 128 in the lump, and need not adopt any extra process.
Because photo-sensitive cell 130 is being subjected under the irradiate light of certain intensity, will produce electric current and make the both sides mutual conduction of photo-sensitive cell 130, in other words, this moment, data line 122 was electrically connected to test solder joint 132, therefore as long as via test solder joint 130 input test signals, can carry out circuit via test solder joint 130 pairs of display panels 112 and connect test (open/short test), and judge whether this display panel 112 has defective and needs discarded or carry out other processing Hotfix again according to the display result of display panel 112.
After finishing circuit and connecting test, only need photo-sensitive cell 130 is covered, can interrupt being electrically connected of each data line 122 and 130 of test solder joints, and make each data line 122 independent running, drive display panel 112 normally and carry out the image demonstration.For example can after finishing circuit and connecting test, qualified display panel 112 be encapsulated, with a housing be installed in display panel 112 around, and cover in photo-sensitive cell 130, can make display panel 112 carry out normal image and show.Thus, need carry out circuit even display panel 112 in subsequent process any problem takes place again and connect when testing, only need this housing is removed, can under strong illumination, carry out circuit once more and connect test.
In addition, though more than be example all with a display panels, display panel 112 structures of the present invention are described, yet range of application of the present invention is not limited to display panels, for a person skilled in the art, and can be easy to according to the above description and accompanying drawing and apply the present invention to the display panel of other types an organic electroluminescence display panel for example.
Compare with routine techniques, utilize a photo-sensitive cell to come control data line and the electrical connection of test between the solder joint in the display panel of the present invention, only need be by the illumination state around changing, get final product being electrically connected between smooth conducting or shutoff data line and the test solder joint, and need not carry out an extra laser cutting process, and the photo-sensitive cell among the present invention completes when making each thin film transistor (TFT) of panel surface in the lump, do not need extra process, so can effectively simplify manufacturing process, significantly shorten manufacturing time, related raising output.In addition, owing to utilize this photo-sensitive cell as a switch in the display panel of the present invention, come the electrical connection between control data line and the test solder joint, therefore even any problem takes place and need carry out circuit again and connect when testing in display panel in subsequent process, also can under strong illumination, carry out circuit connection test once more and detect or trace failure cause, so can effectively improve the quality of product.
The above is the preferred embodiments of the present invention only, and all equivalences of making according to claim of the present invention change and revise, and all should belong to covering scope of the present invention.
Claims (9)
1. display panel, it includes:
One substrate;
Many data line is located on this substrate, carries out the image demonstration to drive this display panel;
At least one test solder joint is located on this substrate; And
A plurality of photo-sensitive cells are located on this substrate, and respectively a side of this photo-sensitive cell is connected to this data line, and opposite side is electrically connected to this test solder joint;
Wherein when this photo-sensitive cell is subjected to the irradiate light of certain intensity, this photo-sensitive cell will become conducting state, this data line is electrically connected mutually with this test solder joint, so that this data line is carried out circuit test via this test solder joint, and when this photo-sensitive cell is not subjected to irradiate light, this photo-sensitive cell then switches to off state, so that respectively this this display panel of data line driven carries out display operation.
2. display panel as claimed in claim 1, wherein this display panel also includes a plurality of pixels and corresponds respectively to respectively a plurality of image element circuits of this pixel, respectively this image element circuit is electrically connected to this data line, carries out image and shows to utilize this data line to drive respectively this pixel.
3. display panel as claimed in claim 2, wherein the shown image of this pixel is made up of red, blue and green institute.
4. display panel as claimed in claim 3, wherein this display panel includes at least three test solder joints, with respectively to showing that redness, blueness and green pixel test.
5. display panel as claimed in claim 4, wherein respectively this data line according to its institute the shown color of the pixel that drives, be electrically connected to respectively the correspondence the test solder joint.
6. display panel as claimed in claim 1, wherein this photo-sensitive cell is the semiconductor film.
7. display panel as claimed in claim 6, wherein this semiconductor film includes an amorphous silicon island portion.
8. display panel as claimed in claim 1, wherein this display panel is a display panels or an organic electroluminescence display panel.
9. display panel as claimed in claim 1, wherein this display panel also includes a housing, is coated on around this substrate, and covers this photo-sensitive cell, so that this display panel carries out normal display operation.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CNB031584497A CN100336099C (en) | 2003-09-10 | 2003-09-10 | Display panel with circuit connection testing design |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CNB031584497A CN100336099C (en) | 2003-09-10 | 2003-09-10 | Display panel with circuit connection testing design |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN1595490A CN1595490A (en) | 2005-03-16 |
| CN100336099C true CN100336099C (en) | 2007-09-05 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CNB031584497A Expired - Fee Related CN100336099C (en) | 2003-09-10 | 2003-09-10 | Display panel with circuit connection testing design |
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Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20070069632A1 (en) * | 2005-09-26 | 2007-03-29 | Toppoly Optoelectronics Corp. | Electroluminescent device and pixel device |
| CN106128345A (en) * | 2016-09-12 | 2016-11-16 | 昆山国显光电有限公司 | Test circuit, array base palte, display floater and method of testing |
| CN106531038B (en) * | 2016-12-09 | 2019-04-30 | 武汉华星光电技术有限公司 | The detection method of display device and display panel |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4819038A (en) * | 1986-12-22 | 1989-04-04 | Ibm Corporation | TFT array for liquid crystal displays allowing in-process testing |
| CN1250300A (en) * | 1999-08-19 | 2000-04-12 | 北京邮电通信设备厂 | Electric economizer for screen and keyboard lighting of mobile telephone set and its usage |
| JP2001124661A (en) * | 1999-10-25 | 2001-05-11 | Horiba Ltd | Quality inspection method and quality inspection device for flat panel display device |
-
2003
- 2003-09-10 CN CNB031584497A patent/CN100336099C/en not_active Expired - Fee Related
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4819038A (en) * | 1986-12-22 | 1989-04-04 | Ibm Corporation | TFT array for liquid crystal displays allowing in-process testing |
| CN1250300A (en) * | 1999-08-19 | 2000-04-12 | 北京邮电通信设备厂 | Electric economizer for screen and keyboard lighting of mobile telephone set and its usage |
| JP2001124661A (en) * | 1999-10-25 | 2001-05-11 | Horiba Ltd | Quality inspection method and quality inspection device for flat panel display device |
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|---|---|
| CN1595490A (en) | 2005-03-16 |
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