CH611017A5 - - Google Patents

Info

Publication number
CH611017A5
CH611017A5 CH560776A CH560776A CH611017A5 CH 611017 A5 CH611017 A5 CH 611017A5 CH 560776 A CH560776 A CH 560776A CH 560776 A CH560776 A CH 560776A CH 611017 A5 CH611017 A5 CH 611017A5
Authority
CH
Switzerland
Application number
CH560776A
Inventor
Peter Nopper
Original Assignee
Zumbach Electronic Ag
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Zumbach Electronic Ag filed Critical Zumbach Electronic Ag
Priority to CH560776A priority Critical patent/CH611017A5/xx
Priority to US05/790,182 priority patent/US4115702A/en
Priority to FR7714161A priority patent/FR2350581A1/fr
Priority to AU24588/77A priority patent/AU505346B2/en
Priority to GB17433/77A priority patent/GB1555874A/en
Priority to DK184077A priority patent/DK184077A/da
Priority to NL7704638A priority patent/NL7704638A/xx
Priority to DE2718807A priority patent/DE2718807C2/de
Priority to SE7704821A priority patent/SE7704821L/xx
Priority to CA277,193A priority patent/CA1071396A/en
Priority to JP5113377A priority patent/JPS52134466A/ja
Priority to BE1008110A priority patent/BE854164A/xx
Priority to IT23109/77A priority patent/IT1086177B/it
Priority to ES458433A priority patent/ES458433A1/es
Publication of CH611017A5 publication Critical patent/CH611017A5/xx

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/08—Measuring arrangements characterised by the use of optical techniques for measuring diameters
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/08—Measuring arrangements characterised by the use of optical techniques for measuring diameters
    • G01B11/10—Measuring arrangements characterised by the use of optical techniques for measuring diameters of objects while moving
    • G01B11/105—Measuring arrangements characterised by the use of optical techniques for measuring diameters of objects while moving using photoelectric detection means

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
CH560776A 1976-05-05 1976-05-05 CH611017A5 (jp)

Priority Applications (14)

Application Number Priority Date Filing Date Title
CH560776A CH611017A5 (jp) 1976-05-05 1976-05-05
US05/790,182 US4115702A (en) 1976-05-05 1977-04-25 Device for measuring at least one dimension of an object and a method of operating said device
FR7714161A FR2350581A1 (fr) 1976-05-05 1977-04-25 Appareil pour mesurer au moins une dimension d'un objet et procede pour la mise en oeuvre de cet appareil
AU24588/77A AU505346B2 (en) 1976-05-05 1977-04-26 Measuring atleast one dimension ofan object
GB17433/77A GB1555874A (en) 1976-05-05 1977-04-26 Device for measuringa least one dimensiion of an opject and a method of operating said device
DK184077A DK184077A (da) 1976-05-05 1977-04-27 Apparat til maling af mindst een dimension pa et objekt og metode til funktion af dette apparat
NL7704638A NL7704638A (nl) 1976-05-05 1977-04-27 Inrichting voor het meten van tenminste een dimensie van een objekt.
DE2718807A DE2718807C2 (de) 1976-05-05 1977-04-27 Gerät zur Messung einer Dimension, insbesondere des Durchmessers, eines Objekts
SE7704821A SE7704821L (sv) 1976-05-05 1977-04-27 Apparat for metning av minst en dimension pa ett foremal samt forfaringssett for apparatens anvendning
CA277,193A CA1071396A (en) 1976-05-05 1977-04-27 Device for measuring at least one dimension of an object and a method of operating said device
JP5113377A JPS52134466A (en) 1976-05-05 1977-05-02 Apparatus for measuring at least one dimensiom of object and method of operating the same
BE1008110A BE854164A (fr) 1976-05-05 1977-05-02 Appareil pour mesurer au moins d'une dimension d'un objet et procede pour la mise en oeuvre de cet appareil
IT23109/77A IT1086177B (it) 1976-05-05 1977-05-03 Apparecchio per misurare almeno una dimensione di un oggetto e procedimento per il funzionamento dell'apparecchio stesso
ES458433A ES458433A1 (es) 1976-05-05 1977-05-04 Perfeccionamientos en aparatos para medir el diametro de ca-bles yno similares.

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CH560776A CH611017A5 (jp) 1976-05-05 1976-05-05

Publications (1)

Publication Number Publication Date
CH611017A5 true CH611017A5 (jp) 1979-05-15

Family

ID=4296429

Family Applications (1)

Application Number Title Priority Date Filing Date
CH560776A CH611017A5 (jp) 1976-05-05 1976-05-05

Country Status (14)

Country Link
US (1) US4115702A (jp)
JP (1) JPS52134466A (jp)
AU (1) AU505346B2 (jp)
BE (1) BE854164A (jp)
CA (1) CA1071396A (jp)
CH (1) CH611017A5 (jp)
DE (1) DE2718807C2 (jp)
DK (1) DK184077A (jp)
ES (1) ES458433A1 (jp)
FR (1) FR2350581A1 (jp)
GB (1) GB1555874A (jp)
IT (1) IT1086177B (jp)
NL (1) NL7704638A (jp)
SE (1) SE7704821L (jp)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3229264A1 (de) * 1982-08-05 1984-02-09 Dipl.-Ing. Bruno Richter GmbH & Co. Elektronische Betriebskontroll-Geräte KG, 8602 Stegaurach Optisch-elektrische messeinrichtung zum messen der lage und/oder der abmessung von gegenstaenden

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DE3261325D1 (en) * 1981-03-09 1985-01-10 Temova Ets Protective bandage for legs and joints of hoofed animals
DE3112026C2 (de) * 1981-03-26 1985-10-03 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V., 8000 München Vorrichtung zur Messung der Lage und Bewegung eines schwingfähigen Körpers
GB2124760B (en) * 1982-08-05 1986-02-12 Electricity Council Temperature of elongate articles
JPS5968606A (ja) * 1982-10-13 1984-04-18 Aichi Boseki Kk 繊維糸条体の太さむら検出装置
DE3334976A1 (de) * 1983-09-27 1985-04-18 Dr.-Ing. Wolfgang Schulz, Meßtechnik, 4020 Mettmann Verfahren und vorrichtung zur beruehrungslosen ermittlung von rundlaufabweichungen eines rotationskoerpers
DE3422988A1 (de) * 1984-06-22 1986-01-02 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V., 8000 München Verfahren und vorrichtung zum messen der querkontraktion einer laenglichen probe
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US4764015A (en) * 1986-12-31 1988-08-16 Owens-Illinois Television Products Inc. Method and apparatus for non-contact spatial measurement
DE3718192A1 (de) * 1987-05-29 1988-12-08 Hommelwerke Gmbh Vorrichtung zur messung des abstandes zwischen der vorrichtung und einer messflaeche
JPH0781833B2 (ja) * 1987-12-07 1995-09-06 日本たばこ産業株式会社 長さ測定装置
US6067379A (en) * 1988-12-09 2000-05-23 Cognex Corporation Method and apparatus for locating patterns in an optical image
JPH086244Y2 (ja) * 1990-08-07 1996-02-21 オムロン株式会社 寸法測定装置
US5371690A (en) * 1992-01-17 1994-12-06 Cognex Corporation Method and apparatus for inspection of surface mounted devices
US5383021A (en) * 1993-04-19 1995-01-17 Mectron Engineering Company Optical part inspection system
US5602937A (en) * 1994-06-01 1997-02-11 Cognex Corporation Methods and apparatus for machine vision high accuracy searching
US5801966A (en) * 1995-07-24 1998-09-01 Cognex Corporation Machine vision methods and articles of manufacture for determination of convex hull and convex hull angle
US6026176A (en) * 1995-07-25 2000-02-15 Cognex Corporation Machine vision methods and articles of manufacture for ball grid array inspection
US5757956A (en) * 1995-10-31 1998-05-26 Cognex Corp. Template rotating method for locating bond pads in an image
US5754679A (en) * 1995-10-31 1998-05-19 Cognex Corp. Image rotating method for locating bond pads in an image
US5845007A (en) * 1996-01-02 1998-12-01 Cognex Corporation Machine vision method and apparatus for edge-based image histogram analysis
US5872870A (en) * 1996-02-16 1999-02-16 Cognex Corporation Machine vision methods for identifying extrema of objects in rotated reference frames
US5909504A (en) * 1996-03-15 1999-06-01 Cognex Corporation Method of testing a machine vision inspection system
US6259827B1 (en) 1996-03-21 2001-07-10 Cognex Corporation Machine vision methods for enhancing the contrast between an object and its background using multiple on-axis images
US5949901A (en) * 1996-03-21 1999-09-07 Nichani; Sanjay Semiconductor device image inspection utilizing image subtraction and threshold imaging
US6298149B1 (en) 1996-03-21 2001-10-02 Cognex Corporation Semiconductor device image inspection with contrast enhancement
US5978502A (en) * 1996-04-01 1999-11-02 Cognex Corporation Machine vision methods for determining characteristics of three-dimensional objects
US6137893A (en) * 1996-10-07 2000-10-24 Cognex Corporation Machine vision calibration targets and methods of determining their location and orientation in an image
US5960125A (en) * 1996-11-21 1999-09-28 Cognex Corporation Nonfeedback-based machine vision method for determining a calibration relationship between a camera and a moveable object
US5953130A (en) * 1997-01-06 1999-09-14 Cognex Corporation Machine vision methods and apparatus for machine vision illumination of an object
US6075881A (en) * 1997-03-18 2000-06-13 Cognex Corporation Machine vision methods for identifying collinear sets of points from an image
US5974169A (en) * 1997-03-20 1999-10-26 Cognex Corporation Machine vision methods for determining characteristics of an object using boundary points and bounding regions
US6141033A (en) * 1997-05-15 2000-10-31 Cognex Corporation Bandwidth reduction of multichannel images for machine vision
US6608647B1 (en) 1997-06-24 2003-08-19 Cognex Corporation Methods and apparatus for charge coupled device image acquisition with independent integration and readout
US5978080A (en) * 1997-09-25 1999-11-02 Cognex Corporation Machine vision methods using feedback to determine an orientation, pixel width and pixel height of a field of view
US6025854A (en) * 1997-12-31 2000-02-15 Cognex Corporation Method and apparatus for high speed image acquisition
US6236769B1 (en) 1998-01-28 2001-05-22 Cognex Corporation Machine vision systems and methods for morphological transformation of an image with zero or other uniform offsets
US6282328B1 (en) 1998-01-28 2001-08-28 Cognex Corporation Machine vision systems and methods for morphological transformation of an image with non-uniform offsets
US6381375B1 (en) 1998-02-20 2002-04-30 Cognex Corporation Methods and apparatus for generating a projection of an image
US6215915B1 (en) 1998-02-20 2001-04-10 Cognex Corporation Image processing methods and apparatus for separable, general affine transformation of an image
US6516092B1 (en) 1998-05-29 2003-02-04 Cognex Corporation Robust sub-model shape-finder
US7016539B1 (en) 1998-07-13 2006-03-21 Cognex Corporation Method for fast, robust, multi-dimensional pattern recognition
US6381366B1 (en) 1998-12-18 2002-04-30 Cognex Corporation Machine vision methods and system for boundary point-based comparison of patterns and images
US6687402B1 (en) 1998-12-18 2004-02-03 Cognex Corporation Machine vision methods and systems for boundary feature comparison of patterns and images
DE19905778A1 (de) * 1999-02-12 2000-08-17 Schlafhorst & Co W Verfahren und Vorrichtung zur Bestimmung wenigstens eines Parameters eines fadenförmigen Körpers
US6684402B1 (en) 1999-12-01 2004-01-27 Cognex Technology And Investment Corporation Control methods and apparatus for coupling multiple image acquisition devices to a digital data processor
US6748104B1 (en) 2000-03-24 2004-06-08 Cognex Corporation Methods and apparatus for machine vision inspection using single and multiple templates or patterns
US7006669B1 (en) 2000-12-31 2006-02-28 Cognex Corporation Machine vision method and apparatus for thresholding images of non-uniform materials
US7190834B2 (en) * 2003-07-22 2007-03-13 Cognex Technology And Investment Corporation Methods for finding and characterizing a deformed pattern in an image
US8081820B2 (en) 2003-07-22 2011-12-20 Cognex Technology And Investment Corporation Method for partitioning a pattern into optimized sub-patterns
US7639861B2 (en) 2005-09-14 2009-12-29 Cognex Technology And Investment Corporation Method and apparatus for backlighting a wafer during alignment
US8111904B2 (en) 2005-10-07 2012-02-07 Cognex Technology And Investment Corp. Methods and apparatus for practical 3D vision system
US8162584B2 (en) 2006-08-23 2012-04-24 Cognex Corporation Method and apparatus for semiconductor wafer alignment
DE102008004731A1 (de) * 2007-09-28 2009-04-02 Vienco Gmbh Verfahren und Anordnung zur Bestimmung des Durchmessers eines laufenden Fadens
CN103971457A (zh) * 2013-01-24 2014-08-06 鸿富锦精密工业(武汉)有限公司 掉货检测系统
US9679224B2 (en) 2013-06-28 2017-06-13 Cognex Corporation Semi-supervised method for training multiple pattern recognition and registration tool models

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US2548755A (en) * 1947-12-12 1951-04-10 Standard Electronics Res Corp Optical area measuring system
US2699701A (en) * 1950-08-01 1955-01-18 Deering Milliken Res Trust Yarn diameter measuring and recording instrument
CH347358A (de) * 1954-11-18 1960-06-30 Standard Telephon & Radio Ag Vergleichsverfahren zur Prüfung mindestens einer radialen Ausdehnung eines Drahtes
US3187183A (en) * 1960-10-17 1965-06-01 Lindly & Company Inc Balanced output photoelectric gage
US3141057A (en) * 1961-02-15 1964-07-14 Gen Electric Non-contacting measuring apparatus
US3428813A (en) * 1966-05-04 1969-02-18 Jones & Laughlin Steel Corp Photodiodes and heat sensitive resistors in series controlling the same circuit
FR1590632A (jp) * 1968-06-21 1970-04-20
DE2053017A1 (de) * 1970-10-29 1972-05-04 Grundig Emv Verfahren zur berührungslosen Abstandsmessung
US3749500A (en) * 1970-12-23 1973-07-31 Gen Electric Optical caliper and edge detector-follower for automatic gaging
CH534342A (de) * 1971-07-17 1973-02-28 Bbc Brown Boveri & Cie Verfahren zur Ausmessung kleiner Objekte
US4021119A (en) * 1975-06-24 1977-05-03 Honeywell Inc. Position gauge
US4037103A (en) * 1975-08-07 1977-07-19 Exxon Research And Engineering Company Diameter measuring system for cylindrical objects

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3229264A1 (de) * 1982-08-05 1984-02-09 Dipl.-Ing. Bruno Richter GmbH & Co. Elektronische Betriebskontroll-Geräte KG, 8602 Stegaurach Optisch-elektrische messeinrichtung zum messen der lage und/oder der abmessung von gegenstaenden

Also Published As

Publication number Publication date
ES458433A1 (es) 1978-11-16
DE2718807A1 (de) 1977-11-24
US4115702A (en) 1978-09-19
SE7704821L (sv) 1977-11-06
BE854164A (fr) 1977-09-01
CA1071396A (en) 1980-02-12
FR2350581A1 (fr) 1977-12-02
IT1086177B (it) 1985-05-28
JPS52134466A (en) 1977-11-10
NL7704638A (nl) 1977-11-08
AU2458877A (en) 1978-11-02
DE2718807C2 (de) 1982-09-30
GB1555874A (en) 1979-11-14
FR2350581B1 (jp) 1980-01-18
DK184077A (da) 1977-11-06
AU505346B2 (en) 1979-11-15

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Legal Events

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PL Patent ceased