BE854164A - Appareil pour mesurer au moins d'une dimension d'un objet et procede pour la mise en oeuvre de cet appareil - Google Patents

Appareil pour mesurer au moins d'une dimension d'un objet et procede pour la mise en oeuvre de cet appareil

Info

Publication number
BE854164A
BE854164A BE1008110A BE1008110A BE854164A BE 854164 A BE854164 A BE 854164A BE 1008110 A BE1008110 A BE 1008110A BE 1008110 A BE1008110 A BE 1008110A BE 854164 A BE854164 A BE 854164A
Authority
BE
Belgium
Prior art keywords
implementing
dimension
measuring
Prior art date
Application number
BE1008110A
Other languages
English (en)
Original Assignee
Zumbach Electronic Ag
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Zumbach Electronic Ag filed Critical Zumbach Electronic Ag
Publication of BE854164A publication Critical patent/BE854164A/fr

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/08—Measuring arrangements characterised by the use of optical techniques for measuring diameters
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/08—Measuring arrangements characterised by the use of optical techniques for measuring diameters
    • G01B11/10—Measuring arrangements characterised by the use of optical techniques for measuring diameters of objects while moving
    • G01B11/105—Measuring arrangements characterised by the use of optical techniques for measuring diameters of objects while moving using photoelectric detection means

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
BE1008110A 1976-05-05 1977-05-02 Appareil pour mesurer au moins d'une dimension d'un objet et procede pour la mise en oeuvre de cet appareil BE854164A (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CH560776A CH611017A5 (fr) 1976-05-05 1976-05-05

Publications (1)

Publication Number Publication Date
BE854164A true BE854164A (fr) 1977-09-01

Family

ID=4296429

Family Applications (1)

Application Number Title Priority Date Filing Date
BE1008110A BE854164A (fr) 1976-05-05 1977-05-02 Appareil pour mesurer au moins d'une dimension d'un objet et procede pour la mise en oeuvre de cet appareil

Country Status (14)

Country Link
US (1) US4115702A (fr)
JP (1) JPS52134466A (fr)
AU (1) AU505346B2 (fr)
BE (1) BE854164A (fr)
CA (1) CA1071396A (fr)
CH (1) CH611017A5 (fr)
DE (1) DE2718807C2 (fr)
DK (1) DK184077A (fr)
ES (1) ES458433A1 (fr)
FR (1) FR2350581A1 (fr)
GB (1) GB1555874A (fr)
IT (1) IT1086177B (fr)
NL (1) NL7704638A (fr)
SE (1) SE7704821L (fr)

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US6026176A (en) 1995-07-25 2000-02-15 Cognex Corporation Machine vision methods and articles of manufacture for ball grid array inspection
US5754679A (en) * 1995-10-31 1998-05-19 Cognex Corp. Image rotating method for locating bond pads in an image
US5757956A (en) * 1995-10-31 1998-05-26 Cognex Corp. Template rotating method for locating bond pads in an image
US5845007A (en) * 1996-01-02 1998-12-01 Cognex Corporation Machine vision method and apparatus for edge-based image histogram analysis
US5872870A (en) * 1996-02-16 1999-02-16 Cognex Corporation Machine vision methods for identifying extrema of objects in rotated reference frames
US5909504A (en) * 1996-03-15 1999-06-01 Cognex Corporation Method of testing a machine vision inspection system
US6298149B1 (en) 1996-03-21 2001-10-02 Cognex Corporation Semiconductor device image inspection with contrast enhancement
US6259827B1 (en) 1996-03-21 2001-07-10 Cognex Corporation Machine vision methods for enhancing the contrast between an object and its background using multiple on-axis images
US5949901A (en) * 1996-03-21 1999-09-07 Nichani; Sanjay Semiconductor device image inspection utilizing image subtraction and threshold imaging
US5978502A (en) * 1996-04-01 1999-11-02 Cognex Corporation Machine vision methods for determining characteristics of three-dimensional objects
US6137893A (en) * 1996-10-07 2000-10-24 Cognex Corporation Machine vision calibration targets and methods of determining their location and orientation in an image
US5960125A (en) * 1996-11-21 1999-09-28 Cognex Corporation Nonfeedback-based machine vision method for determining a calibration relationship between a camera and a moveable object
US5953130A (en) * 1997-01-06 1999-09-14 Cognex Corporation Machine vision methods and apparatus for machine vision illumination of an object
US6075881A (en) * 1997-03-18 2000-06-13 Cognex Corporation Machine vision methods for identifying collinear sets of points from an image
US5974169A (en) * 1997-03-20 1999-10-26 Cognex Corporation Machine vision methods for determining characteristics of an object using boundary points and bounding regions
US6141033A (en) * 1997-05-15 2000-10-31 Cognex Corporation Bandwidth reduction of multichannel images for machine vision
US6608647B1 (en) 1997-06-24 2003-08-19 Cognex Corporation Methods and apparatus for charge coupled device image acquisition with independent integration and readout
US5978080A (en) * 1997-09-25 1999-11-02 Cognex Corporation Machine vision methods using feedback to determine an orientation, pixel width and pixel height of a field of view
US6025854A (en) * 1997-12-31 2000-02-15 Cognex Corporation Method and apparatus for high speed image acquisition
US6236769B1 (en) 1998-01-28 2001-05-22 Cognex Corporation Machine vision systems and methods for morphological transformation of an image with zero or other uniform offsets
US6282328B1 (en) 1998-01-28 2001-08-28 Cognex Corporation Machine vision systems and methods for morphological transformation of an image with non-uniform offsets
US6215915B1 (en) 1998-02-20 2001-04-10 Cognex Corporation Image processing methods and apparatus for separable, general affine transformation of an image
US6381375B1 (en) 1998-02-20 2002-04-30 Cognex Corporation Methods and apparatus for generating a projection of an image
US6516092B1 (en) 1998-05-29 2003-02-04 Cognex Corporation Robust sub-model shape-finder
US7016539B1 (en) 1998-07-13 2006-03-21 Cognex Corporation Method for fast, robust, multi-dimensional pattern recognition
US6381366B1 (en) 1998-12-18 2002-04-30 Cognex Corporation Machine vision methods and system for boundary point-based comparison of patterns and images
US6687402B1 (en) 1998-12-18 2004-02-03 Cognex Corporation Machine vision methods and systems for boundary feature comparison of patterns and images
DE19905778A1 (de) * 1999-02-12 2000-08-17 Schlafhorst & Co W Verfahren und Vorrichtung zur Bestimmung wenigstens eines Parameters eines fadenförmigen Körpers
US6684402B1 (en) 1999-12-01 2004-01-27 Cognex Technology And Investment Corporation Control methods and apparatus for coupling multiple image acquisition devices to a digital data processor
US6748104B1 (en) 2000-03-24 2004-06-08 Cognex Corporation Methods and apparatus for machine vision inspection using single and multiple templates or patterns
US7006669B1 (en) 2000-12-31 2006-02-28 Cognex Corporation Machine vision method and apparatus for thresholding images of non-uniform materials
US7190834B2 (en) 2003-07-22 2007-03-13 Cognex Technology And Investment Corporation Methods for finding and characterizing a deformed pattern in an image
US8081820B2 (en) * 2003-07-22 2011-12-20 Cognex Technology And Investment Corporation Method for partitioning a pattern into optimized sub-patterns
US7639861B2 (en) 2005-09-14 2009-12-29 Cognex Technology And Investment Corporation Method and apparatus for backlighting a wafer during alignment
US8111904B2 (en) 2005-10-07 2012-02-07 Cognex Technology And Investment Corp. Methods and apparatus for practical 3D vision system
US8162584B2 (en) 2006-08-23 2012-04-24 Cognex Corporation Method and apparatus for semiconductor wafer alignment
DE102008004731A1 (de) * 2007-09-28 2009-04-02 Vienco Gmbh Verfahren und Anordnung zur Bestimmung des Durchmessers eines laufenden Fadens
CN103971457A (zh) * 2013-01-24 2014-08-06 鸿富锦精密工业(武汉)有限公司 掉货检测系统
US9679224B2 (en) 2013-06-28 2017-06-13 Cognex Corporation Semi-supervised method for training multiple pattern recognition and registration tool models

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US2548755A (en) * 1947-12-12 1951-04-10 Standard Electronics Res Corp Optical area measuring system
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Also Published As

Publication number Publication date
FR2350581A1 (fr) 1977-12-02
SE7704821L (sv) 1977-11-06
GB1555874A (en) 1979-11-14
DE2718807C2 (de) 1982-09-30
DK184077A (da) 1977-11-06
JPS52134466A (en) 1977-11-10
DE2718807A1 (de) 1977-11-24
NL7704638A (nl) 1977-11-08
FR2350581B1 (fr) 1980-01-18
ES458433A1 (es) 1978-11-16
CA1071396A (fr) 1980-02-12
AU505346B2 (en) 1979-11-15
IT1086177B (it) 1985-05-28
CH611017A5 (fr) 1979-05-15
AU2458877A (en) 1978-11-02
US4115702A (en) 1978-09-19

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Legal Events

Date Code Title Description
RE Patent lapsed

Owner name: ZUMBACH ELECTRONIC A.G.

Effective date: 19930531