CH610440A5 - - Google Patents

Info

Publication number
CH610440A5
CH610440A5 CH1636275A CH1636275A CH610440A5 CH 610440 A5 CH610440 A5 CH 610440A5 CH 1636275 A CH1636275 A CH 1636275A CH 1636275 A CH1636275 A CH 1636275A CH 610440 A5 CH610440 A5 CH 610440A5
Authority
CH
Switzerland
Application number
CH1636275A
Inventor
James T Mckinney
Original Assignee
Minnesota Mining & Mfg
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Minnesota Mining & Mfg filed Critical Minnesota Mining & Mfg
Publication of CH610440A5 publication Critical patent/CH610440A5/xx

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/14—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers
    • H01J49/147—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers with electrons, e.g. electron impact ionisation, electron attachment

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
CH1636275A 1974-12-23 1975-12-17 CH610440A5 (en:Method)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US05/535,805 US3939344A (en) 1974-12-23 1974-12-23 Prefilter-ionizer apparatus for use with quadrupole type secondary-ion mass spectrometers

Publications (1)

Publication Number Publication Date
CH610440A5 true CH610440A5 (en:Method) 1979-04-12

Family

ID=24135839

Family Applications (1)

Application Number Title Priority Date Filing Date
CH1636275A CH610440A5 (en:Method) 1974-12-23 1975-12-17

Country Status (6)

Country Link
US (1) US3939344A (en:Method)
JP (1) JPS5829578B2 (en:Method)
CH (1) CH610440A5 (en:Method)
DE (1) DE2558107A1 (en:Method)
FR (1) FR2296262A1 (en:Method)
GB (1) GB1537250A (en:Method)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3636127A1 (de) * 1985-10-24 1987-04-30 Mds Health Group Ltd Vorrichtung zum richten eines ionensignales in ein massenanalysiergeraet in einer vakuumkammer

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4075479A (en) * 1976-03-04 1978-02-21 Finnigan Corporation Focusing ion lens system for mass spectrometer for separating charged and neutral particles
US4107526A (en) * 1976-03-22 1978-08-15 Minnesota Mining And Manufacturing Company Ion scattering spectrometer with modified bias
US4481415A (en) * 1982-10-27 1984-11-06 Shimadzu Corporation Quadrupole mass spectrometer
US4719349A (en) * 1986-05-27 1988-01-12 The United States Of America As Represented By The Department Of Health And Human Services Electrochemical sample probe for use in fast-atom bombardment mass spectrometry
US4814613A (en) * 1987-03-06 1989-03-21 Extrel Corporation Collision cell for triple quadrupole tandem mass spectrometry
US4800273A (en) * 1988-01-07 1989-01-24 Phillips Bradway F Secondary ion mass spectrometer
JPH02304854A (ja) * 1989-05-19 1990-12-18 Jeol Ltd 同時検出型質量分析装置
US5313061A (en) * 1989-06-06 1994-05-17 Viking Instrument Miniaturized mass spectrometer system
DE69028304T2 (de) * 1989-06-06 1997-04-24 Viking Instr Corp Miniaturisiertes massenspektrometersystem
US4968888A (en) * 1989-07-05 1990-11-06 The United States Of America As Represented By The United States Department Of Energy Pulsed field sample neutralization
DE19511333C1 (de) * 1995-03-28 1996-08-08 Bruker Franzen Analytik Gmbh Verfahren und Vorrichtung für orthogonalen Einschuß von Ionen in ein Flugzeit-Massenspektrometer
US5596193A (en) * 1995-10-11 1997-01-21 California Institute Of Technology Miniature quadrupole mass spectrometer array
US8796638B2 (en) 2011-06-08 2014-08-05 Mks Instruments, Inc. Mass spectrometry for a gas analysis with a two-stage charged particle deflector lens between a charged particle source and a charged particle analyzer both offset from a central axis of the deflector lens
US8796620B2 (en) 2011-06-08 2014-08-05 Mks Instruments, Inc. Mass spectrometry for gas analysis with a one-stage charged particle deflector lens between a charged particle source and a charged particle analyzer both offset from a central axis of the deflector lens
US8450681B2 (en) 2011-06-08 2013-05-28 Mks Instruments, Inc. Mass spectrometry for gas analysis in which both a charged particle source and a charged particle analyzer are offset from an axis of a deflector lens, resulting in reduced baseline signal offsets

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3473018A (en) * 1967-03-02 1969-10-14 Bell & Howell Co Mass analyzer using two spaced,tubular,and coaxial electrodes
DE2255302C3 (de) * 1972-11-11 1980-09-11 Leybold-Heraeus Gmbh, 5000 Koeln Einrichtung für die Sekundär-Ionen-Massenspektroskopie

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3636127A1 (de) * 1985-10-24 1987-04-30 Mds Health Group Ltd Vorrichtung zum richten eines ionensignales in ein massenanalysiergeraet in einer vakuumkammer

Also Published As

Publication number Publication date
JPS5189492A (en:Method) 1976-08-05
FR2296262B1 (en:Method) 1981-09-18
GB1537250A (en) 1978-12-29
DE2558107A1 (de) 1976-06-24
JPS5829578B2 (ja) 1983-06-23
FR2296262A1 (fr) 1976-07-23
US3939344A (en) 1976-02-17

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Legal Events

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