CH609149A5 - - Google Patents

Info

Publication number
CH609149A5
CH609149A5 CH1291976A CH1291976A CH609149A5 CH 609149 A5 CH609149 A5 CH 609149A5 CH 1291976 A CH1291976 A CH 1291976A CH 1291976 A CH1291976 A CH 1291976A CH 609149 A5 CH609149 A5 CH 609149A5
Authority
CH
Switzerland
Application number
CH1291976A
Inventor
Alfons Dipl Ing Spies
Original Assignee
Heidenhain Gmbh Dr Johannes
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from DE19752547478 external-priority patent/DE2547478C2/de
Priority claimed from DE19762625489 external-priority patent/DE2625489C2/de
Application filed by Heidenhain Gmbh Dr Johannes filed Critical Heidenhain Gmbh Dr Johannes
Publication of CH609149A5 publication Critical patent/CH609149A5/xx

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
    • G01B11/306—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces for measuring evenness
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B5/00—Measuring arrangements characterised by the use of mechanical techniques
    • G01B5/0002—Arrangements for supporting, fixing or guiding the measuring instrument or the object to be measured
    • G01B5/0009—Guiding surfaces; Arrangements compensating for non-linearity there-of

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Nonlinear Science (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
CH1291976A 1975-10-23 1976-10-13 CH609149A5 (it)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE19752547478 DE2547478C2 (de) 1975-10-23 1975-10-23 Meßanordnung
DE19762625489 DE2625489C2 (de) 1976-06-05 1976-06-05 Anordnung zum feststellen der abweichungen von der geradheit oder ebenheit von teilen

Publications (1)

Publication Number Publication Date
CH609149A5 true CH609149A5 (it) 1979-02-15

Family

ID=25769542

Family Applications (1)

Application Number Title Priority Date Filing Date
CH1291976A CH609149A5 (it) 1975-10-23 1976-10-13

Country Status (5)

Country Link
US (1) US4120093A (it)
JP (1) JPS5284763A (it)
CH (1) CH609149A5 (it)
FR (1) FR2328943A1 (it)
GB (1) GB1571397A (it)

Families Citing this family (28)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4213245A (en) * 1977-02-08 1980-07-22 British Steel Corporation Profile gauging
BE871628A (fr) * 1977-11-02 1979-02-15 British Steel Corp Perfectionnements a la mesure de profils
US4274205A (en) * 1979-04-23 1981-06-23 General Electric Company Measuring fixture
US4338722A (en) * 1980-06-16 1982-07-13 Microlec, S.A. Optoelectronic displacement sensor
FR2531205A1 (fr) * 1982-07-29 1984-02-03 Commissariat Energie Atomique Dispositif de palpage a laser pour controle dimensionnel
US4608763A (en) * 1983-06-14 1986-09-02 Gte Valeron Corporation Probe
JPH0615970B2 (ja) * 1987-09-01 1994-03-02 三菱重工業株式会社 ロールプロフィール計測方法
US5205046A (en) * 1991-06-05 1993-04-27 Ford Motor Company Method for measuring surface waviness
US5343627A (en) * 1993-05-24 1994-09-06 Hesseltine Dennis R Method and means for measuring squareness of plate structures
US5749452A (en) * 1995-07-27 1998-05-12 R.A. Hanson Company, Inc. Mobile conveyor including alignment system
ATE230103T1 (de) * 1996-10-11 2003-01-15 Heidenhain Gmbh Dr Johannes Massstab einer längenmesseinrichtung sowie verfahren zur anbringung eines massstabs
GB2332056B (en) * 1997-12-04 2000-08-09 Taylor Hobson Ltd Surface measuring apparatus
ATE220971T1 (de) 1998-04-25 2002-08-15 Inst Fertigungstechnik Der Tu Messvorrichtung zum messen der positionier- und bahngenauigkeit eines bewegten maschinenteils
DE19826875A1 (de) 1998-06-17 1999-12-23 Heidenhain Gmbh Dr Johannes Numerische Steuerung mit einem räumlich getrennten Eingabegerät
DE10119018A1 (de) * 2001-04-18 2002-10-24 Emhart Llc Newark Positionier- und/oder Montagehilfe sowie dementsprechendes Verfahren
GB2422015B (en) 2005-02-01 2007-02-28 Taylor Hobson Ltd A metrological instrument
ITMI20081252A1 (it) * 2008-07-10 2010-01-11 Ficep Spa Procedimento e dispositivo per il posizionamento di un pezzo rispetto ad un utensile
US7894079B1 (en) 2009-11-09 2011-02-22 Mitutoyo Corporation Linear displacement sensor using a position sensitive photodetector
US8400643B2 (en) 2011-04-15 2013-03-19 Mitutoyo Corporation Displacement sensor using multiple position sensitive photodetectors
TWM446323U (zh) * 2012-08-03 2013-02-01 Ind Tech Res Inst 開口率量測感知裝置、開口距離感知裝置及光感測模組
ES2694043T3 (es) * 2016-04-05 2018-12-17 Dr. Johannes Heidenhain Gmbh Dispositivo de medición de longitud
PL3443378T3 (pl) * 2017-06-30 2021-06-14 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Urządzenie do bezdotykowego określania prostoliniowości co najmniej jednego produktu podłużnego i sposób kalibracji takiego urządzenia
RU188304U1 (ru) * 2018-04-24 2019-04-05 Федеральное государственное бюджетное образовательное учреждение высшего образования "Череповецкий государственный университет" Измеритель неплоскостности листового проката
CN112146562B (zh) * 2020-09-22 2022-05-13 安徽广毅达精密科技有限公司 一种电容变控的新材料用表面平整度检测仪
CN112757631B (zh) * 2020-12-21 2022-11-11 深圳市创想三维科技股份有限公司 一种3d打印机的自动调平装置及3d打印机
CN114894129B (zh) * 2022-05-16 2024-02-02 杨帅 一种公路沥青路面维护用平整度测量装置
FR3140427A1 (fr) * 2022-09-29 2024-04-05 Saint-Gobain Glass France Système de mesure de la planéité d’un substrat
CN117190925B (zh) * 2023-11-07 2024-01-23 成都鱼凫城产实业有限公司 一种建筑施工用的检测设备

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3208151A (en) * 1962-03-27 1965-09-28 Rank Precision Ind Ltd Testing of surface straightness
GB1195240A (en) * 1967-12-18 1970-06-17 Rank Organisation Ltd Improvements in Surface Measuring Apparatus
US3750299A (en) * 1969-01-22 1973-08-07 Plasser Bahnbaumasch Franz Track apparatus with laser beam reference
US3675233A (en) * 1969-09-05 1972-07-04 Odon Steven Bencsics Light reference system for railroad track surveying
FR2088675A5 (it) * 1970-04-21 1972-01-07 Thomson Csf

Also Published As

Publication number Publication date
US4120093A (en) 1978-10-17
JPS5284763A (en) 1977-07-14
FR2328943B1 (it) 1980-10-24
FR2328943A1 (fr) 1977-05-20
GB1571397A (en) 1980-07-16

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Legal Events

Date Code Title Description
PL Patent ceased