CH608628A5 - - Google Patents

Info

Publication number
CH608628A5
CH608628A5 CH1325176A CH1325176A CH608628A5 CH 608628 A5 CH608628 A5 CH 608628A5 CH 1325176 A CH1325176 A CH 1325176A CH 1325176 A CH1325176 A CH 1325176A CH 608628 A5 CH608628 A5 CH 608628A5
Authority
CH
Switzerland
Application number
CH1325176A
Inventor
Erwin Sick
Angelika Staimer
Original Assignee
Sick Optik Elektronik Erwin
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from DE19752552333 external-priority patent/DE2552333C3/de
Priority claimed from DE19752552331 external-priority patent/DE2552331C3/de
Priority claimed from DE19752552332 external-priority patent/DE2552332C3/de
Application filed by Sick Optik Elektronik Erwin filed Critical Sick Optik Elektronik Erwin
Publication of CH608628A5 publication Critical patent/CH608628A5/xx

Links

Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B26/00—Optical devices or arrangements for the control of light using movable or deformable optical elements
    • G02B26/08—Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light
    • G02B26/10—Scanning systems
    • G02B26/12—Scanning systems using multifaceted mirrors
    • G02B26/129—Systems in which the scanning light beam is repeatedly reflected from the polygonal mirror
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8901—Optical details; Scanning details
CH1325176A 1975-11-21 1976-10-20 CH608628A5 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
DE19752552333 DE2552333C3 (de) 1975-11-21 1975-11-21 Vorrichtung zur Vereinigung von von einem linearen Abtastfeld ausgehendem Licht auf einem Empfanger
DE19752552331 DE2552331C3 (de) 1975-11-21 1975-11-21 Abtastvorrichtung
DE19752552332 DE2552332C3 (de) 1975-11-21 1975-11-21 Abtastvorrichtung

Publications (1)

Publication Number Publication Date
CH608628A5 true CH608628A5 (ja) 1979-01-15

Family

ID=27186627

Family Applications (1)

Application Number Title Priority Date Filing Date
CH1325176A CH608628A5 (ja) 1975-11-21 1976-10-20

Country Status (8)

Country Link
US (1) US4108533A (ja)
JP (1) JPS5264945A (ja)
CA (1) CA1060689A (ja)
CH (1) CH608628A5 (ja)
FI (1) FI763195A (ja)
FR (1) FR2332548A1 (ja)
GB (1) GB1532269A (ja)
SE (1) SE7612949L (ja)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2827704C3 (de) * 1978-06-23 1981-03-19 Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch Optische Vorrichtung zur Bestimmung der Lichtaustrittswinkel
DE3000352C2 (de) * 1980-01-07 1986-07-24 Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch Optoelektronisches Überwachungsgerät
US4397521A (en) * 1980-09-29 1983-08-09 Xerox Corporation Double pass optical system for raster scanners
US4522497A (en) * 1981-06-17 1985-06-11 Ciba Geigy Ag Web scanning apparatus
US4630276A (en) * 1984-10-09 1986-12-16 Aeronca Electronics, Inc. Compact laser scanning system
US5448364A (en) * 1993-03-22 1995-09-05 Estek Corporation Particle detection system with reflective line-to-spot collector
JP3257646B2 (ja) * 1993-04-05 2002-02-18 富士ゼロックス株式会社 レーザービームプリンター
US5892214A (en) * 1996-11-20 1999-04-06 Ncr Corporation Low profile planar scanner

Family Cites Families (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CA617188A (en) * 1961-03-28 The American Brass Company Detecting surface conditions of sheet materials
GB250268A (en) * 1925-04-04 1926-07-29 Isao Kitajima Improvements in lenses
US2644361A (en) * 1946-09-30 1953-07-07 Us Navy Projection plotting lens and optical system
US3062965A (en) * 1959-07-31 1962-11-06 Sick Erwin Photoelectric scanning device
NL279127A (ja) * 1961-05-31
US3138650A (en) * 1962-01-22 1964-06-23 Texas Instruments Inc Optical system
US3345120A (en) * 1963-09-06 1967-10-03 Robert B Palmer Light spot apparatus
US3360659A (en) * 1964-04-23 1967-12-26 Outlook Engineering Corp Compensated optical scanning system
DE1240681B (de) * 1964-11-14 1967-05-18 Eltro G M B H & Co Ges Fuer St Optisches System zur Aussendung und zum Empfang von elektromagnetischer Strahlung
GB1303041A (ja) * 1969-01-17 1973-01-17
NL7103141A (ja) * 1970-03-11 1971-09-14
CH536523A (de) * 1971-03-22 1973-04-30 Zellweger Uster Ag Lesevorrichtung für optisch erkennbare Zeichen
AT338544B (de) * 1971-07-30 1977-08-25 Gao Ges Automation Org Einrichtung zum erkennen von fehlern in papierbahnen
DE2145665A1 (de) * 1971-09-13 1973-03-22 Licentia Gmbh Anordnung zur erfassung von oberflaechenfehlern bei bahnen mit metallisch reflektierender oberflaeche
GB1436124A (en) * 1972-07-29 1976-05-19 Ferranti Ltd Detection of blemishes in surfaces
US3917414A (en) * 1973-10-11 1975-11-04 Geisco Associates Optical inspection system
DE2433683C3 (de) * 1974-07-12 1979-02-22 Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch Vorrichtung zur Überwachung einer Materialbahn auf Fehlstellen

Also Published As

Publication number Publication date
GB1532269A (en) 1978-11-15
JPS5264945A (en) 1977-05-28
US4108533A (en) 1978-08-22
FI763195A (ja) 1977-05-22
CA1060689A (en) 1979-08-21
SE7612949L (sv) 1977-05-22
FR2332548A1 (fr) 1977-06-17

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Legal Events

Date Code Title Description
PL Patent ceased