CH608099A5 - - Google Patents

Info

Publication number
CH608099A5
CH608099A5 CH724576A CH724576A CH608099A5 CH 608099 A5 CH608099 A5 CH 608099A5 CH 724576 A CH724576 A CH 724576A CH 724576 A CH724576 A CH 724576A CH 608099 A5 CH608099 A5 CH 608099A5
Authority
CH
Switzerland
Application number
CH724576A
Inventor
Erwin Sick
Original Assignee
Sick Optik Elektronik Erwin
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sick Optik Elektronik Erwin filed Critical Sick Optik Elektronik Erwin
Publication of CH608099A5 publication Critical patent/CH608099A5/xx

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/89Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8901Optical details; Scanning details
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/30Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Textile Engineering (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
CH724576A 1975-07-21 1976-06-09 CH608099A5 (sv)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE2532603A DE2532603C3 (de) 1975-07-21 1975-07-21 Optische Vorrichtung zur Bestimmung des Lichtaustrittswinkels

Publications (1)

Publication Number Publication Date
CH608099A5 true CH608099A5 (sv) 1978-12-15

Family

ID=5952079

Family Applications (1)

Application Number Title Priority Date Filing Date
CH724576A CH608099A5 (sv) 1975-07-21 1976-06-09

Country Status (8)

Country Link
US (1) US4085322A (sv)
JP (1) JPS5215358A (sv)
CH (1) CH608099A5 (sv)
DE (1) DE2532603C3 (sv)
FR (1) FR2319127A1 (sv)
GB (1) GB1555236A (sv)
IT (1) IT1063714B (sv)
SE (1) SE430829B (sv)

Families Citing this family (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2550815C3 (de) * 1975-11-12 1979-05-31 Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch Optisches Abtastsystem
DE2654465C3 (de) * 1976-12-01 1981-12-03 Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch Mischkammer in Form eines innen verspiegelten optischen Kanals
DE2700027C3 (de) * 1977-01-03 1979-09-20 Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch Lichtleitstab
DE2727927C3 (de) * 1977-06-21 1980-01-24 Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch Vorrichtung zur getrennten Erfassung von Lichtstrahlen
DE2827705C3 (de) * 1978-06-23 1981-07-30 Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch Gerät zur Feststellung von Fehlern an Bahnmaterial
DE3000352C2 (de) * 1980-01-07 1986-07-24 Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch Optoelektronisches Überwachungsgerät
DE3006072C2 (de) * 1980-02-19 1984-11-29 Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch Fehlstellenermittlungsvorrichtung für Materialbahnen
DE3006071C2 (de) * 1980-02-19 1987-05-27 Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch Lichtsammelanordnung in einer Vorrichtung zur Abtastung einer Fläche wie z.B. einer Materialbahn längs einer Geraden mittels eines Lichtstrahls
US4311357A (en) * 1980-09-08 1982-01-19 Raymus K. Payton Annular scanning light pulse system
DE3037622A1 (de) * 1980-10-04 1982-04-22 Theodor Prof. Dr.-Ing. 1000 Berlin Gast Optoelektronisches messverfahren und einrichtungen zum bestimmen der oberflaechenguete streuend reflektierender oberflaechen
DE3044314C2 (de) * 1980-11-25 1986-08-14 kabelmetal electro GmbH, 3000 Hannover Gehäuse zur Aufnahme von mit Wärme erzeugenden elektronischen Bauteilen bestückten gedruckten Schaltungen
GB2117897B (en) * 1982-03-03 1986-04-16 Sira Ltd Detecting surface defects
DE3232885A1 (de) * 1982-09-04 1984-03-08 Robert Bosch Gmbh, 7000 Stuttgart Verfahren zur automatischen pruefung von oberflaechen
US4620230A (en) * 1984-09-24 1986-10-28 The Boeing Company Display system
JPH0627901B2 (ja) * 1985-03-11 1994-04-13 富士写真フイルム株式会社 半導体レ−ザ光源装置
DE3800543A1 (de) * 1988-01-12 1989-07-20 Feldmuehle Ag Vorrichtung zum pruefen von sich mit hoher geschwindigkeit bewegenden bahnfoermigen flaechengebilden
US6509964B2 (en) 2001-05-15 2003-01-21 Amt Inc. Multi-beam apparatus for measuring surface quality
JP3961530B2 (ja) * 2003-05-23 2007-08-22 富士通株式会社 光学素子、光伝送ユニット及び光伝送システム
CN115930850B (zh) * 2023-02-06 2023-05-30 宜科(天津)电子有限公司 一种检测物体表面粗糙度的数据处理系统

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2946253A (en) * 1955-10-31 1960-07-26 Jr Melville Clark Photoelectric apparatus for generating musical tones
DE1211421C2 (de) * 1963-12-12 1973-11-15 Vorrichtung zur abtastung von durchlaufendem gut
US3322032A (en) * 1965-03-26 1967-05-30 Sam L Leach Image display device
DE1962594A1 (de) * 1969-12-13 1971-06-24 Licentia Gmbh Vorrichtung zum Abtasten von bogen- oder bandfoermigem,durchlaufendem Gut
US3728548A (en) * 1971-04-01 1973-04-17 Sick Optik Elektronik Erwin Device for measuring the intensity of a scanning light beam by means of a light conducting rod
US3860814A (en) * 1971-11-15 1975-01-14 Daniel M Klang Light collecting and transmitting apparatus
US3884217A (en) * 1972-09-20 1975-05-20 Ecothermia Inc Method and apparatus for collecting solar energy

Also Published As

Publication number Publication date
DE2532603B2 (de) 1978-04-13
US4085322A (en) 1978-04-18
SE7608141L (sv) 1977-01-22
FR2319127B1 (sv) 1980-07-18
JPS5611084B2 (sv) 1981-03-12
DE2532603C3 (de) 1978-12-14
DE2532603A1 (de) 1977-01-27
FR2319127A1 (fr) 1977-02-18
GB1555236A (en) 1979-11-07
SE430829B (sv) 1983-12-12
JPS5215358A (en) 1977-02-04
IT1063714B (it) 1985-02-11

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Legal Events

Date Code Title Description
PL Patent ceased