CH607043A5CH896675ACH896675ACH607043A5CH 607043 A5CH607043 A5CH 607043A5CH 896675 ACH896675 ACH 896675ACH 896675 ACH896675 ACH 896675ACH 607043 A5CH607043 A5CH 607043A5
Authority
CH
Switzerland
Application number
CH896675A
Inventor
Stanislav Vasilievic Ugolnikov
Stanislav Petrovich Kosach
Vladimir Davydovich Kaplun
Valentin Ivanovich Zhitnik
Anatoly Yakovlevich Bulgakov
Original Assignee
Stanislav Vasilievic Ugolnikov
Stanislav Petrovich Kosach
Vladimir Davydovich Kaplun
Zhitnik Valentin I
Anatoly Yakovlevich Bulgakov
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from SU742085403Aexternal-prioritypatent/SU716132A2/ru
Application filed by Stanislav Vasilievic Ugolnikov, Stanislav Petrovich Kosach, Vladimir Davydovich Kaplun, Zhitnik Valentin I, Anatoly Yakovlevich BulgakovfiledCriticalStanislav Vasilievic Ugolnikov
Publication of CH607043A5publicationCriticalpatent/CH607043A5/xx
G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
G01R31/26—Testing of individual semiconductor devices
G01R31/27—Testing of devices without physical removal from the circuit of which they form part, e.g. compensating for effects surrounding elements
G01R31/275—Testing of devices without physical removal from the circuit of which they form part, e.g. compensating for effects surrounding elements for testing individual semiconductor components within integrated circuits