CH607043A5 - - Google Patents

Info

Publication number
CH607043A5
CH607043A5 CH896675A CH896675A CH607043A5 CH 607043 A5 CH607043 A5 CH 607043A5 CH 896675 A CH896675 A CH 896675A CH 896675 A CH896675 A CH 896675A CH 607043 A5 CH607043 A5 CH 607043A5
Authority
CH
Switzerland
Application number
CH896675A
Inventor
Stanislav Vasilievic Ugolnikov
Stanislav Petrovich Kosach
Vladimir Davydovich Kaplun
Valentin Ivanovich Zhitnik
Anatoly Yakovlevich Bulgakov
Original Assignee
Stanislav Vasilievic Ugolnikov
Stanislav Petrovich Kosach
Vladimir Davydovich Kaplun
Zhitnik Valentin I
Anatoly Yakovlevich Bulgakov
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from SU742085403A external-priority patent/SU716132A2/ru
Application filed by Stanislav Vasilievic Ugolnikov, Stanislav Petrovich Kosach, Vladimir Davydovich Kaplun, Zhitnik Valentin I, Anatoly Yakovlevich Bulgakov filed Critical Stanislav Vasilievic Ugolnikov
Publication of CH607043A5 publication Critical patent/CH607043A5/xx

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/27—Testing of devices without physical removal from the circuit of which they form part, e.g. compensating for effects surrounding elements
    • G01R31/275—Testing of devices without physical removal from the circuit of which they form part, e.g. compensating for effects surrounding elements for testing individual semiconductor components within integrated circuits
CH896675A 1974-10-31 1975-07-09 CH607043A5 (xx)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
SU2071547 1974-10-31
SU742085403A SU716132A2 (ru) 1974-12-30 1974-12-30 Устройство дл измерени параметров сложных электрических цепей

Publications (1)

Publication Number Publication Date
CH607043A5 true CH607043A5 (xx) 1978-11-30

Family

ID=26665538

Family Applications (1)

Application Number Title Priority Date Filing Date
CH896675A CH607043A5 (xx) 1974-10-31 1975-07-09

Country Status (4)

Country Link
JP (1) JPS5221872A (xx)
CH (1) CH607043A5 (xx)
DD (1) DD120719A1 (xx)
DE (1) DE2533332A1 (xx)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2935585C2 (de) * 1979-09-04 1982-04-08 Dürkoppwerke GmbH, 4800 Bielefeld Schaltungsanordnung zur mit Gleichspannung durchführbaren Durchgangsprüfung
FR2495331A1 (fr) * 1980-11-28 1982-06-04 Soguintel Detecteur de defauts sur photocoupleur

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3636440A (en) * 1970-05-27 1972-01-18 Systomation Inc Isolation-guarding measuring instrument for in-circuit component testing

Also Published As

Publication number Publication date
DE2533332A1 (de) 1976-05-06
JPS5221872A (en) 1977-02-18
DD120719A1 (xx) 1976-06-20

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Legal Events

Date Code Title Description
PL Patent ceased