CH594892A5 - - Google Patents
Info
- Publication number
- CH594892A5 CH594892A5 CH1533776A CH1533776A CH594892A5 CH 594892 A5 CH594892 A5 CH 594892A5 CH 1533776 A CH1533776 A CH 1533776A CH 1533776 A CH1533776 A CH 1533776A CH 594892 A5 CH594892 A5 CH 594892A5
- Authority
- CH
- Switzerland
Links
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R33/00—Arrangements or instruments for measuring magnetic variables
- G01R33/12—Measuring magnetic properties of articles or specimens of solids or fluids
- G01R33/1238—Measuring superconductive properties
- G01R33/1246—Measuring critical current
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
- G01R31/58—Testing of lines, cables or conductors
- G01R31/59—Testing of lines, cables or conductors while the cable continuously passes the testing apparatus, e.g. during manufacture
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S505/00—Superconductor technology: apparatus, material, process
- Y10S505/825—Apparatus per se, device per se, or process of making or operating same
- Y10S505/842—Measuring and testing
- Y10S505/843—Electrical
- Y10S505/845—Magnetometer
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
- Measuring Magnetic Variables (AREA)
- Superconductors And Manufacturing Methods Therefor (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE2606504A DE2606504C3 (de) | 1976-02-18 | 1976-02-18 | Verfahren und Vorrichtung zur kontinuierlichen, kontaktlosen Prüfung eines langgestreckten, wenigstens teilweise aus Supraleitermaterial bestehenden Leiters |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CH594892A5 true CH594892A5 (US08124317-20120228-C00038.png) | 1978-01-31 |
Family
ID=5970212
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CH1533776A CH594892A5 (US08124317-20120228-C00038.png) | 1976-02-18 | 1976-12-07 |
Country Status (6)
Families Citing this family (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5030614A (en) * | 1987-05-15 | 1991-07-09 | Omega Engineering, Inc. | Superconductor sensors |
| DE19612613C2 (de) * | 1996-03-29 | 1999-12-16 | Karlsruhe Forschzent | Verfahren zur Bestimmung des kritischen Stromes I¶c¶ von Supraleitern und Meßeinrichtung zur Durchführung des Verfahrens |
| DE19717283C1 (de) * | 1997-04-24 | 1998-04-23 | Karlsruhe Forschzent | Verfahren zur kontaktfreien, longitudinalen und transversalen Homogenitätsuntersuchung der kritischen Stromdiche j¶c¶ in Band-Supraleitern und eine Meßapparatur zur Durchführung des Verfahrens |
| US6841988B1 (en) | 1998-07-16 | 2005-01-11 | American Superconductor Corporation | Method for the determination of the critical current for a conductor including superconducting material, and an apparatus for performing the method |
| EP1105744B1 (en) * | 1998-07-16 | 2002-09-18 | Nordic Superconductor Technologies A/S | A method for the determination of the critical current for a conductor including superconducting material, and an apparatus for performing the method |
| JP4579107B2 (ja) * | 2005-09-06 | 2010-11-10 | 財団法人国際超電導産業技術研究センター | 連続型磁束観察装置および方法 |
| US8085053B2 (en) * | 2008-12-23 | 2011-12-27 | Biosense Webster, Inc. | Twisted-pair electrical cable testing |
Family Cites Families (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| GB574618A (en) * | 1944-02-09 | 1946-01-14 | Victor Planer | Means for the determination of the eccentricity of the conductor with regard to the dielectric in insulated wires and cables |
| US3500181A (en) * | 1967-04-21 | 1970-03-10 | Armco Steel Corp | Eddy current flow detection apparatus utilizing a plurality of circumferential sensors |
| DE2431505C2 (de) * | 1974-07-01 | 1975-11-27 | Siemens Ag, 1000 Berlin Und 8000 Muenchen | Verfahren und Vorrichtung zur kontinuierlichen, kontaktlosen Prüfung eines langgestreckten, wenigstens teilweise aus Supraleitermaterial bestehenden Leiters |
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1976
- 1976-02-18 DE DE2606504A patent/DE2606504C3/de not_active Expired
- 1976-12-07 CH CH1533776A patent/CH594892A5/xx unknown
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1977
- 1977-01-21 US US05/760,988 patent/US4132949A/en not_active Expired - Lifetime
- 1977-02-07 FR FR7703342A patent/FR2357908A2/fr active Pending
- 1977-02-10 JP JP1403177A patent/JPS52100283A/ja active Pending
- 1977-02-14 GB GB6133/77A patent/GB1508565A/en not_active Expired
Also Published As
| Publication number | Publication date |
|---|---|
| GB1508565A (en) | 1978-04-26 |
| FR2357908A2 (fr) | 1978-02-03 |
| DE2606504B2 (de) | 1977-12-15 |
| DE2606504A1 (de) | 1977-08-25 |
| DE2606504C3 (de) | 1978-08-17 |
| JPS52100283A (en) | 1977-08-23 |
| US4132949A (en) | 1979-01-02 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PLZ | Patent of addition ceased |