CH557598A - DEVICE FOR SECONDARY ION MASS SPECTROSCOPY. - Google Patents

DEVICE FOR SECONDARY ION MASS SPECTROSCOPY.

Info

Publication number
CH557598A
CH557598A CH1574373A CH1574373A CH557598A CH 557598 A CH557598 A CH 557598A CH 1574373 A CH1574373 A CH 1574373A CH 1574373 A CH1574373 A CH 1574373A CH 557598 A CH557598 A CH 557598A
Authority
CH
Switzerland
Prior art keywords
mass spectroscopy
ion mass
secondary ion
spectroscopy
mass
Prior art date
Application number
CH1574373A
Other languages
German (de)
Original Assignee
Leybold Heraeus Verwaltung
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Leybold Heraeus Verwaltung filed Critical Leybold Heraeus Verwaltung
Publication of CH557598A publication Critical patent/CH557598A/en

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/06—Electron- or ion-optical arrangements
    • H01J49/067—Ion lenses, apertures, skimmers
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/004—Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0431—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for liquid samples
    • H01J49/044—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for liquid samples with means for preventing droplets from entering the analyzer; Desolvation of droplets
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
    • H01J49/4205—Device types
    • H01J49/421—Mass filters, i.e. deviating unwanted ions without trapping
    • H01J49/4215—Quadrupole mass filters
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/44—Energy spectrometers, e.g. alpha-, beta-spectrometers
    • H01J49/46—Static spectrometers
    • H01J49/48—Static spectrometers using electrostatic analysers, e.g. cylindrical sector, Wien filter

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
CH1574373A 1972-11-11 1973-11-09 DEVICE FOR SECONDARY ION MASS SPECTROSCOPY. CH557598A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE2255302A DE2255302C3 (en) 1972-11-11 1972-11-11 Equipment for secondary ion mass spectroscopy

Publications (1)

Publication Number Publication Date
CH557598A true CH557598A (en) 1974-12-31

Family

ID=5861444

Family Applications (1)

Application Number Title Priority Date Filing Date
CH1574373A CH557598A (en) 1972-11-11 1973-11-09 DEVICE FOR SECONDARY ION MASS SPECTROSCOPY.

Country Status (5)

Country Link
US (1) US3859226A (en)
CH (1) CH557598A (en)
DE (1) DE2255302C3 (en)
FR (1) FR2206579B1 (en)
GB (1) GB1399588A (en)

Families Citing this family (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CH583460A5 (en) * 1974-09-30 1976-12-31 Balzers Patent Beteilig Ag
US3939344A (en) * 1974-12-23 1976-02-17 Minnesota Mining And Manufacturing Company Prefilter-ionizer apparatus for use with quadrupole type secondary-ion mass spectrometers
US4058724A (en) * 1975-06-27 1977-11-15 Minnesota Mining And Manufacturing Company Ion Scattering spectrometer with two analyzers preferably in tandem
DE2534665C2 (en) * 1975-08-02 1985-09-05 Leybold-Heraeus GmbH, 5000 Köln Mass spectroscopic facility
DE2540505A1 (en) * 1975-09-11 1977-03-24 Leybold Heraeus Gmbh & Co Kg FLIGHT TIME MASS SPECTROMETERS FOR IONS WITH DIFFERENT ENERGIES
DE2556291C3 (en) * 1975-12-13 1980-11-27 Gesellschaft Fuer Strahlen- Und Umweltforschung Mbh, 8000 Muenchen Scanning ion microscope
US4075479A (en) * 1976-03-04 1978-02-21 Finnigan Corporation Focusing ion lens system for mass spectrometer for separating charged and neutral particles
DE2753412C2 (en) * 1977-11-30 1983-06-23 Max Planck Gesellschaft zur Förderung der Wissenschaften e.V., 3400 Göttingen Rotationally symmetrical ion-electron converter
DE2947542A1 (en) * 1979-11-26 1981-06-04 Leybold-Heraeus GmbH, 5000 Köln DEVICE FOR MONITORING AND / OR CONTROLLING PLASMA PROCESSES
DE3048392A1 (en) * 1980-12-22 1982-07-22 Leybold-Heraeus GmbH, 5000 Köln Lens system for charged particles analyser - has second grid behind grid at earth potential, at potential safeguarding particles acceleration
US4442354A (en) * 1982-01-22 1984-04-10 Atom Sciences, Inc. Sputter initiated resonance ionization spectrometry
US4556794A (en) * 1985-01-30 1985-12-03 Hughes Aircraft Company Secondary ion collection and transport system for ion microprobe
CA1245778A (en) * 1985-10-24 1988-11-29 John B. French Mass analyzer system with reduced drift
GB9204524D0 (en) * 1992-03-03 1992-04-15 Fisons Plc Mass spectrometer
GB9219457D0 (en) * 1992-09-15 1992-10-28 Fisons Plc Reducing interferences in plasma source mass spectrometers
CA2828967C (en) 2011-03-04 2018-07-10 Perkinelmer Health Sciences, Inc. Electrostatic lenses and systems including the same
US8461524B2 (en) * 2011-03-28 2013-06-11 Thermo Finnigan Llc Ion guide with improved gas dynamics and combined noise reduction device
DE102012200211A1 (en) * 2012-01-09 2013-07-11 Carl Zeiss Nts Gmbh Device and method for surface treatment of a substrate
CN105849857A (en) * 2013-12-31 2016-08-10 Dh科技发展私人贸易有限公司 Ion guide for mass spectrometry

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3501630A (en) * 1969-03-17 1970-03-17 Bell & Howell Co Mass filter with removable auxiliary electrode

Also Published As

Publication number Publication date
GB1399588A (en) 1975-07-02
DE2255302B2 (en) 1980-01-17
DE2255302C3 (en) 1980-09-11
FR2206579B1 (en) 1978-03-10
FR2206579A1 (en) 1974-06-07
US3859226A (en) 1975-01-07
DE2255302A1 (en) 1974-05-22

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Legal Events

Date Code Title Description
PL Patent ceased