CH530001A - Device for determining the properties of a sample by analyzing the radiation emitted by the sample as a result of radiation bombardment - Google Patents

Device for determining the properties of a sample by analyzing the radiation emitted by the sample as a result of radiation bombardment

Info

Publication number
CH530001A
CH530001A CH1377971A CH1377971A CH530001A CH 530001 A CH530001 A CH 530001A CH 1377971 A CH1377971 A CH 1377971A CH 1377971 A CH1377971 A CH 1377971A CH 530001 A CH530001 A CH 530001A
Authority
CH
Switzerland
Prior art keywords
sample
radiation
analyzing
properties
determining
Prior art date
Application number
CH1377971A
Other languages
German (de)
Inventor
James Taylor Norman
Karl Mann Joseph
Wilder Atwood Allen
Original Assignee
Varian Associates
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Varian Associates filed Critical Varian Associates
Publication of CH530001A publication Critical patent/CH530001A/en

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/44—Energy spectrometers, e.g. alpha-, beta-spectrometers
    • H01J49/46—Static spectrometers
    • H01J49/48—Static spectrometers using electrostatic analysers, e.g. cylindrical sector, Wien filter
    • H01J49/482—Static spectrometers using electrostatic analysers, e.g. cylindrical sector, Wien filter with cylindrical mirrors
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/252—Tubes for spot-analysing by electron or ion beams; Microanalysers

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
CH1377971A 1970-09-28 1971-09-21 Device for determining the properties of a sample by analyzing the radiation emitted by the sample as a result of radiation bombardment CH530001A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US7586070A 1970-09-28 1970-09-28

Publications (1)

Publication Number Publication Date
CH530001A true CH530001A (en) 1972-10-31

Family

ID=22128438

Family Applications (1)

Application Number Title Priority Date Filing Date
CH1377971A CH530001A (en) 1970-09-28 1971-09-21 Device for determining the properties of a sample by analyzing the radiation emitted by the sample as a result of radiation bombardment

Country Status (5)

Country Link
US (1) US3686501A (en)
CH (1) CH530001A (en)
DE (1) DE2145017A1 (en)
FR (1) FR2108598A5 (en)
IT (1) IT938849B (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3742214A (en) * 1971-10-18 1973-06-26 Varian Associates Apparatus for performing chemical analysis by electron spectroscopy
US3761721A (en) * 1972-07-06 1973-09-25 Trw Inc Matter wave interferometric apparatus

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2348030A (en) * 1941-04-30 1944-05-02 Rca Corp Scanning type of electron microscope
US2405306A (en) * 1944-01-31 1946-08-06 Rca Corp Electronic microanalyzer monitoring
DE1137573B (en) * 1961-06-26 1962-10-04 Ernst Buerkel Method and device for aligning a sighting device on radiating objects

Also Published As

Publication number Publication date
FR2108598A5 (en) 1972-05-19
IT938849B (en) 1973-02-10
US3686501A (en) 1972-08-22
DE2145017A1 (en) 1972-04-06

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Legal Events

Date Code Title Description
PL Patent ceased