CH510251A - Verfahren zur zerstörungsfreien, automatischen Messung der mittleren Exzentrizität des Schweissdrahtes gegenüber dem Schweisspulvermantel an bewegten Schweisselektroden mit Hilfe von Röntgenstrahlabsorption - Google Patents

Verfahren zur zerstörungsfreien, automatischen Messung der mittleren Exzentrizität des Schweissdrahtes gegenüber dem Schweisspulvermantel an bewegten Schweisselektroden mit Hilfe von Röntgenstrahlabsorption

Info

Publication number
CH510251A
CH510251A CH840070A CH840070A CH510251A CH 510251 A CH510251 A CH 510251A CH 840070 A CH840070 A CH 840070A CH 840070 A CH840070 A CH 840070A CH 510251 A CH510251 A CH 510251A
Authority
CH
Switzerland
Prior art keywords
welding
destructive
aid
relation
powder coating
Prior art date
Application number
CH840070A
Other languages
English (en)
Inventor
Gloor Karl Dr Dipl-Ing
Eugen Dipl Phys Halter
Original Assignee
Oerlikon Buehrle Elektroden
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Oerlikon Buehrle Elektroden filed Critical Oerlikon Buehrle Elektroden
Priority to CH840070A priority Critical patent/CH510251A/de
Priority to DE2122738A priority patent/DE2122738C3/de
Priority to GB1846271*[A priority patent/GB1357592A/en
Priority to US00149759A priority patent/US3770959A/en
Publication of CH510251A publication Critical patent/CH510251A/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/18—Investigating the presence of flaws defects or foreign matter
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B15/00—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/083—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F7/00—Methods or arrangements for processing data by operating upon the order or content of the data handled
    • G06F7/60—Methods or arrangements for performing computations using a digital non-denominational number representation, i.e. number representation without radix; Computing devices using combinations of denominational and non-denominational quantity representations, e.g. using difunction pulse trains, STEELE computers, phase computers
    • G06F7/62—Performing operations exclusively by counting total number of pulses ; Multiplication, division or derived operations using combined denominational and incremental processing by counters, i.e. without column shift

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Health & Medical Sciences (AREA)
  • Pathology (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Immunology (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Theoretical Computer Science (AREA)
  • Computing Systems (AREA)
  • Computational Mathematics (AREA)
  • Mathematical Analysis (AREA)
  • Mathematical Optimization (AREA)
  • Mathematical Physics (AREA)
  • Pure & Applied Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • Toxicology (AREA)
  • Electromagnetism (AREA)
  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
CH840070A 1970-06-04 1970-06-04 Verfahren zur zerstörungsfreien, automatischen Messung der mittleren Exzentrizität des Schweissdrahtes gegenüber dem Schweisspulvermantel an bewegten Schweisselektroden mit Hilfe von Röntgenstrahlabsorption CH510251A (de)

Priority Applications (4)

Application Number Priority Date Filing Date Title
CH840070A CH510251A (de) 1970-06-04 1970-06-04 Verfahren zur zerstörungsfreien, automatischen Messung der mittleren Exzentrizität des Schweissdrahtes gegenüber dem Schweisspulvermantel an bewegten Schweisselektroden mit Hilfe von Röntgenstrahlabsorption
DE2122738A DE2122738C3 (de) 1970-06-04 1971-05-07 Verfahren zur zerstörungsfreien Messung der Exzentrizität eines metallenen Stabkernes gegenüber einer äußeren Umhüllung anderer Materialdichte
GB1846271*[A GB1357592A (en) 1970-06-04 1971-06-01 Monitoring eccentricities of members having an interior
US00149759A US3770959A (en) 1970-06-04 1971-06-03 Methods and means for monitoring eccentricities of coaxial members

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CH840070A CH510251A (de) 1970-06-04 1970-06-04 Verfahren zur zerstörungsfreien, automatischen Messung der mittleren Exzentrizität des Schweissdrahtes gegenüber dem Schweisspulvermantel an bewegten Schweisselektroden mit Hilfe von Röntgenstrahlabsorption

Publications (1)

Publication Number Publication Date
CH510251A true CH510251A (de) 1971-07-15

Family

ID=4339738

Family Applications (1)

Application Number Title Priority Date Filing Date
CH840070A CH510251A (de) 1970-06-04 1970-06-04 Verfahren zur zerstörungsfreien, automatischen Messung der mittleren Exzentrizität des Schweissdrahtes gegenüber dem Schweisspulvermantel an bewegten Schweisselektroden mit Hilfe von Röntgenstrahlabsorption

Country Status (4)

Country Link
US (1) US3770959A (de)
CH (1) CH510251A (de)
DE (1) DE2122738C3 (de)
GB (1) GB1357592A (de)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6600806B1 (en) * 1999-06-02 2003-07-29 Rochester Gasand Electric Corporation System for radiographic determination of pipe wall thickness
CN107806809A (zh) * 2017-10-30 2018-03-16 浙江精雷电器股份有限公司 一种偏心距采集检测设备

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3148279A (en) * 1961-05-04 1964-09-08 Western Electric Co Radiation method of measuring sheath thickness and eccentricity
US3390769A (en) * 1966-11-23 1968-07-02 Continental Can Co X-ray thickness gauging and classifying apparatus
US3609368A (en) * 1968-04-09 1971-09-28 Oberspree Kabelwerke Veb K Apparatus and method for checking the diameter of elongated structures
US3611408A (en) * 1969-04-07 1971-10-05 Industrial Nucleonics Corp Digital setup apparatus for radiation gauging and controlling systems
US3654468A (en) * 1970-03-11 1972-04-04 Industrial Nucleonics Corp Radiation measurement system with mosfet electrometer circuit which is protected against voltage transients

Also Published As

Publication number Publication date
DE2122738C3 (de) 1975-09-11
US3770959A (en) 1973-11-06
GB1357592A (en) 1974-06-26
DE2122738B2 (de) 1975-01-23
DE2122738A1 (de) 1971-12-16

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