CH506070A - Sonde électrique réglable - Google Patents

Sonde électrique réglable

Info

Publication number
CH506070A
CH506070A CH1865769A CH1865769A CH506070A CH 506070 A CH506070 A CH 506070A CH 1865769 A CH1865769 A CH 1865769A CH 1865769 A CH1865769 A CH 1865769A CH 506070 A CH506070 A CH 506070A
Authority
CH
Switzerland
Prior art keywords
adjustable electric
electric probe
probe
adjustable
electric
Prior art date
Application number
CH1865769A
Other languages
English (en)
Inventor
Kulischenko Walter
A Burke Joseph
Original Assignee
Pennwalt Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Pennwalt Corp filed Critical Pennwalt Corp
Publication of CH506070A publication Critical patent/CH506070A/fr

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23D—PLANING; SLOTTING; SHEARING; BROACHING; SAWING; FILING; SCRAPING; LIKE OPERATIONS FOR WORKING METAL BY REMOVING MATERIAL, NOT OTHERWISE PROVIDED FOR
    • B23D61/00—Tools for sawing machines or sawing devices; Clamping devices for these tools
    • B23D61/18—Sawing tools of special type, e.g. wire saw strands, saw blades or saw wire equipped with diamonds or other abrasive particles in selected individual positions
    • B23D61/185—Saw wires; Saw cables; Twisted saw strips
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07342—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being at an angle other than perpendicular to test object, e.g. probe card
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01C—RESISTORS
    • H01C17/00—Apparatus or processes specially adapted for manufacturing resistors
    • H01C17/22—Apparatus or processes specially adapted for manufacturing resistors adapted for trimming
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01C—RESISTORS
    • H01C17/00—Apparatus or processes specially adapted for manufacturing resistors
    • H01C17/22—Apparatus or processes specially adapted for manufacturing resistors adapted for trimming
    • H01C17/24—Apparatus or processes specially adapted for manufacturing resistors adapted for trimming by removing or adding resistive material
    • H01C17/245—Apparatus or processes specially adapted for manufacturing resistors adapted for trimming by removing or adding resistive material by mechanical means, e.g. sand blasting, cutting, ultrasonic treatment
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R11/00—Individual connecting elements providing two or more spaced connecting locations for conductive members which are, or may be, thereby interconnected, e.g. end pieces for wires or cables supported by the wire or cable and having means for facilitating electrical connection to some other wire, terminal, or conductive member, blocks of binding posts
    • H01R11/11—End pieces or tapping pieces for wires, supported by the wire and for facilitating electrical connection to some other wire, terminal or conductive member
    • H01R11/18—End pieces terminating in a probe

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Mechanical Engineering (AREA)
  • Measuring Leads Or Probes (AREA)
CH1865769A 1968-10-01 1969-12-15 Sonde électrique réglable CH506070A (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US78411668A 1968-10-01 1968-10-01

Publications (1)

Publication Number Publication Date
CH506070A true CH506070A (fr) 1971-04-15

Family

ID=25131395

Family Applications (2)

Application Number Title Priority Date Filing Date
CH1475869A CH502172A (fr) 1968-10-01 1969-10-01 Scie à câble sans fin pour pierres dures
CH1865769A CH506070A (fr) 1968-10-01 1969-12-15 Sonde électrique réglable

Family Applications Before (1)

Application Number Title Priority Date Filing Date
CH1475869A CH502172A (fr) 1968-10-01 1969-10-01 Scie à câble sans fin pour pierres dures

Country Status (8)

Country Link
US (1) US3551807A (fr)
BE (1) BE743180A (fr)
CH (2) CH502172A (fr)
DE (1) DE1962446A1 (fr)
FR (1) FR2026236A1 (fr)
GB (1) GB1232175A (fr)
NL (1) NL6917977A (fr)
SE (1) SE358242B (fr)

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3810017A (en) * 1972-05-15 1974-05-07 Teledyne Inc Precision probe for testing micro-electronic units
US4034293A (en) * 1974-03-04 1977-07-05 Electroglas, Inc. Micro-circuit test probe
US4056777A (en) * 1974-08-14 1977-11-01 Electroglas, Inc. Microcircuit test device with multi-axes probe control
US4123706A (en) * 1975-03-03 1978-10-31 Electroglas, Inc. Probe construction
DE3628104A1 (de) * 1986-08-19 1988-02-25 Feinmetall Gmbh Kontaktelement fuer pruefkarten
US4956923A (en) * 1989-11-06 1990-09-18 The Micromanipulator Co., Inc. Probe assembly including touchdown sensor
DE4101920A1 (de) * 1991-01-23 1992-07-30 Ehlermann Eckhard Pruefvorrichtung fuer integrierte schaltkreise
US5446393A (en) * 1993-05-21 1995-08-29 Schaefer; Richard K. Electrical measuring and testing probe having a malleable shaft facilitating positioning of a contact pin
JP2003084009A (ja) * 2001-09-11 2003-03-19 Umc Japan テスト用ピンユニット
US6897668B1 (en) * 2003-11-28 2005-05-24 Premtek International Inc. Double-faced detecting devices for an electronic substrate
US20050200369A1 (en) * 2004-03-12 2005-09-15 Andre Langevin Resistance metering device having probes on bar clamps
US10954606B2 (en) 2018-06-27 2021-03-23 Globalwafers Co., Ltd. Methods for modeling the impurity concentration of a single crystal silicon ingot
US11047066B2 (en) * 2018-06-27 2021-06-29 Globalwafers Co., Ltd. Growth of plural sample rods to determine impurity build-up during production of single crystal silicon ingots
US10830793B2 (en) * 2019-01-29 2020-11-10 Kuan-Hung Chen Deflecting device for a probe
WO2024081107A1 (fr) * 2022-10-12 2024-04-18 Macom Technology Solutions Holdings, Inc. Sonde à ressort à lames à bobine acoustique

Also Published As

Publication number Publication date
NL6917977A (fr) 1970-06-18
DE1962446A1 (de) 1970-07-02
FR2026236A1 (fr) 1970-09-18
CH502172A (fr) 1971-01-31
US3551807A (en) 1970-12-29
GB1232175A (fr) 1971-05-19
BE743180A (fr) 1970-06-16
SE358242B (fr) 1973-07-23

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Legal Events

Date Code Title Description
PL Patent ceased