CH506070A - Sonde électrique réglable - Google Patents
Sonde électrique réglableInfo
- Publication number
- CH506070A CH506070A CH1865769A CH1865769A CH506070A CH 506070 A CH506070 A CH 506070A CH 1865769 A CH1865769 A CH 1865769A CH 1865769 A CH1865769 A CH 1865769A CH 506070 A CH506070 A CH 506070A
- Authority
- CH
- Switzerland
- Prior art keywords
- adjustable electric
- electric probe
- probe
- adjustable
- electric
- Prior art date
Links
- 239000000523 sample Substances 0.000 title 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23D—PLANING; SLOTTING; SHEARING; BROACHING; SAWING; FILING; SCRAPING; LIKE OPERATIONS FOR WORKING METAL BY REMOVING MATERIAL, NOT OTHERWISE PROVIDED FOR
- B23D61/00—Tools for sawing machines or sawing devices; Clamping devices for these tools
- B23D61/18—Sawing tools of special type, e.g. wire saw strands, saw blades or saw wire equipped with diamonds or other abrasive particles in selected individual positions
- B23D61/185—Saw wires; Saw cables; Twisted saw strips
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
- G01R1/07342—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being at an angle other than perpendicular to test object, e.g. probe card
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01C—RESISTORS
- H01C17/00—Apparatus or processes specially adapted for manufacturing resistors
- H01C17/22—Apparatus or processes specially adapted for manufacturing resistors adapted for trimming
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01C—RESISTORS
- H01C17/00—Apparatus or processes specially adapted for manufacturing resistors
- H01C17/22—Apparatus or processes specially adapted for manufacturing resistors adapted for trimming
- H01C17/24—Apparatus or processes specially adapted for manufacturing resistors adapted for trimming by removing or adding resistive material
- H01C17/245—Apparatus or processes specially adapted for manufacturing resistors adapted for trimming by removing or adding resistive material by mechanical means, e.g. sand blasting, cutting, ultrasonic treatment
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R11/00—Individual connecting elements providing two or more spaced connecting locations for conductive members which are, or may be, thereby interconnected, e.g. end pieces for wires or cables supported by the wire or cable and having means for facilitating electrical connection to some other wire, terminal, or conductive member, blocks of binding posts
- H01R11/11—End pieces or tapping pieces for wires, supported by the wire and for facilitating electrical connection to some other wire, terminal or conductive member
- H01R11/18—End pieces terminating in a probe
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Mechanical Engineering (AREA)
- Measuring Leads Or Probes (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US78411668A | 1968-10-01 | 1968-10-01 |
Publications (1)
Publication Number | Publication Date |
---|---|
CH506070A true CH506070A (fr) | 1971-04-15 |
Family
ID=25131395
Family Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CH1475869A CH502172A (fr) | 1968-10-01 | 1969-10-01 | Scie à câble sans fin pour pierres dures |
CH1865769A CH506070A (fr) | 1968-10-01 | 1969-12-15 | Sonde électrique réglable |
Family Applications Before (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CH1475869A CH502172A (fr) | 1968-10-01 | 1969-10-01 | Scie à câble sans fin pour pierres dures |
Country Status (8)
Country | Link |
---|---|
US (1) | US3551807A (fr) |
BE (1) | BE743180A (fr) |
CH (2) | CH502172A (fr) |
DE (1) | DE1962446A1 (fr) |
FR (1) | FR2026236A1 (fr) |
GB (1) | GB1232175A (fr) |
NL (1) | NL6917977A (fr) |
SE (1) | SE358242B (fr) |
Families Citing this family (15)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3810017A (en) * | 1972-05-15 | 1974-05-07 | Teledyne Inc | Precision probe for testing micro-electronic units |
US4034293A (en) * | 1974-03-04 | 1977-07-05 | Electroglas, Inc. | Micro-circuit test probe |
US4056777A (en) * | 1974-08-14 | 1977-11-01 | Electroglas, Inc. | Microcircuit test device with multi-axes probe control |
US4123706A (en) * | 1975-03-03 | 1978-10-31 | Electroglas, Inc. | Probe construction |
DE3628104A1 (de) * | 1986-08-19 | 1988-02-25 | Feinmetall Gmbh | Kontaktelement fuer pruefkarten |
US4956923A (en) * | 1989-11-06 | 1990-09-18 | The Micromanipulator Co., Inc. | Probe assembly including touchdown sensor |
DE4101920A1 (de) * | 1991-01-23 | 1992-07-30 | Ehlermann Eckhard | Pruefvorrichtung fuer integrierte schaltkreise |
US5446393A (en) * | 1993-05-21 | 1995-08-29 | Schaefer; Richard K. | Electrical measuring and testing probe having a malleable shaft facilitating positioning of a contact pin |
JP2003084009A (ja) * | 2001-09-11 | 2003-03-19 | Umc Japan | テスト用ピンユニット |
US6897668B1 (en) * | 2003-11-28 | 2005-05-24 | Premtek International Inc. | Double-faced detecting devices for an electronic substrate |
US20050200369A1 (en) * | 2004-03-12 | 2005-09-15 | Andre Langevin | Resistance metering device having probes on bar clamps |
US11047066B2 (en) * | 2018-06-27 | 2021-06-29 | Globalwafers Co., Ltd. | Growth of plural sample rods to determine impurity build-up during production of single crystal silicon ingots |
US10954606B2 (en) | 2018-06-27 | 2021-03-23 | Globalwafers Co., Ltd. | Methods for modeling the impurity concentration of a single crystal silicon ingot |
US10830793B2 (en) * | 2019-01-29 | 2020-11-10 | Kuan-Hung Chen | Deflecting device for a probe |
WO2024081107A1 (fr) * | 2022-10-12 | 2024-04-18 | Macom Technology Solutions Holdings, Inc. | Sonde à ressort à lames à bobine acoustique |
-
1968
- 1968-12-16 US US784116A patent/US3551807A/en not_active Expired - Lifetime
-
1969
- 1969-10-01 CH CH1475869A patent/CH502172A/fr not_active IP Right Cessation
- 1969-11-24 GB GB1232175D patent/GB1232175A/en not_active Expired
- 1969-11-28 NL NL6917977A patent/NL6917977A/xx unknown
- 1969-12-12 DE DE19691962446 patent/DE1962446A1/de active Pending
- 1969-12-15 SE SE17283/69A patent/SE358242B/xx unknown
- 1969-12-15 FR FR6943306A patent/FR2026236A1/fr not_active Withdrawn
- 1969-12-15 CH CH1865769A patent/CH506070A/fr not_active IP Right Cessation
- 1969-12-16 BE BE743180D patent/BE743180A/xx unknown
Also Published As
Publication number | Publication date |
---|---|
FR2026236A1 (fr) | 1970-09-18 |
SE358242B (fr) | 1973-07-23 |
BE743180A (fr) | 1970-06-16 |
CH502172A (fr) | 1971-01-31 |
US3551807A (en) | 1970-12-29 |
NL6917977A (fr) | 1970-06-18 |
GB1232175A (fr) | 1971-05-19 |
DE1962446A1 (de) | 1970-07-02 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
PL | Patent ceased |