CH485217A - Method for automatic focusing of X-ray spectrometers - Google Patents

Method for automatic focusing of X-ray spectrometers

Info

Publication number
CH485217A
CH485217A CH1383568A CH1383568A CH485217A CH 485217 A CH485217 A CH 485217A CH 1383568 A CH1383568 A CH 1383568A CH 1383568 A CH1383568 A CH 1383568A CH 485217 A CH485217 A CH 485217A
Authority
CH
Switzerland
Prior art keywords
automatic focusing
ray spectrometers
spectrometers
ray
focusing
Prior art date
Application number
CH1383568A
Other languages
German (de)
Inventor
Gerhard Dr Doerfler
Original Assignee
Gerhard Dr Doerfler
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Gerhard Dr Doerfler filed Critical Gerhard Dr Doerfler
Publication of CH485217A publication Critical patent/CH485217A/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/225—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material using electron or ion
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
    • G01N23/2076—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions for spectrometry, i.e. using an analysing crystal, e.g. for measuring X-ray fluorescence spectrum of a sample with wavelength-dispersion, i.e. WDXFS

Landscapes

  • Chemical & Material Sciences (AREA)
  • Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Dispersion Chemistry (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
CH1383568A 1967-10-24 1968-09-16 Method for automatic focusing of X-ray spectrometers CH485217A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
AT958367A AT289428B (en) 1967-10-24 1967-10-24 Device for automatic focusing of X-ray spectrometers for electron beam microprobes

Publications (1)

Publication Number Publication Date
CH485217A true CH485217A (en) 1970-01-31

Family

ID=3615445

Family Applications (1)

Application Number Title Priority Date Filing Date
CH1383568A CH485217A (en) 1967-10-24 1968-09-16 Method for automatic focusing of X-ray spectrometers

Country Status (7)

Country Link
US (1) US3612861A (en)
AT (1) AT289428B (en)
CH (1) CH485217A (en)
DE (1) DE1801656A1 (en)
FR (1) FR1589853A (en)
GB (1) GB1236987A (en)
NL (1) NL6815217A (en)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3898455A (en) * 1973-11-12 1975-08-05 Jr Thomas C Furnas X-ray monochromatic and focusing system
US4028547A (en) * 1975-06-30 1977-06-07 Bell Telephone Laboratories, Incorporated X-ray photolithography
US4697080A (en) * 1986-01-06 1987-09-29 The United States Of America As Represented By The United States Department Of Energy Analysis with electron microscope of multielement samples using pure element standards
RU2419088C1 (en) * 2010-02-01 2011-05-20 Учреждение Российской академии наук Физический институт им. П.Н. Лебедева РАН (ФИАН) X-ray spectrometer

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR1366011A (en) * 1963-04-25 1964-07-10 Cie D Applic Mecaniques A L El Electronic Probe Microanalyzer Scanning Improvements

Also Published As

Publication number Publication date
GB1236987A (en) 1971-06-23
FR1589853A (en) 1970-04-06
NL6815217A (en) 1969-04-28
US3612861A (en) 1971-10-12
DE1801656A1 (en) 1969-06-26
DE1801656B2 (en) 1970-09-17
AT289428B (en) 1971-04-26

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Legal Events

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