CH450737A - Vorrichtung zum Messen der Dicke der Wasserschicht auf Oberflächen - Google Patents

Vorrichtung zum Messen der Dicke der Wasserschicht auf Oberflächen

Info

Publication number
CH450737A
CH450737A CH813665A CH813665A CH450737A CH 450737 A CH450737 A CH 450737A CH 813665 A CH813665 A CH 813665A CH 813665 A CH813665 A CH 813665A CH 450737 A CH450737 A CH 450737A
Authority
CH
Switzerland
Prior art keywords
measuring
thickness
water layer
layer
water
Prior art date
Application number
CH813665A
Other languages
English (en)
Inventor
Kammueller Reiner Ing Dr
Wirz Burkhardt Ing Dr
Original Assignee
Roland Offsetmaschf
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority to DE19641303819D priority Critical patent/DE1303819C2/de
Priority to US458969A priority patent/US3439175A/en
Priority to GB22524/65A priority patent/GB1075205A/en
Application filed by Roland Offsetmaschf filed Critical Roland Offsetmaschf
Priority to CH813665A priority patent/CH450737A/de
Publication of CH450737A publication Critical patent/CH450737A/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J3/42—Absorption spectrometry; Double beam spectrometry; Flicker spectrometry; Reflection spectrometry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
    • G01B11/0616—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating
    • G01B11/0625—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating with measurement of absorption or reflection
    • G01B11/0633—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating with measurement of absorption or reflection using one or more discrete wavelengths
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/314—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry with comparison of measurements at specific and non-specific wavelengths
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N21/3554—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for determining moisture content

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Analytical Chemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
CH813665A 1964-05-29 1965-06-11 Vorrichtung zum Messen der Dicke der Wasserschicht auf Oberflächen CH450737A (de)

Priority Applications (4)

Application Number Priority Date Filing Date Title
DE19641303819D DE1303819C2 (de) 1964-05-29 1964-05-29 Vorrichtung zum messen einer schichtdicke auf oberflaechen
US458969A US3439175A (en) 1964-05-29 1965-05-26 Measuring device for measuring a layer of liquid on a surface
GB22524/65A GB1075205A (en) 1964-05-29 1965-05-27 Measuring moisture layers
CH813665A CH450737A (de) 1964-05-29 1965-06-11 Vorrichtung zum Messen der Dicke der Wasserschicht auf Oberflächen

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DER0037986 1964-05-29
CH813665A CH450737A (de) 1964-05-29 1965-06-11 Vorrichtung zum Messen der Dicke der Wasserschicht auf Oberflächen

Publications (1)

Publication Number Publication Date
CH450737A true CH450737A (de) 1968-01-31

Family

ID=25702847

Family Applications (1)

Application Number Title Priority Date Filing Date
CH813665A CH450737A (de) 1964-05-29 1965-06-11 Vorrichtung zum Messen der Dicke der Wasserschicht auf Oberflächen

Country Status (4)

Country Link
US (1) US3439175A (de)
CH (1) CH450737A (de)
DE (1) DE1303819C2 (de)
GB (1) GB1075205A (de)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2236710A1 (de) * 1971-07-26 1973-03-22 Vickers Ltd Verfahren und vorrichtung zum ermitteln der auf einer benetzten flaeche vorhandenen fluessigkeitsmenge

Families Citing this family (26)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3564265A (en) * 1967-12-18 1971-02-16 Bayer Ag Apparatus for detecting and locating streaks on moving webs in the production of photographic papers and films
AU406591B2 (en) * 1968-05-10 1970-10-02 The Commonwealth Of Australia Thickness control system for multilayer optical thin film work
JPS4838363B1 (de) * 1969-06-09 1973-11-16
CH484479A (de) * 1969-06-12 1970-01-15 Landis & Gyr Ag Vorrichtung zur optischen Echtheitsprüfung von Banknoten und anderen Wertzeichen
US3744916A (en) * 1971-06-08 1973-07-10 Us Navy Optical film thickness monitor
JPS4852611A (de) * 1971-11-05 1973-07-24
US3737237A (en) * 1971-11-18 1973-06-05 Nasa Monitoring deposition of films
GB1438634A (en) * 1972-09-12 1976-06-09 Vickers Ltd Printing
US3869211A (en) * 1972-06-29 1975-03-04 Canon Kk Instrument for measuring thickness of thin film
US3916789A (en) * 1972-09-12 1975-11-04 Vickers Ltd Printing
US4052937A (en) * 1972-09-12 1977-10-11 Vickers Limited Printing plate water sensing means and method
US3981238A (en) * 1972-09-27 1976-09-21 European Rotogravure Association Method and apparatus for determining doctor blade position in a rotogravure process
US3841215A (en) * 1972-10-20 1974-10-15 Ricoh Kk Method and apparatus for control of the supply of ink for offset duplicating machines
US4151796A (en) * 1973-04-02 1979-05-01 Heidelberger Druckmaschinen Aktiengesellschaft Device for automatically controlling deviations in liquid feed in offset presses
US3910701A (en) * 1973-07-30 1975-10-07 George R Henderson Method and apparatus for measuring light reflectance absorption and or transmission
GB1484999A (en) * 1973-11-29 1977-09-08 Vickers Ltd Printing
IT1033240B (it) * 1974-03-14 1979-07-10 Grapho Metronic Gmbh & Co Umidificatore in una macchina stampatrice offset con un dispositivo per la regolazione del quantitativo d acqua sulla piastra
DE3113674A1 (de) * 1981-04-04 1982-10-14 Grapho-Metronic Meß- und Regeltechnik GmbH & Co, KG, 8000 München Vorrichtung zum messen der feuchtmittelmenge auf der druckplatte einer offset-druckmaschine
DE3205941C2 (de) * 1982-02-19 1986-10-30 Forschungsgesellschaft Druckmaschinen E.V., 6000 Frankfurt Vorrichtung zur berührungslosen meßtechnischen Erfassung des Flüssigkeitstransports durch Walzenspalte in Farb- oder Feuchtwerken von Druckmaschinen
DE3220282C3 (de) * 1982-05-28 1995-05-18 Roland Man Druckmasch Vorrichtung zum betrieblichen Erfassen eines Maßes für die Feuchtmittelmenge auf der rotierenden Druckplatte in Offset-Druckmaschinen
DE3238704A1 (de) * 1982-10-19 1984-04-19 Grapho Metronic Meß- und Regeltechnik GmbH & Co KG, 8000 München Vorrichtung zum gewinnen eines masses fuer die feuchtmittelschichtdicke auf offsetdruckplatten
DE3326698A1 (de) * 1983-07-23 1985-02-07 Heidelberger Druckmaschinen Ag, 6900 Heidelberg Vorrichtung zur zonenweisen messtechnischen kontrolle der feuchtmittelfuehrung im druckwerk einer offsetdruckmaschine
US4677298A (en) * 1983-12-13 1987-06-30 Kollmorgen Technologies Corporation Method of monitoring ink-water balance on a lithographic printing press
DE4133359C2 (de) * 1991-10-09 1997-01-02 Porsche Ag Verfahren zur Messung der Dicke einer auf einer Fahrbahn vorhandenen Wasserschicht und Verwendung einer Vorrichtung hierfür
DE19855957B4 (de) * 1998-12-04 2008-10-30 Henkel Ag & Co. Kgaa Automatische Kontrolle der Hydrophilie einer festen Oberfläche mit Infrarotspektroskopie
TWI676083B (zh) * 2013-09-25 2019-11-01 荷蘭商Ａｓｍｌ荷蘭公司 光束傳遞裝置及方法

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US1450061A (en) * 1920-08-06 1923-03-27 William W Coblentz Optical method for producing pulsating electric current
US2656845A (en) * 1948-03-06 1953-10-27 Fmc Corp Apparatus for testing and controlling the concentration of solutions
US3016464A (en) * 1959-06-10 1962-01-09 Daystrom Inc Apparatus for determining the location and thickness of a reflecting object
US3211908A (en) * 1961-07-19 1965-10-12 Michael R Liebowitz Spectrum discriminating radiation detector
US3325649A (en) * 1964-08-28 1967-06-13 Polaroid Corp Radiation responsive apparatus for monitoring a web

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2236710A1 (de) * 1971-07-26 1973-03-22 Vickers Ltd Verfahren und vorrichtung zum ermitteln der auf einer benetzten flaeche vorhandenen fluessigkeitsmenge

Also Published As

Publication number Publication date
DE1303819B (de) 1972-12-21
DE1303819C2 (de) 1973-07-12
GB1075205A (en) 1967-07-12
US3439175A (en) 1969-04-15

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