CH398092A - Device for comparing a test specimen with a masterpiece - Google Patents

Device for comparing a test specimen with a masterpiece

Info

Publication number
CH398092A
CH398092A CH824462A CH824462A CH398092A CH 398092 A CH398092 A CH 398092A CH 824462 A CH824462 A CH 824462A CH 824462 A CH824462 A CH 824462A CH 398092 A CH398092 A CH 398092A
Authority
CH
Switzerland
Prior art keywords
masterpiece
comparing
test specimen
specimen
test
Prior art date
Application number
CH824462A
Other languages
German (de)
Inventor
Sick Erwin
Original Assignee
Sick Erwin
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sick Erwin filed Critical Sick Erwin
Publication of CH398092A publication Critical patent/CH398092A/en

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/24Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/95Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/956Inspecting patterns on the surface of objects
    • G01N21/95607Inspecting patterns on the surface of objects using a comparative method
    • GPHYSICS
    • G04HOROLOGY
    • G04DAPPARATUS OR TOOLS SPECIALLY DESIGNED FOR MAKING OR MAINTAINING CLOCKS OR WATCHES
    • G04D7/00Measuring, counting, calibrating, testing or regulating apparatus
    • G04D7/004Optical measuring and testing apparatus

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Mechanical Optical Scanning Systems (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
CH824462A 1961-07-11 1962-07-11 Device for comparing a test specimen with a masterpiece CH398092A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DES0074763 1961-07-11

Publications (1)

Publication Number Publication Date
CH398092A true CH398092A (en) 1965-08-31

Family

ID=7504877

Family Applications (1)

Application Number Title Priority Date Filing Date
CH824462A CH398092A (en) 1961-07-11 1962-07-11 Device for comparing a test specimen with a masterpiece

Country Status (3)

Country Link
BE (1) BE620045A (en)
CH (1) CH398092A (en)
DE (1) DE1423597B2 (en)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2750109C2 (en) * 1977-11-09 1991-03-07 Spindler & Hoyer GmbH & Co, 3400 Göttingen Device for non-contact measurement of linear distances, in particular the diameter
FR2443078A1 (en) * 1978-03-21 1980-06-27 Thomas Ets Louis Et Pierre Optical inspection system for mfd. mechanical part - uses apertured ground glass sheet and inclined transparent sheet to form image of surface to be tested for comparison with reference
JPS55110904A (en) * 1979-02-20 1980-08-27 Hajime Sangyo Kk Defect detecting device
JPS58103604A (en) * 1981-12-16 1983-06-20 Teijin Ltd Method and device for measuring thickness of film
DE3314465A1 (en) * 1983-04-21 1984-10-25 Robert Bosch Gmbh, 7000 Stuttgart Optical surface testing method
DE3446354A1 (en) * 1984-12-19 1986-06-26 Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch OPTOELECTRONIC COMPARATIVE DEVICE FOR STRUCTURES ON LEVEL SURFACES OR FOR FLAT STRUCTURES
FR2743147B1 (en) * 1995-12-28 1998-02-27 Acep France VISUAL APPARATUS FOR SURFACE CHARACTERISTICS OF REPRODUCED PARTS
RU2179328C1 (en) * 2001-06-19 2002-02-10 Кияшко Сергей Николаевич Technique of differential-phase roughness indication and device for its realization

Also Published As

Publication number Publication date
DE1423597B2 (en) 1970-10-08
BE620045A (en)
DE1423597A1 (en) 1969-05-22

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