BE620045A - - Google Patents

Info

Publication number
BE620045A
BE620045A BE620045DA BE620045A BE 620045 A BE620045 A BE 620045A BE 620045D A BE620045D A BE 620045DA BE 620045 A BE620045 A BE 620045A
Authority
BE
Belgium
Application number
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Publication of BE620045A publication Critical patent/BE620045A/xx

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/956—Inspecting patterns on the surface of objects
    • G01N21/95607—Inspecting patterns on the surface of objects using a comparative method
    • G—PHYSICS
    • G04—HOROLOGY
    • G04D—APPARATUS OR TOOLS SPECIALLY DESIGNED FOR MAKING OR MAINTAINING CLOCKS OR WATCHES
    • G04D7/00—Measuring, counting, calibrating, testing or regulating apparatus
    • G04D7/004—Optical measuring and testing apparatus

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Mechanical Optical Scanning Systems (AREA)
BE620045D 1961-07-11 BE620045A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DES0074763 1961-07-11

Publications (1)

Publication Number Publication Date
BE620045A true BE620045A (en)

Family

ID=7504877

Family Applications (1)

Application Number Title Priority Date Filing Date
BE620045D BE620045A (en) 1961-07-11

Country Status (3)

Country Link
BE (1) BE620045A (en)
CH (1) CH398092A (en)
DE (1) DE1423597B2 (en)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2750109C2 (en) * 1977-11-09 1991-03-07 Spindler & Hoyer GmbH & Co, 3400 Göttingen Device for non-contact measurement of linear distances, in particular the diameter
FR2443078A1 (en) * 1978-03-21 1980-06-27 Thomas Ets Louis Et Pierre Optical inspection system for mfd. mechanical part - uses apertured ground glass sheet and inclined transparent sheet to form image of surface to be tested for comparison with reference
JPS55110904A (en) * 1979-02-20 1980-08-27 Hajime Sangyo Kk Defect detecting device
JPS58103604A (en) * 1981-12-16 1983-06-20 Teijin Ltd Method and device for measuring thickness of film
DE3314465A1 (en) * 1983-04-21 1984-10-25 Robert Bosch Gmbh, 7000 Stuttgart Optical surface testing method
DE3446354A1 (en) * 1984-12-19 1986-06-26 Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch OPTOELECTRONIC COMPARATIVE DEVICE FOR STRUCTURES ON LEVEL SURFACES OR FOR FLAT STRUCTURES
FR2743147B1 (en) * 1995-12-28 1998-02-27 Acep France VISUAL APPARATUS FOR SURFACE CHARACTERISTICS OF REPRODUCED PARTS
RU2179328C1 (en) * 2001-06-19 2002-02-10 Кияшко Сергей Николаевич Technique of differential-phase roughness indication and device for its realization

Also Published As

Publication number Publication date
CH398092A (en) 1965-08-31
DE1423597A1 (en) 1969-05-22
DE1423597B2 (en) 1970-10-08

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