CA999949A - Display baseline stabilization circuit - Google Patents

Display baseline stabilization circuit

Info

Publication number
CA999949A
CA999949A CA148,186A CA148186A CA999949A CA 999949 A CA999949 A CA 999949A CA 148186 A CA148186 A CA 148186A CA 999949 A CA999949 A CA 999949A
Authority
CA
Canada
Prior art keywords
stabilization circuit
baseline stabilization
display baseline
display
circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
CA148,186A
Other languages
English (en)
Other versions
CA148186S (en
Inventor
Henry A. Zimmerman
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tektronix Inc
Original Assignee
Tektronix Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tektronix Inc filed Critical Tektronix Inc
Application granted granted Critical
Publication of CA999949A publication Critical patent/CA999949A/en
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R13/00—Arrangements for displaying electric variables or waveforms
    • G01R13/20—Cathode-ray oscilloscopes
    • G01R13/22—Circuits therefor
    • G01R13/30—Circuits for inserting reference markers, e.g. for timing, for calibrating, for frequency marking
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/28—Measuring attenuation, gain, phase shift or derived characteristics of electric four pole networks, i.e. two-port networks; Measuring transient response
    • G01R27/32—Measuring attenuation, gain, phase shift or derived characteristics of electric four pole networks, i.e. two-port networks; Measuring transient response in circuits having distributed constants, e.g. having very long conductors or involving high frequencies

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing, Inspecting, Measuring Of Stereoscopic Televisions And Televisions (AREA)
CA148,186A 1971-07-30 1972-07-28 Display baseline stabilization circuit Expired CA999949A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US16771171A 1971-07-30 1971-07-30

Publications (1)

Publication Number Publication Date
CA999949A true CA999949A (en) 1976-11-16

Family

ID=22608496

Family Applications (1)

Application Number Title Priority Date Filing Date
CA148,186A Expired CA999949A (en) 1971-07-30 1972-07-28 Display baseline stabilization circuit

Country Status (7)

Country Link
US (1) US3771056A (xx)
JP (1) JPS5312334B2 (xx)
CA (1) CA999949A (xx)
DE (1) DE2237424A1 (xx)
FR (1) FR2148265A1 (xx)
GB (1) GB1350165A (xx)
NL (1) NL7210445A (xx)

Families Citing this family (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5136941Y2 (xx) * 1973-02-28 1976-09-09
JPS6139330Y2 (xx) * 1977-06-30 1986-11-11
JPS634199Y2 (xx) * 1980-01-29 1988-02-02
US4476432A (en) * 1982-02-10 1984-10-09 Tektronix, Inc. Waveform measurement system
US4772847A (en) * 1985-04-17 1988-09-20 Hitachi, Ltd. Stroboscopic type potential measurement device
US4755742A (en) * 1986-04-30 1988-07-05 Tektronix, Inc. Dual channel time domain reflectometer
EP0321808A1 (de) * 1987-12-23 1989-06-28 BBC Brown Boveri AG Verfahren zum Messen eines Wellenwiderstandes und einer Ausbreitungskonstante eines Zweitors
JP2808740B2 (ja) * 1989-10-31 1998-10-08 横河電機株式会社 サンプリングヘッド
US5068614A (en) * 1990-11-05 1991-11-26 Tektronix, Inc. Swept frequency domain relectometry enhancement
US5376888A (en) * 1993-06-09 1994-12-27 Hook; William R. Timing markers in time domain reflectometry systems
US6621562B2 (en) * 2001-09-26 2003-09-16 Tempo Research Corporation Time domain reflectometer with wideband dual balanced duplexer line coupling circuit
US6771023B1 (en) * 2002-12-18 2004-08-03 National Semiconductor Corporation System and method for regulating cathode ray tube beam current using autobias
JP4501951B2 (ja) * 2007-03-27 2010-07-14 日本電気株式会社 差動伝送回路、ディスクアレイ装置、出力信号設定方法
TWI467920B (zh) * 2011-10-31 2015-01-01 Richtek Technology Corp 高壓偏移偵測電路
KR101853464B1 (ko) 2015-06-22 2018-06-04 두산중공업 주식회사 실링구조를 포함하는 연료공급노즐.
US10955477B2 (en) * 2018-06-29 2021-03-23 Hamilton Sundstrand Corporation Power distribution health management and monitoring

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2994825A (en) * 1958-07-09 1961-08-01 Hewlett Packard Co Voltage to time-interval converter
US3248655A (en) * 1962-05-07 1966-04-26 Tektronix Inc Ratchet memory circuit and sampling system employing such circuit
US3529249A (en) * 1965-12-07 1970-09-15 Texas Instruments Inc Sample and store apparatus including means to compensate for base line drift
US3532980A (en) * 1967-11-22 1970-10-06 Monsanto Co Peak voltage reader

Also Published As

Publication number Publication date
JPS5312334B2 (xx) 1978-04-28
FR2148265A1 (xx) 1973-03-11
NL7210445A (xx) 1973-02-01
JPS4825444A (xx) 1973-04-03
GB1350165A (en) 1974-04-18
DE2237424A1 (de) 1973-02-01
US3771056A (en) 1973-11-06

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