CA965481A - Scanner element for coulter particle apparatus - Google Patents

Scanner element for coulter particle apparatus

Info

Publication number
CA965481A
CA965481A CA138,226A CA138226A CA965481A CA 965481 A CA965481 A CA 965481A CA 138226 A CA138226 A CA 138226A CA 965481 A CA965481 A CA 965481A
Authority
CA
Canada
Prior art keywords
coulter particle
particle apparatus
scanner element
scanner
coulter
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
CA138,226A
Other versions
CA138226S (en
Inventor
Walter R. Hogg
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Individual
Original Assignee
Individual
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Individual filed Critical Individual
Application granted granted Critical
Publication of CA965481A publication Critical patent/CA965481A/en
Expired legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/10Investigating individual particles
    • G01N15/1031Investigating individual particles by measuring electrical or magnetic effects
    • G01N15/12Investigating individual particles by measuring electrical or magnetic effects by observing changes in resistance or impedance across apertures when traversed by individual particles, e.g. by using the Coulter principle
    • G01N15/13Details pertaining to apertures

Landscapes

  • Chemical & Material Sciences (AREA)
  • Biochemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Dispersion Chemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
  • Crystals, And After-Treatments Of Crystals (AREA)
CA138,226A 1971-04-05 1972-03-27 Scanner element for coulter particle apparatus Expired CA965481A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US13136171A 1971-04-05 1971-04-05

Publications (1)

Publication Number Publication Date
CA965481A true CA965481A (en) 1975-04-01

Family

ID=22449111

Family Applications (1)

Application Number Title Priority Date Filing Date
CA138,226A Expired CA965481A (en) 1971-04-05 1972-03-27 Scanner element for coulter particle apparatus

Country Status (7)

Country Link
US (1) US3771058A (en)
JP (1) JPS5247716B1 (en)
CA (1) CA965481A (en)
CH (1) CH557534A (en)
FR (1) FR2136054A5 (en)
GB (1) GB1353884A (en)
SE (1) SE382502B (en)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3924180A (en) * 1973-10-12 1975-12-02 Us Energy Potential sensing cell analyzer
US4760328A (en) * 1986-05-05 1988-07-26 Integrated Ionics, Inc. Particle counter having electrodes and circuitry mounted on the pane of the orifice
WO1995017659A1 (en) * 1993-12-23 1995-06-29 Abbott Laboratories Method of making a stress relieved count probe
US5402062A (en) * 1993-12-23 1995-03-28 Abbott Laboratories Mechanical capture of count wafer for particle analysis
US5432992A (en) * 1993-12-23 1995-07-18 Abbott Laboratories Method of making count probe with removable count wafer
GB9526652D0 (en) * 1995-12-29 1996-02-28 Shine Thomas A Electrode assembly
US6175227B1 (en) 1997-07-03 2001-01-16 Coulter International Corp. Potential-sensing method and apparatus for sensing and characterizing particles by the Coulter principle
US6111398A (en) * 1997-07-03 2000-08-29 Coulter International Corp. Method and apparatus for sensing and characterizing particles
US6259242B1 (en) 1999-05-26 2001-07-10 Coulter International Corp. Apparatus incorporating a sensing conduit in conductive material and method of use thereof for sensing and characterizing particles
US7258838B2 (en) * 1999-06-22 2007-08-21 President And Fellows Of Harvard College Solid state molecular probe device
JP2012524908A (en) * 2009-04-24 2012-10-18 ベックマン コールター, インコーポレイテッド How to characterize particles

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2861932A (en) * 1957-03-06 1958-11-25 Rauland Corp Method of treating semi-conductor articles
NL240601A (en) * 1958-12-29
US3238452A (en) * 1961-10-18 1966-03-01 Union Oil Co Apparatus and method for detecting contaminants in a fluid
US3266526A (en) * 1962-11-26 1966-08-16 Robert H Berg Peripherally locked and sealed orifice disk and method
US3345561A (en) * 1963-09-26 1967-10-03 Sperry Rand Corp Mount for supporting dual bolometers at same temperature
US3457501A (en) * 1966-08-18 1969-07-22 Maxwell Ingram Probe for measuring conductivity of an electrolyte solution
BE758383A (en) * 1969-11-06 1971-04-16 Coulter Electronics SCANNING ELEMENT AND PENETRATED PLATE FOR ELECTRONIC COUNTING SORTING OF PARTICLES

Also Published As

Publication number Publication date
DE2214903A1 (en) 1972-10-19
GB1353884A (en) 1974-05-22
JPS5247716B1 (en) 1977-12-05
CH557534A (en) 1974-12-31
FR2136054A5 (en) 1972-12-22
SE382502B (en) 1976-02-02
US3771058A (en) 1973-11-06
DE2214903B2 (en) 1975-08-14

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