CA873044A - Semiconductor device and method of fabrication thereof - Google Patents

Semiconductor device and method of fabrication thereof

Info

Publication number
CA873044A
CA873044A CA873044A CA873044DA CA873044A CA 873044 A CA873044 A CA 873044A CA 873044 A CA873044 A CA 873044A CA 873044D A CA873044D A CA 873044DA CA 873044 A CA873044 A CA 873044A
Authority
CA
Canada
Prior art keywords
fabrication
semiconductor device
semiconductor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
CA873044A
Inventor
J. Grimes Milton
F. Henrikson Donald
R. Meisel Herbert
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
RCA Corp
Original Assignee
RCA Corp
Publication date
Application granted granted Critical
Publication of CA873044A publication Critical patent/CA873044A/en
Expired legal-status Critical Current

Links

CA873044A Semiconductor device and method of fabrication thereof Expired CA873044A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CA873044T

Publications (1)

Publication Number Publication Date
CA873044A true CA873044A (en) 1971-06-08

Family

ID=36359020

Family Applications (1)

Application Number Title Priority Date Filing Date
CA873044A Expired CA873044A (en) Semiconductor device and method of fabrication thereof

Country Status (1)

Country Link
CA (1) CA873044A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN116047254A (en) * 2023-02-10 2023-05-02 新磊半导体科技(苏州)股份有限公司 Method for processing semiconductor test data

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN116047254A (en) * 2023-02-10 2023-05-02 新磊半导体科技(苏州)股份有限公司 Method for processing semiconductor test data
CN116047254B (en) * 2023-02-10 2025-06-27 新磊半导体科技(苏州)股份有限公司 A method for processing semiconductor test data

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