CA776252A - Method of measuring thickness of dielectric film vacuum applied onto conductive backing - Google Patents

Method of measuring thickness of dielectric film vacuum applied onto conductive backing

Info

Publication number
CA776252A
CA776252A CA776252A CA776252DA CA776252A CA 776252 A CA776252 A CA 776252A CA 776252 A CA776252 A CA 776252A CA 776252D A CA776252D A CA 776252DA CA 776252 A CA776252 A CA 776252A
Authority
CA
Canada
Prior art keywords
dielectric film
applied onto
vacuum applied
conductive backing
measuring thickness
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
CA776252A
Inventor
Pavlovich Derkach Vitaly
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
INSTITUTE KIBERNETIKI
Original Assignee
INSTITUTE KIBERNETIKI
Publication date
Application granted granted Critical
Publication of CA776252A publication Critical patent/CA776252A/en
Expired legal-status Critical Current

Links

CA776252A Method of measuring thickness of dielectric film vacuum applied onto conductive backing Expired CA776252A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CA776252T

Publications (1)

Publication Number Publication Date
CA776252A true CA776252A (en) 1968-01-16

Family

ID=36223547

Family Applications (1)

Application Number Title Priority Date Filing Date
CA776252A Expired CA776252A (en) Method of measuring thickness of dielectric film vacuum applied onto conductive backing

Country Status (1)

Country Link
CA (1) CA776252A (en)

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