CA2402849A1 - Systeme permettant de projeter simultanement des motifs a dephasage multiple en vue de l'inspection tridimensionnelle d'un objet - Google Patents

Systeme permettant de projeter simultanement des motifs a dephasage multiple en vue de l'inspection tridimensionnelle d'un objet Download PDF

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Publication number
CA2402849A1
CA2402849A1 CA002402849A CA2402849A CA2402849A1 CA 2402849 A1 CA2402849 A1 CA 2402849A1 CA 002402849 A CA002402849 A CA 002402849A CA 2402849 A CA2402849 A CA 2402849A CA 2402849 A1 CA2402849 A1 CA 2402849A1
Authority
CA
Canada
Prior art keywords
recited
phase
projecting
pattern
dimensional image
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
CA002402849A
Other languages
English (en)
Inventor
Michel Cantin
Alain Coulombe
Alexandre Nikitine
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Solvision Inc
Original Assignee
Individual
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from CA002301822A external-priority patent/CA2301822A1/fr
Application filed by Individual filed Critical Individual
Priority to CA002402849A priority Critical patent/CA2402849A1/fr
Publication of CA2402849A1 publication Critical patent/CA2402849A1/fr
Abandoned legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/24Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/24Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/24Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2509Color coding
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/24Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2513Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object with several lines being projected in more than one direction, e.g. grids, patterns
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/24Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2518Projection by scanning of the object
    • G01B11/2527Projection by scanning of the object with phase change by in-plane movement of the patern
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/24Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2531Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object using several gratings, projected with variable angle of incidence on the object, and one detection device
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00Image analysis
    • G06T7/50Depth or shape recovery
    • G06T7/521Depth or shape recovery from laser ranging, e.g. using interferometry; from the projection of structured light

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Optics & Photonics (AREA)
  • Theoretical Computer Science (AREA)
  • Length Measuring Devices By Optical Means (AREA)

Abstract

L'invention concerne un numériseur d'image tridimensionnelle permettant de projeter simultanément des motifs à déphasage multiple sur un objet et d'acquérir simultanément de multiples images de ces mêmes motifs à déphasage multiple. Le numériseur comprend un assemblage de projection de motif et un assemblage d'acquisition d'image. L'assemblage de projection de motif comporte, par exemple, un disperseur spectral ou plusieurs sources lumineuses, des grilles et des projecteurs permettant la projection simultanée de plusieurs motifs sous diverses lumières monochromatiques. L'assemblage d'acquisition d'image comprend, par exemple, une caméra CCD sensible à diverses lumières monochromatiques ou plusieurs caméras CCD dotées de filtres, afin de rassembler les différentes lumières arrivant sur l'objet simultanément illuminé par plusieurs motifs à déphasage multiple. L'invention concerne également un procédé et un système permettant de mesurer le relief d'un objet, en utilisant le procédé décrit ci-dessus.
CA002402849A 2000-03-24 2001-03-20 Systeme permettant de projeter simultanement des motifs a dephasage multiple en vue de l'inspection tridimensionnelle d'un objet Abandoned CA2402849A1 (fr)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CA002402849A CA2402849A1 (fr) 2000-03-24 2001-03-20 Systeme permettant de projeter simultanement des motifs a dephasage multiple en vue de l'inspection tridimensionnelle d'un objet

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
CA2,301,822 2000-03-24
CA002301822A CA2301822A1 (fr) 2000-03-24 2000-03-24 Projection simultanee de plusieurs patrons avec acquisition simultanee pour l'inspection d'objets en trois dimensions
PCT/CA2001/000376 WO2001071279A1 (fr) 2000-03-24 2001-03-20 Systeme permettant de projeter simultanement des motifs a dephasage multiple en vue de l'inspection tridimensionnelle d'un objet
CA002402849A CA2402849A1 (fr) 2000-03-24 2001-03-20 Systeme permettant de projeter simultanement des motifs a dephasage multiple en vue de l'inspection tridimensionnelle d'un objet

Publications (1)

Publication Number Publication Date
CA2402849A1 true CA2402849A1 (fr) 2001-09-27

Family

ID=25681651

Family Applications (1)

Application Number Title Priority Date Filing Date
CA002402849A Abandoned CA2402849A1 (fr) 2000-03-24 2001-03-20 Systeme permettant de projeter simultanement des motifs a dephasage multiple en vue de l'inspection tridimensionnelle d'un objet

Country Status (1)

Country Link
CA (1) CA2402849A1 (fr)

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Legal Events

Date Code Title Description
FZDE Discontinued