CA2278807A1 - A method for element-selective detection, a micro plasma mass spectrometer for use in the method and a plasma ion source, together with applications thereof - Google Patents

A method for element-selective detection, a micro plasma mass spectrometer for use in the method and a plasma ion source, together with applications thereof Download PDF

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Publication number
CA2278807A1
CA2278807A1 CA002278807A CA2278807A CA2278807A1 CA 2278807 A1 CA2278807 A1 CA 2278807A1 CA 002278807 A CA002278807 A CA 002278807A CA 2278807 A CA2278807 A CA 2278807A CA 2278807 A1 CA2278807 A1 CA 2278807A1
Authority
CA
Canada
Prior art keywords
ion source
micro plasma
plasma ion
micro
mass spectrometer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
CA002278807A
Other languages
English (en)
French (fr)
Inventor
Cato Brede
Stig Pedersen-Bjergaard
Elsa Lundanes
Tyge Greibrokk
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Individual
Original Assignee
Individual
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Individual filed Critical Individual
Publication of CA2278807A1 publication Critical patent/CA2278807A1/en
Abandoned legal-status Critical Current

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Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/105—Ion sources; Ion guns using high-frequency excitation, e.g. microwave excitation, Inductively Coupled Plasma [ICP]

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
CA002278807A 1997-02-14 1998-02-12 A method for element-selective detection, a micro plasma mass spectrometer for use in the method and a plasma ion source, together with applications thereof Abandoned CA2278807A1 (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
NO970707 1997-02-14
NO970707A NO304861B1 (no) 1997-02-14 1997-02-14 FremgangsmÕte ved elementselektiv deteksjon, mikroplasmamassespektrometer til bruk ved fremgangsmÕten og plasmaionekilde, samt anvendelser av disse
PCT/NO1998/000048 WO1998036440A1 (en) 1997-02-14 1998-02-12 A method for element-selective detection, a micro plasma mass spectrometer for use in the method and a plasma ion source, together with applications thereof

Publications (1)

Publication Number Publication Date
CA2278807A1 true CA2278807A1 (en) 1998-08-20

Family

ID=19900391

Family Applications (1)

Application Number Title Priority Date Filing Date
CA002278807A Abandoned CA2278807A1 (en) 1997-02-14 1998-02-12 A method for element-selective detection, a micro plasma mass spectrometer for use in the method and a plasma ion source, together with applications thereof

Country Status (7)

Country Link
EP (1) EP0960431B1 (no)
JP (1) JP2001512617A (no)
AU (1) AU719247B2 (no)
CA (1) CA2278807A1 (no)
DE (1) DE69804772T2 (no)
NO (1) NO304861B1 (no)
WO (1) WO1998036440A1 (no)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7274015B2 (en) * 2001-08-08 2007-09-25 Sionex Corporation Capacitive discharge plasma ion source
DE10248055B4 (de) * 2002-10-11 2012-02-23 Spectro Analytical Instruments Gmbh & Co. Kg Methode zur Anregung optischer Atom-Emission und apparative Vorrichtung für die spektrochemische Analyse
US7460225B2 (en) 2004-03-05 2008-12-02 Vassili Karanassios Miniaturized source devices for optical and mass spectrometry
GB2432711B (en) * 2005-10-11 2008-04-02 Gv Instr Ion source preparation system
DE102009046504B4 (de) * 2009-11-06 2016-06-09 Westfälische Wilhelms-Universität Münster Verfahren und Vorrichtung zum Analysieren eines Stoffgemisches
EP2710623B1 (en) * 2011-05-20 2019-10-23 Purdue Research Foundation (PRF) System for analyzing a sample

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3215487B2 (ja) * 1992-04-13 2001-10-09 セイコーインスツルメンツ株式会社 誘導結合プラズマ質量分析装置
CA2116821C (en) * 1993-03-05 2003-12-23 Stephen Esler Anderson Improvements in plasma mass spectrometry
JPH07272671A (ja) * 1994-03-29 1995-10-20 Ulvac Japan Ltd ガス分析装置及びガス分析方法
WO1997020620A1 (en) * 1995-12-07 1997-06-12 The Regents Of The University Of California Improvements in method and apparatus for isotope enhancement in a plasma apparatus
EP0792091B1 (en) * 1995-12-27 2002-03-13 Nippon Telegraph And Telephone Corporation Elemental analysis method

Also Published As

Publication number Publication date
NO970707D0 (no) 1997-02-14
AU719247B2 (en) 2000-05-04
EP0960431B1 (en) 2002-04-10
DE69804772T2 (de) 2002-11-28
JP2001512617A (ja) 2001-08-21
WO1998036440A1 (en) 1998-08-20
NO970707L (no) 1998-08-17
AU6231498A (en) 1998-09-08
NO304861B1 (no) 1999-02-22
DE69804772D1 (de) 2002-05-16
EP0960431A1 (en) 1999-12-01

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Legal Events

Date Code Title Description
FZDE Discontinued