CA2277460A1 - Methode et systeme d'imagerie ultrasonique haute resolution de defauts ou d'anomalies de petite taille - Google Patents
Methode et systeme d'imagerie ultrasonique haute resolution de defauts ou d'anomalies de petite taille Download PDFInfo
- Publication number
- CA2277460A1 CA2277460A1 CA 2277460 CA2277460A CA2277460A1 CA 2277460 A1 CA2277460 A1 CA 2277460A1 CA 2277460 CA2277460 CA 2277460 CA 2277460 A CA2277460 A CA 2277460A CA 2277460 A1 CA2277460 A1 CA 2277460A1
- Authority
- CA
- Canada
- Prior art keywords
- saft
- laser
- aperture
- frequency
- small defects
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
- G01N29/44—Processing the detected response signal, e.g. electronic circuits specially adapted therefor
- G01N29/4409—Processing the detected response signal, e.g. electronic circuits specially adapted therefor by comparison
- G01N29/4436—Processing the detected response signal, e.g. electronic circuits specially adapted therefor by comparison with a reference signal
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
- G01N29/04—Analysing solids
- G01N29/06—Visualisation of the interior, e.g. acoustic microscopy
- G01N29/0654—Imaging
- G01N29/069—Defect imaging, localisation and sizing using, e.g. time of flight diffraction [TOFD], synthetic aperture focusing technique [SAFT], Amplituden-Laufzeit-Ortskurven [ALOK] technique
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
- G01N29/22—Details, e.g. general constructional or apparatus details
- G01N29/24—Probes
- G01N29/2418—Probes using optoacoustic interaction with the material, e.g. laser radiation, photoacoustics
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
- G01N29/44—Processing the detected response signal, e.g. electronic circuits specially adapted therefor
- G01N29/46—Processing the detected response signal, e.g. electronic circuits specially adapted therefor by spectral analysis, e.g. Fourier analysis or wavelet analysis
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
- G01S15/00—Systems using the reflection or reradiation of acoustic waves, e.g. sonar systems
- G01S15/88—Sonar systems specially adapted for specific applications
- G01S15/89—Sonar systems specially adapted for specific applications for mapping or imaging
- G01S15/8906—Short-range imaging systems; Acoustic microscope systems using pulse-echo techniques
- G01S15/8993—Three dimensional imaging systems
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
- G01S15/00—Systems using the reflection or reradiation of acoustic waves, e.g. sonar systems
- G01S15/88—Sonar systems specially adapted for specific applications
- G01S15/89—Sonar systems specially adapted for specific applications for mapping or imaging
- G01S15/8906—Short-range imaging systems; Acoustic microscope systems using pulse-echo techniques
- G01S15/8997—Short-range imaging systems; Acoustic microscope systems using pulse-echo techniques using synthetic aperture techniques
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2291/00—Indexing codes associated with group G01N29/00
- G01N2291/04—Wave modes and trajectories
- G01N2291/042—Wave modes
- G01N2291/0423—Surface waves, e.g. Rayleigh waves, Love waves
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2291/00—Indexing codes associated with group G01N29/00
- G01N2291/04—Wave modes and trajectories
- G01N2291/042—Wave modes
- G01N2291/0427—Flexural waves, plate waves, e.g. Lamb waves, tuning fork, cantilever
Landscapes
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Remote Sensing (AREA)
- Radar, Positioning & Navigation (AREA)
- Acoustics & Sound (AREA)
- Chemical & Material Sciences (AREA)
- Health & Medical Sciences (AREA)
- General Health & Medical Sciences (AREA)
- Analytical Chemistry (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Biochemistry (AREA)
- Life Sciences & Earth Sciences (AREA)
- Signal Processing (AREA)
- Computer Networks & Wireless Communication (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Mathematical Physics (AREA)
- Optics & Photonics (AREA)
- Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CA 2277460 CA2277460C (fr) | 1999-07-13 | 1999-07-13 | Methode et systeme d'imagerie ultrasonique haute resolution de defauts ou d'anomalies de petite taille |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CA 2277460 CA2277460C (fr) | 1999-07-13 | 1999-07-13 | Methode et systeme d'imagerie ultrasonique haute resolution de defauts ou d'anomalies de petite taille |
Publications (2)
Publication Number | Publication Date |
---|---|
CA2277460A1 true CA2277460A1 (fr) | 2001-01-13 |
CA2277460C CA2277460C (fr) | 2003-02-18 |
Family
ID=4163741
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CA 2277460 Expired - Lifetime CA2277460C (fr) | 1999-07-13 | 1999-07-13 | Methode et systeme d'imagerie ultrasonique haute resolution de defauts ou d'anomalies de petite taille |
Country Status (1)
Country | Link |
---|---|
CA (1) | CA2277460C (fr) |
Cited By (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US9157896B2 (en) | 2010-03-25 | 2015-10-13 | Kabushiki Kaisha Toshiba | Ultrasonic flaw detecting apparatus and ultrasonic flaw detecting method |
CN111307945A (zh) * | 2020-04-09 | 2020-06-19 | 上海工程技术大学 | 一种基于超声阵列检测无砟轨道近表面缺陷的成像方法及装置 |
CN111323485A (zh) * | 2020-04-09 | 2020-06-23 | 上海工程技术大学 | 一种用于轨道板内部缺陷检测的成像方法及装置 |
CN112114045A (zh) * | 2020-08-03 | 2020-12-22 | 中国科学院大学 | 一种面向超声显微镜的分辨率增强方法 |
CN112485336A (zh) * | 2020-11-23 | 2021-03-12 | 西南交通大学 | 一种基于差分技术的激光超声合成孔径成像方法 |
CN113533526A (zh) * | 2021-06-02 | 2021-10-22 | 中北大学 | 超声相控阵界面脱粘缺陷全聚焦c扫描成像方法及系统 |
CN114295731A (zh) * | 2021-12-28 | 2022-04-08 | 杭州电子科技大学 | 一种基于激光激励纵波测量亚表面缺陷深度的方法 |
-
1999
- 1999-07-13 CA CA 2277460 patent/CA2277460C/fr not_active Expired - Lifetime
Cited By (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US9157896B2 (en) | 2010-03-25 | 2015-10-13 | Kabushiki Kaisha Toshiba | Ultrasonic flaw detecting apparatus and ultrasonic flaw detecting method |
CN111307945A (zh) * | 2020-04-09 | 2020-06-19 | 上海工程技术大学 | 一种基于超声阵列检测无砟轨道近表面缺陷的成像方法及装置 |
CN111323485A (zh) * | 2020-04-09 | 2020-06-23 | 上海工程技术大学 | 一种用于轨道板内部缺陷检测的成像方法及装置 |
CN112114045A (zh) * | 2020-08-03 | 2020-12-22 | 中国科学院大学 | 一种面向超声显微镜的分辨率增强方法 |
CN112114045B (zh) * | 2020-08-03 | 2023-09-19 | 中国科学院大学 | 一种面向超声显微镜的分辨率增强方法 |
CN112485336A (zh) * | 2020-11-23 | 2021-03-12 | 西南交通大学 | 一种基于差分技术的激光超声合成孔径成像方法 |
CN113533526A (zh) * | 2021-06-02 | 2021-10-22 | 中北大学 | 超声相控阵界面脱粘缺陷全聚焦c扫描成像方法及系统 |
CN113533526B (zh) * | 2021-06-02 | 2022-10-11 | 中北大学 | 超声相控阵界面脱粘缺陷全聚焦c扫描成像方法及系统 |
CN114295731A (zh) * | 2021-12-28 | 2022-04-08 | 杭州电子科技大学 | 一种基于激光激励纵波测量亚表面缺陷深度的方法 |
Also Published As
Publication number | Publication date |
---|---|
CA2277460C (fr) | 2003-02-18 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
EEER | Examination request | ||
MKEX | Expiry |
Effective date: 20190715 |