CA2277460A1 - Method and system for high resolution ultrasonic imaging of small defects or anomalies - Google Patents

Method and system for high resolution ultrasonic imaging of small defects or anomalies Download PDF

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Publication number
CA2277460A1
CA2277460A1 CA 2277460 CA2277460A CA2277460A1 CA 2277460 A1 CA2277460 A1 CA 2277460A1 CA 2277460 CA2277460 CA 2277460 CA 2277460 A CA2277460 A CA 2277460A CA 2277460 A1 CA2277460 A1 CA 2277460A1
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CA
Canada
Prior art keywords
saft
laser
aperture
frequency
small defects
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
CA 2277460
Other languages
French (fr)
Other versions
CA2277460C (en
Inventor
Daniel Levesque
Alain Blouin
Christian Neron
Jean-Pierre Monchalin
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
National Research Council of Canada
Original Assignee
National Research Council of Canada
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by National Research Council of Canada filed Critical National Research Council of Canada
Priority to CA 2277460 priority Critical patent/CA2277460C/en
Publication of CA2277460A1 publication Critical patent/CA2277460A1/en
Application granted granted Critical
Publication of CA2277460C publication Critical patent/CA2277460C/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/44—Processing the detected response signal, e.g. electronic circuits specially adapted therefor
    • G01N29/4409—Processing the detected response signal, e.g. electronic circuits specially adapted therefor by comparison
    • G01N29/4436—Processing the detected response signal, e.g. electronic circuits specially adapted therefor by comparison with a reference signal
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/04—Analysing solids
    • G01N29/06—Visualisation of the interior, e.g. acoustic microscopy
    • G01N29/0654—Imaging
    • G01N29/069—Defect imaging, localisation and sizing using, e.g. time of flight diffraction [TOFD], synthetic aperture focusing technique [SAFT], Amplituden-Laufzeit-Ortskurven [ALOK] technique
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/22—Details, e.g. general constructional or apparatus details
    • G01N29/24—Probes
    • G01N29/2418—Probes using optoacoustic interaction with the material, e.g. laser radiation, photoacoustics
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/44—Processing the detected response signal, e.g. electronic circuits specially adapted therefor
    • G01N29/46—Processing the detected response signal, e.g. electronic circuits specially adapted therefor by spectral analysis, e.g. Fourier analysis or wavelet analysis
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S15/00—Systems using the reflection or reradiation of acoustic waves, e.g. sonar systems
    • G01S15/88—Sonar systems specially adapted for specific applications
    • G01S15/89—Sonar systems specially adapted for specific applications for mapping or imaging
    • G01S15/8906—Short-range imaging systems; Acoustic microscope systems using pulse-echo techniques
    • G01S15/8993—Three dimensional imaging systems
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S15/00—Systems using the reflection or reradiation of acoustic waves, e.g. sonar systems
    • G01S15/88—Sonar systems specially adapted for specific applications
    • G01S15/89—Sonar systems specially adapted for specific applications for mapping or imaging
    • G01S15/8906—Short-range imaging systems; Acoustic microscope systems using pulse-echo techniques
    • G01S15/8997—Short-range imaging systems; Acoustic microscope systems using pulse-echo techniques using synthetic aperture techniques
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00—Indexing codes associated with group G01N29/00
    • G01N2291/04—Wave modes and trajectories
    • G01N2291/042—Wave modes
    • G01N2291/0423—Surface waves, e.g. Rayleigh waves, Love waves
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00—Indexing codes associated with group G01N29/00
    • G01N2291/04—Wave modes and trajectories
    • G01N2291/042—Wave modes
    • G01N2291/0427—Flexural waves, plate waves, e.g. Lamb waves, tuning fork, cantilever

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Radar, Positioning & Navigation (AREA)
  • Remote Sensing (AREA)
  • Acoustics & Sound (AREA)
  • Pathology (AREA)
  • General Health & Medical Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Immunology (AREA)
  • Signal Processing (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Optics & Photonics (AREA)
  • Mathematical Physics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)

Abstract

A method and system is provided for enhanced ultrasonic detection and imaging of small defects inside or at the surface of an object. The Synthetic Aperture Focusing Technique (SAFT) has been used to improve the detectability and to enhance images in conventional ultrasonics and this method has recently been adapted to laser-ultrasonics. In the present invention, an improved version of the frequency-domain SAFT (F-SAFT) based on the angular spectrum approach is described. The method proposed includes temporal deconvolution of the waveform data to enhance both axial and lateral resolutions, control of the aperture and of the frequency bandwidth to improve signal-to-noise ratio, as well as spatial interpolation of the subsurface images. All the above operations are well adapted to the frequency domain calculations and embedded in the F-SAFT data processing. The aperture control and the spatial interpolation allow also a reduction of sampling requirements to further decrease both inspection and processing times. This method is of particular interest when ultrasound is generated by a laser and detected by either a contact ultrasonic transducer or a laser interferometer.
CA 2277460 1999-07-13 1999-07-13 Method and system for high resolution ultrasonic imaging of small defects or anomalies Expired - Lifetime CA2277460C (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CA 2277460 CA2277460C (en) 1999-07-13 1999-07-13 Method and system for high resolution ultrasonic imaging of small defects or anomalies

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CA 2277460 CA2277460C (en) 1999-07-13 1999-07-13 Method and system for high resolution ultrasonic imaging of small defects or anomalies

Publications (2)

Publication Number Publication Date
CA2277460A1 true CA2277460A1 (en) 2001-01-13
CA2277460C CA2277460C (en) 2003-02-18

Family

ID=4163741

Family Applications (1)

Application Number Title Priority Date Filing Date
CA 2277460 Expired - Lifetime CA2277460C (en) 1999-07-13 1999-07-13 Method and system for high resolution ultrasonic imaging of small defects or anomalies

Country Status (1)

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CA (1) CA2277460C (en)

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9157896B2 (en) 2010-03-25 2015-10-13 Kabushiki Kaisha Toshiba Ultrasonic flaw detecting apparatus and ultrasonic flaw detecting method
CN111307945A (en) * 2020-04-09 2020-06-19 上海工程技术大学 Imaging method and device for detecting near-surface defects of ballastless track based on ultrasonic array
CN111323485A (en) * 2020-04-09 2020-06-23 上海工程技术大学 Imaging method and device for detecting internal defects of track slab
CN112114045A (en) * 2020-08-03 2020-12-22 中国科学院大学 Resolution enhancement method for ultrasonic microscope
CN112485336A (en) * 2020-11-23 2021-03-12 西南交通大学 Laser ultrasonic synthetic aperture imaging method based on differential technology
CN113533526A (en) * 2021-06-02 2021-10-22 中北大学 Ultrasonic phased array interface debonding defect full-focusing C scanning imaging method and system
CN114295731A (en) * 2021-12-28 2022-04-08 杭州电子科技大学 Method for measuring depth of subsurface defect based on laser excitation longitudinal wave

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9157896B2 (en) 2010-03-25 2015-10-13 Kabushiki Kaisha Toshiba Ultrasonic flaw detecting apparatus and ultrasonic flaw detecting method
CN111307945A (en) * 2020-04-09 2020-06-19 上海工程技术大学 Imaging method and device for detecting near-surface defects of ballastless track based on ultrasonic array
CN111323485A (en) * 2020-04-09 2020-06-23 上海工程技术大学 Imaging method and device for detecting internal defects of track slab
CN112114045A (en) * 2020-08-03 2020-12-22 中国科学院大学 Resolution enhancement method for ultrasonic microscope
CN112114045B (en) * 2020-08-03 2023-09-19 中国科学院大学 Resolution enhancement method for ultrasonic microscope
CN112485336A (en) * 2020-11-23 2021-03-12 西南交通大学 Laser ultrasonic synthetic aperture imaging method based on differential technology
CN113533526A (en) * 2021-06-02 2021-10-22 中北大学 Ultrasonic phased array interface debonding defect full-focusing C scanning imaging method and system
CN113533526B (en) * 2021-06-02 2022-10-11 中北大学 Ultrasonic phased array interface debonding defect full-focusing C scanning imaging method and system
CN114295731A (en) * 2021-12-28 2022-04-08 杭州电子科技大学 Method for measuring depth of subsurface defect based on laser excitation longitudinal wave

Also Published As

Publication number Publication date
CA2277460C (en) 2003-02-18

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