CA2246374C - Dispositif et procedes de mesure du contour d'une surface - Google Patents

Dispositif et procedes de mesure du contour d'une surface Download PDF

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Publication number
CA2246374C
CA2246374C CA 2246374 CA2246374A CA2246374C CA 2246374 C CA2246374 C CA 2246374C CA 2246374 CA2246374 CA 2246374 CA 2246374 A CA2246374 A CA 2246374A CA 2246374 C CA2246374 C CA 2246374C
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CA
Canada
Prior art keywords
radiation
sources
coherent
point
phase
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
CA 2246374
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English (en)
Other versions
CA2246374A1 (fr
Inventor
Lyle G. Shirley
Michael S. Mermelstein
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Massachusetts Institute of Technology
Original Assignee
Massachusetts Institute of Technology
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from US08/600,216 external-priority patent/US5870191A/en
Application filed by Massachusetts Institute of Technology filed Critical Massachusetts Institute of Technology
Publication of CA2246374A1 publication Critical patent/CA2246374A1/fr
Application granted granted Critical
Publication of CA2246374C publication Critical patent/CA2246374C/fr
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
  • Length Measuring Devices By Optical Means (AREA)
CA 2246374 1996-02-12 1997-02-03 Dispositif et procedes de mesure du contour d'une surface Expired - Lifetime CA2246374C (fr)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US08/600,216 US5870191A (en) 1996-02-12 1996-02-12 Apparatus and methods for surface contour measurement
US08/600,216 1996-02-12
PCT/US1997/001744 WO1997029341A1 (fr) 1996-02-12 1997-02-03 Dispositif et procedes de mesure du contour d'une surface

Publications (2)

Publication Number Publication Date
CA2246374A1 CA2246374A1 (fr) 1997-08-14
CA2246374C true CA2246374C (fr) 2006-08-08

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ID=29422888

Family Applications (1)

Application Number Title Priority Date Filing Date
CA 2246374 Expired - Lifetime CA2246374C (fr) 1996-02-12 1997-02-03 Dispositif et procedes de mesure du contour d'une surface

Country Status (1)

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CA (1) CA2246374C (fr)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103412314A (zh) * 2013-08-01 2013-11-27 清华大学 一种基于天体辐射信号相干性的成像方法

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN115144861B (zh) * 2022-09-05 2022-11-04 天津帆探科技有限公司 一种混合固态激光雷达及扫描方法

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103412314A (zh) * 2013-08-01 2013-11-27 清华大学 一种基于天体辐射信号相干性的成像方法
CN103412314B (zh) * 2013-08-01 2015-07-29 清华大学 一种基于天体辐射信号相干性的成像方法

Also Published As

Publication number Publication date
CA2246374A1 (fr) 1997-08-14

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