CA2235176A1 - Methode et appareil pour l'inspection et la classification ameliorees des attributs d'une piece a travailler - Google Patents
Methode et appareil pour l'inspection et la classification ameliorees des attributs d'une piece a travailler Download PDFInfo
- Publication number
- CA2235176A1 CA2235176A1 CA002235176A CA2235176A CA2235176A1 CA 2235176 A1 CA2235176 A1 CA 2235176A1 CA 002235176 A CA002235176 A CA 002235176A CA 2235176 A CA2235176 A CA 2235176A CA 2235176 A1 CA2235176 A1 CA 2235176A1
- Authority
- CA
- Canada
- Prior art keywords
- workpiece
- signals
- generate
- encoder wheel
- angular velocity
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
- G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
- G01N21/898—Irregularities in textured or patterned surfaces, e.g. textiles, wood
- G01N21/8986—Wood
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
- G01N23/083—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
- G01N23/16—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the material being a moving sheet or film
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
- G01N23/18—Investigating the presence of flaws defects or foreign matter
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
- G01N33/46—Wood
Landscapes
- Life Sciences & Earth Sciences (AREA)
- Health & Medical Sciences (AREA)
- Chemical & Material Sciences (AREA)
- General Physics & Mathematics (AREA)
- Pathology (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Physics & Mathematics (AREA)
- Immunology (AREA)
- Engineering & Computer Science (AREA)
- Wood Science & Technology (AREA)
- Toxicology (AREA)
- Textile Engineering (AREA)
- Food Science & Technology (AREA)
- Medicinal Chemistry (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CA002235176A CA2235176C (fr) | 1998-04-17 | 1998-04-17 | Methode et appareil pour l'inspection et la classification ameliorees des attributs d'une piece a travailler |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CA002235176A CA2235176C (fr) | 1998-04-17 | 1998-04-17 | Methode et appareil pour l'inspection et la classification ameliorees des attributs d'une piece a travailler |
Publications (2)
Publication Number | Publication Date |
---|---|
CA2235176A1 true CA2235176A1 (fr) | 1999-10-17 |
CA2235176C CA2235176C (fr) | 2005-08-16 |
Family
ID=29275567
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CA002235176A Expired - Lifetime CA2235176C (fr) | 1998-04-17 | 1998-04-17 | Methode et appareil pour l'inspection et la classification ameliorees des attributs d'une piece a travailler |
Country Status (1)
Country | Link |
---|---|
CA (1) | CA2235176C (fr) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN114994139A (zh) * | 2022-08-05 | 2022-09-02 | 国网天津市电力公司电力科学研究院 | 一种电缆缓冲层的缺陷检测方法、装置、设备及存储介质 |
-
1998
- 1998-04-17 CA CA002235176A patent/CA2235176C/fr not_active Expired - Lifetime
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN114994139A (zh) * | 2022-08-05 | 2022-09-02 | 国网天津市电力公司电力科学研究院 | 一种电缆缓冲层的缺陷检测方法、装置、设备及存储介质 |
CN114994139B (zh) * | 2022-08-05 | 2022-11-08 | 国网天津市电力公司电力科学研究院 | 一种电缆缓冲层的缺陷检测方法、装置、设备及存储介质 |
Also Published As
Publication number | Publication date |
---|---|
CA2235176C (fr) | 2005-08-16 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
EEER | Examination request | ||
MKEX | Expiry |
Effective date: 20180417 |