CA2235176A1 - Method and apparatus for improved inspection and classification of attributes of a workpiece - Google Patents

Method and apparatus for improved inspection and classification of attributes of a workpiece Download PDF

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Publication number
CA2235176A1
CA2235176A1 CA002235176A CA2235176A CA2235176A1 CA 2235176 A1 CA2235176 A1 CA 2235176A1 CA 002235176 A CA002235176 A CA 002235176A CA 2235176 A CA2235176 A CA 2235176A CA 2235176 A1 CA2235176 A1 CA 2235176A1
Authority
CA
Canada
Prior art keywords
workpiece
signals
generate
encoder wheel
angular velocity
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
CA002235176A
Other languages
French (fr)
Other versions
CA2235176C (en
Inventor
Steve C. Woods
Michael Mcguire
Harry Ogloff
Zvonimir Skocic
Emeric Johnson
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
USNR Kockums Cancar Co
Original Assignee
CAE Newnes Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by CAE Newnes Ltd filed Critical CAE Newnes Ltd
Priority to CA002235176A priority Critical patent/CA2235176C/en
Publication of CA2235176A1 publication Critical patent/CA2235176A1/en
Application granted granted Critical
Publication of CA2235176C publication Critical patent/CA2235176C/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • G01N21/898—Irregularities in textured or patterned surfaces, e.g. textiles, wood
    • G01N21/8986—Wood
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/083—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/16—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the material being a moving sheet or film
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/18—Investigating the presence of flaws defects or foreign matter
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
    • G01N33/46—Wood

Abstract

An apparatus for detecting the probable existence, location, and type of defects in a workpiece is described. The apparatus includes a sensor subsystem, an optimizer, a control subsystem, and a computer system having a processor and computer readable memory. Sensor subsystem senses a first section of the workpiece and produces signals corresponding to a physical characteristic of the workpiece. The computer system is configured to generate a workpiece model based on the signals produced by the sensor subsystem. In an alternate embodiment, a defect assembler can be provided to merge signals from a plurality of sensor subsystems. The defect assembler can also be configured to generate the workpiece data model. The optimizer is configured to generate workpiece segmentation recommendations based on the workpiece data model. The processor is configured with a first producer thread program which, in response to the receipt of a first set of signals by the computer system, receives a data subscription request from a subsystem which uses data and transmits the signals from the computer readable memory to the generator of the data subscription request. The processor is further configured to generate a second producer thread in response to storage of a second set of signals in the computer readable memory. The second producer thread is configured to receive one of the data subscription requests and selectively send the second set of signals to the generator of the data subscription request. A tracking device for tracking selective kinematics of a workpiece moving through a plant is also disclosed. The tracking device includes an encoder wheel configured to tangentially contact a workpiece and rotate at an angular velocity coincident with the linear velocity of the workpiece. The tracking apparatus further includes a drive mechanism for driving the encoder wheel at a first angular velocity approaching the angular velocity of the encoder wheel which is coincident with the linear velocity of the workpiece. The tracking device also includes a signal generator configured to interact with the encoder wheel and generate a signal in response to the angular velocity of the encoder wheel. The tracking apparatus can be incorporated into the apparatus for detecting defects within a workpiece by providing the signal from the signal generator to the control subsystem.
CA002235176A 1998-04-17 1998-04-17 Method and apparatus for improved inspection and classification of attributes of a workpiece Expired - Lifetime CA2235176C (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CA002235176A CA2235176C (en) 1998-04-17 1998-04-17 Method and apparatus for improved inspection and classification of attributes of a workpiece

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CA002235176A CA2235176C (en) 1998-04-17 1998-04-17 Method and apparatus for improved inspection and classification of attributes of a workpiece

Publications (2)

Publication Number Publication Date
CA2235176A1 true CA2235176A1 (en) 1999-10-17
CA2235176C CA2235176C (en) 2005-08-16

Family

ID=29275567

Family Applications (1)

Application Number Title Priority Date Filing Date
CA002235176A Expired - Lifetime CA2235176C (en) 1998-04-17 1998-04-17 Method and apparatus for improved inspection and classification of attributes of a workpiece

Country Status (1)

Country Link
CA (1) CA2235176C (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN114994139A (en) * 2022-08-05 2022-09-02 国网天津市电力公司电力科学研究院 Defect detection method, device and equipment for cable buffer layer and storage medium

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN114994139A (en) * 2022-08-05 2022-09-02 国网天津市电力公司电力科学研究院 Defect detection method, device and equipment for cable buffer layer and storage medium
CN114994139B (en) * 2022-08-05 2022-11-08 国网天津市电力公司电力科学研究院 Defect detection method, device and equipment for cable buffer layer and storage medium

Also Published As

Publication number Publication date
CA2235176C (en) 2005-08-16

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MKEX Expiry

Effective date: 20180417