CA2171479A1 - Methode et dispositif de commande de faisceaux de particules neutres et chargees - Google Patents

Methode et dispositif de commande de faisceaux de particules neutres et chargees

Info

Publication number
CA2171479A1
CA2171479A1 CA002171479A CA2171479A CA2171479A1 CA 2171479 A1 CA2171479 A1 CA 2171479A1 CA 002171479 A CA002171479 A CA 002171479A CA 2171479 A CA2171479 A CA 2171479A CA 2171479 A1 CA2171479 A1 CA 2171479A1
Authority
CA
Canada
Prior art keywords
radiation
optical system
capillaries
section
hemilenses
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
CA002171479A
Other languages
English (en)
Inventor
Muradin Abubekirovich Kumakhov
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Individual
Original Assignee
Individual
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Individual filed Critical Individual
Priority to CA002171479A priority Critical patent/CA2171479A1/fr
Publication of CA2171479A1 publication Critical patent/CA2171479A1/fr
Abandoned legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B82—NANOTECHNOLOGY
    • B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y20/00—Nanooptics, e.g. quantum optics or photonic crystals
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
    • G21K1/06—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diffraction, refraction or reflection, e.g. monochromators
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
    • G21K1/10—Scattering devices; Absorbing devices; Ionising radiation filters
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K5/00—Irradiation devices
    • G21K5/04—Irradiation devices with beam-forming means

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Chemical & Material Sciences (AREA)
  • Nanotechnology (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Biophysics (AREA)
  • Optics & Photonics (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)

Abstract

Cette invention permet de dévier ou de focaliser des faisceaux, de convertir des faisceaux divergents en faisceaux quasi-parallèles et inversement, ainsi que de filtrer et de monochromatiser des faisceaux. Les pertes d'énergie dans le transport du rayonnement sont réduites, le spectre d'énergie utile est élargi et la concentration du rayonnement accrue. On peut utiliser des sources à grande échelle sans aucune réduction de la proportion de particules capturées et le spectre de rayonnement peut être régulé. Pour ce faire, le procédé consiste, outre la réflexion répétée de particules à mesure qu'elles interagissent avec des milieux alternés de différentes densités, en la dissémination diffuse et potentielle ou l'interférence des particules diffractées par des structures multicouches créées sur des surfaces réfléchissantes. Le dispositif de l'invention est doté d'un revêtement constituant lesdites surfaces sous forme de couches aux propriétés électromagnétiques différentes. Le système optique est de préférence conçu sous la forme d'un ensemble de lentilles ou de demi-lentilles (28) miniatures constituées d'une pluralité de capillaires ou de poly-capillaires, un revêtement approprié (22) étant appliqué aux parois des canaux (24) de ces capillaires. Cet agencement permet d'éliminer les structures de support pour le façonnage des profilés du système optique.
CA002171479A 1994-07-08 1994-07-08 Methode et dispositif de commande de faisceaux de particules neutres et chargees Abandoned CA2171479A1 (fr)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CA002171479A CA2171479A1 (fr) 1994-07-08 1994-07-08 Methode et dispositif de commande de faisceaux de particules neutres et chargees

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CA002171479A CA2171479A1 (fr) 1994-07-08 1994-07-08 Methode et dispositif de commande de faisceaux de particules neutres et chargees

Publications (1)

Publication Number Publication Date
CA2171479A1 true CA2171479A1 (fr) 1996-01-25

Family

ID=4157725

Family Applications (1)

Application Number Title Priority Date Filing Date
CA002171479A Abandoned CA2171479A1 (fr) 1994-07-08 1994-07-08 Methode et dispositif de commande de faisceaux de particules neutres et chargees

Country Status (1)

Country Link
CA (1) CA2171479A1 (fr)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111504455A (zh) * 2020-04-29 2020-08-07 中国工程物理研究院核物理与化学研究所 一种用于中子小角散射谱仪聚焦的菲涅尔透镜组的制备方法

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111504455A (zh) * 2020-04-29 2020-08-07 中国工程物理研究院核物理与化学研究所 一种用于中子小角散射谱仪聚焦的菲涅尔透镜组的制备方法

Similar Documents

Publication Publication Date Title
EP0723272B1 (fr) Procede de guidage de faisceaux de particules neutres et chargees et son dispositif de mise en uvre
Kumakhov et al. Multiple reflection from surface X-ray optics
Dabagov Channeling of neutral particles in micro-and nanocapillaries
Wilkins et al. On the concentration, focusing, and collimation of x‐rays and neutrons using microchannel plates and configurations of holes
US5022064A (en) X-ray optical system formed by multilayer reflecting mirrors for reflecting X-rays of different wavelengths
Yang Fresnel and refractive lenses for X-rays
AU754593B2 (en) Integral lens for high energy particle flow, method for producing such lenses and use thereof in analysis devices and devices for radiation therapy and lithography
WO1992008235A1 (fr) Dispositif de commande de faisceaux de particules, de rayons x et de quanta gamma, et leurs utilisations
Dhez et al. Instrumental aspects of x-ray microbeams in the range above 1 keV
Franks X-ray optics
Dabagov et al. Observation of Interference Effects at the Focus of an X-ray Lens
Kumakhov X-ray capillary optics: history of development and present status
Lengeler et al. Beryllium parabolic refractive x‐ray lenses
Bonse et al. Kirkpatrick–Baez microprobe on the basis of two linear single crystal Bragg–Fresnel lenses
Ott Focusing optics for neutrons
CA2171479A1 (fr) Methode et dispositif de commande de faisceaux de particules neutres et chargees
Thompson et al. Focussing of synchroton radiation X-ray beams using synthetic multilayer mirrors
Aristov et al. Recent advances in X-ray refractive optics
Kumakhov Status of x-ray capillary optics
US7548607B2 (en) Refractive x-ray element
Patommel Hard X-Ray Scanning Microscope Using Nanofocusing Parabolic Refractive Lenses
Idir et al. 2D focusing with an off-axis elliptical Bragg-Fresnel multilayer lens and application to X-ray imaging
Kumakhov State and perspectives of capillary Roentgen optics
Cocco et al. Synchrotron Radiation Sources and Optical Devices
Dudchik et al. Short-focal-length compound refractive lenses for x-rays

Legal Events

Date Code Title Description
EEER Examination request
FZDE Discontinued