CA2157343A1 - Apparatus and method for isotopic ratio plasma mass spectrometry - Google Patents

Apparatus and method for isotopic ratio plasma mass spectrometry

Info

Publication number
CA2157343A1
CA2157343A1 CA002157343A CA2157343A CA2157343A1 CA 2157343 A1 CA2157343 A1 CA 2157343A1 CA 002157343 A CA002157343 A CA 002157343A CA 2157343 A CA2157343 A CA 2157343A CA 2157343 A1 CA2157343 A1 CA 2157343A1
Authority
CA
Canada
Prior art keywords
orifice
pressure
skimming
maintained
sampling
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
CA002157343A
Other languages
English (en)
French (fr)
Inventor
Alan Lyle Gray
Martin Liezers
John Gareth Williams
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fisons Ltd
Original Assignee
Alan Lyle Gray
Martin Liezers
John Gareth Williams
Fisons Plc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Alan Lyle Gray, Martin Liezers, John Gareth Williams, Fisons Plc filed Critical Alan Lyle Gray
Publication of CA2157343A1 publication Critical patent/CA2157343A1/en
Abandoned legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/06—Electron- or ion-optical arrangements
    • H01J49/067—Ion lenses, apertures, skimmers
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/105—Ion sources; Ion guns using high-frequency excitation, e.g. microwave excitation, Inductively Coupled Plasma [ICP]
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
    • B01D—SEPARATION
    • B01D59/00—Separation of different isotopes of the same chemical element
    • B01D59/44—Separation by mass spectrography

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
CA002157343A 1994-09-02 1995-08-31 Apparatus and method for isotopic ratio plasma mass spectrometry Abandoned CA2157343A1 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
GB9417700A GB9417700D0 (en) 1994-09-02 1994-09-02 Apparatus and method for isotopic ratio plasma mass spectrometry
GB9417700.3 1994-09-02

Publications (1)

Publication Number Publication Date
CA2157343A1 true CA2157343A1 (en) 1996-03-03

Family

ID=10760753

Family Applications (1)

Application Number Title Priority Date Filing Date
CA002157343A Abandoned CA2157343A1 (en) 1994-09-02 1995-08-31 Apparatus and method for isotopic ratio plasma mass spectrometry

Country Status (5)

Country Link
US (1) US5572024A (de)
EP (1) EP0700068A1 (de)
JP (1) JPH08193978A (de)
CA (1) CA2157343A1 (de)
GB (1) GB9417700D0 (de)

Families Citing this family (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6265717B1 (en) * 1998-07-15 2001-07-24 Agilent Technologies Inductively coupled plasma mass spectrometer and method
US6391649B1 (en) 1999-05-04 2002-05-21 The Rockefeller University Method for the comparative quantitative analysis of proteins and other biological material by isotopic labeling and mass spectroscopy
JP3727047B2 (ja) * 1999-07-30 2005-12-14 住友イートンノバ株式会社 イオン注入装置
JP3827132B2 (ja) * 1999-07-30 2006-09-27 株式会社 Ｓｅｎ−Ｓｈｉ・アクセリス カンパニー イオン注入装置及びイオン注入方法
US6974951B1 (en) 2001-01-29 2005-12-13 Metara, Inc. Automated in-process ratio mass spectrometry
US6610978B2 (en) 2001-03-27 2003-08-26 Agilent Technologies, Inc. Integrated sample preparation, separation and introduction microdevice for inductively coupled plasma mass spectrometry
US7220383B2 (en) 2001-07-13 2007-05-22 Metara, Inc. Method and instrument for automated analysis of fluid-based processing systems
US7531134B1 (en) 2002-03-08 2009-05-12 Metara, Inc. Method and apparatus for automated analysis and characterization of chemical constituents of process solutions
US20040002166A1 (en) * 2002-06-27 2004-01-01 Wiederin Daniel R. Remote analysis using aerosol sample transport
JP4162138B2 (ja) 2003-10-27 2008-10-08 株式会社リガク 昇温脱離ガス分析装置
US8263413B1 (en) 2008-10-17 2012-09-11 Andrew S Hansen Methods for analyzing lipids and membrane proteins in biological matter using stable isotopes and mass spectrometry
US8373118B2 (en) * 2010-10-21 2013-02-12 Advion, Inc. Atmospheric pressure ionization inlet for mass spectrometers
US11585743B2 (en) 2020-08-28 2023-02-21 Halliburton Energy Services, Inc. Determining formation porosity and permeability
US11536136B2 (en) 2020-08-28 2022-12-27 Halliburton Energy Services, Inc. Plasma chemistry based analysis and operations for pulse power drilling
US11619129B2 (en) 2020-08-28 2023-04-04 Halliburton Energy Services, Inc. Estimating formation isotopic concentration with pulsed power drilling
US11459883B2 (en) 2020-08-28 2022-10-04 Halliburton Energy Services, Inc. Plasma chemistry derived formation rock evaluation for pulse power drilling
US11499421B2 (en) 2020-08-28 2022-11-15 Halliburton Energy Services, Inc. Plasma chemistry based analysis and operations for pulse power drilling

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4963735A (en) * 1988-11-11 1990-10-16 Hitachi, Ltd. Plasma source mass spectrometer
GB8901975D0 (en) * 1989-01-30 1989-03-22 Vg Instr Group Plasma mass spectrometer
JPH03194843A (ja) * 1989-12-25 1991-08-26 Hitachi Ltd プラズマイオン源極微量元素質量分析装置
JPH03261062A (ja) * 1990-03-09 1991-11-20 Hitachi Ltd プラズマ極微量元素質量分析装置
GB9105073D0 (en) * 1991-03-11 1991-04-24 Vg Instr Group Isotopic-ratio plasma mass spectrometer
US5218204A (en) * 1992-05-27 1993-06-08 Iowa State University Research Foundation, Inc. Plasma sampling interface for inductively coupled plasma-mass spectrometry (ICP-MS)

Also Published As

Publication number Publication date
EP0700068A1 (de) 1996-03-06
US5572024A (en) 1996-11-05
JPH08193978A (ja) 1996-07-30
GB9417700D0 (en) 1994-10-19

Similar Documents

Publication Publication Date Title
US5818041A (en) Mass spectrometer system and method for transporting and analyzing ions
US5572024A (en) Apparatus and method for isotopic ratio plasma mass spectrometry
US6265717B1 (en) Inductively coupled plasma mass spectrometer and method
US7230232B2 (en) Means for removing unwanted ions from an ion transport system and mass spectrometer
Gray Mass spectrometry with an inductively coupled plasma as an ion source: the influence on ultratrace analysis of background and matrix response
US7053368B2 (en) Focusing ions using gas dynamics
EP0698281B1 (de) Verfahren zur plasmamassenspektrometrie mit reduziertem raumladungseffekt
EP1483775B1 (de) Plasmamassenspektrometer
US5051584A (en) Plasma mass spectrometer
CA2143669C (en) Reducing interferences in plasma source mass spectrometers
Satzger et al. Detection of halogens as positive ions using a He microwave induced plasma as an ion source for mass spectrometry
CA2259352A1 (en) Ion source for a mass analyser and method of providing a source of ions for analysis
Chambers et al. Fundamental studies of the sampling process in an inductively coupled plasma mass spectrometer-II: Ion kinetic energy measurements
HyweláEvans Feasibility study of low pressure inductively coupled plasma mass spectrometry for qualitative and quantitative speciation
Wu et al. Elemental mass spectrometry using a helium microwave plasma torch as an ion source
US6075243A (en) Mass spectrometer
Poussel et al. Dissociation of analyte oxide ions in inductively coupled plasma mass spectrometry
Houk et al. Atomic emission spectrometry with a reduced-pressure afterglow extracted from an inductively coupled plasma
Bruins LC-MS and LC-MS-MS for Biomedical Analyses
JP2901628B2 (ja) 質量分析装置
JPH02295055A (ja) プラズマイオン化質量分析装置
JPS6120859A (ja) 水素キヤリアガスを用いたガスクロマトグラフ質量分析装置
WO1991015029A1 (en) Plasma mass spectrometer

Legal Events

Date Code Title Description
FZDE Discontinued