CA2048669A1 - Coating process - Google Patents
Coating processInfo
- Publication number
- CA2048669A1 CA2048669A1 CA 2048669 CA2048669A CA2048669A1 CA 2048669 A1 CA2048669 A1 CA 2048669A1 CA 2048669 CA2048669 CA 2048669 CA 2048669 A CA2048669 A CA 2048669A CA 2048669 A1 CA2048669 A1 CA 2048669A1
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- CA
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- Prior art keywords
- substrate
- irradiated
- layer
- regions
- radiation
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Abandoned
Links
- 238000000576 coating method Methods 0.000 title abstract description 11
- 239000000758 substrate Substances 0.000 claims abstract description 48
- 238000000034 method Methods 0.000 claims abstract description 19
- 150000001875 compounds Chemical class 0.000 claims abstract description 9
- 230000005855 radiation Effects 0.000 claims abstract description 9
- 229910052782 aluminium Inorganic materials 0.000 claims description 10
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 claims description 10
- PMHQVHHXPFUNSP-UHFFFAOYSA-M copper(1+);methylsulfanylmethane;bromide Chemical compound Br[Cu].CSC PMHQVHHXPFUNSP-UHFFFAOYSA-M 0.000 claims description 7
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 claims description 6
- 229910052751 metal Inorganic materials 0.000 claims description 4
- 239000002184 metal Substances 0.000 claims description 4
- 239000000203 mixture Substances 0.000 claims description 4
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims description 3
- 229910052802 copper Inorganic materials 0.000 claims description 3
- 239000010949 copper Substances 0.000 claims description 3
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 claims description 3
- 229910052737 gold Inorganic materials 0.000 claims description 3
- 239000010931 gold Substances 0.000 claims description 3
- 229910052759 nickel Inorganic materials 0.000 claims description 3
- 239000000126 substance Substances 0.000 claims description 3
- PIGFYZPCRLYGLF-UHFFFAOYSA-N Aluminum nitride Chemical compound [Al]#N PIGFYZPCRLYGLF-UHFFFAOYSA-N 0.000 claims description 2
- HCHKCACWOHOZIP-UHFFFAOYSA-N Zinc Chemical compound [Zn] HCHKCACWOHOZIP-UHFFFAOYSA-N 0.000 claims description 2
- VZPPHXVFMVZRTE-UHFFFAOYSA-N [Kr]F Chemical compound [Kr]F VZPPHXVFMVZRTE-UHFFFAOYSA-N 0.000 claims description 2
- 229910052725 zinc Inorganic materials 0.000 claims description 2
- 239000011701 zinc Substances 0.000 claims description 2
- 229910010293 ceramic material Inorganic materials 0.000 claims 1
- 238000001465 metallisation Methods 0.000 claims 1
- 238000004544 sputter deposition Methods 0.000 claims 1
- 238000007740 vapor deposition Methods 0.000 claims 1
- 230000001678 irradiating effect Effects 0.000 abstract description 8
- 239000011248 coating agent Substances 0.000 abstract description 7
- 230000003014 reinforcing effect Effects 0.000 abstract description 2
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 10
- 239000007789 gas Substances 0.000 description 6
- 229910052757 nitrogen Inorganic materials 0.000 description 5
- 229910052581 Si3N4 Inorganic materials 0.000 description 3
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 description 3
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 2
- 239000000956 alloy Substances 0.000 description 2
- 229910045601 alloy Inorganic materials 0.000 description 2
- 239000000919 ceramic Substances 0.000 description 2
- 239000004020 conductor Substances 0.000 description 2
- 229910052756 noble gas Inorganic materials 0.000 description 2
- 230000003287 optical effect Effects 0.000 description 2
- 238000002230 thermal chemical vapour deposition Methods 0.000 description 2
- 229910052724 xenon Inorganic materials 0.000 description 2
- FHNFHKCVQCLJFQ-UHFFFAOYSA-N xenon atom Chemical compound [Xe] FHNFHKCVQCLJFQ-UHFFFAOYSA-N 0.000 description 2
- -1 AlN compound Chemical class 0.000 description 1
- ZAMOUSCENKQFHK-UHFFFAOYSA-N Chlorine atom Chemical compound [Cl] ZAMOUSCENKQFHK-UHFFFAOYSA-N 0.000 description 1
- QLJCFNUYUJEXET-UHFFFAOYSA-K aluminum;trinitrite Chemical compound [Al+3].[O-]N=O.[O-]N=O.[O-]N=O QLJCFNUYUJEXET-UHFFFAOYSA-K 0.000 description 1
- 229910052786 argon Inorganic materials 0.000 description 1
- ISQINHMJILFLAQ-UHFFFAOYSA-N argon hydrofluoride Chemical compound F.[Ar] ISQINHMJILFLAQ-UHFFFAOYSA-N 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 239000003054 catalyst Substances 0.000 description 1
- 239000000460 chlorine Substances 0.000 description 1
- 229910052801 chlorine Inorganic materials 0.000 description 1
- 238000010276 construction Methods 0.000 description 1
- 239000001307 helium Substances 0.000 description 1
- 229910052734 helium Inorganic materials 0.000 description 1
- SWQJXJOGLNCZEY-UHFFFAOYSA-N helium atom Chemical compound [He] SWQJXJOGLNCZEY-UHFFFAOYSA-N 0.000 description 1
- 229910052743 krypton Inorganic materials 0.000 description 1
- 238000005121 nitriding Methods 0.000 description 1
- 230000003647 oxidation Effects 0.000 description 1
- 238000007254 oxidation reaction Methods 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
Classifications
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- C—CHEMISTRY; METALLURGY
- C04—CEMENTS; CONCRETE; ARTIFICIAL STONE; CERAMICS; REFRACTORIES
- C04B—LIME, MAGNESIA; SLAG; CEMENTS; COMPOSITIONS THEREOF, e.g. MORTARS, CONCRETE OR LIKE BUILDING MATERIALS; ARTIFICIAL STONE; CERAMICS; REFRACTORIES; TREATMENT OF NATURAL STONE
- C04B41/00—After-treatment of mortars, concrete, artificial stone or ceramics; Treatment of natural stone
- C04B41/009—After-treatment of mortars, concrete, artificial stone or ceramics; Treatment of natural stone characterised by the material treated
-
- C—CHEMISTRY; METALLURGY
- C04—CEMENTS; CONCRETE; ARTIFICIAL STONE; CERAMICS; REFRACTORIES
- C04B—LIME, MAGNESIA; SLAG; CEMENTS; COMPOSITIONS THEREOF, e.g. MORTARS, CONCRETE OR LIKE BUILDING MATERIALS; ARTIFICIAL STONE; CERAMICS; REFRACTORIES; TREATMENT OF NATURAL STONE
- C04B41/00—After-treatment of mortars, concrete, artificial stone or ceramics; Treatment of natural stone
- C04B41/0036—Laser treatment
-
- C—CHEMISTRY; METALLURGY
- C04—CEMENTS; CONCRETE; ARTIFICIAL STONE; CERAMICS; REFRACTORIES
- C04B—LIME, MAGNESIA; SLAG; CEMENTS; COMPOSITIONS THEREOF, e.g. MORTARS, CONCRETE OR LIKE BUILDING MATERIALS; ARTIFICIAL STONE; CERAMICS; REFRACTORIES; TREATMENT OF NATURAL STONE
- C04B41/00—After-treatment of mortars, concrete, artificial stone or ceramics; Treatment of natural stone
- C04B41/45—Coating or impregnating, e.g. injection in masonry, partial coating of green or fired ceramics, organic coating compositions for adhering together two concrete elements
- C04B41/4505—Coating or impregnating, e.g. injection in masonry, partial coating of green or fired ceramics, organic coating compositions for adhering together two concrete elements characterised by the method of application
- C04B41/455—Coating or impregnating, e.g. injection in masonry, partial coating of green or fired ceramics, organic coating compositions for adhering together two concrete elements characterised by the method of application the coating or impregnating process including a chemical conversion or reaction
- C04B41/4556—Coating or impregnating, e.g. injection in masonry, partial coating of green or fired ceramics, organic coating compositions for adhering together two concrete elements characterised by the method of application the coating or impregnating process including a chemical conversion or reaction coating or impregnating with a product reacting with the substrate, e.g. generating a metal coating by surface reduction of a ceramic substrate
-
- C—CHEMISTRY; METALLURGY
- C04—CEMENTS; CONCRETE; ARTIFICIAL STONE; CERAMICS; REFRACTORIES
- C04B—LIME, MAGNESIA; SLAG; CEMENTS; COMPOSITIONS THEREOF, e.g. MORTARS, CONCRETE OR LIKE BUILDING MATERIALS; ARTIFICIAL STONE; CERAMICS; REFRACTORIES; TREATMENT OF NATURAL STONE
- C04B41/00—After-treatment of mortars, concrete, artificial stone or ceramics; Treatment of natural stone
- C04B41/45—Coating or impregnating, e.g. injection in masonry, partial coating of green or fired ceramics, organic coating compositions for adhering together two concrete elements
- C04B41/50—Coating or impregnating, e.g. injection in masonry, partial coating of green or fired ceramics, organic coating compositions for adhering together two concrete elements with inorganic materials
- C04B41/5093—Coating or impregnating, e.g. injection in masonry, partial coating of green or fired ceramics, organic coating compositions for adhering together two concrete elements with inorganic materials with elements other than metals or carbon
- C04B41/5096—Silicon
-
- C—CHEMISTRY; METALLURGY
- C04—CEMENTS; CONCRETE; ARTIFICIAL STONE; CERAMICS; REFRACTORIES
- C04B—LIME, MAGNESIA; SLAG; CEMENTS; COMPOSITIONS THEREOF, e.g. MORTARS, CONCRETE OR LIKE BUILDING MATERIALS; ARTIFICIAL STONE; CERAMICS; REFRACTORIES; TREATMENT OF NATURAL STONE
- C04B41/00—After-treatment of mortars, concrete, artificial stone or ceramics; Treatment of natural stone
- C04B41/45—Coating or impregnating, e.g. injection in masonry, partial coating of green or fired ceramics, organic coating compositions for adhering together two concrete elements
- C04B41/50—Coating or impregnating, e.g. injection in masonry, partial coating of green or fired ceramics, organic coating compositions for adhering together two concrete elements with inorganic materials
- C04B41/51—Metallising, e.g. infiltration of sintered ceramic preforms with molten metal
- C04B41/515—Other specific metals
- C04B41/5155—Aluminium
-
- C—CHEMISTRY; METALLURGY
- C04—CEMENTS; CONCRETE; ARTIFICIAL STONE; CERAMICS; REFRACTORIES
- C04B—LIME, MAGNESIA; SLAG; CEMENTS; COMPOSITIONS THEREOF, e.g. MORTARS, CONCRETE OR LIKE BUILDING MATERIALS; ARTIFICIAL STONE; CERAMICS; REFRACTORIES; TREATMENT OF NATURAL STONE
- C04B41/00—After-treatment of mortars, concrete, artificial stone or ceramics; Treatment of natural stone
- C04B41/45—Coating or impregnating, e.g. injection in masonry, partial coating of green or fired ceramics, organic coating compositions for adhering together two concrete elements
- C04B41/52—Multiple coating or impregnating multiple coating or impregnating with the same composition or with compositions only differing in the concentration of the constituents, is classified as single coating or impregnation
-
- C—CHEMISTRY; METALLURGY
- C04—CEMENTS; CONCRETE; ARTIFICIAL STONE; CERAMICS; REFRACTORIES
- C04B—LIME, MAGNESIA; SLAG; CEMENTS; COMPOSITIONS THEREOF, e.g. MORTARS, CONCRETE OR LIKE BUILDING MATERIALS; ARTIFICIAL STONE; CERAMICS; REFRACTORIES; TREATMENT OF NATURAL STONE
- C04B41/00—After-treatment of mortars, concrete, artificial stone or ceramics; Treatment of natural stone
- C04B41/80—After-treatment of mortars, concrete, artificial stone or ceramics; Treatment of natural stone of only ceramics
-
- C—CHEMISTRY; METALLURGY
- C04—CEMENTS; CONCRETE; ARTIFICIAL STONE; CERAMICS; REFRACTORIES
- C04B—LIME, MAGNESIA; SLAG; CEMENTS; COMPOSITIONS THEREOF, e.g. MORTARS, CONCRETE OR LIKE BUILDING MATERIALS; ARTIFICIAL STONE; CERAMICS; REFRACTORIES; TREATMENT OF NATURAL STONE
- C04B41/00—After-treatment of mortars, concrete, artificial stone or ceramics; Treatment of natural stone
- C04B41/80—After-treatment of mortars, concrete, artificial stone or ceramics; Treatment of natural stone of only ceramics
- C04B41/81—Coating or impregnation
-
- C—CHEMISTRY; METALLURGY
- C04—CEMENTS; CONCRETE; ARTIFICIAL STONE; CERAMICS; REFRACTORIES
- C04B—LIME, MAGNESIA; SLAG; CEMENTS; COMPOSITIONS THEREOF, e.g. MORTARS, CONCRETE OR LIKE BUILDING MATERIALS; ARTIFICIAL STONE; CERAMICS; REFRACTORIES; TREATMENT OF NATURAL STONE
- C04B41/00—After-treatment of mortars, concrete, artificial stone or ceramics; Treatment of natural stone
- C04B41/80—After-treatment of mortars, concrete, artificial stone or ceramics; Treatment of natural stone of only ceramics
- C04B41/81—Coating or impregnation
- C04B41/85—Coating or impregnation with inorganic materials
-
- C—CHEMISTRY; METALLURGY
- C04—CEMENTS; CONCRETE; ARTIFICIAL STONE; CERAMICS; REFRACTORIES
- C04B—LIME, MAGNESIA; SLAG; CEMENTS; COMPOSITIONS THEREOF, e.g. MORTARS, CONCRETE OR LIKE BUILDING MATERIALS; ARTIFICIAL STONE; CERAMICS; REFRACTORIES; TREATMENT OF NATURAL STONE
- C04B41/00—After-treatment of mortars, concrete, artificial stone or ceramics; Treatment of natural stone
- C04B41/80—After-treatment of mortars, concrete, artificial stone or ceramics; Treatment of natural stone of only ceramics
- C04B41/81—Coating or impregnation
- C04B41/85—Coating or impregnation with inorganic materials
- C04B41/88—Metals
-
- C—CHEMISTRY; METALLURGY
- C04—CEMENTS; CONCRETE; ARTIFICIAL STONE; CERAMICS; REFRACTORIES
- C04B—LIME, MAGNESIA; SLAG; CEMENTS; COMPOSITIONS THEREOF, e.g. MORTARS, CONCRETE OR LIKE BUILDING MATERIALS; ARTIFICIAL STONE; CERAMICS; REFRACTORIES; TREATMENT OF NATURAL STONE
- C04B41/00—After-treatment of mortars, concrete, artificial stone or ceramics; Treatment of natural stone
- C04B41/80—After-treatment of mortars, concrete, artificial stone or ceramics; Treatment of natural stone of only ceramics
- C04B41/81—Coating or impregnation
- C04B41/89—Coating or impregnation for obtaining at least two superposed coatings having different compositions
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/04—Coating on selected surface areas, e.g. using masks
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C26/00—Coating not provided for in groups C23C2/00 - C23C24/00
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/10—Apparatus or processes for manufacturing printed circuits in which conductive material is applied to the insulating support in such a manner as to form the desired conductive pattern
- H05K3/105—Apparatus or processes for manufacturing printed circuits in which conductive material is applied to the insulating support in such a manner as to form the desired conductive pattern by conversion of non-conductive material on or in the support into conductive material, e.g. by using an energy beam
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2203/00—Indexing scheme relating to apparatus or processes for manufacturing printed circuits covered by H05K3/00
- H05K2203/05—Patterning and lithography; Masks; Details of resist
- H05K2203/0548—Masks
- H05K2203/056—Using an artwork, i.e. a photomask for exposing photosensitive layers
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Ceramic Engineering (AREA)
- Materials Engineering (AREA)
- Organic Chemistry (AREA)
- Structural Engineering (AREA)
- Inorganic Chemistry (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Manufacturing & Machinery (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Chemical & Material Sciences (AREA)
- Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Chemical Vapour Deposition (AREA)
- Chemically Coating (AREA)
- Manufacturing Of Printed Wiring (AREA)
- Physical Vapour Deposition (AREA)
- Other Surface Treatments For Metallic Materials (AREA)
Abstract
Abstract Coating Process The invention relates to a process for coating a substrate surface (1A). To this end, the surface (lA) of the substrate (1) is irradiated with UV radiation having a defined wavelength. The substrate (1) used comprises a chemical compound that has at least one readily oxidizable or readily sublimatable component.
Irradiating all or part of the substrate surface (lA) liberates the readily oxidizable or readily sublimating component of the chemical compound, so that the irradiated regions (lB) of the surface (lA) are formed by the remaining components of the chemical compound. These regions can then be reinforced with a reinforcing layer (4) using conventional coating processes.
Significant figure: Fig. 2
Irradiating all or part of the substrate surface (lA) liberates the readily oxidizable or readily sublimating component of the chemical compound, so that the irradiated regions (lB) of the surface (lA) are formed by the remaining components of the chemical compound. These regions can then be reinforced with a reinforcing layer (4) using conventional coating processes.
Significant figure: Fig. 2
Description
-`' 20~69 PCT/EP 90/02270, December 20, 1990 COATING PROCESS
The invention relates to a process for coating substrates as ~enerically defined by the preamble to claim 1.
Such processes are used wherever the surface of a substrate is to be metallized partially or completely, or provided with an alloy or a dielectric layer.
The object of the invention is to disclose a process with which metallizing and/or the application of a layer to a substrate can be performed in a simple manner.
According to the invention, this object is attained by the characteristics of claim 1.
With the process according to the invention it is possible in a simple manner to partially or completely metallize the surface of the substrate, which is manufactured from aluminum nitrite, for example. By irradiating the substrate surface with UV radiation of a defined wavelen~th and pulse rate, the nitrogen in the irradiated region of the substrate surface can be liberated. The surface of the substrate in the irradiated regions, once the irradiation has ended, will be formed of pure aluminum. In currentless wet-chemical metall1zing baths, an alloy, a dielectric or a metal in the form of copper, nickel, gold, and so forth can then be applied to these regions.
Furthermore, all the surface reglons that are formed by~pure :, ~ , ' - :
.
~ 2 (~
aluminum after the irradiation can be reinforced by other processes, for instance by a conventional thermal chemical vapor deposition or electrolytic metallizing process. As a result of irradiating a substrate of silicon nitride the possibility also exists of liberating the nitrogen in the irradiated regions, so that the irradiated surface regions of the substrate are formed by pure silicon. The possibility also exists of irradiating ceramic substrates, prepared from chemical compounds that have at least one component that sublimates readily. The readily sublimating component is liberated by the irradiation, and the irradiated surface regions of the substrate are then formed by the components of the chemical compound that remain behind.
The invention will be described below in further detail in terms of examples. Shown are:
Fig. 1, the treatment of a substrate surface by the process according to the invention;
Fig. 2, an irradiated substrate:
Fig. 3, a coating substrate; and Fig. 4, a substrate provided with bondiny.
Fig. 1 shows a generally flat substrate 1, which in the exemplary embodiment shown here is manufactured of aluminum nitride (AlN). To form regions on the surface lA of the substrate 1 that are formed by a pure metal, the æubstrate 1 is irradiated with UV radiation. A high-power W emitter 2, in the form of an excimer laser or an excimer emitter is therefore .
'.
The invention relates to a process for coating substrates as ~enerically defined by the preamble to claim 1.
Such processes are used wherever the surface of a substrate is to be metallized partially or completely, or provided with an alloy or a dielectric layer.
The object of the invention is to disclose a process with which metallizing and/or the application of a layer to a substrate can be performed in a simple manner.
According to the invention, this object is attained by the characteristics of claim 1.
With the process according to the invention it is possible in a simple manner to partially or completely metallize the surface of the substrate, which is manufactured from aluminum nitrite, for example. By irradiating the substrate surface with UV radiation of a defined wavelen~th and pulse rate, the nitrogen in the irradiated region of the substrate surface can be liberated. The surface of the substrate in the irradiated regions, once the irradiation has ended, will be formed of pure aluminum. In currentless wet-chemical metall1zing baths, an alloy, a dielectric or a metal in the form of copper, nickel, gold, and so forth can then be applied to these regions.
Furthermore, all the surface reglons that are formed by~pure :, ~ , ' - :
.
~ 2 (~
aluminum after the irradiation can be reinforced by other processes, for instance by a conventional thermal chemical vapor deposition or electrolytic metallizing process. As a result of irradiating a substrate of silicon nitride the possibility also exists of liberating the nitrogen in the irradiated regions, so that the irradiated surface regions of the substrate are formed by pure silicon. The possibility also exists of irradiating ceramic substrates, prepared from chemical compounds that have at least one component that sublimates readily. The readily sublimating component is liberated by the irradiation, and the irradiated surface regions of the substrate are then formed by the components of the chemical compound that remain behind.
The invention will be described below in further detail in terms of examples. Shown are:
Fig. 1, the treatment of a substrate surface by the process according to the invention;
Fig. 2, an irradiated substrate:
Fig. 3, a coating substrate; and Fig. 4, a substrate provided with bondiny.
Fig. 1 shows a generally flat substrate 1, which in the exemplary embodiment shown here is manufactured of aluminum nitride (AlN). To form regions on the surface lA of the substrate 1 that are formed by a pure metal, the æubstrate 1 is irradiated with UV radiation. A high-power W emitter 2, in the form of an excimer laser or an excimer emitter is therefore .
'.
2 ~
disposed a defined distance above the substrate surface lA. A
detailed description of a high-powered emitter 2 of this kind can be found in European Patent Application 0 ~54 110. The high-power emitter 2, hereinafter called an excimer emitter for short, comprises a discharge chamber (not shown here) that is filled with a noble gas or gas mixture and is defined by metal electrodes (not shown here) cooled on one side and by a dielectric (also not shown here). The dielectric and the second electrode located on the surface of the dielectric remote from the discharge chamber are transparent to the radiation generated by corona electrical discharge. By means of this construction and a suitable selection of the filling gas, a high-power W
emitter of high efficiency with a large surface area is created.
The high-power emitter 2 operates in a quasi-pulsed mode. In the exemplary embodiment shown here, it is ~illed with krypton fluoride and can therefore produce UV radiation in the range from 240 to 270 nm. To produce UV radiation having a wavelength between 60 and 165 nm, a noble gas filling of helium or argon is used. With a xenon gas filling, a wavelength between 160 and 190 ~0 nm can be generated. With an argon fluoride gas filling, the wavelength is from 180 to 200 nm, while w1th a gas mixture of xenon and chlorine, a UV wavelength of from 300 to 320 nm can be attained. The excimer laser has a pulse rate of from 100 to 200 Hz, and the pulse energy is 100 to 200 mJ. With the gas mixtures Ar/F, Kr/F, XeCl, and Xe/F, the corresponding wavelengths 193 nm, :
disposed a defined distance above the substrate surface lA. A
detailed description of a high-powered emitter 2 of this kind can be found in European Patent Application 0 ~54 110. The high-power emitter 2, hereinafter called an excimer emitter for short, comprises a discharge chamber (not shown here) that is filled with a noble gas or gas mixture and is defined by metal electrodes (not shown here) cooled on one side and by a dielectric (also not shown here). The dielectric and the second electrode located on the surface of the dielectric remote from the discharge chamber are transparent to the radiation generated by corona electrical discharge. By means of this construction and a suitable selection of the filling gas, a high-power W
emitter of high efficiency with a large surface area is created.
The high-power emitter 2 operates in a quasi-pulsed mode. In the exemplary embodiment shown here, it is ~illed with krypton fluoride and can therefore produce UV radiation in the range from 240 to 270 nm. To produce UV radiation having a wavelength between 60 and 165 nm, a noble gas filling of helium or argon is used. With a xenon gas filling, a wavelength between 160 and 190 ~0 nm can be generated. With an argon fluoride gas filling, the wavelength is from 180 to 200 nm, while w1th a gas mixture of xenon and chlorine, a UV wavelength of from 300 to 320 nm can be attained. The excimer laser has a pulse rate of from 100 to 200 Hz, and the pulse energy is 100 to 200 mJ. With the gas mixtures Ar/F, Kr/F, XeCl, and Xe/F, the corresponding wavelengths 193 nm, :
.
. ~
:
- 2 ~
248 nm, 308 nm and 351 nm can be generated. If the entire surface of the substrate l is not to be irradiated, then a mask 3 is disposed between the surface lA and the excimer laser 2. This mask has openings 3D. The openings 3D are disposed precisely where irradiation of the substrate surface 1 is desired. By irradiating the substrate surface 1, the nitrogen in the AlN
compound is liberated. As a result, after the irradiation has ended, the irradiated regions lB are formed by pure aluminum.
The non-irradiated regions lN of the substrate surface lA
continue to be formed of aluminum nitride. If the entire surface of the substrate is to have an aluminum coating, then the irradiation can be performed without the mask 3. The surface regions lB, now formed by aluminum and shown in Fig. 2, can be used as catalysts, for instance, if the substrate 1 is further treated in currentless metallizing baths, so that a layer~of copper, nickel, gold or zinc, for instance, can be applied to these regions lB in a thickness of up to 30 ~m. A substrate 1 provided with such layers 4 is shown in Fig. 3. As can be seen from Fig. 3, the regions lN that comprise aluminum nitride remain ~-~
~0 free of any coating. According to the invention, the possibility also exists of reinforcinq or coating the regions lB by other processes. For instance, electrolytic metaIlizing can also be employed for coating or reinforcing. A current can also be passed continuously or in pulsed fashion through the regions lB.
In a CVD (chemical vapor deposltion) reactor, a thermal CVD
:
_4_ , - : . .
- . . . ..
- ' 2 ~ 6 ~ -process can also be performed locally in this way. The regions lB comprising aluminum can be oxidized or nitrified locally as well. By suitable disposition of a mask 3 between the substrate surface lA and the excimer laser 2, the regions lB can be embodied as conductor tracks for a circuit, by purposefully irradiating the surface lA. By means of the local oxidation or nitriding of certain regions of these conductors tracks, these tracks can be provided with interruptions for carrying electrical signals at desired points. With the aid of the excimer laser 2, the aluminum nitride substrate 1 can also be drilled through.
With the aid of focusing optical elements in the form of lenses and an XY displacing device, aluminum tracks can also be inscribed, in the course of which the AlN substrate is moved relative to the focusing beam of UV light. With the aid of a focusing optical element (not shown here), the beam arriving from the excimer laser can be bunched in such a way that the bore 5, shown in Fig. 4, can be formed with the particular desired diameter. As already mentioned, the suhstrate 1 is fabricated completely of aluminum nitride. During the formation of the bore 5, the nitrogen present in the wall defining the bore 5 is liberated, so that the defining wall, after the bore 5 has been finished, is formed exclusively of aluminum~ If the bore 5 is in direct electrically conductive contact with the region lB on the surface lA on the substrate 1, then this region 1~ is connected electrically conductively, via the wall of the bore 5, with the ",~ ' 2 (~ 9 layer 10 that is immediately adjacent the underside of the substrate 1.
The process according to the invention can be employed not only on substrates of aluminum nitride; there is also the possibility of irradiating substrates of silicon nitride (Si3N4) with the excimer laser. With this substrate as well, the nitrogen in the irradiated surface regions (not shown hexe) is again liberated. The possibility also exists of irradiating ceramic substrates that are formed of a chemical compound that has a readily sublimating component. The readily sublimating component is liberated by the irradiation. The irradiation surface regions of the substrate are then formed by the remaining components of the chemical compound. Since both the aluminum layers and the layers formed in the case of other substrates form an atomic bond with the layers located beneath them, a very high adhesion strength is effected thereby.
'
. ~
:
- 2 ~
248 nm, 308 nm and 351 nm can be generated. If the entire surface of the substrate l is not to be irradiated, then a mask 3 is disposed between the surface lA and the excimer laser 2. This mask has openings 3D. The openings 3D are disposed precisely where irradiation of the substrate surface 1 is desired. By irradiating the substrate surface 1, the nitrogen in the AlN
compound is liberated. As a result, after the irradiation has ended, the irradiated regions lB are formed by pure aluminum.
The non-irradiated regions lN of the substrate surface lA
continue to be formed of aluminum nitride. If the entire surface of the substrate is to have an aluminum coating, then the irradiation can be performed without the mask 3. The surface regions lB, now formed by aluminum and shown in Fig. 2, can be used as catalysts, for instance, if the substrate 1 is further treated in currentless metallizing baths, so that a layer~of copper, nickel, gold or zinc, for instance, can be applied to these regions lB in a thickness of up to 30 ~m. A substrate 1 provided with such layers 4 is shown in Fig. 3. As can be seen from Fig. 3, the regions lN that comprise aluminum nitride remain ~-~
~0 free of any coating. According to the invention, the possibility also exists of reinforcinq or coating the regions lB by other processes. For instance, electrolytic metaIlizing can also be employed for coating or reinforcing. A current can also be passed continuously or in pulsed fashion through the regions lB.
In a CVD (chemical vapor deposltion) reactor, a thermal CVD
:
_4_ , - : . .
- . . . ..
- ' 2 ~ 6 ~ -process can also be performed locally in this way. The regions lB comprising aluminum can be oxidized or nitrified locally as well. By suitable disposition of a mask 3 between the substrate surface lA and the excimer laser 2, the regions lB can be embodied as conductor tracks for a circuit, by purposefully irradiating the surface lA. By means of the local oxidation or nitriding of certain regions of these conductors tracks, these tracks can be provided with interruptions for carrying electrical signals at desired points. With the aid of the excimer laser 2, the aluminum nitride substrate 1 can also be drilled through.
With the aid of focusing optical elements in the form of lenses and an XY displacing device, aluminum tracks can also be inscribed, in the course of which the AlN substrate is moved relative to the focusing beam of UV light. With the aid of a focusing optical element (not shown here), the beam arriving from the excimer laser can be bunched in such a way that the bore 5, shown in Fig. 4, can be formed with the particular desired diameter. As already mentioned, the suhstrate 1 is fabricated completely of aluminum nitride. During the formation of the bore 5, the nitrogen present in the wall defining the bore 5 is liberated, so that the defining wall, after the bore 5 has been finished, is formed exclusively of aluminum~ If the bore 5 is in direct electrically conductive contact with the region lB on the surface lA on the substrate 1, then this region 1~ is connected electrically conductively, via the wall of the bore 5, with the ",~ ' 2 (~ 9 layer 10 that is immediately adjacent the underside of the substrate 1.
The process according to the invention can be employed not only on substrates of aluminum nitride; there is also the possibility of irradiating substrates of silicon nitride (Si3N4) with the excimer laser. With this substrate as well, the nitrogen in the irradiated surface regions (not shown hexe) is again liberated. The possibility also exists of irradiating ceramic substrates that are formed of a chemical compound that has a readily sublimating component. The readily sublimating component is liberated by the irradiation. The irradiation surface regions of the substrate are then formed by the remaining components of the chemical compound. Since both the aluminum layers and the layers formed in the case of other substrates form an atomic bond with the layers located beneath them, a very high adhesion strength is effected thereby.
'
Claims (6)
1. A process for forming layers on a substrate, characterized in that a substrate or a layer (1) comprising a chemical composition that has at least one compound which can be readily oxidized, nitrided or sublimated is irradiated partially or over the entire surface area to eliminate this component, such that the irradiated regions (1B) of the surface (1A) of the substrate (1) is now formed only by the remaining components of the chemical compound.
2. The process of claim 1, characterized in that the substrate or layer (1), which is produced by sputtering, vapor deposition or CVD processes, is irradiated with UV radiation having a wavelength between 60 and 370 nm.
3. The process of claim 1, characterized in that the substrate or layer (1) is irradiated with a high-power emitter (2) described in European Patent Application 0 254 111 or with an excimer laser, which has a pulse rate of 100 to 200 Hz and a pulse energy of 100 to 200 mJ.
4. The process of one of claims 1 to 3, characterized in that a substrate (1) of aluminum nitride (AlN) is irradiated with a high-power emitter (2) that has a gas filling of krypton fluoride and emits a UV radiation in the range from 240 to 270 nm.
5. The process of one of claims 1 to 4, characterized in that a substrate or layer (1) of a ceramic material is irradiated by a high-power emitter (2) that emits UV radiation in the wavelength range between 60 nm and 320 nm.
6. The process of one of claims 1 to 4, characterized in that the surface regions (IB), comprising aluminum, of the substrate (1) fabricated from aluminum nitride are reinforced in a currentless metal bath, by means of CVD processes or electrolytic metallization, with a layer of copper, nickel, gold, or zinc having a thickness of up to 30 nm.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE19893942472 DE3942472A1 (en) | 1989-12-22 | 1989-12-22 | COATING PROCESS |
DEP3942472.3 | 1989-12-22 |
Publications (1)
Publication Number | Publication Date |
---|---|
CA2048669A1 true CA2048669A1 (en) | 1991-06-23 |
Family
ID=6396137
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CA 2048669 Abandoned CA2048669A1 (en) | 1989-12-22 | 1990-12-20 | Coating process |
Country Status (4)
Country | Link |
---|---|
JP (1) | JPH04505481A (en) |
CA (1) | CA2048669A1 (en) |
DE (1) | DE3942472A1 (en) |
WO (1) | WO1991009984A1 (en) |
Families Citing this family (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0501278B1 (en) | 1991-02-28 | 1998-09-30 | Texas Instruments Incorporated | Method to produce masking |
DE4141365A1 (en) * | 1991-12-14 | 1993-06-17 | Mathias Dr Herrmann | SILICON NITRIDE INTERMEDIATE WITH MODIFIED SURFACE AND METHOD FOR PRODUCING THIS MODIFIED SURFACE |
TW260806B (en) * | 1993-11-26 | 1995-10-21 | Ushio Electric Inc | |
DE4342258A1 (en) * | 1993-12-10 | 1995-06-14 | Resma Gmbh | Conductive region prodn. on or in ceramic |
DE4401612A1 (en) * | 1994-01-20 | 1995-07-27 | Resma Gmbh | Conductive region prodn. in or on ceramic workpiece |
US5460693A (en) * | 1994-05-31 | 1995-10-24 | Texas Instruments Incorporated | Dry microlithography process |
DE10137763C2 (en) * | 2001-08-02 | 2003-08-14 | Siemens Ag | Process for the surface pretreatment of a surface of a substrate to be coated with a coating material |
EP1845170A3 (en) * | 2006-04-12 | 2007-11-21 | LPKF Laser & Electronics AG | Method for manufacturing a conductor path structure and such a conductor path structure |
DE102006017630A1 (en) * | 2006-04-12 | 2007-10-18 | Lpkf Laser & Electronics Ag | Method for producing a printed conductor structure and a printed conductor structure produced in this way |
TWI613177B (en) * | 2011-11-16 | 2018-02-01 | 製陶技術股份有限公司 | Process to produce a substrate |
DE102017223646A1 (en) | 2017-12-22 | 2019-06-27 | Robert Bosch Gmbh | A method of manufacturing a circuit carrier assembly and circuit carrier assembly |
DE102017223647A1 (en) | 2017-12-22 | 2019-06-27 | Robert Bosch Gmbh | Method for producing an electronic component, electronic component, SMD component and circuit carrier assembly |
DE102017223648A1 (en) | 2017-12-22 | 2019-06-27 | Robert Bosch Gmbh | A method of forming aluminum circuit traces by converting aluminum nitride into aluminum and circuit carrier assembly with aluminum tracks on a carrier substrate |
Family Cites Families (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3256109A (en) * | 1962-12-20 | 1966-06-14 | Berger Carl | Metal formation within a substrate |
US3390012A (en) * | 1964-05-14 | 1968-06-25 | Texas Instruments Inc | Method of making dielectric bodies having conducting portions |
JPS60253207A (en) * | 1984-05-30 | 1985-12-13 | 株式会社東芝 | Method of producing capacitor |
US4547432A (en) * | 1984-07-31 | 1985-10-15 | The United States Of America As Represented By The United States Department Of Energy | Method of bonding silver to glass and mirrors produced according to this method |
JPS62136897A (en) * | 1985-12-11 | 1987-06-19 | 株式会社東芝 | Manufacture of ceramic circuit substrate |
US4691091A (en) * | 1985-12-31 | 1987-09-01 | At&T Technologies | Direct writing of conductive patterns |
CH670171A5 (en) * | 1986-07-22 | 1989-05-12 | Bbc Brown Boveri & Cie | |
JPH02501253A (en) * | 1987-09-14 | 1990-04-26 | ヒューズ・エアクラフト・カンパニー | Induced metallization treatment with dissociated aluminum nitride ceramic |
GB2217349B (en) * | 1988-03-29 | 1992-06-24 | Univ Hull | Vapour deposited self-sealing ceramic coatings |
US4933206A (en) * | 1988-08-17 | 1990-06-12 | Intel Corporation | UV-vis characteristic writing in silicon nitride and oxynitride films |
-
1989
- 1989-12-22 DE DE19893942472 patent/DE3942472A1/en not_active Withdrawn
-
1990
- 1990-12-20 JP JP3502065A patent/JPH04505481A/en active Pending
- 1990-12-20 CA CA 2048669 patent/CA2048669A1/en not_active Abandoned
- 1990-12-20 WO PCT/EP1990/002270 patent/WO1991009984A1/en active Application Filing
Also Published As
Publication number | Publication date |
---|---|
DE3942472A1 (en) | 1991-06-27 |
WO1991009984A1 (en) | 1991-07-11 |
JPH04505481A (en) | 1992-09-24 |
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