CA2002179C - Surface acoustic wave devices - Google Patents
Surface acoustic wave devices Download PDFInfo
- Publication number
- CA2002179C CA2002179C CA 2002179 CA2002179A CA2002179C CA 2002179 C CA2002179 C CA 2002179C CA 2002179 CA2002179 CA 2002179 CA 2002179 A CA2002179 A CA 2002179A CA 2002179 C CA2002179 C CA 2002179C
- Authority
- CA
- Canada
- Prior art keywords
- transponder
- acoustic wave
- surface acoustic
- fingers
- transducer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06K—GRAPHICAL DATA READING; PRESENTATION OF DATA; RECORD CARRIERS; HANDLING RECORD CARRIERS
- G06K19/00—Record carriers for use with machines and with at least a part designed to carry digital markings
- G06K19/06—Record carriers for use with machines and with at least a part designed to carry digital markings characterised by the kind of the digital marking, e.g. shape, nature, code
- G06K19/067—Record carriers with conductive marks, printed circuits or semiconductor circuit elements, e.g. credit or identity cards also with resonating or responding marks without active components
- G06K19/0672—Record carriers with conductive marks, printed circuits or semiconductor circuit elements, e.g. credit or identity cards also with resonating or responding marks without active components with resonating marks
- G06K19/0675—Record carriers with conductive marks, printed circuits or semiconductor circuit elements, e.g. credit or identity cards also with resonating or responding marks without active components with resonating marks the resonating marks being of the surface acoustic wave [SAW] kind
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
- G01S13/00—Systems using the reflection or reradiation of radio waves, e.g. radar systems; Analogous systems using reflection or reradiation of waves whose nature or wavelength is irrelevant or unspecified
- G01S13/74—Systems using reradiation of radio waves, e.g. secondary radar systems; Analogous systems
- G01S13/75—Systems using reradiation of radio waves, e.g. secondary radar systems; Analogous systems using transponders powered from received waves, e.g. using passive transponders, or using passive reflectors
- G01S13/751—Systems using reradiation of radio waves, e.g. secondary radar systems; Analogous systems using transponders powered from received waves, e.g. using passive transponders, or using passive reflectors wherein the responder or reflector radiates a coded signal
- G01S13/755—Systems using reradiation of radio waves, e.g. secondary radar systems; Analogous systems using transponders powered from received waves, e.g. using passive transponders, or using passive reflectors wherein the responder or reflector radiates a coded signal using delay lines, e.g. acoustic delay lines
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H3/00—Apparatus or processes specially adapted for the manufacture of impedance networks, resonating circuits, resonators
- H03H3/007—Apparatus or processes specially adapted for the manufacture of impedance networks, resonating circuits, resonators for the manufacture of electromechanical resonators or networks
- H03H3/08—Apparatus or processes specially adapted for the manufacture of impedance networks, resonating circuits, resonators for the manufacture of electromechanical resonators or networks for the manufacture of resonators or networks using surface acoustic waves
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H9/00—Networks comprising electromechanical or electro-acoustic elements; Electromechanical resonators
- H03H9/02—Details
- H03H9/125—Driving means, e.g. electrodes, coils
- H03H9/145—Driving means, e.g. electrodes, coils for networks using surface acoustic waves
Landscapes
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Acoustics & Sound (AREA)
- Radar, Positioning & Navigation (AREA)
- Remote Sensing (AREA)
- General Physics & Mathematics (AREA)
- Theoretical Computer Science (AREA)
- Computer Networks & Wireless Communication (AREA)
- Manufacturing & Machinery (AREA)
- Surface Acoustic Wave Elements And Circuit Networks Thereof (AREA)
Abstract
A surface acoustic wave transponder in which transducers (14) on the surface of a piezoelectric substrate (10) modify an interrogating signal. The transducers are phase encoded by selectively connecting their finger sets to respective busbars (11, 12) and by displacement relative to their nominal positions. Transducer fingers and track-crossing connections (20) are located sa as to cause cancellation of reflected surface acoustic waves. A
marker transducer (15) assists decoding. In the encapsulation of the transponders a cover plate (35) or individual cover plates (24) are attached to the substrate prior to the cutting of individual transponders from the substrate.
marker transducer (15) assists decoding. In the encapsulation of the transponders a cover plate (35) or individual cover plates (24) are attached to the substrate prior to the cutting of individual transponders from the substrate.
Description
SURFACE ACOUSTIC WAVE DEVICES
FIELD OF THE INVENTION
The present invention relates to passive surface acoustic wave (SAW) transponders or tags for use in remote identification systems.
Known transponders of this kind comprise a substrate of piezoelectric material having coded information inscribed thereon, serving to receive electromagnetic energy, convert it to acoustic: energy, store the converted energy.far a period of time, re-convert the stored energy to electromagnetic farm and re-transmit the electromagnetic energy. These tags thus produce a reply signal in response to the interrogation signal from the remote interrogator. The xeply signal is processed to recover the code unique to the interrogated tag.
BACKGROUND ART.
Passive label interrogation systems employing SAW
transponders are disclosed in Cole and Vaughan US
patents 3,7Q6,094, 3,755,QQ3, 4,058,217 4,399,441.
Thane systems incorporate a radio frequency transmitter capable of transmitting pulsed CW
electromagnetic energy. Interrogation pulses are received at the rewote antenna of a passive label and applied to a "launch" interdigitated transducer (IDT) on the surface of a piezoelectric substrate. This transducer converts the electrical energy received from the antenna into acoustic energy in the form of a surface acoustic wave or SAW that propagates on the substrate along a defined acoustic path. Groups of "coding" or "tap" ZDT's era arranged at intervals along this path to convert the SAW back to electrical ~~o~~.'~~~
FIELD OF THE INVENTION
The present invention relates to passive surface acoustic wave (SAW) transponders or tags for use in remote identification systems.
Known transponders of this kind comprise a substrate of piezoelectric material having coded information inscribed thereon, serving to receive electromagnetic energy, convert it to acoustic: energy, store the converted energy.far a period of time, re-convert the stored energy to electromagnetic farm and re-transmit the electromagnetic energy. These tags thus produce a reply signal in response to the interrogation signal from the remote interrogator. The xeply signal is processed to recover the code unique to the interrogated tag.
BACKGROUND ART.
Passive label interrogation systems employing SAW
transponders are disclosed in Cole and Vaughan US
patents 3,7Q6,094, 3,755,QQ3, 4,058,217 4,399,441.
Thane systems incorporate a radio frequency transmitter capable of transmitting pulsed CW
electromagnetic energy. Interrogation pulses are received at the rewote antenna of a passive label and applied to a "launch" interdigitated transducer (IDT) on the surface of a piezoelectric substrate. This transducer converts the electrical energy received from the antenna into acoustic energy in the form of a surface acoustic wave or SAW that propagates on the substrate along a defined acoustic path. Groups of "coding" or "tap" ZDT's era arranged at intervals along this path to convert the SAW back to electrical ~~o~~.'~~~
energy and in so doing to impart either an amplitude or phase calling to the s~.gnal that is then retransmitted via the antenna to the interrogator receiver, The antenna is a common antenna in the 5- sense of acting both to receive and to re-transmit to the interrogator receiver. Of course, surfaco acoustic waves will sianultaneausly be launched from the tap IDT~s, but as the linear SAW delay line behaves in a reciprocal fashion, these waves will sum constructively at the launch -transducer effectively to double the overall delay line response.
finother form of interrogator uses a FraCw {frequency modulated continuous wave) signal, This technique is described in Australian patent specification 444,838 and in US patents 4,604,623, 4,605,929, 4,620,191, 4,623,890, 4,625,207 and 4,525,20$ assigned to X-Cyte Corporation. This form of reoeiver utilises a simple homodyne process whereby the return signal is mixed with the originally transmitted "chirp" signal in a four quadrant multiplier to generate a low audio frequency baseband signal. A range of beat frequencies are generated because of the different delays of the transducers an the SAW delay line label.
A different audio frequency is recovered for each of the elements df the encoding pattern and the relative amplitude and/or phase of these frequency elements repr~asents the code pattern of that particular label, The encoded information is recovered by performing a spectral analysis of the baseband received signal.
In performing the spec-Gral analysis of the beat frequencies generated by the FMCW system it is important that the comb line spectr$ fall an, or are coincident with, the centre of the discrete Fourier transform channels used to analyse them. Satisfying this condition minimises the intersymbol interference YEA
_3_ Caused by physical limitations an the spacing between tap transducers.
The SAW delay line "chips" proposed in the prior art are produced on piezoelectric wafers of lithium niobate ox quartz. The wafers are made Pram thin slices sawn from a synthetic crystal grown in an autoclave undex rigidly Controlled conditions of pxessure, temperature and purity. Angles of cutting relative to the axes of the crystal, determine the combination of properties in the wafer. Because of Constraints an growing the synthetic crystals, wafer slices are limited to approximately 5" in diameter or circumscribed area. ' The wafers are mirror polished and then covered with a layer of aluminium by vapour deposition. This thin metal layer is coated with a photosensitive resist which is then selectively exposed to form the desired ~ transducer electrode pattern by means of high precision photolithography. The exposed resist and the underlying metal are then removed.
The crit~.cal step of exposing the resist is carried out by a weiZ_known semiconductor mask-making process using step..and-repeat cameras. This involves using a pattern generator to produce retiCles, each of which is a photographic copy (much like a photographic negative) of the layout of one chip, usually at a scale lOX the f~,nal chip size, For every chip with a different Code a different and very accurate reticle must be produced.
once the 1px reticles have been generated, -there are two principal. techniques which can be used to expose the resist.
~:~~~1."".d~~
~4-Method 1.
Tn the first of these techniques, a lx master mask is generated using a step-and-repeat camera held on a movable stage. Each plate exposure is a ten times photoreduction of one lOx reticle. Between exposures the stage is moved by a precise amount to the next chip position, the reticle is changed to provide the pattern for the next and differently coded chip, and the plate is exposed to transfer the chip pattern to the master mask. This process is repeated until the complete master mask area has been Gavered with differently coded EAW chips.
The master mask is used to contact print one or more working masks, which are used to contact print or expose resist on a metallised wafer. It will be clear that a different rnaster mask is required for each wafer in order to make differently coded chips.
Method 2, In the second approach, a 10x reduction threat-step-on-wafer camera is used da,rectly to expose the resist on the metallised wafer, This eliminates the intermediate step of preparing a master mask, but still requires the 10x reticle to be changed to provide the pattern far the next and differently coded chip. Tt will be appreciated that a different lOx raticla is still required for each and every differently coded chip. The cost of these reticles is still, a prohibitive factor in the cost of the chips themselves.
~5 It is to be understood that references above to lax reduatic~ns era by way 4f example only, and that it makes na difference in principle whether 5 times, 20 _r~_ times ox some ofiher ratio is used. The possibility of such and other minor_ variations will be clear to those experienced in the art.
After exposing the photoresist on the metallised wafer the unwanted metallisation is selectively etched away.
The number of high precision lOx reticles may be reduced by using a second process uniquely to code a number of chips produced from the same retiaZe, This process may comprise a second photographic exposure, at a much lower resolution than that of the lOx reticle, before etching, ox the use of some cutting means such as a laser trimmer after the chip has been 15- manufactured. The number of lOx retiales required is reduced by the number of unique codes that can be produced by such a secondary process for each original reticle.
X-Cyte Corporation Australian patent 564,849 describes one method of reducing the number of reticles and master masks. xn this method delay pads insert a selectable coding delay between the transducer elements. This allows $ single reticla to be used to 25~ make the master mask, which is then used to generate all wafers. A subsequent cutting operation of Lower pracisivn is then used to trim the delay pads for each chip, thu$ generating unique codes.
30° 'his techna~que has the disadvantage that it is applicable only to piezoelectric materials with a high piezoelectric coupling constant, such as lithium niobate, as only such materials allow sufficiently small delay pads. With piezoelectric materials w~.th a 35 lpw coupling coefficient, such as quartz or zinc oxit~a, the length required for the delay pads would exceed the distance between the coding transducers.
In the method of the present invention, many wafers can be made from a single master mask, and the master mask is made from a single reticle, By thus spreading the cost of the retiCle and master mask over many chips a great reduction in tag cost is achieved.
To achieve this, while at the same time allowing the use of piezoelectric materials of either high or low couplzng coefficients, the tags of the present invention incorporate novel features of transducer layout, It is fundamental to the proper operation of coded delay lines of the type'to which the present invention relates, that the transducs,r structures produce minimum reflection of the propagating surface acoustic wave, to avoid confusion of the returned code. Such reflections are caused by SAW impedance discontinuities due to finger mass loading and surface conductivity effects. This problem is addressed in US
patent No. 4,620,191, where a solution is proposed involving the location of groups of tap transducers in multiple parallel ac4ustiC paths. The present invention provides an alternative approach, by means of a transducer structure which uses wave cancellation to reduce these effects.
In prior art processes the finished wafers are divided into chips which are hermetically sealed, antennas are aQnnected, and the assembly packaged to produce the final tag. These can be costly operations, and the need exists for an improved approach to the packaging process. The present invention provides methods for hermetic sealing and antenna connection which reduce the east of these operations.
OBJECTS OF THE INVENTION:
A principle object of the present invention is to provide an approach to the design and manufacture of such transponders which will enable reductions in manufacturing and production costs.
It is also an abject of the present invention to provide a novel design of phaae reversible tap transducer which allows phase encoding easily to be accomplished from a standard wafer mask.
It is a further object of the invention to provide a design of tap transducer which minimises SAW
reflections.
It i.s a further object of the present invention to provide amplitude encoding of selected transducers in such a way that the transducer capacitance remains constant enabling the SAW delay line to be tuned for maximum return signal strength and hence signal-.to_noise ratio.
It ig a further object of the present invention to provide packaging techniques which reduces the cost of production of a complete, hermetically sealed chip.
It is a further object of the present invention to provide a SAW coded delay line transponder in which may be employed a farm c~f piezoelectric substrate that is significantly lower in cost than presently used materials such as quartz and lithium niabate, and which enables a significantly larger wafer size, so as to maximise the number of chips or die per wafer, Further objects of the present invention include the "~5 provision of means to enhance the readability of a t.ag by the use of an optional °markex~~ tap transducer.
~~~~1. i _Q_ These objects, as well as further objects which will become apparent from the discussion that (allows, are achieved, according to the present invention, by the location of the tap transducers, by the physical design of the tap transducers, by the choice of wafer material and by the techniques employed to package the chip.
It is to be appreciated that different forms of the invention will embady some but not necessarily all of the above objects.
SUMMARY OF THE INVENTION'.
In one form, the present invention resides in a surface acoustic wave transpondar comprising a plurality of tag transducers in contact with a piezoelectric material, means fox the reception of an interrogating signal, means transmitting said interrogating signal as a surface acoustic wave in said material and means for retransmitting said interrogating signal modified by said tap transducers, said retransmitting means including first and second signal transmission means connected to each tap transducer, each tap transducer comprising a first set of.electrically interconnected parallel fingers and a second set of electrically interconnected paxallel fingers interdigitated with the finge~:s of the first get, characterised in that each said set of fingers is selectively connectable to one or the other of said first and, second transmission means.
Preferably, the fingers of each set are respectively connected to first arid sarond conductive path means, and these path means era connected by interruptable connection means to each of the first and second transmission means.
In a further form, the invention resides in a rnethod of encoding such a transponder, comprising tyre steps of selectively interrupting said connection means such that the first set of fingers of a given tap transducer are connected to a selected one of the first and second signal transmission moans and the second set of fingers is connected to the other of said signal transmission means, thereby determining the phase of the connection of that tap transducer with said transmissian means.
In another form the invention resides in a SAW
transponder comprising a plurality of tap transducers in contact with a piozoelectra.c material, means for the reception of an interxogating signal, means transmitting said interrogating signal as a surface acoustic wave along said surface and means for retransmitting said intorrogating signal modified by said tap transducers, said retransmitting means including first and second signal transmission means connected to each tap transducer, each tap transducer comprising a first set of electrically intercannectad parallel fingers and a second set of electxically interconnected parallel fingers interdigitatad with the fingers of the first sat, characterised in that the location of the edges of 'the fingers of each transducer is chosen in relation to the wave length of the surface acoustic wave such that suxfaca acoustic wave reflectians from said edges cancel.
From another asgact, such a transponder is characterised i.n that the fingers are located at such intervals along the path of the surface acoustic wave that reflections from their edges cancel.
--lo_ In yet another form, the invention resides in a SAW
transponder comprising a plurality of tap transducers in contact with a piezoelectric material, means for the reception of an interrogating signal, means transmitting said interrogating signal. as a surface acoustic wave along said surface and means for retransmitting said interroqating signal modified by said tap transducers, said retransmitting means including first and second signal transmission means canneoted to ear_2~. tap transducer, each tap transducer comprising a first set of electrically interconnected parallel. fingers and a second set of electrically interconnected paxallel fingers interdigitated with the ~a.ngers of the first sat, characterised in that a group of fingers of at least one of said tap transducers is displaced in the path of the surface acoustic wave so as to be in phase opposition to another group of fingers of the same transducer.
2p In a further farm, the invention provides a SAW
transponder comprising a plurality of tap transducers in contact with a piezoel,eCtric material at regular nominal spacings of surface acoustic wave path lengths, means for the reception of an interrogating signal, means transmitting said interrogating signal as a surface acoustic wave along said surface arid means for retransmitting said interrogating signal modified by said tap transducers, characterised in that a further transducer is provided, spaced by a 3p known surface acoustic wave path length from said tap transducers.
In a further farm, the invent ion resides in a method of manufacturing surface acoustic wave transponders, each consisting of a layer of metallisation on a p.iszoelectric substrate, the method comprising the steps of applying said metallisation over an area as a _m repetitive pattern of individuaJC transponder patterns, attaching a cover platy aver said area, and subsequently cutting through said cover plate and said substrate in orthogonal directions to beparate individual transponders.
In a further form, the invention resides in a method of manufacturing a plurality of surface acoustic wave transponders each consisting of a layer of metallisation in contact with a piezoe7.ectric substrate, the method comprising the steps of producing said metallisation over $n area as a repetitive pattern o.~ individual transponder patterns, attaching a transponder cover plate over each I5 transponder pattern, and subsequently cutting through said substrate in orthogonal directions to separate individual txansponders.
In another form, the invention resides in a surface acoustic wave transponder consisting of a layer of metallisation in contact with a piezoelectric substrate and having a contact region at at least one end, a cover plate being attaahod over said metallisation, characterised in that each cover plate is provided with contact regions opposed to the contact regtans of the transponders and extending beyond them.
To facilitate an understanding of the invewtior~ in its 3~ various forms, practical embodiments will now be described, by way of example only, with reference to the accompanying drawings, in whicha Figure 1 is a schematic plan vista showing the layout 3~ of a transponder chip incorporating the present invention;
A"hw Figure 2 is a detailed view of tl~e metallisation pattern of a sir~gl~ tr~nsducer;
Figure 3 illustrates a relatively phase shifted transducer;
Figure ~ illustrates a transducer modulated in amplitude relative to that of Figure 2;
Figure 5 is a schematic isometric view of portion of the chip:
Figure 6 is a schematic cross section of the chip illustrated in Figure 6'i Figure 7 illustrates an alternative transducer structure3 Frgure FJ is a fragmentary plan view of a metallised substrate.
Figure 9 is a fragmer~t.ary bottom plan view of a Graver plate.
Figures 1Q (a) to (d) illustrate an economical tag construction according to a preferred .~orm of the inventions BETA2LED pEEGRZpTI(~N OF QftEFERRED EMBODIMENTS.
The general layout of a tag incorporating the present invention is shown in Fig, 1. A substrate 10 of piezoelectric material has printed thereon busbars 11 and 12, which are connected respectively to a centre ~5 fed dipole antenna (not shown). From the busbars ll and 12 interdigitated Fingers of conductive material project to provide a launch transducer 1.~ and a series ~r::~~~~~t~~
of encoding tap transducers 14.
Tn the preferred FMCW interrogator implementation, the returned phase information from each tap transducer on the tag is presented to the signal analysis unit as a unique frequency. The signal returned by a complete tag is thus 'the vector sum of the signals returned by each individual tap transducer, and is equivalent to a comb line specarum, with the number of frequency peaks corresponding to the number of tap transducers on the label and with the amplitude and relative phase of these peaks corresponding to the amplitude and phase encoded information of the delay line label.
The homodyne demodulated received signal is sampled at l.ra~e7l,acrtul l.~y ail aIidloyue-to-digital C:aIIVC3rt.EtL'. 2'tiib sampled signal is then analysed by a discrete Fourier transform which separates the returned frequencies into discrete frequency bins or channels. 'Pha phase differences or amplitude ratios between these bins 'then becomes the tag code. If the comb line spectrum derived from the tag return does not align with the DFm analysis channels then energy fram one comb line will incorrectly be assigned to an adjacent channel.
This misalignment will cause inter-symbol interference between analysis channels and will degrade the readability of the tag. Misalignment can be caused by a tag being at an unexpected range, or by a Doppler shift due to a tag's velocity relative to they ~0 interrogator, It is well known that complex frequency shifts can be used to align comb line spectra with DFT channels. Tt is difficult, however, to determine the shift required to correct for the rnisalignment. With good signal to noise reties it is possible to examine the ripple and edge steepnass of the DFT result and use this as a ~.a~ ~a~ ~..~:~
_x~_ guide to aligrut~ent, but in to noisy signal this technique is prone to exxaar.
In one form of tt~e p.resen-t invention, accurate alignment is facilitated by the addition to the tag of a separate "marker" tap transducer 15. This transducear is located as close as possible to the encoding transducers 14 but far enough away to allow discrimi.natian of the alignment and encoding responses under conditions of severe inter-symbol interference.
In the preferred embodiment this marker transducer i.s located three channel spacings before the encoding transducers. ~'he launch transducer is not used for this purpose because its'response is swamped by low Z5 frequency environmental clutter, and it is too tar from the encoding transducers tv allow accurate alig~ent .
As mentioned above, it is desirable to minimise reflection of the propagating SAW wave by the tap transducers. In accordance with a preferred farm of the present invention, physical reflections from the fingers are eliminated by cancellation. In the embodiment of the invention illustrated in Fig. 2, the fingers are located along the acoustic wave path at such intervals that successive leading and trailing edges of the interdigitated fingers are respectively separated by a distance which is equal to one third of the wave length of the ar.AW. With equal mark space ratio, the finger width will thus be ~1/6.
To examine the effect of this spacing, cansi,der firstly the leading edge discontinuities. Assuming that each leading edge discontinuity has an identical effect, then each set of three successive fingers x'eflects ~ proportion of the energy summing to zero, vix., r15-E + E 2x12.0" -~~ E 2x240° = 0 The effect of the leading edge discont;inul.ties has thus been pulled.
Consider secondly the trailing edge discontinuities.
Again assuming only that each trailing edge discontinuity has an identical effect, then each set of three successive fingers reflects a proportion of 1.0 energy gumming to zero, viz., E 28 + E~29 +. 2x12Q° + E /2g + 2x240° ~- 0 where E? is a phase angle dependent on the finger width lg and being nominally equal to 60° for ~/6 wide fingers having a nominally equal mark-space ratio.
As a consequence of the independent summing to zero of the leading and trailing edge discontinuities, the 20 finger mark-space ratio and therefore manufacturing etch control is not GritiCal.
The example given here of "self cancellation" of three successive /~/6 fingers at a spacing periodicity of ~l/3 is not exhaustive. A spacing of ~/3 gives the widest possible fingers for a givon fundamental frequency.
At 915 mHz this spacing gives dimensions which can ba achieved in production with current photolithographic technology. With a system employing a lower centre g0 frequency, or with higher resolution photolithography, cancellation from four successive ~/8 fingers of spacing periodicity 71/4 is workable, viz., E ~+~ E/ . 2 xx 90° + E/ 2 x 1$0" + EL 2 x 274°_ = 0, and likewise for even smaller pariodicities, e.g.
~L3~~~'~ ~:~
s-15, N6, etc., provided the spacing also allows satisfactory coupling botween the transducers and the SAW at the fundamental frequency of the signal.
Given a selected a finger spacing, the pattern of polarity of suc.aessive transducer fingers must also be chosen. Thus, in the case of ~1/3 spacing described here, the f3.ngers should be connected to the busbars 11 arid 12 in thc~ pattern i~.lustrated in Figs. 2 to 4, if the most efficient coupling is to ba achieved.
In general the polarity pattern of the fingers can be examined by plotting the stepwise appr4ximation of the eleearic potential due to the fingers, and, with a knowledge of the relationship between piezoelectric d~.splacement and electric field for the substrate material,, using a Fourier transform to derive the fundamental sino wave. mhe most efficient pattern is that which maximizes the amplitude of this fundamental sine wave.
As will be observed in the drawings, the polarity pattern of the fingers for 1'/3 spacing (++-+--) repeats in sections a in length, and consists of phase-reversed left and right half.-sections each one wavelength long. 'Phis structure maximizes the amplitude of the fundamental frequonay sine wave.
Other patterns, such as repeating left half-seaG~.ons, will produce a fundamental frequency sine wane of less amp~.itude. .
It will be appreciated that the number of fingers used in the transducer will preferably be Chosen to be an integral multiple of the number of fingers in a 3S section. in the case of ~/3 spacing, the preferred number o~ fingers wild. therefore be an integral multiple Qf 6.
~~~~.''~~~?
-17_ While in this way SILW rofloGtions genoratad at transducer discontinuities can be -reduced or cancelled, it will be realised that surface acoustic waves arising from e:Lectrical regeneration at the transducers must also be controlled in a practical label by, far example and depending an the strength of the piezoelectric coefficient of the sub~strat~, they number of fingers used for transducers and/or by the electrical impedance loading shunted across the lU busboys 11 and 12 of the delay line. Electrical regeneration can never be entirely eliminated but sinr_e it depends an a voltage being induced across one ox' more tap transducers and this voltage then causing the generation and propagation of a "secondary" SAW, 15 this effect can usually be reduced to negligible proportions by arranging for a swfficient loss in this 2-step generation and regeneration process.
Tn the practice of the present invention as 20 illustrated in Fig. 2, the intexdigitated fingers of the coding transducers 14 are provided with individual busboys 16 and 17, separated from the adjacent bulbar 11 or 12 but connected thereto by respective metallisation bridges 18 and 19. FurthErmore, each 25 "coding bus" 16 and 17 is connected to the opposite main busLar 11 or 12 by tracks 20 and respective bridges 21 and 22. In this way a stxuGture is created whereby each coding bus can be connected to either bulbar 11 or bulbar 12 by cutting the appropriate 30 cutting bridges. By e~pprapriate choice of cutting it is thus possible to produce an IDT whose phase is "flipped" by 180 degrees. Cutting the bridges 21 and 22 produces an IDT at relative 0 degrees, while cutting the bridges 18 and 19 produces an IDT at 35 relative 180 degrees.
~T~''~v~'~'~'~~
-is-It can be seen that the flip connecting tracks 20 pass across the active SAW region. It is of course desirable to minimise the disturbing effect of the flip connections Cio~r1.11g thE. aC~iV6 SAW xegion. The two major sources of such disturbance are reflections of the aooustic wave at the boundary discontinuities between the metallisation and the piezoelectric material, and the mass loading effect of the metall3.sation upon the piezoelectric material.
The boundary discontinuities can be minimised by correct choice of the dimension X (Fi.g. 2), representing the interval by which the elements are spaced along the acoustic patYz. In accordance with .this aspect of the invention, the dimension X is a function of the number of discontinuities across the active region. In Fig. 3 there are 3 leading edge discontinuities and 3 trailing edge discontinuities due to the three elements which cross the SAW active region.
~y choosing the spacing of the leading edge discontinuities correctly it is possible t.o vac~.or sum the contributions from the leading edges so that their effect is hulled. The approach here is similar to that discussed above in relation to the spacing of the fingers of. the transducer, but without limitations brought about by the need for signal coupling with the a~abstrate, 7~n this example, if we assign a distance 3Q of (3n+1) ~/3 (equal to 120 degrees phase shift) for X
we find that, assuming each discontinuity has similar effect and xe-radiates a proportion of the enexgy E, that E ~- E 2 120° + E f 24 ° - 0 The effect of the leading edge discontinuity has been ~~~~~~.'~~
nulled. Similarly, by spacing the trailing edges at multiples of (3n+1) ~/3 roe can null the trailing edge dxscantinuities. The leading and trailing edges have again been txeatad separately as this removes the need to consider whether a trailing edge discontinuity has the same properties as a leading edge discontinuity or not.
It will be understood that the connecting track may 14 consist of more than or less than three, elements, and the above approach can be generalised correspondingly.
For a "flip" connection of k elements the leading edges (and independently the trailing edges) should be spaced at multiples of (~kn + 1) ~ /k such that the reflections from k successive edges sum identically to zero, viz., fox the simplest case of n = 0, E + ~~2(1 x 360°/k) + E~2(2 x (360°/k)) + .,..
2p . . . + E~z_( (k-1) x 360°/k) ) - U
With the above condition holding fox any group'of k slam~nts, then it is permissible for a "flip"
connection to consist of more than one k element group if this is desirable, for example to reduce the resistance of such "flip" connections. The approach can thus be generalised to the statement that for k elements in a flip connection, and treating them as groups of a leading and trailing edges where k/~ is an integer, then the leading edges and trailing edges must be separated by (jn+1) A /j. That is to say, the elements are located along the path of the surface acoustic wane at intervals of (jn + 1) Where the reflecting properties of the leading and trailing edge are similar, a single connectinc3 track will be a special case of the above approach. where rs:~~ic~~.'d~
-20~
these properties differ, however, the track width will be chosen to achieve cancellation in accordance with those properties.
It will have been observed that in the illustrated embodiment, the connecting tracks 20 consist of three elements of equal mark-space ratio. In order to reduce resistance it may be desirable to provide alemonts which are of substantially greater width than the space between them. Far example, three elements may be provided, each of ~ widthr spaced apart by ll/3, so that successive elements are located at 4~3 intervals.
As will ba apprec:a.ated by those familiar with printed circuit and integrated circuit. technology, the techniques which can be used selectively tv remove the auttable bridges include chemical etching or the use of a photoplotter to define the bridges to be etched.
2p Alternative approaches include laser scribing or electrical fuszon, whereby contacts are provided on both the coding buses and the chip busbars to allow sufficient current to pass through the coding bridges to cause them to become open circuit.
It should be noted that the representation of the IbT's in Figs. 2, 3 and 4 has been simplified, and that the number of elements in a practical IDT will depend on the piezoeJ.ectric material chosen for the substrate.
Ta enable quad phase coding to be achieved two types of flip coded IDT's are employed. The transducer shown in Fig. 2, r.~ype A (01180), is placed at a nominal reference position, while the Type B (90/270) transducer shown in Fig. 3 is displaced a quarter o~ a wavelength either towards ar away from the launch transducer. Further extensions can be made to this principle to provide other types of transducers, at n'mre phase angles and/or with different amplitude responses, to allow extension from quad phase ceding to some higher level of coding.
The Launch transducer 13 is of well known IDT design for generating a surface acoustic wave. The placement of subsequent transducers is in units of a given separation. Tn the preferred embodiment this separation is in units of delay as realised as distance on the SAW chip. Depending on the bandwidth which is allowed for the interrogating and response signals, this rnay represent the distance a SAW wave travels on the surface in a period of the order of 80 to 160 nsecs. The alignment transducer 15 is placed many units of separation away from the launch transducer 13 (for example approximately 960 nsecs).
The al~.gnment transducer 15 is of well known IDT
design.
Tha first tap or encoding transducer as reference transducer 14a, which as described above is preferably placed three separation units past the alignment transducer 15. The reference transducer 14a is of the flip code design described above in relation to Fig. 2 arid is preferably a type A transducer due to the manufacturing errors possible in placement over a 3 unit distance. Following the reference transducer 14a are a flip coding transducers 14 spaced at consecutive one separation unit distances from each other. The coding transducers 14 are a combinati.r~n of type A and type B transducers, and in the illustrated embodiment fifteen of these transducers are used.
This method of chip manufacture allows a code space in _22_ this Case of X15 x 2. --- 2, 14'7, 4F33, 648. This is due to the fifteen coding -transducers each having 4 available positions (choice of A or B type flip transducer set to either 0 or 180 degrees and 90 or 270 degrees .5 respectively). The .factor of 2 is the extra node due to the phasing of the reference transducer 14a with respect to the alignment transducer 15.
The fifteen flip transducers, chosen to be either A ar 1~l 8 type transducers, are available for programming into one of 2 states by severing the cuttabla bridges, and there is also the type A ,reference transducer which can be in 1 of 2 states. This allows 216 = 65,536 Chips to be made from the one reticle before a new 15 retiCle must be made.
Theca has thus been ,~ reduction in the re-ticles needed by a factor of 65,536, a significant saving in reticles.
There are also savings in the number of master masks rtaeded, since the number of master masks required is reduced by a factor equal to the number of chips an each wafer, which may for example be 1024.
The number of flip coding transducers 14 is chosen to suit the particular application, within severe].
restrainCs. The length and therefore the Gost of the SA.W chips will increase with the number of tap f.ransduCers and will be .inversely dependent. upon the bandwidth of interrogating signal allowed by the regulatory ,authorities in the country concerned. The Code capacity will depend upon the number of hits encoded per transducer (for exgmple; 2 bits per transducer for simple quad phase encoding). Some applications may place limits on the length of the tac3, for example in the case of implantable tags far ~w the livestock industry. While some applications may require only a small code capacity, for example twelve bits or less, others may require as many as 64 bits including error correction bits.
During the exposure ref the resist on the wafer the following r3teps are performed:
1. An accurate rnask common to all chips with a given combination of A & B type transducers is used ~to create a pattern on the wafer resist. This mask Creates many chips but all of the cuttabl~ bridges are still intact.
1' 2~ Each chap is then individually coded by appropriately selecting which auttable bridges to cut.
This is preferably done by using a pattern generator (sim~,lar to and possibly even the same pattern generator as used for the lOX reticle manufacture) directly to expose the resist aver the bridges to be out~ The bridges produced by the masking process are made large enough so that the photographic resolution :~s sufficient to cut them without needing the intermediate step of a retiale and lOX reduction.
3. The wafer is then processed to produce twdividuall.y coded chips .
As mentioned above, in the preferred forms of the ~ present invention, amplitude coding is added to the quad phase encoding described above. While such coding may be achieved by a simple measure such as the removal of a proportion of the fingers of a tap transducer to reduce its coupling with the substrate, this has the disadvantage of altering the capacitance of the transponder, and would therefore require individual tuning of transpondors to achieve impedance matching with the antenna, depending on the amplitude coding.
'this problem is avoided in preferred farms of the invention, aGCOrding to which amplitude encoding is achieved by the longitudinal displacement of a group of the fingers of ~t given transducer, relative to the remaining fingers or to another group of the fingers of that transducer.
~'ig. 4 shows a transducer layout in which the transducer fingers comprise 4 groups of fingers each group having an equal number of fingers (in this example, 6). The fingers of one group, the left hand group as seen in Fig. 4, are displaced from the remaining groups by one half a wave length.
Consideration of this layout will reveal that the first three groups will contribute a tapped signal with the same phase and a nominal ampJ.itude of three units, while the fourth group will contribute an anti.phase signal with an amplitude of one unit. The net effect will be to supp7.y to the busbars a tapped signal of 2 units, or one half the amplitude of a transducer in which none of the groups is displaced.
Amplitude modulation is thus achieved which may be superimposed upon the quad phase modulation described above.
xt will be appreciated that finger groups may be displaced in other ways to achieve similar results.
~'or example, groups each comprising one eighth of the fingers of a transducer may be displaced by ~1/4 in opposite directions, also providing a 50~ amplitude modulation, Again, changes of amplitude of more or less than 50~ can be achieved by appropriate choice of the proportion of interfering fingers.
~Q~~a~~.'~'~
_25_ In addition to the economies achieved by the new approaches to transponder des~.gn described so fax, the p.resen.t invention enables the use of inexpensive materials, rather than duartz or lithium niabate as in the prior art. Tn its preferred forms, the present invention ewploys cheap borosilicate glass as the substrate material, coated with a thin film of zinc oxide. The Znp film is formed by planar RF magnetron sputtering, which allows optimal control of substrate tomperatuxe.
Zinc oxide .is a well )cnown piezoelecf.ric material with a hexagonal crystalline structure, and polycrystalline Zn~ films of suitable orientation, i.e, with the C
axis normal to film surface, can be deposited on glass by the sputter technique.
It is the orientated crystal structure that yields a stxong piezoelectric effect in the film. The thickness of the film is chosen to be less than one acoustic SAW wavelength, and to optimise the Piezoelectric coupling coefficient. For transponder operation at 915MHz, this thickness would be of the order of 1.5 microns. Th;zs as shown schematically in Figs~ 5 and 6 the thin film substrate is a layered structure in which a piezoelectric film 10 is suitably de~positad an a non piezoelectric base 23 suitably of borosiliCate glass. the alumin.lum metal for the TaT~s 1~! is them deposited an this film by vacuum evaporation or sputtering. The noxmal photolithographic processes are used to produce the chips.
An alternative to this method zs to deposit the SAW
transducers direotly an the suxface of the non-piezoelectric glass 23 rather than on the surface of the piezoeleatria film 10. As shown in Fig. 7, iv:~~iCv~. i~~
the Zn0 film is then foamed Q~rer the top of the glass and the metal transducer fingers, the thin film serving to convert the electr~.cal signals of the IDT
into SAW waves and back again. The glass base material provides the mechanical strength and serves as the S.F1W transmission material. .fin important secondary function of this technique is that the Zn0 film layer forms a protective barrier for the aluminium IDT's and thus increases the delay line reliability.
By these methods, the glass base material can be chdsan to have large physical dimensions limited only by the ~-Y travel of the. step-and-repeat camera used 1S fox the photolithographic process. Typically, a large glass plate $ inches square or more may be used as a processed wafer, capable of yielding a very large number a~ individual chips. Selective etches are available which allow etching of either the aluminium metallisatian or the zinc oxide alone. The use of a larger wafer a~.lows proportionately less wastage required for handling.
Figs. 8 and 9 illustrate the method of fabrication according to an aspect of the invention which enables the encapsulation of the transponders to be completed pxior to the slicing of the individual transponders from the wafer or substrate. In this embodiment, rows of transponder metallisatian patterns era applied 30 to a wafer, with the connection pads of longitudinally adjoining patterns being applied in a continuous area 31. (No attempt is made to show the transducers in this figure).
3S A sealant such as an epoxy resin of low gas permeability ar a glass frit is applied by silk screening to the surface of a aovar plate 35 (Fig.) of the same dimensions as the wafer. The sealant is applied in the form of "moats" 36 located to surround each transponder, leaving the pads 26 outside, when the cover plate is located over the wafer. The cover plate is placed over the wafer and the sealant cured or allowed to set, preferably under pneumatic pressure.
The moats 36 are of a height which provides a small gap between the cover plate and the wafer.
The cover plate is then sliced along the lines 32 in Fig. 8, to a depth which is just above the contact pads 31, and the strips of cover plate material between these pairs of cuts are removed (for example by air suction) to expose the pads 31. Individual transponders are then created by slicing right through the assembly on the lines 33 and 34. An antenna (not shown) is then attached to each transponder in any suitable manner.
Alternatively, a spacing sealant can be applied in the manner described to the surface of the wafer and the individual cover plates positioned over each transponder by a pick-and-place machine. After curing, the wafer is sliced in the normal way.
In the practice of the present invention therefore, handling cost is reduced by performing the sealing process while the chips are still in wafer form.
While in this technique as described above the sealant is described~as being applied to the cover plate, it may alternatively be applied to the wafer or substrate.
35' It should also be observed that this method is equally applicable to devices comprising zinc oxide on glass, as well as to wafers of lithium niobate or quartz.
Traditionally SAW devices have been constructed with the wire bonding pads fabricated along with the SAW
metallisation on the surface of the active piezoelectric material. The bonding pads consume valuable active material (such as lithium niobate) but do not rely upon any of the active characteristics of that material to function. In another aspect of the present invention the cover plate provides mechanical support for the bonding pads and thus allows the area of active piezoelectric material to be reduced.
To minimise the area of active SAW material, the SAW
chip may be redesigned with much reduced metal contact pads. The size of these pads now only need be sufficient to support the epoxy which provides the hermetic sealing for the chip. Fig. 10 illustrates a ~ SAW chip with bonding pads reduced to the minimum size necessary far hermetic sealing. The glass cover plate 24 is extended in size to allow room for the metal bonding pads 25 produced by a simgle process auto the cheap glass cover plate material.
Conneatian of the large bonding pads 25 on the cover plate 24 with: the small bonding pads 26 on the SAW
chip may be achieved by using conductive epoxy 27 only in the vicinity of the pads 26. The he~rmatic seal is then completed by placing normal epoxy 2$ around the perimeter of the SAW chip, as shown in the cross-sectional view of Fig. 10(d).
It wild, be appreciated that each transponder must be equipped with an appropriately tuned antenna. Such e~ntennae may be mounted on the cover plate and connected by means of the bonding pads 25, but since _29-the dimensions of these pads axe not constrained by considerations of substrate waterial cost, the pads 25 themselves may in suitable cases be dimensioned to act as antennae, providing an elegant solution to the pxoblem of antenna attachment,
finother form of interrogator uses a FraCw {frequency modulated continuous wave) signal, This technique is described in Australian patent specification 444,838 and in US patents 4,604,623, 4,605,929, 4,620,191, 4,623,890, 4,625,207 and 4,525,20$ assigned to X-Cyte Corporation. This form of reoeiver utilises a simple homodyne process whereby the return signal is mixed with the originally transmitted "chirp" signal in a four quadrant multiplier to generate a low audio frequency baseband signal. A range of beat frequencies are generated because of the different delays of the transducers an the SAW delay line label.
A different audio frequency is recovered for each of the elements df the encoding pattern and the relative amplitude and/or phase of these frequency elements repr~asents the code pattern of that particular label, The encoded information is recovered by performing a spectral analysis of the baseband received signal.
In performing the spec-Gral analysis of the beat frequencies generated by the FMCW system it is important that the comb line spectr$ fall an, or are coincident with, the centre of the discrete Fourier transform channels used to analyse them. Satisfying this condition minimises the intersymbol interference YEA
_3_ Caused by physical limitations an the spacing between tap transducers.
The SAW delay line "chips" proposed in the prior art are produced on piezoelectric wafers of lithium niobate ox quartz. The wafers are made Pram thin slices sawn from a synthetic crystal grown in an autoclave undex rigidly Controlled conditions of pxessure, temperature and purity. Angles of cutting relative to the axes of the crystal, determine the combination of properties in the wafer. Because of Constraints an growing the synthetic crystals, wafer slices are limited to approximately 5" in diameter or circumscribed area. ' The wafers are mirror polished and then covered with a layer of aluminium by vapour deposition. This thin metal layer is coated with a photosensitive resist which is then selectively exposed to form the desired ~ transducer electrode pattern by means of high precision photolithography. The exposed resist and the underlying metal are then removed.
The crit~.cal step of exposing the resist is carried out by a weiZ_known semiconductor mask-making process using step..and-repeat cameras. This involves using a pattern generator to produce retiCles, each of which is a photographic copy (much like a photographic negative) of the layout of one chip, usually at a scale lOX the f~,nal chip size, For every chip with a different Code a different and very accurate reticle must be produced.
once the 1px reticles have been generated, -there are two principal. techniques which can be used to expose the resist.
~:~~~1."".d~~
~4-Method 1.
Tn the first of these techniques, a lx master mask is generated using a step-and-repeat camera held on a movable stage. Each plate exposure is a ten times photoreduction of one lOx reticle. Between exposures the stage is moved by a precise amount to the next chip position, the reticle is changed to provide the pattern for the next and differently coded chip, and the plate is exposed to transfer the chip pattern to the master mask. This process is repeated until the complete master mask area has been Gavered with differently coded EAW chips.
The master mask is used to contact print one or more working masks, which are used to contact print or expose resist on a metallised wafer. It will be clear that a different rnaster mask is required for each wafer in order to make differently coded chips.
Method 2, In the second approach, a 10x reduction threat-step-on-wafer camera is used da,rectly to expose the resist on the metallised wafer, This eliminates the intermediate step of preparing a master mask, but still requires the 10x reticle to be changed to provide the pattern far the next and differently coded chip. Tt will be appreciated that a different lOx raticla is still required for each and every differently coded chip. The cost of these reticles is still, a prohibitive factor in the cost of the chips themselves.
~5 It is to be understood that references above to lax reduatic~ns era by way 4f example only, and that it makes na difference in principle whether 5 times, 20 _r~_ times ox some ofiher ratio is used. The possibility of such and other minor_ variations will be clear to those experienced in the art.
After exposing the photoresist on the metallised wafer the unwanted metallisation is selectively etched away.
The number of high precision lOx reticles may be reduced by using a second process uniquely to code a number of chips produced from the same retiaZe, This process may comprise a second photographic exposure, at a much lower resolution than that of the lOx reticle, before etching, ox the use of some cutting means such as a laser trimmer after the chip has been 15- manufactured. The number of lOx retiales required is reduced by the number of unique codes that can be produced by such a secondary process for each original reticle.
X-Cyte Corporation Australian patent 564,849 describes one method of reducing the number of reticles and master masks. xn this method delay pads insert a selectable coding delay between the transducer elements. This allows $ single reticla to be used to 25~ make the master mask, which is then used to generate all wafers. A subsequent cutting operation of Lower pracisivn is then used to trim the delay pads for each chip, thu$ generating unique codes.
30° 'his techna~que has the disadvantage that it is applicable only to piezoelectric materials with a high piezoelectric coupling constant, such as lithium niobate, as only such materials allow sufficiently small delay pads. With piezoelectric materials w~.th a 35 lpw coupling coefficient, such as quartz or zinc oxit~a, the length required for the delay pads would exceed the distance between the coding transducers.
In the method of the present invention, many wafers can be made from a single master mask, and the master mask is made from a single reticle, By thus spreading the cost of the retiCle and master mask over many chips a great reduction in tag cost is achieved.
To achieve this, while at the same time allowing the use of piezoelectric materials of either high or low couplzng coefficients, the tags of the present invention incorporate novel features of transducer layout, It is fundamental to the proper operation of coded delay lines of the type'to which the present invention relates, that the transducs,r structures produce minimum reflection of the propagating surface acoustic wave, to avoid confusion of the returned code. Such reflections are caused by SAW impedance discontinuities due to finger mass loading and surface conductivity effects. This problem is addressed in US
patent No. 4,620,191, where a solution is proposed involving the location of groups of tap transducers in multiple parallel ac4ustiC paths. The present invention provides an alternative approach, by means of a transducer structure which uses wave cancellation to reduce these effects.
In prior art processes the finished wafers are divided into chips which are hermetically sealed, antennas are aQnnected, and the assembly packaged to produce the final tag. These can be costly operations, and the need exists for an improved approach to the packaging process. The present invention provides methods for hermetic sealing and antenna connection which reduce the east of these operations.
OBJECTS OF THE INVENTION:
A principle object of the present invention is to provide an approach to the design and manufacture of such transponders which will enable reductions in manufacturing and production costs.
It is also an abject of the present invention to provide a novel design of phaae reversible tap transducer which allows phase encoding easily to be accomplished from a standard wafer mask.
It is a further object of the invention to provide a design of tap transducer which minimises SAW
reflections.
It i.s a further object of the present invention to provide amplitude encoding of selected transducers in such a way that the transducer capacitance remains constant enabling the SAW delay line to be tuned for maximum return signal strength and hence signal-.to_noise ratio.
It ig a further object of the present invention to provide packaging techniques which reduces the cost of production of a complete, hermetically sealed chip.
It is a further object of the present invention to provide a SAW coded delay line transponder in which may be employed a farm c~f piezoelectric substrate that is significantly lower in cost than presently used materials such as quartz and lithium niabate, and which enables a significantly larger wafer size, so as to maximise the number of chips or die per wafer, Further objects of the present invention include the "~5 provision of means to enhance the readability of a t.ag by the use of an optional °markex~~ tap transducer.
~~~~1. i _Q_ These objects, as well as further objects which will become apparent from the discussion that (allows, are achieved, according to the present invention, by the location of the tap transducers, by the physical design of the tap transducers, by the choice of wafer material and by the techniques employed to package the chip.
It is to be appreciated that different forms of the invention will embady some but not necessarily all of the above objects.
SUMMARY OF THE INVENTION'.
In one form, the present invention resides in a surface acoustic wave transpondar comprising a plurality of tag transducers in contact with a piezoelectric material, means fox the reception of an interrogating signal, means transmitting said interrogating signal as a surface acoustic wave in said material and means for retransmitting said interrogating signal modified by said tap transducers, said retransmitting means including first and second signal transmission means connected to each tap transducer, each tap transducer comprising a first set of.electrically interconnected parallel fingers and a second set of electrically interconnected paxallel fingers interdigitated with the finge~:s of the first get, characterised in that each said set of fingers is selectively connectable to one or the other of said first and, second transmission means.
Preferably, the fingers of each set are respectively connected to first arid sarond conductive path means, and these path means era connected by interruptable connection means to each of the first and second transmission means.
In a further form, the invention resides in a rnethod of encoding such a transponder, comprising tyre steps of selectively interrupting said connection means such that the first set of fingers of a given tap transducer are connected to a selected one of the first and second signal transmission moans and the second set of fingers is connected to the other of said signal transmission means, thereby determining the phase of the connection of that tap transducer with said transmissian means.
In another form the invention resides in a SAW
transponder comprising a plurality of tap transducers in contact with a piozoelectra.c material, means for the reception of an interxogating signal, means transmitting said interrogating signal as a surface acoustic wave along said surface and means for retransmitting said intorrogating signal modified by said tap transducers, said retransmitting means including first and second signal transmission means connected to each tap transducer, each tap transducer comprising a first set of electrically intercannectad parallel fingers and a second set of electxically interconnected parallel fingers interdigitatad with the fingers of the first sat, characterised in that the location of the edges of 'the fingers of each transducer is chosen in relation to the wave length of the surface acoustic wave such that suxfaca acoustic wave reflectians from said edges cancel.
From another asgact, such a transponder is characterised i.n that the fingers are located at such intervals along the path of the surface acoustic wave that reflections from their edges cancel.
--lo_ In yet another form, the invention resides in a SAW
transponder comprising a plurality of tap transducers in contact with a piezoelectric material, means for the reception of an interrogating signal, means transmitting said interrogating signal. as a surface acoustic wave along said surface and means for retransmitting said interroqating signal modified by said tap transducers, said retransmitting means including first and second signal transmission means canneoted to ear_2~. tap transducer, each tap transducer comprising a first set of electrically interconnected parallel. fingers and a second set of electrically interconnected paxallel fingers interdigitated with the ~a.ngers of the first sat, characterised in that a group of fingers of at least one of said tap transducers is displaced in the path of the surface acoustic wave so as to be in phase opposition to another group of fingers of the same transducer.
2p In a further farm, the invention provides a SAW
transponder comprising a plurality of tap transducers in contact with a piezoel,eCtric material at regular nominal spacings of surface acoustic wave path lengths, means for the reception of an interrogating signal, means transmitting said interrogating signal as a surface acoustic wave along said surface arid means for retransmitting said interrogating signal modified by said tap transducers, characterised in that a further transducer is provided, spaced by a 3p known surface acoustic wave path length from said tap transducers.
In a further farm, the invent ion resides in a method of manufacturing surface acoustic wave transponders, each consisting of a layer of metallisation on a p.iszoelectric substrate, the method comprising the steps of applying said metallisation over an area as a _m repetitive pattern of individuaJC transponder patterns, attaching a cover platy aver said area, and subsequently cutting through said cover plate and said substrate in orthogonal directions to beparate individual transponders.
In a further form, the invention resides in a method of manufacturing a plurality of surface acoustic wave transponders each consisting of a layer of metallisation in contact with a piezoe7.ectric substrate, the method comprising the steps of producing said metallisation over $n area as a repetitive pattern o.~ individual transponder patterns, attaching a transponder cover plate over each I5 transponder pattern, and subsequently cutting through said substrate in orthogonal directions to separate individual txansponders.
In another form, the invention resides in a surface acoustic wave transponder consisting of a layer of metallisation in contact with a piezoelectric substrate and having a contact region at at least one end, a cover plate being attaahod over said metallisation, characterised in that each cover plate is provided with contact regions opposed to the contact regtans of the transponders and extending beyond them.
To facilitate an understanding of the invewtior~ in its 3~ various forms, practical embodiments will now be described, by way of example only, with reference to the accompanying drawings, in whicha Figure 1 is a schematic plan vista showing the layout 3~ of a transponder chip incorporating the present invention;
A"hw Figure 2 is a detailed view of tl~e metallisation pattern of a sir~gl~ tr~nsducer;
Figure 3 illustrates a relatively phase shifted transducer;
Figure ~ illustrates a transducer modulated in amplitude relative to that of Figure 2;
Figure 5 is a schematic isometric view of portion of the chip:
Figure 6 is a schematic cross section of the chip illustrated in Figure 6'i Figure 7 illustrates an alternative transducer structure3 Frgure FJ is a fragmentary plan view of a metallised substrate.
Figure 9 is a fragmer~t.ary bottom plan view of a Graver plate.
Figures 1Q (a) to (d) illustrate an economical tag construction according to a preferred .~orm of the inventions BETA2LED pEEGRZpTI(~N OF QftEFERRED EMBODIMENTS.
The general layout of a tag incorporating the present invention is shown in Fig, 1. A substrate 10 of piezoelectric material has printed thereon busbars 11 and 12, which are connected respectively to a centre ~5 fed dipole antenna (not shown). From the busbars ll and 12 interdigitated Fingers of conductive material project to provide a launch transducer 1.~ and a series ~r::~~~~~t~~
of encoding tap transducers 14.
Tn the preferred FMCW interrogator implementation, the returned phase information from each tap transducer on the tag is presented to the signal analysis unit as a unique frequency. The signal returned by a complete tag is thus 'the vector sum of the signals returned by each individual tap transducer, and is equivalent to a comb line specarum, with the number of frequency peaks corresponding to the number of tap transducers on the label and with the amplitude and relative phase of these peaks corresponding to the amplitude and phase encoded information of the delay line label.
The homodyne demodulated received signal is sampled at l.ra~e7l,acrtul l.~y ail aIidloyue-to-digital C:aIIVC3rt.EtL'. 2'tiib sampled signal is then analysed by a discrete Fourier transform which separates the returned frequencies into discrete frequency bins or channels. 'Pha phase differences or amplitude ratios between these bins 'then becomes the tag code. If the comb line spectrum derived from the tag return does not align with the DFm analysis channels then energy fram one comb line will incorrectly be assigned to an adjacent channel.
This misalignment will cause inter-symbol interference between analysis channels and will degrade the readability of the tag. Misalignment can be caused by a tag being at an unexpected range, or by a Doppler shift due to a tag's velocity relative to they ~0 interrogator, It is well known that complex frequency shifts can be used to align comb line spectra with DFT channels. Tt is difficult, however, to determine the shift required to correct for the rnisalignment. With good signal to noise reties it is possible to examine the ripple and edge steepnass of the DFT result and use this as a ~.a~ ~a~ ~..~:~
_x~_ guide to aligrut~ent, but in to noisy signal this technique is prone to exxaar.
In one form of tt~e p.resen-t invention, accurate alignment is facilitated by the addition to the tag of a separate "marker" tap transducer 15. This transducear is located as close as possible to the encoding transducers 14 but far enough away to allow discrimi.natian of the alignment and encoding responses under conditions of severe inter-symbol interference.
In the preferred embodiment this marker transducer i.s located three channel spacings before the encoding transducers. ~'he launch transducer is not used for this purpose because its'response is swamped by low Z5 frequency environmental clutter, and it is too tar from the encoding transducers tv allow accurate alig~ent .
As mentioned above, it is desirable to minimise reflection of the propagating SAW wave by the tap transducers. In accordance with a preferred farm of the present invention, physical reflections from the fingers are eliminated by cancellation. In the embodiment of the invention illustrated in Fig. 2, the fingers are located along the acoustic wave path at such intervals that successive leading and trailing edges of the interdigitated fingers are respectively separated by a distance which is equal to one third of the wave length of the ar.AW. With equal mark space ratio, the finger width will thus be ~1/6.
To examine the effect of this spacing, cansi,der firstly the leading edge discontinuities. Assuming that each leading edge discontinuity has an identical effect, then each set of three successive fingers x'eflects ~ proportion of the energy summing to zero, vix., r15-E + E 2x12.0" -~~ E 2x240° = 0 The effect of the leading edge discont;inul.ties has thus been pulled.
Consider secondly the trailing edge discontinuities.
Again assuming only that each trailing edge discontinuity has an identical effect, then each set of three successive fingers reflects a proportion of 1.0 energy gumming to zero, viz., E 28 + E~29 +. 2x12Q° + E /2g + 2x240° ~- 0 where E? is a phase angle dependent on the finger width lg and being nominally equal to 60° for ~/6 wide fingers having a nominally equal mark-space ratio.
As a consequence of the independent summing to zero of the leading and trailing edge discontinuities, the 20 finger mark-space ratio and therefore manufacturing etch control is not GritiCal.
The example given here of "self cancellation" of three successive /~/6 fingers at a spacing periodicity of ~l/3 is not exhaustive. A spacing of ~/3 gives the widest possible fingers for a givon fundamental frequency.
At 915 mHz this spacing gives dimensions which can ba achieved in production with current photolithographic technology. With a system employing a lower centre g0 frequency, or with higher resolution photolithography, cancellation from four successive ~/8 fingers of spacing periodicity 71/4 is workable, viz., E ~+~ E/ . 2 xx 90° + E/ 2 x 1$0" + EL 2 x 274°_ = 0, and likewise for even smaller pariodicities, e.g.
~L3~~~'~ ~:~
s-15, N6, etc., provided the spacing also allows satisfactory coupling botween the transducers and the SAW at the fundamental frequency of the signal.
Given a selected a finger spacing, the pattern of polarity of suc.aessive transducer fingers must also be chosen. Thus, in the case of ~1/3 spacing described here, the f3.ngers should be connected to the busbars 11 arid 12 in thc~ pattern i~.lustrated in Figs. 2 to 4, if the most efficient coupling is to ba achieved.
In general the polarity pattern of the fingers can be examined by plotting the stepwise appr4ximation of the eleearic potential due to the fingers, and, with a knowledge of the relationship between piezoelectric d~.splacement and electric field for the substrate material,, using a Fourier transform to derive the fundamental sino wave. mhe most efficient pattern is that which maximizes the amplitude of this fundamental sine wave.
As will be observed in the drawings, the polarity pattern of the fingers for 1'/3 spacing (++-+--) repeats in sections a in length, and consists of phase-reversed left and right half.-sections each one wavelength long. 'Phis structure maximizes the amplitude of the fundamental frequonay sine wave.
Other patterns, such as repeating left half-seaG~.ons, will produce a fundamental frequency sine wane of less amp~.itude. .
It will be appreciated that the number of fingers used in the transducer will preferably be Chosen to be an integral multiple of the number of fingers in a 3S section. in the case of ~/3 spacing, the preferred number o~ fingers wild. therefore be an integral multiple Qf 6.
~~~~.''~~~?
-17_ While in this way SILW rofloGtions genoratad at transducer discontinuities can be -reduced or cancelled, it will be realised that surface acoustic waves arising from e:Lectrical regeneration at the transducers must also be controlled in a practical label by, far example and depending an the strength of the piezoelectric coefficient of the sub~strat~, they number of fingers used for transducers and/or by the electrical impedance loading shunted across the lU busboys 11 and 12 of the delay line. Electrical regeneration can never be entirely eliminated but sinr_e it depends an a voltage being induced across one ox' more tap transducers and this voltage then causing the generation and propagation of a "secondary" SAW, 15 this effect can usually be reduced to negligible proportions by arranging for a swfficient loss in this 2-step generation and regeneration process.
Tn the practice of the present invention as 20 illustrated in Fig. 2, the intexdigitated fingers of the coding transducers 14 are provided with individual busboys 16 and 17, separated from the adjacent bulbar 11 or 12 but connected thereto by respective metallisation bridges 18 and 19. FurthErmore, each 25 "coding bus" 16 and 17 is connected to the opposite main busLar 11 or 12 by tracks 20 and respective bridges 21 and 22. In this way a stxuGture is created whereby each coding bus can be connected to either bulbar 11 or bulbar 12 by cutting the appropriate 30 cutting bridges. By e~pprapriate choice of cutting it is thus possible to produce an IDT whose phase is "flipped" by 180 degrees. Cutting the bridges 21 and 22 produces an IDT at relative 0 degrees, while cutting the bridges 18 and 19 produces an IDT at 35 relative 180 degrees.
~T~''~v~'~'~'~~
-is-It can be seen that the flip connecting tracks 20 pass across the active SAW region. It is of course desirable to minimise the disturbing effect of the flip connections Cio~r1.11g thE. aC~iV6 SAW xegion. The two major sources of such disturbance are reflections of the aooustic wave at the boundary discontinuities between the metallisation and the piezoelectric material, and the mass loading effect of the metall3.sation upon the piezoelectric material.
The boundary discontinuities can be minimised by correct choice of the dimension X (Fi.g. 2), representing the interval by which the elements are spaced along the acoustic patYz. In accordance with .this aspect of the invention, the dimension X is a function of the number of discontinuities across the active region. In Fig. 3 there are 3 leading edge discontinuities and 3 trailing edge discontinuities due to the three elements which cross the SAW active region.
~y choosing the spacing of the leading edge discontinuities correctly it is possible t.o vac~.or sum the contributions from the leading edges so that their effect is hulled. The approach here is similar to that discussed above in relation to the spacing of the fingers of. the transducer, but without limitations brought about by the need for signal coupling with the a~abstrate, 7~n this example, if we assign a distance 3Q of (3n+1) ~/3 (equal to 120 degrees phase shift) for X
we find that, assuming each discontinuity has similar effect and xe-radiates a proportion of the enexgy E, that E ~- E 2 120° + E f 24 ° - 0 The effect of the leading edge discontinuity has been ~~~~~~.'~~
nulled. Similarly, by spacing the trailing edges at multiples of (3n+1) ~/3 roe can null the trailing edge dxscantinuities. The leading and trailing edges have again been txeatad separately as this removes the need to consider whether a trailing edge discontinuity has the same properties as a leading edge discontinuity or not.
It will be understood that the connecting track may 14 consist of more than or less than three, elements, and the above approach can be generalised correspondingly.
For a "flip" connection of k elements the leading edges (and independently the trailing edges) should be spaced at multiples of (~kn + 1) ~ /k such that the reflections from k successive edges sum identically to zero, viz., fox the simplest case of n = 0, E + ~~2(1 x 360°/k) + E~2(2 x (360°/k)) + .,..
2p . . . + E~z_( (k-1) x 360°/k) ) - U
With the above condition holding fox any group'of k slam~nts, then it is permissible for a "flip"
connection to consist of more than one k element group if this is desirable, for example to reduce the resistance of such "flip" connections. The approach can thus be generalised to the statement that for k elements in a flip connection, and treating them as groups of a leading and trailing edges where k/~ is an integer, then the leading edges and trailing edges must be separated by (jn+1) A /j. That is to say, the elements are located along the path of the surface acoustic wane at intervals of (jn + 1) Where the reflecting properties of the leading and trailing edge are similar, a single connectinc3 track will be a special case of the above approach. where rs:~~ic~~.'d~
-20~
these properties differ, however, the track width will be chosen to achieve cancellation in accordance with those properties.
It will have been observed that in the illustrated embodiment, the connecting tracks 20 consist of three elements of equal mark-space ratio. In order to reduce resistance it may be desirable to provide alemonts which are of substantially greater width than the space between them. Far example, three elements may be provided, each of ~ widthr spaced apart by ll/3, so that successive elements are located at 4~3 intervals.
As will ba apprec:a.ated by those familiar with printed circuit and integrated circuit. technology, the techniques which can be used selectively tv remove the auttable bridges include chemical etching or the use of a photoplotter to define the bridges to be etched.
2p Alternative approaches include laser scribing or electrical fuszon, whereby contacts are provided on both the coding buses and the chip busbars to allow sufficient current to pass through the coding bridges to cause them to become open circuit.
It should be noted that the representation of the IbT's in Figs. 2, 3 and 4 has been simplified, and that the number of elements in a practical IDT will depend on the piezoeJ.ectric material chosen for the substrate.
Ta enable quad phase coding to be achieved two types of flip coded IDT's are employed. The transducer shown in Fig. 2, r.~ype A (01180), is placed at a nominal reference position, while the Type B (90/270) transducer shown in Fig. 3 is displaced a quarter o~ a wavelength either towards ar away from the launch transducer. Further extensions can be made to this principle to provide other types of transducers, at n'mre phase angles and/or with different amplitude responses, to allow extension from quad phase ceding to some higher level of coding.
The Launch transducer 13 is of well known IDT design for generating a surface acoustic wave. The placement of subsequent transducers is in units of a given separation. Tn the preferred embodiment this separation is in units of delay as realised as distance on the SAW chip. Depending on the bandwidth which is allowed for the interrogating and response signals, this rnay represent the distance a SAW wave travels on the surface in a period of the order of 80 to 160 nsecs. The alignment transducer 15 is placed many units of separation away from the launch transducer 13 (for example approximately 960 nsecs).
The al~.gnment transducer 15 is of well known IDT
design.
Tha first tap or encoding transducer as reference transducer 14a, which as described above is preferably placed three separation units past the alignment transducer 15. The reference transducer 14a is of the flip code design described above in relation to Fig. 2 arid is preferably a type A transducer due to the manufacturing errors possible in placement over a 3 unit distance. Following the reference transducer 14a are a flip coding transducers 14 spaced at consecutive one separation unit distances from each other. The coding transducers 14 are a combinati.r~n of type A and type B transducers, and in the illustrated embodiment fifteen of these transducers are used.
This method of chip manufacture allows a code space in _22_ this Case of X15 x 2. --- 2, 14'7, 4F33, 648. This is due to the fifteen coding -transducers each having 4 available positions (choice of A or B type flip transducer set to either 0 or 180 degrees and 90 or 270 degrees .5 respectively). The .factor of 2 is the extra node due to the phasing of the reference transducer 14a with respect to the alignment transducer 15.
The fifteen flip transducers, chosen to be either A ar 1~l 8 type transducers, are available for programming into one of 2 states by severing the cuttabla bridges, and there is also the type A ,reference transducer which can be in 1 of 2 states. This allows 216 = 65,536 Chips to be made from the one reticle before a new 15 retiCle must be made.
Theca has thus been ,~ reduction in the re-ticles needed by a factor of 65,536, a significant saving in reticles.
There are also savings in the number of master masks rtaeded, since the number of master masks required is reduced by a factor equal to the number of chips an each wafer, which may for example be 1024.
The number of flip coding transducers 14 is chosen to suit the particular application, within severe].
restrainCs. The length and therefore the Gost of the SA.W chips will increase with the number of tap f.ransduCers and will be .inversely dependent. upon the bandwidth of interrogating signal allowed by the regulatory ,authorities in the country concerned. The Code capacity will depend upon the number of hits encoded per transducer (for exgmple; 2 bits per transducer for simple quad phase encoding). Some applications may place limits on the length of the tac3, for example in the case of implantable tags far ~w the livestock industry. While some applications may require only a small code capacity, for example twelve bits or less, others may require as many as 64 bits including error correction bits.
During the exposure ref the resist on the wafer the following r3teps are performed:
1. An accurate rnask common to all chips with a given combination of A & B type transducers is used ~to create a pattern on the wafer resist. This mask Creates many chips but all of the cuttabl~ bridges are still intact.
1' 2~ Each chap is then individually coded by appropriately selecting which auttable bridges to cut.
This is preferably done by using a pattern generator (sim~,lar to and possibly even the same pattern generator as used for the lOX reticle manufacture) directly to expose the resist aver the bridges to be out~ The bridges produced by the masking process are made large enough so that the photographic resolution :~s sufficient to cut them without needing the intermediate step of a retiale and lOX reduction.
3. The wafer is then processed to produce twdividuall.y coded chips .
As mentioned above, in the preferred forms of the ~ present invention, amplitude coding is added to the quad phase encoding described above. While such coding may be achieved by a simple measure such as the removal of a proportion of the fingers of a tap transducer to reduce its coupling with the substrate, this has the disadvantage of altering the capacitance of the transponder, and would therefore require individual tuning of transpondors to achieve impedance matching with the antenna, depending on the amplitude coding.
'this problem is avoided in preferred farms of the invention, aGCOrding to which amplitude encoding is achieved by the longitudinal displacement of a group of the fingers of ~t given transducer, relative to the remaining fingers or to another group of the fingers of that transducer.
~'ig. 4 shows a transducer layout in which the transducer fingers comprise 4 groups of fingers each group having an equal number of fingers (in this example, 6). The fingers of one group, the left hand group as seen in Fig. 4, are displaced from the remaining groups by one half a wave length.
Consideration of this layout will reveal that the first three groups will contribute a tapped signal with the same phase and a nominal ampJ.itude of three units, while the fourth group will contribute an anti.phase signal with an amplitude of one unit. The net effect will be to supp7.y to the busbars a tapped signal of 2 units, or one half the amplitude of a transducer in which none of the groups is displaced.
Amplitude modulation is thus achieved which may be superimposed upon the quad phase modulation described above.
xt will be appreciated that finger groups may be displaced in other ways to achieve similar results.
~'or example, groups each comprising one eighth of the fingers of a transducer may be displaced by ~1/4 in opposite directions, also providing a 50~ amplitude modulation, Again, changes of amplitude of more or less than 50~ can be achieved by appropriate choice of the proportion of interfering fingers.
~Q~~a~~.'~'~
_25_ In addition to the economies achieved by the new approaches to transponder des~.gn described so fax, the p.resen.t invention enables the use of inexpensive materials, rather than duartz or lithium niabate as in the prior art. Tn its preferred forms, the present invention ewploys cheap borosilicate glass as the substrate material, coated with a thin film of zinc oxide. The Znp film is formed by planar RF magnetron sputtering, which allows optimal control of substrate tomperatuxe.
Zinc oxide .is a well )cnown piezoelecf.ric material with a hexagonal crystalline structure, and polycrystalline Zn~ films of suitable orientation, i.e, with the C
axis normal to film surface, can be deposited on glass by the sputter technique.
It is the orientated crystal structure that yields a stxong piezoelectric effect in the film. The thickness of the film is chosen to be less than one acoustic SAW wavelength, and to optimise the Piezoelectric coupling coefficient. For transponder operation at 915MHz, this thickness would be of the order of 1.5 microns. Th;zs as shown schematically in Figs~ 5 and 6 the thin film substrate is a layered structure in which a piezoelectric film 10 is suitably de~positad an a non piezoelectric base 23 suitably of borosiliCate glass. the alumin.lum metal for the TaT~s 1~! is them deposited an this film by vacuum evaporation or sputtering. The noxmal photolithographic processes are used to produce the chips.
An alternative to this method zs to deposit the SAW
transducers direotly an the suxface of the non-piezoelectric glass 23 rather than on the surface of the piezoeleatria film 10. As shown in Fig. 7, iv:~~iCv~. i~~
the Zn0 film is then foamed Q~rer the top of the glass and the metal transducer fingers, the thin film serving to convert the electr~.cal signals of the IDT
into SAW waves and back again. The glass base material provides the mechanical strength and serves as the S.F1W transmission material. .fin important secondary function of this technique is that the Zn0 film layer forms a protective barrier for the aluminium IDT's and thus increases the delay line reliability.
By these methods, the glass base material can be chdsan to have large physical dimensions limited only by the ~-Y travel of the. step-and-repeat camera used 1S fox the photolithographic process. Typically, a large glass plate $ inches square or more may be used as a processed wafer, capable of yielding a very large number a~ individual chips. Selective etches are available which allow etching of either the aluminium metallisatian or the zinc oxide alone. The use of a larger wafer a~.lows proportionately less wastage required for handling.
Figs. 8 and 9 illustrate the method of fabrication according to an aspect of the invention which enables the encapsulation of the transponders to be completed pxior to the slicing of the individual transponders from the wafer or substrate. In this embodiment, rows of transponder metallisatian patterns era applied 30 to a wafer, with the connection pads of longitudinally adjoining patterns being applied in a continuous area 31. (No attempt is made to show the transducers in this figure).
3S A sealant such as an epoxy resin of low gas permeability ar a glass frit is applied by silk screening to the surface of a aovar plate 35 (Fig.) of the same dimensions as the wafer. The sealant is applied in the form of "moats" 36 located to surround each transponder, leaving the pads 26 outside, when the cover plate is located over the wafer. The cover plate is placed over the wafer and the sealant cured or allowed to set, preferably under pneumatic pressure.
The moats 36 are of a height which provides a small gap between the cover plate and the wafer.
The cover plate is then sliced along the lines 32 in Fig. 8, to a depth which is just above the contact pads 31, and the strips of cover plate material between these pairs of cuts are removed (for example by air suction) to expose the pads 31. Individual transponders are then created by slicing right through the assembly on the lines 33 and 34. An antenna (not shown) is then attached to each transponder in any suitable manner.
Alternatively, a spacing sealant can be applied in the manner described to the surface of the wafer and the individual cover plates positioned over each transponder by a pick-and-place machine. After curing, the wafer is sliced in the normal way.
In the practice of the present invention therefore, handling cost is reduced by performing the sealing process while the chips are still in wafer form.
While in this technique as described above the sealant is described~as being applied to the cover plate, it may alternatively be applied to the wafer or substrate.
35' It should also be observed that this method is equally applicable to devices comprising zinc oxide on glass, as well as to wafers of lithium niobate or quartz.
Traditionally SAW devices have been constructed with the wire bonding pads fabricated along with the SAW
metallisation on the surface of the active piezoelectric material. The bonding pads consume valuable active material (such as lithium niobate) but do not rely upon any of the active characteristics of that material to function. In another aspect of the present invention the cover plate provides mechanical support for the bonding pads and thus allows the area of active piezoelectric material to be reduced.
To minimise the area of active SAW material, the SAW
chip may be redesigned with much reduced metal contact pads. The size of these pads now only need be sufficient to support the epoxy which provides the hermetic sealing for the chip. Fig. 10 illustrates a ~ SAW chip with bonding pads reduced to the minimum size necessary far hermetic sealing. The glass cover plate 24 is extended in size to allow room for the metal bonding pads 25 produced by a simgle process auto the cheap glass cover plate material.
Conneatian of the large bonding pads 25 on the cover plate 24 with: the small bonding pads 26 on the SAW
chip may be achieved by using conductive epoxy 27 only in the vicinity of the pads 26. The he~rmatic seal is then completed by placing normal epoxy 2$ around the perimeter of the SAW chip, as shown in the cross-sectional view of Fig. 10(d).
It wild, be appreciated that each transponder must be equipped with an appropriately tuned antenna. Such e~ntennae may be mounted on the cover plate and connected by means of the bonding pads 25, but since _29-the dimensions of these pads axe not constrained by considerations of substrate waterial cost, the pads 25 themselves may in suitable cases be dimensioned to act as antennae, providing an elegant solution to the pxoblem of antenna attachment,
Claims (44)
1. A surface acoustic wave transponder comprising a plurality of tap transducers in contact with a piezoelectric material, means for the reception of an interrogating signal, means transmitting said interrogating signal as a surface acoustic wave in said material and means for retransmitting said interrogating signal modified by said tap transducers, said retransmitting means including first and second signal transmission means connected to each tap transducer, each tap transducer comprising a first set of electrically interconnected parallel fingers and a second set of electrically interconnected parallel fingers interdigitated with the fingers of the first set, characterised in that the fingers of each transducer are located at such intervals along the path of the surface acoustic wave such that surface acoustic wave reflections from their edges cancel, and further characterised in that each said set of fingers is selectively connectable to one or the other of said first and second transmission means.
2. A transponder as claimed in claim 1, wherein each tap transducer includes first and second conductive path means, the fingers of the first and second set being connected respectively to said first and second path means.
3. A transponder as claimed in claim 2, wherein said conductive path means are each connected by interruptible connection means to said first and second transmission means.
4. A transponder as claimed in claim 3, wherein each interruptible connection means which crosses the path of said acoustic wave include a plurality of parallel conductive tracks, said conductive tracks being located along the path of said wave at such intervals that reflections of the surface acoustic wave from their edges cancel.
5. A transponder as claimed in claim 4, wherein each said connection means include j conductive tracks located along the path of said wave at intervals of (jn + 1) .lambda. /j where .lambda. is the wavelength of the surface acoustic wave and n is 0 or an integer.
6. A transponder as claimed in claim 5, further characterised in that each interruptible connection means which crosses the path of the surface acoustic wave includes a plurality of groups of j parallel conductive tracks.
7. A transponder as claimed in claim 5, in which j = 3 and n = 0.
8. A transponder as claimed in claim 5, in which j + 3 and n = 1.
9. A transponder as claimed in claim 3, further characterised in that said signal transmission means include a pair of parallel conductive tracks, said conductive path means of each tap transducer comprise parallel conductive tracks, and said interruptible connection means comprise conductive tracks extending between a given conductive path means and each of the signal transmission means.
10. A method of encoding a transponder of the kind defined in claim 3, comprising the steps of selectively interrupting said connection means such that the first set of fingers of a given tap transducer is connected to a selected one of the first and second signal transmission means and the second set of fingers is connected to the other of said signal transmission means, thereby determining a phase of the connection of that tap transducer with said transmission means.
11. A transponder as claimed in claim 1, wherein the tap transducers are placed at nominal positions regularly spaced along the path of the surface acoustic wave.
12. A transponder as claimed in claim 11, wherein at least one of the tap transducers is displaced along the path of the surface acoustic wave, relative to its nominal position.
13. A transponder as claimed in claim 11, in which at least one of the tap transducers is displaced along the path of the surface acoustic wave by one quarter of the wavelength of the surface acoustic wave, relative to its nominal position.
14. A method of manufacturing transponders of the kind claimed in claim 12 or 13, including the steps of preparing on a substrate a pattern of transponders in each of which the same first selected tap transducer, or the same first selection of tap transducers, is so displaced, providing each transponder with a unique phase encoding by the method claimed in claim 10, preparing on a substrate a second pattern of transponders in each of which the same selected tap transducer, or the same second selection of tap transducers, is so displaced, and providing each transponder of the second pattern with a unique phase encoding by the method claimed in claim 10.
15. A surface acoustic wave transponder as claimed in claim 1, wherein the fingers of each transducer are located at intervals of one third of the wavelength of said acoustic wave.
16. A transponder as claimed in claim 15, wherein said first set of fingers is connected with said first signal transmission means and said second set of fingers is connected with said second signal transmission means, further characterised in that the fingers are arranged in successive groups along the path of the acoustic wave, the fingers in each group being in the following order, namely, two fingers of the first set, one finger of the second set , one finger of the first set, two fingers of the second set.
17. A surface acoustic wave transponder as claimed in claim 16, characterised in that a group of fingers of at least one of said tap transducers is displaced in the path of the surface acoustic wave so as to be in phase opposition to another group of fingers of the same transducer.
18. A transponder as claimed in claim 17, in which the first group of fingers is displaced in the path of the surface acoustic wave by (2n + 1) .lambda. /2 relatively to the remaining fingers of said transducer, where .lambda. is the wavelength of the surface acoustic wave and n is 0 or an integer.
19. A surface acoustic wave transponder as claimed in claim 18, further characterised in that said group of fingers contains one quarter of the total number of fingers in the transducer.
20. A surface acoustic wave transponder as claimed in claim 19, wherein said displacement is .lambda. /2.
21. A method of manufacturing surface acoustic wave transponders of the kind defined in any one of claims 17 to 20, including the steps of preparing on a substrate a first pattern of transponders in each of which a said group of fingers of the same first selected tap transducer, or of the same first selection of tap transducers, is so displaced, and preparing on a substrate a second pattern of transponders in each of which a said group of fingers of a second selected tap transducer, or of the same second selection of tap transducers, is so displaced.
22. A method of manufacturing a transponder of the kind defined in any one of claims 17 to 20, including the steps of preparing on an substrate a pattern of transponders in each of which the same first selected transducer, or the same first selection of a plurality of transducers, is so displaced, providing each transducer with a unique phase encoding by the method defined in claim 10, preparing on a substrate a second pattern of transponders in each of which the same second selected transducer, or the same second selection of a plurality of transducers, is so displaced, and providing each transponder of the second pattern with a unique phase encoding by the method defined in claim 10.
23. A surface acoustic wave transponder as claimed in claim 1, wherein a further transducer is provided, spaced by a known surface acoustic wave path length from said tap transducers.
24. A surface acoustic wave transponder as claimed in claim 23, wherein the spacing of said further transducer is a multiple of the nominal spacing between the tap transducers.
25. A surface acoustic wave transponder as claimed in claim 24, wherein said multiple is 3.
26. A method of manufacturing a plurality of surface acoustic wave transponders, each of the kind defined in any one of claims 1 to 9, 11 to 13, 15 to 20 or 23 to 25, each consisting of a layer of metallisation in contact with a piezoelectric substrate, the method comprising the steps of producing said metalisation over an area as a repetitive pattern of individual transponder patterns, attaching a cover plate over said area, and subsequently cutting through said cover plate and said substrate in orthogonal directions to separate individual transponders.
27. A method of manufacturing a plurality of surface acoustic wave transponders, each of the kind defined in any one of claims 1 to 9, 11 to 13, 15 to 20 or 23 to 25, each consisting of a layer of metallisation in contact with a piezoelectric substrate, the method comprising the steps of producing said metallisation over an area as a repetitive pattern of individual transponder patterns, attaching a cover plate over each transponder pattern, and subsequently cutting through said substrate in orthogonal directions to separate individual transponders.
28. A method of manufacturing a plurality of surface acoustic wave transponders, each of the kind defined in claim 1, each consisting of a layer of metallisation in contact with a piezoelectric substrate, the method comprising the steps of producing said metalisation over an area as a repetitive pattern of individual transponder patterns, applying spacing means to the metalised substrate, attaching a cover plate aver said spacing means, and subsequently cutting through said cover plate and said substrate in orthogonal directions to separate individual transponders.
29. A method as claimed in claim 28, wherein said spacing means is applied around boundaries of each transponder.
30. A method as claimed in claim 28, wherein said spacing means comprises a sealant.
31. A method as claimed in claim 30, wherein said sealant is an adhesive sealant.
32. A method as claimed in claim 31, wherein said sealant is an epoxy resin.
33. A method as claimed in claim 31, wherein said sealant is a glass frit.
34. A method as claimed in claim 28, wherein each individual transponder pattern includes a contact region at at least one end thereof, and, after attachment of the cover plate and prior to said orthogonal cutting, strips of said cover plate are removed to expose said contact regions.
35. A method of manufacturing a plurality of surface acoustic wave transponders, each of the kind defined in claim 1, each consisting of a layer of metallisation in contact with a piezoelectric substrate, the method comprising the steps of producing said metallisation over an area as a repetitive pattern of individual transponder patterns, applying spacing means to the metalised substrate, attaching a cover plate over the spacing means, and subsequently cutting through said substrate in orthogonal directions to separate individual transponders.
36. A method as claimed in claim 35, wherein said spacing means is applied around the boundaries of each transponder.
37. A method as claimed in claim 35, wherein said spacing means comprises a sealant.
38. A method as claimed in claim 37, wherein said sealant is an adhesive sealant.
39. A method as claimed in claim 38, wherein said sealant is an epoxy resin.
40. A method as claimed in claim 38, wherein said sealant is a glass frit.
41. A method as claimed in claim 35, wherein each individual transponder pattern includes a contact region at at least one end thereof, and, after attachment of the cover plate and prior to said orthogonal cutting, strips of said cover plate are removed to expose said contact regions.
42. A surface acoustic wave transponder as claimed in claim 1, wherein the transponder consists of a layer of metallisation in contact with a piezoelectric substrate and has a contact region at at least one end with a cover plate being attached over said metallisation, the cover plate being provided with contact regions opposed to the contact regions of the transponder and extending beyond them.
43. A transponder as claimed in claim 42, wherein a conductive sealant is provided between each contact region of the transponder and the opposed contact region of the cover plate.
44. A transponder as claimed in claim 43, wherein the contact regions on said cover plate are dimensioned to act as an antenna for said transponder.
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| AUPJ1305 | 1988-11-04 | ||
| AUPJ130588 | 1988-11-04 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CA2002179A1 CA2002179A1 (en) | 1990-05-04 |
| CA2002179C true CA2002179C (en) | 2000-05-23 |
Family
ID=3773485
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CA 2002179 Expired - Fee Related CA2002179C (en) | 1988-11-04 | 1989-11-03 | Surface acoustic wave devices |
Country Status (3)
| Country | Link |
|---|---|
| CA (1) | CA2002179C (en) |
| NZ (1) | NZ231251A (en) |
| WO (1) | WO1990005409A1 (en) |
Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6966493B2 (en) * | 2001-12-18 | 2005-11-22 | Rf Saw Components, Incorporated | Surface acoustic wave identification tag having enhanced data content and methods of operation and manufacture thereof |
| JP2007506367A (en) | 2003-09-15 | 2007-03-15 | アールエフ ソウ コンポーネンツ,インコーポレーテッド | Method for distinguishing SAW (surface acoustic wave) identification tags |
| FR3030154B1 (en) * | 2014-12-10 | 2018-11-23 | Sasu Frec'n'sys | ELASTIC SURFACE WAVE SENSOR DEVICE WITH STABLE ELECTRICAL RESPONSE |
| FR3108192A1 (en) * | 2020-03-12 | 2021-09-17 | Saint-Gobain Glass France | WINDOWS INCLUDING A GLASS ELEMENT CONTAINING A COMMUNICATION DEVICE CONFIGURED TO OPERATE BY RADIO FREQUENCIES AND SURFACE ACOUSTIC WAVES |
Family Cites Families (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3870975A (en) * | 1974-03-22 | 1975-03-11 | Hazeltine Corp | Surface wave transducer with reduced reflection coefficient |
| JPS5566118A (en) * | 1978-11-13 | 1980-05-19 | Matsushita Electric Ind Co Ltd | Elastic surface wave device |
| JPS5937605B2 (en) * | 1979-09-25 | 1984-09-11 | 富士通株式会社 | surface acoustic wave device |
| JPS56164614A (en) * | 1980-05-21 | 1981-12-17 | Japan Radio Co Ltd | Elastic surface wave device |
| US4410823A (en) * | 1981-11-13 | 1983-10-18 | Zenith Radio Corporation | Surface acoustic wave device employing reflectors |
| JPS60186109A (en) * | 1984-03-06 | 1985-09-21 | Toshiba Corp | Surface acoustic wave resonator |
| US4535265A (en) * | 1984-05-17 | 1985-08-13 | Kabushiki Kaisha Toshiba | Surface acoustic wave transducer with internal acoustic reflection |
| AU565454B2 (en) * | 1984-10-09 | 1987-09-17 | X-Cyte Inc. | Saw transponder |
| AU564844B2 (en) * | 1984-10-09 | 1987-08-27 | X-Cyte Inc. | Saw transponder |
| US4616197A (en) * | 1985-12-05 | 1986-10-07 | R. F. Monolithics, Inc. | Resonator |
-
1989
- 1989-11-03 NZ NZ23125189A patent/NZ231251A/en unknown
- 1989-11-03 WO PCT/AU1989/000470 patent/WO1990005409A1/en not_active Ceased
- 1989-11-03 CA CA 2002179 patent/CA2002179C/en not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| NZ231251A (en) | 1993-03-26 |
| CA2002179A1 (en) | 1990-05-04 |
| WO1990005409A1 (en) | 1990-05-17 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CA2356610C (en) | Surface acoustic wave component which can be interrogated by radio and has an optimum code size | |
| US7103948B1 (en) | Method of manufacturing piezoelectric wafers of saw identification tags | |
| US6240621B1 (en) | Method of manufacturing a plurality of electronic components | |
| US5095240A (en) | Inductively coupled saw device and method for making the same | |
| US4951057A (en) | Inductive input/output coupling for a surface acoustic wave device | |
| US4479128A (en) | Polarization means for generating circularly polarized electro-magnetic waves | |
| GB2114856A (en) | Ultrasonic transducer array shading | |
| CA2002179C (en) | Surface acoustic wave devices | |
| SE504815C2 (en) | Protection for one or more electromagnetic sensors | |
| EP0939907A1 (en) | Process for carrying out a non-contact remote enquiry | |
| JPS62171209A (en) | Leakage waveguide antenna and manufacture of the same | |
| EP0030854B1 (en) | Surface acoustic wave transducer | |
| JPH1153656A (en) | Resonance label | |
| JPH10190390A (en) | Manufacture of electronic component and manufacture of surface acoustic wave device | |
| CN1027318C (en) | Surface acoustic wave devices | |
| US6407716B1 (en) | Broadband dichroic surface | |
| GB1597324A (en) | Integrated magnetic field sensor | |
| US3383508A (en) | Infrared radiometer array comprising a pair of multi-element subarrays | |
| JP2633404B2 (en) | Polarizer | |
| GB2073529A (en) | Surface acoustic wave device and method for producing the same | |
| KR20180134238A (en) | Wafer Level Package and manufacturing method | |
| Hunt et al. | Reduction of surface acoustic wave grating impedance and velocity perturbations via buried bimetallic electrode geometries | |
| KR100616661B1 (en) | Electrode pattern formation method of surface acoustic wave device using electron beam lithography | |
| JPH0318367B2 (en) | ||
| CN115759131A (en) | Surface acoustic wave label structure with radio frequency identification and temperature measurement functions and method |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| EEER | Examination request | ||
| MKLA | Lapsed |