CA1333817C - Method and apparatus for statistical set point bias control - Google Patents
Method and apparatus for statistical set point bias controlInfo
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- CA1333817C CA1333817C CA 571772 CA571772A CA1333817C CA 1333817 C CA1333817 C CA 1333817C CA 571772 CA571772 CA 571772 CA 571772 A CA571772 A CA 571772A CA 1333817 C CA1333817 C CA 1333817C
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Abstract
A process controller may incorporate statistical computations of the variance in the controlled vari-able. Statistical measures may then be used to offset the controller set point to maintain the controlled variable distribution in an acceptable specification zone. The statistical measures may be made automatically and continuously thereby obviating human intervention, while producing high quality, though statistically variable, process output. The statistical measures may be calculated specifically or generated by a weighted integration method.
Description
WEM.017 US
Method and Apparatus for Statistical Set Point Bias Control S
Technical Field The present invention relates to feedback control devices, and in particular to feedback control devices employing a numerically calculated set point.
Background Art Industrial process controllers are commonly tuned to control an output to meet a particular output specification. Where the features of the system function ideally, setting the control to the ideal specification then produces the specified output with no variation. Material handling systems do not work ideally for numerous reasons, and as a result there is frequently a statistical distribution in the out-put from the system. Where there is no functional difference between the high side and the low side results of the statistical distribution, setting the control to meet the center of the statistical dis-tribution is a correct choice.
Functional differences may exist between the high and low sides of the distribution. One side of the distribution is then acceptable, while the other is not. For example, a chemical reaction may occur on the high side of the distribution that produces a pollutant thereby spoiling the output, or the mater-- ial or energy investment may exceed what is necessary thereby wasting resources. In the cases where an important difference esists in the output distribu-tion, the process needs to be controlled so the dis-trlbution ls on the preferred slde of the speclflcatlon and then to be withln a measure of closeness to the speclficatlon.
Where the dlstrlbutlon ls known and has a fixed value, a slmple solutlon ls to tune the process to a level offset from the speciflcation by an amount sufflcient to locate the distrlbution center in the preferred zone, but close enough to the speclflcatlon so the amount of output falllng ln the unacceptable zone ls tolerable. Unfortunately, an output distrlbutlon is generally not known, and is likely to change ln tlme. Further, the feature lmportant to control may not be the center of the distribution, which may not be symmetrlc, but the amount of product, or the exlstence of any product occurring in the unacceptable zone.
Summary of the Inventlon The lnventlon provldes a process control devlce for set polnt bias control comprislng:
a) a process control devlce responsive to a set polnt condltlon and a measured amount condltion to produce a control signal used to affect a process havlng a feature measured to produce the measured amount, b) means for generatlng a set polnt blas, and c) means for offsettlng a speclficatlon llmlt by the set polnt blas ln a preferred dlrectlon to produce the set polnt condltlon.
The lnventlon also provldes a method for set polnt blas control of a process wlth a controller recelvlng a set polnt value to operate on the process produclng a measured amount comprlslng B~
1 ~ 3~ ~ 7 65859-98 the steps of:
a) recelvlng a speclflcatlon llmlt, b) offsettlng the speclflcatlon llmlt ln a preferred dlrectlon wlth a blas amount to produce a set polnt amount, c) generatlng an error slgnal amount from the set polnt amount and the measured amount, d) controlllng a process accordlng to the error slgnal amount, e) measurlng a process feature to produce the measured 0 amount, and f) performlng a blas computatlon on the measured amount to generate the blas amount.
The lnventlon further provldes a process control devlce for set polnt blas control comprlslng:
a) a process control devlce responslve to a set polnt amount and a measured amount to produce a control slgnal used to affect a process havlng a feature measured to produce the measured amount, b) means for produclng the set polnt amount offset by a blas amount from a speclflcatlon llmlt on a preferred slde of the speclflcatlon llmlt, and c) means for generatlng a control slgnal from the set polnt amount and the measured amount.
The lnventlon stlll further provldes a method for set polnt blas control of a process wlth a controller recelvlng a set polnt value to operate on the process produclng a measured amount comprlslng the steps of:
2a ~ ~ 1 3338 1 7 a) recelvlng a speclflcation llmlt, b) produclng a set polnt amount from a dlfference between the speclflcatlon llmlt and the measured amount, a duratlon of the dlfference, and a flrst galn whlle the measured amount ls on a preferred slde of the speclflcatlon limlt and a second galn whlle the measured amount ls not on the preferred slde of the speclflcatlon llmlt, c) generatlng an error slgnal amount ln response to the set polnt amount and the measured amount, d) controlllng the process accordlng to the error slgnal amount, and e) measurlng a process feature to produce the measured amount.
Blasing the set polnt of a controller to the preferred slde of a speclflcatlon llmlt ln relatlon to the standard devlatlons or varlatlon ln the controlled varlable keeps most of the excurslons ln the controlled varlable on the acceptable slde of the speclflcatlon llmlt. The speclflcatlon llmlt may then be approached as closely as observed varlatlon allows. The controlled process may then be maxlmlzed for proflt or quallty by keeplng the controlled varlable close to the speclflcatlon llmlt, but wlthout exceedlng the llmlt.
Brlef DescrlPtlon of the Drawlnqs FIG. 1 shows a schematlc dlagram of a statlstlcal control process.
FIG. 2 shows a schematlc dlagram of a preferred control process.
2b `- 1 3338 1 7 Best Mode for Making the Invention FIG. 1 shows a schematic diagram of a control process employing a statistical control process. A
specification limit 30 is received defining the pre-ferred output condition. The specification limit 30is then augmented or diminished by a bias amount 40 in a summation block 50 depending on whether errors in the process output are preferred on the high side or low side of the specification limit 30. The specification limit 30 offset by the bias amount 40 is then the set point 60 for a controller 70.
The controller 70 affects a process 80 having a measured feature called a measured variable 90. The goai of the controller 70 is to bring the process 80 to a state where the measured variable equals the set point 60, or in the present case, where the distribu-tion of the measured variable 90 values is offset on the preferred side of the specification limit 30.
The set point 60 and measured variable 90 are used to produce a control signal affecting the controller.
Commonly, the difference between the set point 60 and the measured variable 90 is computed in a difference block 100 as an error signal 110 used as the control signal. The error signal 110 is supplied to the 2S controller 70 to direct the direction and size of the controller's response in affecting the process 80 and correspondingly the measured variable 90. The pro-cess 80 is sensed to produce the measured variable go which is returned to the difference block 100 to generate the error signal 110.
Applicant additionally supplies the measured variable 90 to a bias calculating block 120. The bias calculating block 120 calculates a statistical measure of the distribution in the measured variable `- ` 1 333~17 90, for esample, the standard deviation. The statis-tical measure is then appropriately scaled to produce the bias amount 40.
Numerous statistical measures may be made. The standard deviation is a familiar and preferred measure by the applicant. To compute the standard deviation of the measured variable 90, an average value of the measured variable 90 is computed for a sample period. The length of the sample period is determined by the user in accordance with the nature - of the process 80, the sampling rate of the measured variable 90, and the level of confidence sought.
Where the specification limit 30 has a fixed value, and the process 80 is slow moving in comparison to the sampling rate, good statistics may generally be taken under all conditions. Where the distribution is changing, the statistic needs to be normalized by the distribution trend, and compensated for the delay in the process 80.
The average sample value of the measured variable 90 may be computed as a running average of a number of sample values. A number ns is selected by the user which is the number of samples to be averaged.
The number ns times the sample rate tr gives an effective sample period, which in the preferred form esceeds the closed loop period of the measured signal, and in further preference is set to corres-pond to the capacity of the process 80.
The sample average, save, may be computed in several ways. A running average may be computed by summing the ns most recent sample values si and dividing the sum by the sample count ns. With each additional sample, the oldest sample value S(i ns 1) is removed, while the newest sample value ~ 333~
Si is included in the sum. The sum is divided by the sample count ns.
Alternatively, a weighted time series sum may be computed, for example, save ~sie ti/~, where all sample values si are included but given less weight as the sample ages. The time ti is the age of the sample si. The factor ~ is a- time constant similar to the sample count ns selected by the user to correspond to the process 80, sampling rate and other process 80 features. The weighted time series is conveniently computed as a percentage of the previous weighted average plus the remaining percentage times the current sample value, save =
(X %) (sold) ~ (100 - X %) (Si) -Alternatively a block average, although not a preferred average, may be computed where ns samples are taken, and averaged as a block. The next ns values are used as a block for the next average cal-culation. Applicant prefers a running average.
The average value, save, is subtracted from the current sample value, si, and the result squared, (Si ~ Save) The squared value is then averaged over a number of samples. Again the average of the squared values may be computed in the several ways listed. Averaging the sum of the squares in the same fashion as the sample average is convenient.
Again a running average is preferred. The square root of the result is the standard deviation. The standard deviation is then scaled according to the degree of quality assurance required in measured variable 90. For a normal distribution and an offset of one standard deviation, only 15.87 percent of the measured variable 90 samples should be in the unac-ceptable zone, for an offset of two standard devia-1333~17 tions only 2.28 percent of the output should be inthe unacceptable zone, and for three standard deviations, only 0.14 percent.
To enhance the uniformity of the distribution in S the measured variable 90 a subgrouping procedure may be performed. A subgroup of nS samples, four or more, may be averaged as a group to form a subgroup sample value sgj. The statistical analysis is per-formed on the subgroup sample values sgj. Thus,10 the standard deviation calculated is for the subgroup values sgj which may then be converted to the standard deviation of the individual samples si by multiplying by the square root of the number of samples in the subgroup.
The statistically calculated bias operates with the assumption that the set point is at the mean of the distribution. If the process is nonlinear, dis-tribution of the controlled variable tends to be skewed leading to a statistically inaccurate result.
Compensation may be applied to the set point 60 and measurement variable 90 signals to linearize the signals, and as a result, to linearize the error signal 110 and the response of the controller. The distribution in the measured variable 90 is then forced to become more uniform. However, the mean of measured variable 90 distribution curve may no longer coincide with the set point 60 of the controller 70.
Setting the bias 40 as function of the standard devi-ation is then not completely accurate, and fails according to the degree of skewness in the measured variable 90.
An alternative method and apparatus uses an integrator to position the set point so no more than a selected percentage of the integrated area between 1 ~33~R ~
the measured variable and the specification limit lies on the unacceptable side of the specification limit. An integrator gain is weighted so a higher gain is applied when the measurement is on the un-acceptable side of the specification limit than whenthe measurement is on the acceptable side of the specification. The gains are weighted in portion to the ratio of the desired integrated areas.
FIG. 2 shows a schematic diagragm of a preferred controlled area biasing control process. A specifi-cation limit 210 is received by an integrator block 220. Broadly, the integrator block 220 responds to the difference between the specification limit 210 and a measurment signal 230. As the difference lS increases, the response of the integrator block 220 increases. The integrator block 220 also responds to the duration of the difference. As the duration of the difference increases, the response of the integrator block also increases.
The integrator block 220 also responds to a gain factor. A separate gain block may be used, operating with the measurement signal 230, and providing a gain signal to the integrator block 220. Applicant pre-fers including the gain generating process in the integrator block 220. The gain producing means in a simple and preferred form examines the measurement signal 230 for one of two conditions. Where the measurement signal 230 is on the preferred side of the measurement distribution, the gain signal is low.
Where the measurement signal 230 is on the unaccept-able side of the specification limit 210 the gain signal is high. Preferrably, the product of the low gain and the portion of the output sought to be on the preferred side of the specification limit eguals the product of the high gain and the portion of the output allowed in the unacceptable side of the dis-tribution. For example, where 97 percent of the distribution is sought to be in the acceptable region, and 3 percent is allowed in the unacceptable region, the low qain signal times 97 should equal 3 times the high gain signal. Conceptually the pre-ferred integrator block 220 integrates the area between the specification and measurement amounts, and weights the result so the area on the unaccept-able side appears large. The preferred integrator block 220 integrates the difference between the specification limit 210 and the measurement signal 230 according to a two state (high low) gain func-tion. The integrator block 220 then outputs a setpoint signal 240.
The set point signal 240 may optionally be lin-earized in a set point function block 250 to produce a linearized set point signal 260. The set point signal 240, or linearized set point signal 260, as the case may be, is combined in a difference block 270 with the measurement signal 230 to produce an error signal 280. The error signal 280 is supplied to a controller 290 operating on a process 300 having a measured feature to produce the measured signal 230. The measured signal 230 may optionally be li-nearized in a measurement function block 310 to produce a linearized measurement signal 320. In most instances, where the set point 240 is linearized in a function block 250, the measurement signal 230 is linearized correspondingly so the two signals com-bined in the difference block 270 are comparable.
While there have been shown and described what are at present considered to be the preferred embodi-ments of the invention, it will be apparent to thoseskilled in the art that various changes and modifi-cations can be made herein without departing from the scope of the invention defined by the appended claims. For example, numerous combinations and formulations of statistical measures are possible.
Different statistical moments, cubic or higher orders, may be made, or corresponding roots of higher order moments may be made. Different distributions in the measured variable other than a normal dis-- tribution may be used or assumed. The calculation and signal processes may be performed by digital or analog equipment, or may be implemented directly in hardware as is within the scope of those skilled in the art.
Method and Apparatus for Statistical Set Point Bias Control S
Technical Field The present invention relates to feedback control devices, and in particular to feedback control devices employing a numerically calculated set point.
Background Art Industrial process controllers are commonly tuned to control an output to meet a particular output specification. Where the features of the system function ideally, setting the control to the ideal specification then produces the specified output with no variation. Material handling systems do not work ideally for numerous reasons, and as a result there is frequently a statistical distribution in the out-put from the system. Where there is no functional difference between the high side and the low side results of the statistical distribution, setting the control to meet the center of the statistical dis-tribution is a correct choice.
Functional differences may exist between the high and low sides of the distribution. One side of the distribution is then acceptable, while the other is not. For example, a chemical reaction may occur on the high side of the distribution that produces a pollutant thereby spoiling the output, or the mater-- ial or energy investment may exceed what is necessary thereby wasting resources. In the cases where an important difference esists in the output distribu-tion, the process needs to be controlled so the dis-trlbution ls on the preferred slde of the speclflcatlon and then to be withln a measure of closeness to the speclficatlon.
Where the dlstrlbutlon ls known and has a fixed value, a slmple solutlon ls to tune the process to a level offset from the speciflcation by an amount sufflcient to locate the distrlbution center in the preferred zone, but close enough to the speclflcatlon so the amount of output falllng ln the unacceptable zone ls tolerable. Unfortunately, an output distrlbutlon is generally not known, and is likely to change ln tlme. Further, the feature lmportant to control may not be the center of the distribution, which may not be symmetrlc, but the amount of product, or the exlstence of any product occurring in the unacceptable zone.
Summary of the Inventlon The lnventlon provldes a process control devlce for set polnt bias control comprislng:
a) a process control devlce responsive to a set polnt condltlon and a measured amount condltion to produce a control signal used to affect a process havlng a feature measured to produce the measured amount, b) means for generatlng a set polnt blas, and c) means for offsettlng a speclficatlon llmlt by the set polnt blas ln a preferred dlrectlon to produce the set polnt condltlon.
The lnventlon also provldes a method for set polnt blas control of a process wlth a controller recelvlng a set polnt value to operate on the process produclng a measured amount comprlslng B~
1 ~ 3~ ~ 7 65859-98 the steps of:
a) recelvlng a speclflcatlon llmlt, b) offsettlng the speclflcatlon llmlt ln a preferred dlrectlon wlth a blas amount to produce a set polnt amount, c) generatlng an error slgnal amount from the set polnt amount and the measured amount, d) controlllng a process accordlng to the error slgnal amount, e) measurlng a process feature to produce the measured 0 amount, and f) performlng a blas computatlon on the measured amount to generate the blas amount.
The lnventlon further provldes a process control devlce for set polnt blas control comprlslng:
a) a process control devlce responslve to a set polnt amount and a measured amount to produce a control slgnal used to affect a process havlng a feature measured to produce the measured amount, b) means for produclng the set polnt amount offset by a blas amount from a speclflcatlon llmlt on a preferred slde of the speclflcatlon llmlt, and c) means for generatlng a control slgnal from the set polnt amount and the measured amount.
The lnventlon stlll further provldes a method for set polnt blas control of a process wlth a controller recelvlng a set polnt value to operate on the process produclng a measured amount comprlslng the steps of:
2a ~ ~ 1 3338 1 7 a) recelvlng a speclflcation llmlt, b) produclng a set polnt amount from a dlfference between the speclflcatlon llmlt and the measured amount, a duratlon of the dlfference, and a flrst galn whlle the measured amount ls on a preferred slde of the speclflcatlon limlt and a second galn whlle the measured amount ls not on the preferred slde of the speclflcatlon llmlt, c) generatlng an error slgnal amount ln response to the set polnt amount and the measured amount, d) controlllng the process accordlng to the error slgnal amount, and e) measurlng a process feature to produce the measured amount.
Blasing the set polnt of a controller to the preferred slde of a speclflcatlon llmlt ln relatlon to the standard devlatlons or varlatlon ln the controlled varlable keeps most of the excurslons ln the controlled varlable on the acceptable slde of the speclflcatlon llmlt. The speclflcatlon llmlt may then be approached as closely as observed varlatlon allows. The controlled process may then be maxlmlzed for proflt or quallty by keeplng the controlled varlable close to the speclflcatlon llmlt, but wlthout exceedlng the llmlt.
Brlef DescrlPtlon of the Drawlnqs FIG. 1 shows a schematlc dlagram of a statlstlcal control process.
FIG. 2 shows a schematlc dlagram of a preferred control process.
2b `- 1 3338 1 7 Best Mode for Making the Invention FIG. 1 shows a schematic diagram of a control process employing a statistical control process. A
specification limit 30 is received defining the pre-ferred output condition. The specification limit 30is then augmented or diminished by a bias amount 40 in a summation block 50 depending on whether errors in the process output are preferred on the high side or low side of the specification limit 30. The specification limit 30 offset by the bias amount 40 is then the set point 60 for a controller 70.
The controller 70 affects a process 80 having a measured feature called a measured variable 90. The goai of the controller 70 is to bring the process 80 to a state where the measured variable equals the set point 60, or in the present case, where the distribu-tion of the measured variable 90 values is offset on the preferred side of the specification limit 30.
The set point 60 and measured variable 90 are used to produce a control signal affecting the controller.
Commonly, the difference between the set point 60 and the measured variable 90 is computed in a difference block 100 as an error signal 110 used as the control signal. The error signal 110 is supplied to the 2S controller 70 to direct the direction and size of the controller's response in affecting the process 80 and correspondingly the measured variable 90. The pro-cess 80 is sensed to produce the measured variable go which is returned to the difference block 100 to generate the error signal 110.
Applicant additionally supplies the measured variable 90 to a bias calculating block 120. The bias calculating block 120 calculates a statistical measure of the distribution in the measured variable `- ` 1 333~17 90, for esample, the standard deviation. The statis-tical measure is then appropriately scaled to produce the bias amount 40.
Numerous statistical measures may be made. The standard deviation is a familiar and preferred measure by the applicant. To compute the standard deviation of the measured variable 90, an average value of the measured variable 90 is computed for a sample period. The length of the sample period is determined by the user in accordance with the nature - of the process 80, the sampling rate of the measured variable 90, and the level of confidence sought.
Where the specification limit 30 has a fixed value, and the process 80 is slow moving in comparison to the sampling rate, good statistics may generally be taken under all conditions. Where the distribution is changing, the statistic needs to be normalized by the distribution trend, and compensated for the delay in the process 80.
The average sample value of the measured variable 90 may be computed as a running average of a number of sample values. A number ns is selected by the user which is the number of samples to be averaged.
The number ns times the sample rate tr gives an effective sample period, which in the preferred form esceeds the closed loop period of the measured signal, and in further preference is set to corres-pond to the capacity of the process 80.
The sample average, save, may be computed in several ways. A running average may be computed by summing the ns most recent sample values si and dividing the sum by the sample count ns. With each additional sample, the oldest sample value S(i ns 1) is removed, while the newest sample value ~ 333~
Si is included in the sum. The sum is divided by the sample count ns.
Alternatively, a weighted time series sum may be computed, for example, save ~sie ti/~, where all sample values si are included but given less weight as the sample ages. The time ti is the age of the sample si. The factor ~ is a- time constant similar to the sample count ns selected by the user to correspond to the process 80, sampling rate and other process 80 features. The weighted time series is conveniently computed as a percentage of the previous weighted average plus the remaining percentage times the current sample value, save =
(X %) (sold) ~ (100 - X %) (Si) -Alternatively a block average, although not a preferred average, may be computed where ns samples are taken, and averaged as a block. The next ns values are used as a block for the next average cal-culation. Applicant prefers a running average.
The average value, save, is subtracted from the current sample value, si, and the result squared, (Si ~ Save) The squared value is then averaged over a number of samples. Again the average of the squared values may be computed in the several ways listed. Averaging the sum of the squares in the same fashion as the sample average is convenient.
Again a running average is preferred. The square root of the result is the standard deviation. The standard deviation is then scaled according to the degree of quality assurance required in measured variable 90. For a normal distribution and an offset of one standard deviation, only 15.87 percent of the measured variable 90 samples should be in the unac-ceptable zone, for an offset of two standard devia-1333~17 tions only 2.28 percent of the output should be inthe unacceptable zone, and for three standard deviations, only 0.14 percent.
To enhance the uniformity of the distribution in S the measured variable 90 a subgrouping procedure may be performed. A subgroup of nS samples, four or more, may be averaged as a group to form a subgroup sample value sgj. The statistical analysis is per-formed on the subgroup sample values sgj. Thus,10 the standard deviation calculated is for the subgroup values sgj which may then be converted to the standard deviation of the individual samples si by multiplying by the square root of the number of samples in the subgroup.
The statistically calculated bias operates with the assumption that the set point is at the mean of the distribution. If the process is nonlinear, dis-tribution of the controlled variable tends to be skewed leading to a statistically inaccurate result.
Compensation may be applied to the set point 60 and measurement variable 90 signals to linearize the signals, and as a result, to linearize the error signal 110 and the response of the controller. The distribution in the measured variable 90 is then forced to become more uniform. However, the mean of measured variable 90 distribution curve may no longer coincide with the set point 60 of the controller 70.
Setting the bias 40 as function of the standard devi-ation is then not completely accurate, and fails according to the degree of skewness in the measured variable 90.
An alternative method and apparatus uses an integrator to position the set point so no more than a selected percentage of the integrated area between 1 ~33~R ~
the measured variable and the specification limit lies on the unacceptable side of the specification limit. An integrator gain is weighted so a higher gain is applied when the measurement is on the un-acceptable side of the specification limit than whenthe measurement is on the acceptable side of the specification. The gains are weighted in portion to the ratio of the desired integrated areas.
FIG. 2 shows a schematic diagragm of a preferred controlled area biasing control process. A specifi-cation limit 210 is received by an integrator block 220. Broadly, the integrator block 220 responds to the difference between the specification limit 210 and a measurment signal 230. As the difference lS increases, the response of the integrator block 220 increases. The integrator block 220 also responds to the duration of the difference. As the duration of the difference increases, the response of the integrator block also increases.
The integrator block 220 also responds to a gain factor. A separate gain block may be used, operating with the measurement signal 230, and providing a gain signal to the integrator block 220. Applicant pre-fers including the gain generating process in the integrator block 220. The gain producing means in a simple and preferred form examines the measurement signal 230 for one of two conditions. Where the measurement signal 230 is on the preferred side of the measurement distribution, the gain signal is low.
Where the measurement signal 230 is on the unaccept-able side of the specification limit 210 the gain signal is high. Preferrably, the product of the low gain and the portion of the output sought to be on the preferred side of the specification limit eguals the product of the high gain and the portion of the output allowed in the unacceptable side of the dis-tribution. For example, where 97 percent of the distribution is sought to be in the acceptable region, and 3 percent is allowed in the unacceptable region, the low qain signal times 97 should equal 3 times the high gain signal. Conceptually the pre-ferred integrator block 220 integrates the area between the specification and measurement amounts, and weights the result so the area on the unaccept-able side appears large. The preferred integrator block 220 integrates the difference between the specification limit 210 and the measurement signal 230 according to a two state (high low) gain func-tion. The integrator block 220 then outputs a setpoint signal 240.
The set point signal 240 may optionally be lin-earized in a set point function block 250 to produce a linearized set point signal 260. The set point signal 240, or linearized set point signal 260, as the case may be, is combined in a difference block 270 with the measurement signal 230 to produce an error signal 280. The error signal 280 is supplied to a controller 290 operating on a process 300 having a measured feature to produce the measured signal 230. The measured signal 230 may optionally be li-nearized in a measurement function block 310 to produce a linearized measurement signal 320. In most instances, where the set point 240 is linearized in a function block 250, the measurement signal 230 is linearized correspondingly so the two signals com-bined in the difference block 270 are comparable.
While there have been shown and described what are at present considered to be the preferred embodi-ments of the invention, it will be apparent to thoseskilled in the art that various changes and modifi-cations can be made herein without departing from the scope of the invention defined by the appended claims. For example, numerous combinations and formulations of statistical measures are possible.
Different statistical moments, cubic or higher orders, may be made, or corresponding roots of higher order moments may be made. Different distributions in the measured variable other than a normal dis-- tribution may be used or assumed. The calculation and signal processes may be performed by digital or analog equipment, or may be implemented directly in hardware as is within the scope of those skilled in the art.
Claims (23)
1. A process control device for set point bias control comprising:
a) a process control device responsive to a set point condition and a measured amount con-dition to produce a control signal used to affect a process having a feature measured to produce the measured amount, b) means for generating a set point bias, and c) means for offsetting a specification limit by the set point bias in a preferred direc-tion to produce the set point condition.
a) a process control device responsive to a set point condition and a measured amount con-dition to produce a control signal used to affect a process having a feature measured to produce the measured amount, b) means for generating a set point bias, and c) means for offsetting a specification limit by the set point bias in a preferred direc-tion to produce the set point condition.
2. The device of claim 1 wherein the means for gen-erating a set point bias includes means for per-forming a statistical measure of the measured amount to produce the set point bias in a form related to the statistical measure.
3. The device of claim 2 wherein the statistical measure is an nth degree moment measure.
4. The device of claim 2 wherein the statistical measure is an nth degree root of an nth degree moment measure.
5. The device of claim 4 wherein the statistical measure is the standard deviation.
6. The device of claim 5 wherein the standard devi-ation is scaled to produce the bias.
7. The device of claim 3 wherein the statistical measure is the variance in the measured amount scaled to produce the bias.
8. The device of claim 2 wherein the statistical measure is scaled to produce the bias.
9. A method for set point bias control of a process with a controller receiving a set point value to operate on the process producing a measured amount comprising the steps of:
a) receiving a specification limit, b) offsetting the specification limit in a preferred direction with a bias amount to produce a set point amount, c) generating a error signal amount from the set point amount and the measured amount, d) controlling a process according to the error signal amount, e) measuring a process feature to produce the measured amount, and f) performing a bias computation on the measured amount to generate the bias amount.
a) receiving a specification limit, b) offsetting the specification limit in a preferred direction with a bias amount to produce a set point amount, c) generating a error signal amount from the set point amount and the measured amount, d) controlling a process according to the error signal amount, e) measuring a process feature to produce the measured amount, and f) performing a bias computation on the measured amount to generate the bias amount.
10. The method of claim 9 wherein generating the set point bias includes performing a statistical measure of the measured amount to produce the set point bias related to the statistical measure.
11. The method of claim 10 wherein the statistical measure is a measure of standard deviation.
12. The method of claim 11 including the step of scaling the standard deviation to produce the bias.
13. The method of claim 11 including the steps of obtaining statistical measurement samples and subgrouping the samples to produce subgroup values used in place of the sample values, and transforming the statistical measure made on the subgroup values to correspond to a sample value.
14. A method for set point bias control of a process with a controller receiving a set point amount to operate on the process producing a measured amount comprising the steps of:
a) receiving a specification limit, b) offsetting the specification limit in a preferred direction with a bias amount to produce a set point amount, c) generating an error signal amount as a difference between the set point amount and a measured amount, d) controlling a process according to the error signal amount, e) measuring a process feature to produce the measured amount, f) performing a bias computation on the measured amount to generate the bias amount from a measure of standard deviation of the measured amount to produce the set point bias, and g) scaling the measure of standard deviation to pro-duce the bias amount.
a) receiving a specification limit, b) offsetting the specification limit in a preferred direction with a bias amount to produce a set point amount, c) generating an error signal amount as a difference between the set point amount and a measured amount, d) controlling a process according to the error signal amount, e) measuring a process feature to produce the measured amount, f) performing a bias computation on the measured amount to generate the bias amount from a measure of standard deviation of the measured amount to produce the set point bias, and g) scaling the measure of standard deviation to pro-duce the bias amount.
15. A process control device for set point bias control comprising:
a) a process control device responsive to a set point amount and a measured amount to pro-duce a control signal used to affect a process having a feature measured to produce the measured amount, b) means for producing the set point amount offset by a bias amount from a specification limit on a preferred side of the specifica-tion limit, and c) means for generating a control signal from the set point amount and the measured amount.
a) a process control device responsive to a set point amount and a measured amount to pro-duce a control signal used to affect a process having a feature measured to produce the measured amount, b) means for producing the set point amount offset by a bias amount from a specification limit on a preferred side of the specifica-tion limit, and c) means for generating a control signal from the set point amount and the measured amount.
16. The process control device of claim 15 wherein, means for producing the set point amount includes means for producing a bias offsetting the set point amount from the specification amount such that over a time average a portion of the measured amount is on the preferred side of the specification limit at least equals a desired portion of the total measured amount.
17. The process control device of claim 15 wherein, the means for producing the set point amount includes an integrator.
18. The process control device of claim 17 wherein the integrator includes a two state gain function with a first gain applied when the measured amount is on a preferred side of the specifica-tion limit, and a second gain applied when the measured amount is not on the preferred side of the specification limit.
19. The process control device of claim 18 wherein the first and second gains are in proportion to the amount of the measured amount desired on the preferred side of the specification limit to the amount of the measured amount allowed not on the preferred side of the specification limit.
20. A method for set point bias control of a process with a controller receiving a set point value to operate on the process producing a measured amount comprising the steps of:
a) receiving a specification limit, b) producing a set point amount from a dif-ference between the specification limit and the measured amount, a duration of the dif-ference, and a first gain while the measured amount is on a preferred side of the speci-fication limit and a second gain while the measured amount is not on the preferred side of the specification limit, c) generating an error signal amount in response to the set point amount and the measured amount, d) controlling the process according to the error signal amount, and e) measuring a process feature to produce the measured amount.
a) receiving a specification limit, b) producing a set point amount from a dif-ference between the specification limit and the measured amount, a duration of the dif-ference, and a first gain while the measured amount is on a preferred side of the speci-fication limit and a second gain while the measured amount is not on the preferred side of the specification limit, c) generating an error signal amount in response to the set point amount and the measured amount, d) controlling the process according to the error signal amount, and e) measuring a process feature to produce the measured amount.
21. The method of claim 20 wherein producing the set point amount includes the steps of:
a) integrating the difference between the specification limit and a measured amount, to form an integration result and b) multiplying the integration result by a first gain while the measured amount is on a preferred side of the specification limit and by a second gain while the measured amount in not on the preferred side to produce the set point amount.
a) integrating the difference between the specification limit and a measured amount, to form an integration result and b) multiplying the integration result by a first gain while the measured amount is on a preferred side of the specification limit and by a second gain while the measured amount in not on the preferred side to produce the set point amount.
22. The method of claim 21 wherein the second gain is greater than the first gain.
23. The method of claim 21 wherein the second gain is greater than the first gain in ratio to the amount the measured amount on the preferred side of the specification limit is sought to have to the amount of the measured amount not on the preferred side of the specification limit.
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US3779887A | 1987-07-13 | 1987-07-13 | |
| US7/037,798 | 1987-07-13 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CA1333817C true CA1333817C (en) | 1995-01-03 |
Family
ID=21896405
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CA 571772 Expired - Fee Related CA1333817C (en) | 1987-07-13 | 1988-07-12 | Method and apparatus for statistical set point bias control |
Country Status (1)
| Country | Link |
|---|---|
| CA (1) | CA1333817C (en) |
-
1988
- 1988-07-12 CA CA 571772 patent/CA1333817C/en not_active Expired - Fee Related
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