CA1262372A - Method for the measurement of capacitances, in particular of low capacitances, wherein two references are used - Google Patents

Method for the measurement of capacitances, in particular of low capacitances, wherein two references are used

Info

Publication number
CA1262372A
CA1262372A CA000482808A CA482808A CA1262372A CA 1262372 A CA1262372 A CA 1262372A CA 000482808 A CA000482808 A CA 000482808A CA 482808 A CA482808 A CA 482808A CA 1262372 A CA1262372 A CA 1262372A
Authority
CA
Canada
Prior art keywords
measurement
signals
capacitances
circuit
capacitance
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
CA000482808A
Other languages
English (en)
French (fr)
Inventor
Jorma Ponkala
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Vaisala Oy
Original Assignee
Vaisala Oy
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Vaisala Oy filed Critical Vaisala Oy
Application granted granted Critical
Publication of CA1262372A publication Critical patent/CA1262372A/en
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables
    • G01R27/2605—Measuring capacitance

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
  • Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
  • Transmission And Conversion Of Sensor Element Output (AREA)
CA000482808A 1984-05-31 1985-05-30 Method for the measurement of capacitances, in particular of low capacitances, wherein two references are used Expired CA1262372A (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FI842193A FI69932C (fi) 1984-05-31 1984-05-31 Maetningsfoerfarande foer kapacitanser speciellt foer smao kapacitanser vid vilker man anvaender tvao referenser
FI842193 1984-05-31

Publications (1)

Publication Number Publication Date
CA1262372A true CA1262372A (en) 1989-10-17

Family

ID=8519172

Family Applications (1)

Application Number Title Priority Date Filing Date
CA000482808A Expired CA1262372A (en) 1984-05-31 1985-05-30 Method for the measurement of capacitances, in particular of low capacitances, wherein two references are used

Country Status (10)

Country Link
JP (1) JPS60262067A (fi)
AU (1) AU587578B2 (fi)
BR (1) BR8502572A (fi)
CA (1) CA1262372A (fi)
DE (1) DE3519390A1 (fi)
FI (1) FI69932C (fi)
FR (1) FR2565353B1 (fi)
GB (1) GB2159965B (fi)
IT (1) IT1200492B (fi)
ZA (1) ZA853855B (fi)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FI74549C (fi) * 1986-02-13 1988-02-08 Vaisala Oy Maetningsfoerfarande foer impedanser, saerskilt smao kapacitanser.
DE19524387C1 (de) * 1995-07-04 1996-11-07 Siemens Ag Schaltungsanordnung und Verfahren zum Messen eines Kapazitätsunterschiedes zwischen einer ersten Kapazität C1 und einer zweiten Kapazität C2
CN102096057B (zh) * 2010-11-16 2013-10-02 北京航天测控技术有限公司 一种电容测量电路的校准方法及装置

Family Cites Families (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE970798C (de) * 1953-05-16 1958-10-30 Rolf Scheunert Dr Ing Anordnung zur Messung von vorzugsweise sehr kleinen Kapazitaeten bzw. Kapazitaetsaenderungen
DE1026860B (de) * 1956-05-24 1958-03-27 Die Bundesrepublik Deutschland Schwebungskompensator
US3480857A (en) * 1967-12-27 1969-11-25 Ibm Digital method and apparatus for measuring small inductances and capacitances
DE2508033A1 (de) * 1975-02-25 1976-09-02 Zinn Erich Kapazitaets- und verlustfaktormesseinrichtung mit selbsttaetiger abgleichung
US4041382A (en) * 1976-08-16 1977-08-09 The Sippican Corporation Calibrating a measurement system including bridge circuit
GB2006970B (en) * 1977-09-23 1982-03-31 Testut Aequitas Capacitance measuring device
FI57319C (fi) * 1977-10-14 1980-07-10 Vaisala Oy Foerfarande foer maetning av smao kapacitanser
FI54664C (fi) * 1977-10-14 1979-01-10 Vaisala Oy Elektronisk omkopplingstroemstaellare i synnerhet foer telemeteranvaendning i sonder
US4130796A (en) * 1977-12-07 1978-12-19 Westinghouse Electric Corp. Calibrating and measuring circuit for a capacitive probe-type instrument
AU530552B2 (en) * 1978-04-07 1983-07-21 Minister of Public Works of Nsw Wave level measuring apparatus
JPS5528157A (en) * 1978-08-19 1980-02-28 Fuji Electric Co Ltd Displacement converter
US4295091B1 (en) * 1978-10-12 1995-08-15 Vaisala Oy Circuit for measuring low capacitances
FR2446037A1 (fr) * 1979-01-03 1980-08-01 Vaisala Oy Procede d'emission de signaux pour une radiosonde
DE2901516C2 (de) * 1979-01-16 1985-01-24 VEGA Grieshaber GmbH & Co, 7620 Wolfach Anordnung zur Erzeugung eines einer Kapazität proportionalen Signals
US4322977A (en) * 1980-05-27 1982-04-06 The Bendix Corporation Pressure measuring system
SE436936B (sv) * 1981-01-29 1985-01-28 Asea Ab Integrerad kapacitiv givare
US4398426A (en) * 1981-07-02 1983-08-16 Kavlico Corporation Linear capacitive pressure transducer system
DE3321580A1 (de) * 1983-06-15 1984-12-20 Philips Patentverwaltung Gmbh, 2000 Hamburg Einrichtung zur erfassung der temperatur fuer die kompensation temperaturabhaengiger fehler in einem kapazitiven differenzdrucksensor

Also Published As

Publication number Publication date
AU4274985A (en) 1985-12-05
FI842193A0 (fi) 1984-05-31
DE3519390C2 (fi) 1990-10-25
ZA853855B (en) 1986-03-26
FI69932B (fi) 1985-12-31
FR2565353A1 (fr) 1985-12-06
FI69932C (fi) 1986-05-26
GB2159965B (en) 1988-06-29
JPS60262067A (ja) 1985-12-25
DE3519390A1 (de) 1985-12-12
FR2565353B1 (fr) 1986-12-26
AU587578B2 (en) 1989-08-24
IT8520967A0 (it) 1985-05-30
GB8513830D0 (en) 1985-07-03
IT1200492B (it) 1989-01-18
BR8502572A (pt) 1986-02-04
GB2159965A (en) 1985-12-11

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Legal Events

Date Code Title Description
MKLA Lapsed